| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 07/28/1999 | EP0701210B1 Data processor having data bus and instruction fetch bus provided separately from each other |
| 07/28/1999 | EP0689695B1 Fault tolerant memory system |
| 07/28/1999 | EP0569040B1 Memory card device |
| 07/28/1999 | CN1224220A Semiconductor memory capable of testing regardless of spare unit configuration |
| 07/27/1999 | US5930815 Moving sequential sectors within a block of information in a flash memory mass storage architecture |
| 07/27/1999 | US5930814 Computer system and method for synthesizing a filter circuit for filtering out addresses greater than a maximum address |
| 07/27/1999 | US5930194 Semiconductor memory device capable of block writing in large bus width |
| 07/27/1999 | US5930188 Memory circuit for performing threshold voltage tests on cells of a memory array |
| 07/27/1999 | US5930187 One-chip LSI including a general memory and a logic |
| 07/27/1999 | US5930186 Method and apparatus for testing counter and serial access memory |
| 07/27/1999 | US5930185 Data retention test for static memory cell |
| 07/27/1999 | US5930184 Memory device having two or more memory arrays and a testpath connected to one of the memory arrays and not operably connected to another memory array, and a method of operating the testpath |
| 07/27/1999 | US5930183 Semiconductor memory device |
| 07/27/1999 | US5930182 Memory device |
| 07/27/1999 | US5930169 Nonvolatile semiconductor memory device capable of improving of chip's lifetime and method of operating the same |
| 07/27/1999 | US5929696 Circuit for converting internal voltage of semiconductor device |
| 07/27/1999 | US5929691 Mode setting circuit for a memory device |
| 07/27/1999 | US5928373 High speed test circuit for a semiconductor memory device |
| 07/27/1999 | US5928370 Controller device for use in a digital system |
| 07/27/1999 | US5928367 Mirrored memory dual controller disk storage system |
| 07/27/1999 | US5928343 Method for assigning identification values to memories |
| 07/22/1999 | WO1999037083A2 Affine transformation means and method of affine transformation |
| 07/22/1999 | DE19838857A1 Semiconductor arrangement for memory cell evaluation |
| 07/22/1999 | DE19826021A1 Semiconductor memory arrangement |
| 07/22/1999 | CA2312126A1 Affine transformation means and method of affine transformation |
| 07/21/1999 | EP0930569A2 Trimbit circuit for flash memory integrated circuits |
| 07/21/1999 | EP0929939A1 Self-timed pulse control circuit |
| 07/21/1999 | EP0929901A1 Memory array, memory cell, and sense amplifier test and characterization |
| 07/21/1999 | EP0929900A1 Data retention test for static memory cell |
| 07/21/1999 | EP0929898A1 Memory block select using multiple word lines to address a single memory cell row |
| 07/21/1999 | EP0929896A1 Memory including resistor bit-line loads |
| 07/21/1999 | EP0929895A1 Active power supply filter |
| 07/21/1999 | EP0832486A4 Nonvolatile memory blocking architecture and redundancy |
| 07/21/1999 | CN1223444A Semiconductor memory device having ECC circuit |
| 07/21/1999 | CN1223443A 半导体集成电路装置 The semiconductor integrated circuit device |
| 07/20/1999 | US5926620 Content addressable bit replacement memory |
| 07/20/1999 | US5926485 Semiconductor testing device with rewrite controller |
| 07/20/1999 | US5926484 Fault correction apparatus for an address array of a store-in cache memory and method therefor |
| 07/20/1999 | US5926431 Semiconductor memory |
| 07/20/1999 | US5926424 Semiconductor memory device capable of performing internal test at high speed |
| 07/20/1999 | US5926423 Wafer burn-in circuit for a semiconductor memory device |
| 07/20/1999 | US5926422 Integrated circuit memory device having current-mode data compression test mode |
| 07/20/1999 | US5926421 Semiconductor memory devices with spare column decoder |
| 07/20/1999 | US5926420 Merged Memory and Logic (MML) integrated circuits including data path width reducing circuits and methods |
| 07/20/1999 | US5926036 Programmable logic array circuits comprising look up table implementation of fast carry adders and counters |
| 07/20/1999 | US5925143 Scan-bypass architecture without additional external latches |
| 07/20/1999 | US5925142 Self-test RAM using external synchronous clock |
| 07/20/1999 | US5925141 Semiconductor memory device with data scramble circuit |
| 07/20/1999 | US5925138 Method for allowing data transfers with a memory having defective storage locations |
| 07/20/1999 | CA2044869C Array disc memory equipment capable of confirming logical address positions for disc drive modules installed therein |
