Patents
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
03/1999
03/31/1999EP0905625A2 Semiconductor memory circuit having shift redundancy circuits
03/31/1999EP0905624A2 Semiconductor memory having redundancy circuit
03/31/1999CN1212464A Semiconductor integrated circuit with DRAM
03/31/1999CN1212437A Floating bitline test mode with digitally controllable bitline equalizers
03/31/1999CN1212432A Dimension programmable fusebanks and methods for making the same
03/30/1999US5890218 System for allocating and accessing shared storage using program mode and DMA mode
03/30/1999US5890188 Nonvolatile semiconductor memory device having means for selective transfer of memory block contents and for chaining together unused memory blocks
03/30/1999US5889938 Data reconstruction method and system wherein timing of data reconstruction is controlled in accordance with conditions when a failure occurs
03/30/1999US5889796 Method of insuring data integrity with a data randomizer
03/30/1999US5889786 Memory testing device
03/30/1999US5889727 Circuit for reducing the transmission delay of the redundancy evaluation for synchronous DRAM
03/30/1999US5889713 Testing of embedded memory by coupling the memory to input/output pads using switches
03/30/1999US5889712 Semiconductor memory device
03/30/1999US5889710 Semiconductor memory device with row redundancy
03/30/1999US5889702 Read circuit for memory adapted to the measurement of leakage currents
03/30/1999US5889701 Method and apparatus for selecting optimum levels for in-system programmable charge pumps
03/30/1999US5889414 Programmable circuits
03/25/1999WO1999014674A1 Dynamic memory with two operating modes
03/25/1999WO1998047060A3 Systems and methods for protecting access to encrypted information
03/25/1999DE19818045A1 Test circuit for integrated circuit on same chip
03/24/1999EP0903755A2 Ciruit and method to externally adjust internal circuit timing
03/24/1999EP0903754A2 Nonvolatile semiconductor memory
03/24/1999EP0903753A2 Nonvolatile semiconductor memory
03/24/1999EP0903752A2 Nonvolatile semiconductor memory
03/24/1999EP0903749A2 Nonvolatile semiconductor memory device
03/24/1999EP0902924A1 Redundancy concept for memory circuits with rom storage cells
03/24/1999CN1211796A Semiconductor memory
03/23/1999US5887270 Fault tolerant controller system and method
03/23/1999US5887128 Method and apparatus for redundant disk storage system with offset
03/23/1999US5886926 Circuit and method of measuring the negative threshold voltage of a non-volatile memory cell
03/23/1999US5886918 Semiconductor integrated circuit device having synchronous function with a plurality of external clocks
03/23/1999US5886905 Method of determining operating conditions for a nonvolatile semiconductor memory
03/23/1999US5886569 Semiconductor integrated circuit device with control circuit for controlling an internal source voltage
03/23/1999US5885846 Method and apparatus for testing of dielectric defects in a packaged semiconductor memory device
03/18/1999WO1999013475A1 Low cost, highly parallel memory tester
03/18/1999DE19814143A1 Semiconductor DRAM device for portable computer
03/18/1999DE19740933A1 Dynamic memory e.g. DRAM
03/17/1999CN1211044A 半导体装置 Semiconductor device
03/17/1999CN1211043A Semiconductor memory device having selection circuit
03/16/1999US5883903 Semiconductor memory of XN type having parity corresponding to n×m bits
03/16/1999US5883849 Method and apparatus for simultaneous memory subarray testing
03/16/1999US5883844 Method of stress testing integrated circuit having memory and integrated circuit having stress tester for memory thereof
03/16/1999US5883843 Built-in self-test arrangement for integrated circuit memory devices
03/16/1999US5883842 Memory card having block erasure type memory units which are used even when partially defective
03/16/1999US5883826 Memory block select using multiple word lines to address a single memory cell row
03/16/1999US5883008 Integrated circuit die suitable for wafer-level testing and method for forming the same
03/11/1999DE19819252A1 Semiconductor memory device
03/11/1999DE19813740A1 Semiconductor memory device
03/10/1999EP0901076A2 Dimension programmable fusebanks and methods for making the same
03/09/1999US5881221 Driver level diagnostics
03/09/1999US5881218 Apparatus for scan test of SRAM for microprocessors having full scan capability
03/09/1999US5881004 Burn-in stress control circuit for a semiconductor memory device
03/09/1999US5881003 Method of making a memory device fault tolerant using a variable domain redundancy replacement configuration
