G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation

Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
08/1999
08/31/1999	US5946559 Method of forming a field effect transistor
08/31/1999	US5946257 Memory device
08/31/1999	US5946250 Memory testing apparatus
08/31/1999	US5946249 Circuit configuration for a programmable nonvolatile memory and method for operating the circuit configuration
08/31/1999	US5946248 Method for burn-in operation on a wafer of memory devices
08/31/1999	US5946247 Semiconductor memory testing device
08/31/1999	US5946246 Semiconductor memory device with built-in self test circuit
08/31/1999	US5946245 Memory array test circuit and method
08/31/1999	US5946242 Internal source voltage generator for a semiconductor memory device
08/31/1999	US5946239 Non-volatile semiconductor memory device
08/31/1999	US5946226 SRAM for SNM measurement
08/31/1999	US5945840 Low current redundancy anti-fuse assembly
08/26/1999	WO1999043004A1 Circuit and method for testing a digital semi-conductor circuit
08/25/1999	EP0618535B1 EEPROM card with defective cell substitution and cache memory
08/24/1999	US5943693 Algorithmic array mapping to decrease defect sensitivity of memory devices
08/24/1999	US5943281 Semiconductor integrated circuit reducing undesired current
08/24/1999	US5943280 Semiconductor memory device which can be tested while selecting word lines successively at high speed
08/24/1999	US5943277 Apparatus and method for recognizing the state of connection of terminals
08/24/1999	US5943276 Circuit and method for testing a memory device with a cell plate generator having a variable current
08/24/1999	US5943275 Redundancy system
08/24/1999	US5943272 Circuit for sensing memory having a plurality of threshold voltages
08/24/1999	US5943257 Ferroelectric memory device and data protection method thereof
08/24/1999	US5942808 Semiconductor device with plural power supply circuits, plural internal circuits, and single external terminal
08/24/1999	US5942004 Device and a method for storing data and corresponding error-correction information
08/24/1999	US5942000 Circuit and method for testing an integrated circuit
08/24/1999	US5941993 Data reconstruction method and system wherein timing of data reconstruction is controlled in accordance with conditions when a failure occurs
08/18/1999	EP0936611A2 Information recording method and apparatus
08/18/1999	EP0936549A2 Semiconductor memory device incorporating redundancy memory cells having uniform layout
08/18/1999	EP0936534A2 Recording device
08/18/1999	EP0935802A1 Staggered row line firing in a single ras cycle
08/17/1999	US5940875 Address pattern generator for burst address access of an SDRAM
08/17/1999	US5940874 Memory device speed tester
08/17/1999	US5940588 Method for testing an integrated circuit
08/17/1999	US5940413 Method for detecting operational errors in a tester for semiconductor devices
08/17/1999	US5940335 Prioritizing the repair of faults in a semiconductor memory device
08/17/1999	US5940334 Memory interface circuit including bypass data forwarding with essentially no delay
08/17/1999	US5940323 Erase circuit of flash memory device
08/17/1999	US5939914 Synchronous test mode initialization
08/17/1999	US5938784 Linear feedback shift register, multiple input signature register, and built-in self test circuit using such registers
08/17/1999	US5938779 Asic control and data retrieval method and apparatus having an internal collateral test interface function
08/17/1999	CA2065832C Recording device having short data writing time
08/12/1999	WO1999040450A1 Apparatus for testing semiconductor device
08/12/1999	DE19860516A1 Semiconductor memory with redundant memory cell matrix
08/12/1999	DE19825012A1 Integrated semiconductor memory device
08/12/1999	DE19825011A1 Integrated semiconductor memory device
08/12/1999	DE19823701A1 Equalization pulse width control circuit for data transmission system
08/12/1999	DE19804596A1 Method to test semiconducting memories addressable using partial address decoder
08/11/1999	EP0935256A1 Test method for writable nonvolatile semiconductor memory device
08/11/1999	EP0935255A2 Flash EEPROM system
08/11/1999	EP0808487B1 Apparatus and method for entering and executing test mode operations for memory
08/10/1999	US5937435 System and method for skip-sector mapping in a data recording disk drive