| 07/14/1999 | EP0929077A2 Semiconductor memory with built-in parallel bit test mode |
| 07/14/1999 | EP0929036A2 Method and apparatus of column redundancy for non-volatile analog and multilevel memory integrated circuits |
| 07/14/1999 | EP0928486A1 Device and method for testing integrated circuit dice in an integrated circuit module |
| 07/14/1999 | EP0928484A1 Charge sharing detection circuit for anti-fuses |
| 07/14/1999 | EP0867070A4 Zero power fuse circuit |
| 07/14/1999 | CN1222740A Redundancy method and semiconductor circuit |
| 07/13/1999 | US5924113 Direct logical block addressing flash memory mass storage architecture |
| 07/13/1999 | US5923899 System for generating configuration output signal responsive to configuration input signal, enabling configuration, and providing status signal identifying enabled configuration responsive to the output signal |
| 07/13/1999 | US5923835 Method for scan test of SRAM for microprocessors having full scan capability |
| 07/13/1999 | US5923682 Error correction chip for memory applications |
| 07/13/1999 | US5923675 Semiconductor tester for testing devices with embedded memory |
| 07/13/1999 | US5923674 Semiconductor electrically erasable and writeable non-volatile memory device |
| 07/13/1999 | US5923672 Multipath antifuse circuit |
| 07/13/1999 | US5923602 In an integrated circuit device |
| 07/13/1999 | US5923601 In an integrated circuit |
| 07/13/1999 | US5923600 Semiconductor device and test method and apparatus for semiconductor device |
| 07/13/1999 | US5923599 In a semiconductor memory unit |
| 07/13/1999 | US5923598 Row fuse detect circuit |
| 07/13/1999 | US5923157 Semiconductor device capable of decreasing an internal voltage in period of acceleration test |
| 07/08/1999 | DE19833952A1 Semiconductor memory with block write mode, for writing data values in numerous memory cells |
| 07/07/1999 | EP0928002A1 Dual memory for digital signal processor |
| 07/07/1999 | EP0927422A1 Method and apparatus for providing external access to internal integrated circuit test circuits |
| 07/07/1999 | CN1221958A Semiconductor memory device |
| 07/06/1999 | US5920579 Digital signal reproduction apparatus |
| 07/06/1999 | US5920574 Method for accelerated test of semiconductor devices |
| 07/06/1999 | US5920573 Method and apparatus for reducing area and pin count required in design for test of wide data path memories |
| 07/06/1999 | US5920517 Memory array test and characterization using isolated memory cell power supply |
| 07/06/1999 | US5920516 Circuit and method for enabling a function in a multiple memory device module |
| 07/06/1999 | US5920515 Register-based redundancy circuit and method for built-in self-repair in a semiconductor memory device |
| 07/06/1999 | US5920514 Memory device with efficient redundancy using sense amplifiers |
| 07/06/1999 | US5920513 Partial replacement of partially defective memory devices |
| 07/06/1999 | US5920512 Method of storing and retrieving data |
| 07/06/1999 | US5920502 Nonvolatile semiconductor memory with fast data programming and erasing function using ECC |
| 07/06/1999 | US5920201 Circuit for testing pumped voltage gates in a programmable gate array |
| 07/06/1999 | US5919270 Programmable formatter circuit for integrated circuit tester |
| 07/06/1999 | US5919269 Memory device |
| 07/01/1999 | WO1999032977A1 Flash memory system |
| 07/01/1999 | WO1999032975A1 Process for repairing integrated circuits |
| 07/01/1999 | WO1999018509A9 Moving sequential sectors within a block of information in a flash memory mass storage architecture |
| 07/01/1999 | DE19831766A1 Semiconductor memory with a test mode |
| 07/01/1999 | DE19755384A1 Überwachungssystem Monitoring system |
| 07/01/1999 | DE19606637C2 Integrierte Halbleiterschaltungsvorrichtung A semiconductor integrated circuit device |
| 07/01/1999 | CA2316314A1 Process for repairing integrated circuits |
| 06/30/1999 | EP0926687A1 Self-test and correction of loss of charge errors in a flash memory, erasable and programmable by sectors thereof |
| 06/30/1999 | EP0926599A1 Memory control unit with programmable timing |
| 06/30/1999 | CN1221190A Semiconductor memory device having test mode |
| 06/30/1999 | CN1043928C Multi-bit test circuit of semiconductor memory device |
| 06/29/1999 | US5918241 Method and apparatus for setting a plurality of addresses |
| 06/29/1999 | US5917833 Testing apparatus for semiconductor device |
| 06/29/1999 | US5917832 Self-test circuit and method utilizing interlaced scanning for testing a semiconductor memory device |