Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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06/29/1999 | US5917766 Semiconductor memory device that can carry out read disturb testing and burn-in testing reliably |
06/29/1999 | US5917765 Semiconductor memory device capable of burn in mode operation |
06/29/1999 | US5917764 Semiconductor memory device |
06/29/1999 | US5917763 Method and apparatus for repairing opens on global column lines |
06/29/1999 | US5917750 Nonvolatile semiconductor memory with a protect circuit |
06/29/1999 | CA2116818C Method for storing security relevant data |
06/29/1999 | CA2004436C Test chip for use in semiconductor fault analysis |
06/24/1999 | WO1999031661A1 Optical disc recording/reproducing method, optical disc, and optical disc device |
06/24/1999 | WO1999031592A1 Flash memory system |
06/24/1999 | WO1999031585A1 Monitoring system for a digital trimming cell |
06/24/1999 | CA2313646A1 Monitoring system |
06/23/1999 | EP0924765A2 Memory with word line voltage control |
06/23/1999 | CN1220465A Memory with word line voltage control |
06/22/1999 | US5915105 Memory device |
06/22/1999 | US5915084 Scannable sense amplifier circuit |
06/22/1999 | US5914964 Memory fail analysis device in semiconductor memory test system |
06/22/1999 | US5914907 Semiconductor memory device capable of increasing chip yields while maintaining rapid operation |
06/22/1999 | US5914905 Semiconductor integrated circuit |
06/22/1999 | US5914902 Synchronous memory tester |
06/22/1999 | US5913928 Data compression test mode independent of redundancy |
06/17/1999 | WO1999030327A1 Semiconductor memory device, semiconductor device and electronic apparatus employing it |
06/16/1999 | EP0923082A2 Semiconductor memory having a sense amplifier |
06/16/1999 | EP0923029A1 Redundant memory, data processor using same, and method therefor |
06/16/1999 | EP0549374B1 Nonvolatile semiconductor memory |
06/16/1999 | CN1043694C Circuit for generating internal source voltage |
06/15/1999 | US5913219 Database recovery apparatus and method of using dual plane nonvolatile memory |
06/15/1999 | US5913020 Method for using fuse identification codes for masking bad bits on single in-line memory modules |
06/15/1999 | US5912901 Method and built-in self-test apparatus for testing an integrated circuit which capture failure information for a selected failure |
06/15/1999 | US5912899 Integrated memory device |
06/15/1999 | US5912852 Synchronous memory test method |
06/15/1999 | US5912851 Multi-bit semiconductor memory device allowing efficient testing |
06/15/1999 | US5912850 Multi-port RAM with shadow write test enhancement |
06/15/1999 | US5912841 Repair fuse circuit performing complete latch operation using flash memory cell |
06/15/1999 | US5912836 Circuit for detecting both charge gain and charge loss properties in a non-volatile memory array |
06/15/1999 | US5912579 Circuit for cancelling and replacing redundant elements |
06/15/1999 | US5912564 Voltage-boosting circuit with mode signal |
06/09/1999 | EP0921528A1 A memory device using direct access mode test and a method of testing the same |
06/09/1999 | EP0920699A1 Antifuse detect circuit |
06/09/1999 | EP0860011B1 Method and device for automatic determination of the required high voltage for programming/erasing an eeprom |
06/09/1999 | CN1218962A Method and apparatus for detecting multiple cluster memory device with multiple memory clusters |
06/09/1999 | CN1218961A Method for detecting memory unit |
06/08/1999 | US5910923 Memory access circuits for test time reduction |
06/08/1999 | US5910922 Method for testing data retention in a static random access memory using isolated Vcc supply |
06/08/1999 | US5910921 Self-test of a memory device |
06/08/1999 | US5910916 Flash-erasable semiconductor memory device having improved reliability |
06/08/1999 | US5910181 Semiconductor integrated circuit device comprising synchronous DRAM core and logic circuit integrated into a single chip and method of testing the synchronous DRAM core |
06/03/1999 | WO1999027453A1 Alignment of cluster address to block addresses within a semiconductor non-volatile mass storage memory |
06/03/1999 | WO1999027431A2 A memory redundancy allocation system and a method of redundancy allocation |
06/03/1999 | CA2310771A1 A memory redundancy allocation system and a method of redundancy allocation |
06/02/1999 | EP0920032A2 Ferroelectric random access memory device having short-lived cell detector available for life test for ferroelectric capacitor and method for testing ferroelectric memory cells |