08/10/1999	US5937367 Method for testing a memory chip, divided into cell arrays, during ongoing operation of a computer while maintaining real-time conditions
08/10/1999	US5937180 Method and apparatus relating to a telecommunications system
08/10/1999	US5936976 Selecting a test data input bus to supply test data to logical blocks within an integrated circuit
08/10/1999	US5936975 Semiconductor memory device with switching circuit for controlling internal addresses in parallel test
08/10/1999	US5936974 Circuit and method for testing an integrated circuit
08/10/1999	US5936973 For enabling a program verify mode of operation in a device
08/10/1999	US5936971 Multi-state flash EEprom system with cache memory
08/10/1999	US5936970 Repair circuit of a flash memory cell and repair method
08/10/1999	US5936910 Semiconductor memory device having burn-in test function
08/10/1999	US5936907 Method for detecting redunded defective addresses in a memory device with redundancy
08/10/1999	US5936902 Method of testing for SRAM pull-down transistor sub-threshold leakage
08/10/1999	US5936901 Shared data lines for memory write and memory test operations
08/10/1999	US5936900 Integrated circuit memory device having built-in self test circuit with monitor and tester modes
08/10/1999	US5936899 Wafer burn-in test circuit of a semiconductor memory device
08/10/1999	US5936892 Memory cell DC characterization apparatus and method
08/10/1999	US5936269 Semiconductor memory device including a redundant circuit
08/10/1999	US5935263 Method and apparatus for memory array compressed data testing
08/10/1999	US5935258 Apparatus for allowing data transfers with a memory having defective storage locations
08/10/1999	CA2003377C Epm having an improvement in non-volatile storage of accounting data
08/05/1999	WO1999039354A2 Event phase modulator for integrated circuit tester
08/05/1999	WO1999039218A2 Circuit with interconnect test unit and a method of testing interconnects between a first and a second electronic circuit
08/05/1999	DE19844703A1 Logic integrated semiconductor device for use as synchronous memory
08/05/1999	DE19804035A1 Integrierter Speicher Built-in Memory
08/04/1999	EP0933785A1 Semiconductor device and power supply current detecting method
08/04/1999	EP0933778A2 Nonvolatile semiconductor memory
08/04/1999	EP0933709A2 Repairable semiconductor intergrated circuit memory by selective assignmment of groups of redundancy elements to domains
08/04/1999	EP0933708A2 Integrated storage featuring error correcting data in one operating mode
08/04/1999	EP0933644A1 Device scan testing
08/04/1999	EP0932904A1 Overvoltage detection circuit for test mode selection
08/04/1999	EP0932868A2 A method of updating program code for an optical disc drive microcontroller and an optical disc drive
08/04/1999	EP0757836A4 An iterative method of recording analog signals
08/04/1999	CN1224898A Semi-conductor storing apparatus and its driving method
08/03/1999	US5933852 System and method for accelerated remapping of defective memory locations
08/03/1999	US5933608 Multiway signal switching device including a WSIC and optical communication ports
08/03/1999	US5933522 Specific part searching method and device for memory LSI
08/03/1999	US5933434 Integrated circuit memory device
08/03/1999	US5933382 Semiconductor memory device including a redundant memory cell circuit which can reduce a peak current generated in a redundant fuse box
08/03/1999	US5933381 Semiconductor integrated circuit having DRAM mounted on semiconductor chip
08/03/1999	US5933379 Method and circuit for testing a semiconductor memory device operating at high frequency
08/03/1999	US5933377 Semiconductor memory device and defect repair method for semiconductor memory device
08/03/1999	US5933376 Semiconductor memory device with electrically programmable redundancy
08/03/1999	US5933374 Memory with reduced wire connections
08/03/1999	US5933370 Trimbit circuit for flash memory
07/1999
07/29/1999	WO1999038170A1 Encoding method and memory device
07/29/1999	WO1999038075A1 Defect-tolerant memory system
07/29/1999	WO1999038066A1 Flash memory system
07/29/1999	DE19839108A1 Circuit for memory cell sensing by several threshold voltages
07/28/1999	EP0931315A1 Trimming circuit
07/28/1999	EP0931288A1 Layout for a semiconductor memory device having redundant elements

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