03/09/1999US5880996 Memory system having non-volatile data storage structure for memory control parameters and method
03/09/1999US5880993 Method and circuit for checking multilevel programming of floating-gate nonvolatile memory cells particularly flash cells
03/04/1999WO1999010893A2 Object reconstruction on object oriented data storage device
03/04/1999WO1999010891A1 Selective power distribution circuit for an integrated circuit
03/04/1999WO1999010754A1 Programmable formatter circuit for integrated circuit tester
03/03/1999EP0899740A2 Semiconductor device with plural power supply circuits, plural internal circuits, and single external terminal
03/03/1999EP0898786A1 Method and apparatus for programming anti-fuses using internally generated programming voltage
03/03/1999EP0842516A4 Method and apparatus for performing memory cell verification on a nonvolatile memory circuit
03/03/1999EP0547888B1 A read/write memory with improved test mode data compare
03/03/1999CN1209631A Semiconductor storage device having circuit making electric characteristics changed
03/02/1999US5878203 Recording device having alternative recording units operated in three different conditions depending on activities in maintaining diagnosis mechanism and recording sections
03/02/1999US5878201 Disk system and factory automation controller and method therefor
03/02/1999US5878052 Method and hardware arrangement for replacing defective function blocks in an integrated circuit
03/02/1999US5878050 Method and apparatus for data compare detection of memory errors on a computers memory subsystem
03/02/1999US5878048 Mask ROM having redundancy function
03/02/1999US5877993 Memory circuit voltage regulator
03/02/1999US5877991 Variable comparison voltage generation apparatus for generating a comparison voltage corresponding to a variation of electric charge quantity in a ferroelectric substance memory element
03/02/1999US5877987 Method and circuit for self-latching data read lines in the data output path of a semiconductor memory device
03/02/1999US5877986 Multi-state Flash EEprom system on a card that includes defective cell substitution
02/1999
02/25/1999DE19808338A1 Semiconductor memory with circuit for testing (AB) normal safety blow-out
02/24/1999EP0898285A1 Memory block replacement system and replacement method for a semiconductor memory
02/24/1999EP0898284A2 Semiconductor memory having a test circuit
02/24/1999EP0898283A2 Semiconductor component and method of testing and operating the semiconductor component
02/24/1999CN1208936A Semi-conductor assembly and method for testing and operating semi-conductor assembly
02/24/1999CN1208934A Semiconductor memory device with redundancy circuit
02/23/1999US5875477 Method and apparatus for error management in a solid state disk drive using primary and secondary logical sector numbers
02/23/1999US5875194 Semiconductor memory device
02/23/1999US5875153 Internal/external clock option for built-in self test
02/23/1999US5875144 Shared pull-up and selection circuitry for programmable cells such as antifuse cells
02/23/1999US5875137 Semiconductor memory device externally confirmable of a currently operated test mode
02/23/1999US5875135 Characterization of self time circuit
02/18/1999WO1999008116A2 A memory test system with a means for test sequence optimisation and a method of its operation
02/17/1999EP0896720A2 Self-test for integrated memories
02/17/1999EP0896673A1 Methods and systems for increased numbers of test points on printed circuit boards
02/17/1999CN1208254A Semiconductor integrated circuit reducing undesired current
02/17/1999CN1208236A Semiconductor memory device
02/17/1999CN1208235A Semiconductor integrated circuit device capable of externally monitoring internal voltage
02/17/1999CN1208234A One-chip clock synchronized memory device
02/17/1999CN1208231A Synchronous-type semiconductor storage
02/17/1999CN1042178C Method and apparatus for testing a static RAM
02/16/1999US5872994 Flash memory incorporating microcomputer having on-board writing function
02/16/1999US5872794 Flash EPROM control with embedded pulse timer and with built-in signature analysis
02/16/1999US5872792 Microcomputer
02/16/1999US5872738 Semiconductor integrated circuit device for enabling easy confirmation of discrete information
02/16/1999US5872448 Integrated circuit architecture having an array of test cells providing full controlability for automatic circuit verification
02/11/1999WO1999006911A2 Method for generating an error identification signal in the data inventory of a memory, and device designed for that purpose
02/11/1999DE19801557A1 Semiconductor device with contact test circuit