G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation

Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
10/1998
10/13/1998	US5822333 Digital memory testing method
10/13/1998	US5822258 Circuit and method for testing a memory device with a cell plate generator having a variable current
10/13/1998	US5822257 Semiconductor memory device capable of relieving fixed-failure memory cells and refresh-failure memory cells
10/13/1998	US5822256 Method and circuitry for usage of partially functional nonvolatile memory
10/08/1998	WO1998044420A1 Moving sectors within a block in a flash memory
10/08/1998	DE19755707A1 Single semiconductor chip with SDRAM core and integrated logic circuit
10/08/1998	DE19753423A1 Automatic power reduction circuit for SRAM control
10/07/1998	EP0869505A2 Voltage detection circuit and internal voltage clamp circuit
10/07/1998	EP0869440A1 Fault-tolerant memories and methods
10/07/1998	EP0868746A1 Reduced pitch laser redundancy fuse bank structure
10/07/1998	EP0868694A1 Method for setting the operating mode of an integrated circuit and an integrated circuit
10/07/1998	EP0868693A1 Circuit and method for enabling a function in a multiple memory device module
10/07/1998	EP0582370B1 Disk drive controller with a posted write cache memory
10/07/1998	CN1195232A Voltage detection circuit and internal voltage clamp circuit
10/07/1998	CN1195174A Auto power down circuit for semiconductor memory device
10/07/1998	CN1195173A Flexible fuse placement in redundant semiconductor memory
10/06/1998	US5819306 Shadow mechanism for a modifiable object oriented system
10/06/1998	US5819054 Storage system realizing scalability and fault tolerance
10/06/1998	US5819025 Method of testing interconnections between integrated circuits in a circuit
10/06/1998	US5818848 Automatic test circuitry with non-volatile status write
10/06/1998	US5818792 Semiconductor memory device and memory module using the same
10/06/1998	US5818791 Non-volatile semiconductor memory device and memory system using the same
10/06/1998	US5818778 Redundancy circuit for programmable integrated circuits
10/06/1998	US5818772 Semiconductor memory devices having a built-in test function
10/06/1998	US5818765 Semiconductor memory device having auxiliary memory
10/06/1998	US5818738 Method for testing the authenticity of a data carrier having an integrated circuit
10/06/1998	US5818286 Integrated circuit device capable of making a burn-in setting and test mode setting to run a burn-in and a test mode operation
10/06/1998	US5818285 Fuse signature circuits for microelectronic devices
10/06/1998	US5818268 Circuit for detecting leakage voltage of MOS capacitor
10/06/1998	US5818213 Back bias voltage detection circuit for semiconductor memory device
10/01/1998	DE19812198A1 Semiconductor memory tester with fault analysis memory
10/01/1998	DE19751544A1 Fault analyser for analysing origins of semiconductor faults
09/1998
09/30/1998	EP0867887A2 Memory access time measurement circuit and method
09/30/1998	EP0867810A2 Flexible fuse placement in redundant semiconductor memory
09/30/1998	EP0867727A2 Probeless testing of pad buffers on a wafer
09/30/1998	EP0867070A1 Zero power fuse circuit
09/30/1998	EP0482819B1 On-line reconstruction of a failed redundant array system
09/29/1998	US5815512 Semiconductor memory testing device
09/29/1998	US5815511 Semiconductor integrated circuit equipped with test circuit
09/29/1998	US5815509 Method and system for testing memory
09/29/1998	US5815453 Semiconductor memory device having redundant decoder with subtantially constant margin regardless of power voltage level
09/29/1998	US5815449 Semiconductor memory device
09/29/1998	US5815448 Semiconductor memory having redundancy circuit
09/29/1998	US5815447 Memory device having complete row redundancy
09/29/1998	US5815440 Semiconductor memory device with electrically controllable threshold voltage
09/29/1998	US5815437 Data input/output managing device, particularly for a non-volatile memory
09/29/1998	US5815425 Combined digital write and analog rewrite process for non-volatile memory
09/29/1998	US5815404 Method and apparatus for obtaining and using antifuse testing information to increase programmable device yield
09/24/1998	WO1998041990A1 Integrated circuit with a memory and a control circuit
09/24/1998	DE19736938A1 Micro computer with flash memory
