Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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03/31/1999 | EP0905625A2 Semiconductor memory circuit having shift redundancy circuits |
03/31/1999 | EP0905624A2 Semiconductor memory having redundancy circuit |
03/31/1999 | CN1212464A Semiconductor integrated circuit with DRAM |
03/31/1999 | CN1212437A Floating bitline test mode with digitally controllable bitline equalizers |
03/31/1999 | CN1212432A Dimension programmable fusebanks and methods for making the same |
03/30/1999 | US5890218 System for allocating and accessing shared storage using program mode and DMA mode |
03/30/1999 | US5890188 Nonvolatile semiconductor memory device having means for selective transfer of memory block contents and for chaining together unused memory blocks |
03/30/1999 | US5889938 Data reconstruction method and system wherein timing of data reconstruction is controlled in accordance with conditions when a failure occurs |
03/30/1999 | US5889796 Method of insuring data integrity with a data randomizer |
03/30/1999 | US5889786 Memory testing device |
03/30/1999 | US5889727 Circuit for reducing the transmission delay of the redundancy evaluation for synchronous DRAM |
03/30/1999 | US5889713 Testing of embedded memory by coupling the memory to input/output pads using switches |
03/30/1999 | US5889712 Semiconductor memory device |
03/30/1999 | US5889710 Semiconductor memory device with row redundancy |
03/30/1999 | US5889702 Read circuit for memory adapted to the measurement of leakage currents |
03/30/1999 | US5889701 Method and apparatus for selecting optimum levels for in-system programmable charge pumps |
03/30/1999 | US5889414 Programmable circuits |
03/25/1999 | WO1999014674A1 Dynamic memory with two operating modes |
03/25/1999 | WO1998047060A3 Systems and methods for protecting access to encrypted information |
03/25/1999 | DE19818045A1 Test circuit for integrated circuit on same chip |
03/24/1999 | EP0903755A2 Ciruit and method to externally adjust internal circuit timing |
03/24/1999 | EP0903754A2 Nonvolatile semiconductor memory |
03/24/1999 | EP0903753A2 Nonvolatile semiconductor memory |
03/24/1999 | EP0903752A2 Nonvolatile semiconductor memory |
03/24/1999 | EP0903749A2 Nonvolatile semiconductor memory device |
03/24/1999 | EP0902924A1 Redundancy concept for memory circuits with rom storage cells |
03/24/1999 | CN1211796A Semiconductor memory |
03/23/1999 | US5887270 Fault tolerant controller system and method |
03/23/1999 | US5887128 Method and apparatus for redundant disk storage system with offset |
03/23/1999 | US5886926 Circuit and method of measuring the negative threshold voltage of a non-volatile memory cell |
03/23/1999 | US5886918 Semiconductor integrated circuit device having synchronous function with a plurality of external clocks |
03/23/1999 | US5886905 Method of determining operating conditions for a nonvolatile semiconductor memory |
03/23/1999 | US5886569 Semiconductor integrated circuit device with control circuit for controlling an internal source voltage |
03/23/1999 | US5885846 Method and apparatus for testing of dielectric defects in a packaged semiconductor memory device |
03/18/1999 | WO1999013475A1 Low cost, highly parallel memory tester |
03/18/1999 | DE19814143A1 Semiconductor DRAM device for portable computer |
03/18/1999 | DE19740933A1 Dynamic memory e.g. DRAM |
03/17/1999 | CN1211044A 半导体装置 Semiconductor device |
03/17/1999 | CN1211043A Semiconductor memory device having selection circuit |
03/16/1999 | US5883903 Semiconductor memory of XN type having parity corresponding to n×m bits |
03/16/1999 | US5883849 Method and apparatus for simultaneous memory subarray testing |
03/16/1999 | US5883844 Method of stress testing integrated circuit having memory and integrated circuit having stress tester for memory thereof |
03/16/1999 | US5883843 Built-in self-test arrangement for integrated circuit memory devices |
03/16/1999 | US5883842 Memory card having block erasure type memory units which are used even when partially defective |
03/16/1999 | US5883826 Memory block select using multiple word lines to address a single memory cell row |
03/16/1999 | US5883008 Integrated circuit die suitable for wafer-level testing and method for forming the same |
03/11/1999 | DE19819252A1 Semiconductor memory device |
03/11/1999 | DE19813740A1 Semiconductor memory device |
03/10/1999 | EP0901076A2 Dimension programmable fusebanks and methods for making the same |
03/09/1999 | US5881221 Driver level diagnostics |
03/09/1999 | US5881218 Apparatus for scan test of SRAM for microprocessors having full scan capability |
03/09/1999 | US5881004 Burn-in stress control circuit for a semiconductor memory device |
03/09/1999 | US5881003 Method of making a memory device fault tolerant using a variable domain redundancy replacement configuration |