06/02/1999 | EP0919917A2 Method to test the buffer memory of a microprocessor system |
06/02/1999 | EP0919914A1 Architecture for managing vital data in a multi-modular machine and method for operating such an architecture |
06/02/1999 | CN1218572A Circuit arrangement with test circuit |
06/02/1999 | CN1218260A Ferroelectric random access memory device having short-lived cell detector AV ailable for life test for ferroelectric capacitor and method for testing ferroelectric memory cells |
06/01/1999 | US5909657 Semiconductor device testing apparatus |
06/01/1999 | US5909449 Multibit-per-cell non-volatile memory with error detection and correction |
06/01/1999 | US5909448 Memory testing apparatus using a failure cell array |
06/01/1999 | US5909404 Method for on-chip testing of a memory device |
06/01/1999 | US5909402 Circuit for driving/controlling sensing amplifier |
06/01/1999 | US5909399 Non-volatile semiconductor memory device and memory system using the same |
06/01/1999 | US5909398 Semiconductor memory device and high-voltage switching circuit |
06/01/1999 | US5909397 Method and system for testing and adjusting threshold voltages in flash eeproms |
06/01/1999 | US5909395 Flash EEPROM with erase verification and address scrambling architecture |
06/01/1999 | US5909390 Techniques of programming and erasing an array of multi-state flash EEPROM cells including comparing the states of the cells to desired values |
05/27/1999 | DE19751578A1 Read-only memory testing method for data processor ROM |
05/26/1999 | CN1217548A Semiconductor storage device having address conversion circuit |
05/26/1999 | CN1217547A Internal-circuit timed external regulation circuit and method therefor |
05/26/1999 | CN1217546A Synchronous semiconductor storage device having timed circuit of controlling activation/non-activation of word line |
05/26/1999 | CN1217545A Synchronous semiconductor storage device having circuit capable of reliably resetting detection means |
05/25/1999 | US5907856 Moving sectors within a block of information in a flash memory mass storage architecture |
05/25/1999 | US5907561 Method of testing semiconductor memory devices |
05/25/1999 | US5907515 Semiconductor memory device |
05/25/1999 | US5907514 Circuit and method for controlling a redundant memory cell in an integrated memory circuit |
05/25/1999 | US5907513 Semiconductor memory device |
05/25/1999 | US5907511 Electrically selectable redundant components for an embedded DRAM |
05/25/1999 | US5907507 Microcomputer and multi-chip module |
05/20/1999 | DE19851861A1 Fault analysis memory for semiconductor memory testers |
05/19/1999 | EP0917059A1 A semiconductor memory device having an ECC circuit |
05/19/1999 | EP0916140A1 Method and apparatus for self-testing multi-port rams |
05/19/1999 | CN1217082A Data processor with built- in DRAM |
05/19/1999 | CN1217062A Assembly and method for testing integrated circuit device |
05/19/1999 | CN1216850A Semiconductor memory device with redundant decoder having small scale in circuitry |
05/18/1999 | US5905986 Highly compressible representation of test pattern data |
05/18/1999 | US5905854 Fault tolerant memory system |
05/18/1999 | US5905737 Test circuit |
05/18/1999 | US5905691 Semiconductor memory |
05/18/1999 | US5905690 Synchronous semiconductor device having circuitry capable of surely resetting test mode |
05/18/1999 | US5905688 Auto power down circuit for a semiconductor memory device |
05/18/1999 | US5905687 Fuse refresh circuit |
05/18/1999 | US5905683 Method and structure for recovering smaller density memories from larger density memories |
05/18/1999 | US5905681 Redundant decoder utilizing address signal and burst length |
05/18/1999 | US5905675 Biasing scheme for reducing stress and improving reliability in EEPROM cells |
05/18/1999 | US5905650 Failure analyzer |
05/18/1999 | US5905392 Auto-refresh control circuit for semiconductor device |
05/18/1999 | US5905295 Reduced pitch laser redundancy fuse bank structure |
05/14/1999 | WO1999023666A1 Circuit and method for stress testing eeproms |
05/14/1999 | WO1999023665A1 Method for testing the bus terminals of writable-readable integrated electronic integrated circuits, especially of memory chips |
05/12/1999 | EP0915421A2 Semiconductor memory device capable of preventing malfunction due to disconnection of column select line or word select line |
05/12/1999 | DE19749240A1 Testing buffer memory of microprocessor system |
05/12/1999 | CN1216388A Nonvolatile memory device and deterioration detecting |