09/24/1998	DE19711097A1 Integrierte Schaltung mit einem Speicher und einer Prüfschaltung An integrated circuit comprising a memory and a test circuit
09/24/1998	DE19708965A1 Datenspeicher Data storage
09/24/1998	DE19708963A1 Datenspeicher mit einer Redundanzschaltung Data memory having a redundancy circuit
09/24/1998	DE19708962A1 Datenspeicher mit einer Redundanzschaltung Data memory having a redundancy circuit
09/23/1998	EP0866466A2 Biasing scheme for reducing stress and improving reliability in EEPROM cells
09/23/1998	EP0817998A4 Memory testing in a multiple processor computer system
09/23/1998	EP0782747A4 Memory with stress circuitry for detecting defects
09/22/1998	US5812861 Override signal for forcing a powerdown of a flash memory
09/22/1998	US5812748 Method for improving recovery performance from hardware and software errors in a fault-tolerant computer system
09/22/1998	US5812565 In a programmable circuit memory
09/22/1998	US5812559 Controlling method and apparatus for examination of multiport RAM(s)
09/22/1998	US5812481 Semiconductor integrated circuit device allowing change of product specification and chip screening method therewith
09/22/1998	US5812472 Nested loop method of identifying synchronous memories
09/22/1998	US5812470 Apparatus, system and method for identifying semiconductor memory access modes
09/22/1998	US5812469 Method and apparatus for testing multi-port memory
09/22/1998	US5812468 Programmable device for redundant element cancel in a memory
09/22/1998	US5812467 Redundancy memory register
09/22/1998	US5812466 Column redundancy circuit for a semiconductor memory device
09/22/1998	US5812465 Redundancy circuit and method for providing word lines driven by a shift register
09/22/1998	US5812460 Nonvolatile semiconductor memory device having test circuit for testing erasing function thereof
09/16/1998	EP0865046A2 Analog signal recording and playback integrated circuit and message management system
09/16/1998	EP0864976A1 System for automatic fault searching applicable to any electronic digital equipment controlled by a processor
09/16/1998	EP0864870A2 Method of making an integrated circuit testing device
09/16/1998	EP0658845B1 Method and apparatus to store transaction data
09/16/1998	CN1193240A Detection-digital-signal processor in digital videl-disk reproducing device
09/15/1998	US5809556 Data storage system for highly frequent repetitive data writing
09/15/1998	US5809263 Integrated circuit I/O using a high performance bus interface
09/15/1998	US5809225 Semiconductor memory with built-in parallel bit test mode
09/15/1998	US5809224 On-line disk array reconfiguration
09/15/1998	US5809040 Testable circuit configuration having a plurality of identical circuit blocks
09/15/1998	US5809038 Method and apparatus for reading compressed test data from memory devices
09/15/1998	US5808960 Circuit and method for tracking the start of a write to a memory cell
09/15/1998	US5808953 Internal voltage generating circuit for semiconductor memory apparatus
09/15/1998	US5808949 Semiconductor memory
09/15/1998	US5808948 Semiconductor memory device
09/15/1998	US5808947 Integrated circuit that supports and method for wafer-level testing
09/15/1998	US5808946 Parallel processing redundancy scheme for faster access times and lower die area
09/15/1998	US5808945 Semiconductor memory having redundant memory array
09/15/1998	US5808944 Semiconductor memory device having a defect relief arrangement
09/12/1998	CA2230476A1 Analog signal recording and playback integrated circuit and message management system
09/11/1998	WO1998039777A2 Self-test for integrated memories
09/11/1998	WO1998039776A1 Memory with redundancy circuit
09/11/1998	WO1998039709A1 Data storage device with redundancy circuit
09/11/1998	WO1998039708A1 Memory with redundancy circuit
09/10/1998	DE19737838A1 DRAM for write and read-out of data
09/09/1998	EP0863515A1 Connection matrix for a semiconductor integrated microcontroller
09/09/1998	EP0863513A2 Method of writing data into memory with finite guaranteed write number of times and device for writing data into such memory
09/09/1998	EP0862762A1 Semiconductor memory device having error detection and correction
09/09/1998	EP0862761A2 Data error detection and correction for a shared sram
09/09/1998	EP0832438A4 Method and apparatus for probing, testing, burn-in, repairing and programming of integrated circuits in a closed environment using a single apparatus

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