03/09/1999 | US5880996 Memory system having non-volatile data storage structure for memory control parameters and method |
03/09/1999 | US5880993 Method and circuit for checking multilevel programming of floating-gate nonvolatile memory cells particularly flash cells |
03/04/1999 | WO1999010893A2 Object reconstruction on object oriented data storage device |
03/04/1999 | WO1999010891A1 Selective power distribution circuit for an integrated circuit |
03/04/1999 | WO1999010754A1 Programmable formatter circuit for integrated circuit tester |
03/03/1999 | EP0899740A2 Semiconductor device with plural power supply circuits, plural internal circuits, and single external terminal |
03/03/1999 | EP0898786A1 Method and apparatus for programming anti-fuses using internally generated programming voltage |
03/03/1999 | EP0842516A4 Method and apparatus for performing memory cell verification on a nonvolatile memory circuit |
03/03/1999 | EP0547888B1 A read/write memory with improved test mode data compare |
03/03/1999 | CN1209631A Semiconductor storage device having circuit making electric characteristics changed |
03/02/1999 | US5878203 Recording device having alternative recording units operated in three different conditions depending on activities in maintaining diagnosis mechanism and recording sections |
03/02/1999 | US5878201 Disk system and factory automation controller and method therefor |
03/02/1999 | US5878052 Method and hardware arrangement for replacing defective function blocks in an integrated circuit |
03/02/1999 | US5878050 Method and apparatus for data compare detection of memory errors on a computers memory subsystem |
03/02/1999 | US5878048 Mask ROM having redundancy function |
03/02/1999 | US5877993 Memory circuit voltage regulator |
03/02/1999 | US5877991 Variable comparison voltage generation apparatus for generating a comparison voltage corresponding to a variation of electric charge quantity in a ferroelectric substance memory element |
03/02/1999 | US5877987 Method and circuit for self-latching data read lines in the data output path of a semiconductor memory device |
03/02/1999 | US5877986 Multi-state Flash EEprom system on a card that includes defective cell substitution |
02/25/1999 | DE19808338A1 Semiconductor memory with circuit for testing (AB) normal safety blow-out |
02/24/1999 | EP0898285A1 Memory block replacement system and replacement method for a semiconductor memory |
02/24/1999 | EP0898284A2 Semiconductor memory having a test circuit |
02/24/1999 | EP0898283A2 Semiconductor component and method of testing and operating the semiconductor component |
02/24/1999 | CN1208936A Semi-conductor assembly and method for testing and operating semi-conductor assembly |
02/24/1999 | CN1208934A Semiconductor memory device with redundancy circuit |
02/23/1999 | US5875477 Method and apparatus for error management in a solid state disk drive using primary and secondary logical sector numbers |
02/23/1999 | US5875194 Semiconductor memory device |
02/23/1999 | US5875153 Internal/external clock option for built-in self test |
02/23/1999 | US5875144 Shared pull-up and selection circuitry for programmable cells such as antifuse cells |
02/23/1999 | US5875137 Semiconductor memory device externally confirmable of a currently operated test mode |
02/23/1999 | US5875135 Characterization of self time circuit |
02/18/1999 | WO1999008116A2 A memory test system with a means for test sequence optimisation and a method of its operation |
02/17/1999 | EP0896720A2 Self-test for integrated memories |
02/17/1999 | EP0896673A1 Methods and systems for increased numbers of test points on printed circuit boards |
02/17/1999 | CN1208254A Semiconductor integrated circuit reducing undesired current |
02/17/1999 | CN1208236A Semiconductor memory device |
02/17/1999 | CN1208235A Semiconductor integrated circuit device capable of externally monitoring internal voltage |
02/17/1999 | CN1208234A One-chip clock synchronized memory device |
02/17/1999 | CN1208231A Synchronous-type semiconductor storage |
02/17/1999 | CN1042178C Method and apparatus for testing a static RAM |
02/16/1999 | US5872994 Flash memory incorporating microcomputer having on-board writing function |
02/16/1999 | US5872794 Flash EPROM control with embedded pulse timer and with built-in signature analysis |
02/16/1999 | US5872792 Microcomputer |
02/16/1999 | US5872738 Semiconductor integrated circuit device for enabling easy confirmation of discrete information |
02/16/1999 | US5872448 Integrated circuit architecture having an array of test cells providing full controlability for automatic circuit verification |
02/11/1999 | WO1999006911A2 Method for generating an error identification signal in the data inventory of a memory, and device designed for that purpose |
02/11/1999 | DE19801557A1 Semiconductor device with contact test circuit |