| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 09/29/1999 | EP0945803A2 Redundancy word line replacement in semiconductor memory device |
| 09/29/1999 | EP0945802A2 Semiconductor memory device with redundancy |
| 09/29/1999 | CN1229999A Semiconductor memory device, and method of checking the semiconductor device and method of using the same |
| 09/29/1999 | CN1229924A IC testing apparatus |
| 09/29/1999 | CN1045345C Row redundancy circuit and method for semiconductor memory device with double row decoder |
| 09/28/1999 | USRE36319 Structure for deselective broken select lines in memory arrays |
| 09/28/1999 | US5960457 Cache coherency test system and methodology for testing cache operation in the presence of an external snoop |
| 09/28/1999 | US5960008 Test circuit |
| 09/28/1999 | US5959932 Method and apparatus for detecting errors in the writing of data to a memory |
| 09/28/1999 | US5959917 Circuit for detecting the coincidence between a binary information unit stored therein and an external datum |
| 09/28/1999 | US5959915 Test method of integrated circuit devices by using a dual edge clock technique |
| 09/28/1999 | US5959914 Memory controller with error correction memory test application |
| 09/28/1999 | US5959913 Device and method for stress testing a semiconductor memory |
| 09/28/1999 | US5959912 ROM embedded mask release number for built-in self-test |
| 09/28/1999 | US5959911 Apparatus and method for implementing a bank interlock scheme and related test mode for multibank memory devices |
| 09/28/1999 | US5959910 Sense amplifier control of a memory device |
| 09/28/1999 | US5959909 Memory circuit with auto redundancy |
| 09/28/1999 | US5959908 Semiconductor memory device having spare word lines |
| 09/28/1999 | US5959907 Semiconductor memory device having a redundancy circuit |
| 09/28/1999 | US5959906 Semiconductor memory device with a fully accessible redundant memory cell array |
| 09/28/1999 | US5959904 Dynamic column redundancy driving circuit for synchronous semiconductor memory device |
| 09/28/1999 | US5959903 Column redundancy in semiconductor memories |
| 09/28/1999 | US5959891 Evaluation of memory cell characteristics |
| 09/28/1999 | US5959890 Non-volatile semiconductor memory device |
| 09/28/1999 | US5959860 Method and apparatus for operating an array of storage devices |
| 09/28/1999 | US5959467 High speed dynamic differential logic circuit employing capacitance matching devices |
| 09/28/1999 | US5959445 Static, high-sensitivity, fuse-based storage cell |
| 09/28/1999 | US5958074 Data processor having data bus and instruction fetch bus provided separately from each other |
| 09/28/1999 | US5958065 Content addressable bit replacement memory |
| 09/23/1999 | WO1999039218A3 Circuit with interconnect test unit and a method of testing interconnects between a first and a second electronic circuit |
| 09/22/1999 | EP0944094A2 Flash memory with improved erasability and its circuitry |
| 09/22/1999 | EP0820631B1 Circuit for sram test mode isolated bitline modulation |
| 09/22/1999 | CN1229249A Semiconductor memory device having means for outputting redundancy replacement selection signal |
| 09/21/1999 | US5956475 Computer failure recovery and alert system |
| 09/21/1999 | US5956473 Method and system for managing a flash memory mass storage system |
| 09/21/1999 | US5956352 Adjustable filter for error detecting and correcting system |
| 09/21/1999 | US5956350 Built in self repair for DRAMs using on-chip temperature sensing and heating |
| 09/21/1999 | US5956349 Semiconductor memory device for high speed data communication capable of accurate testing of pass/fail and memory system employing the same |
| 09/21/1999 | US5956282 Antifuse detect circuit |
| 09/21/1999 | US5956281 Semiconductor memory device capable of setting substrate voltage shallow in disturb test mode and self refresh mode |
| 09/21/1999 | US5956280 Contact test method and system for memory testers |
| 09/21/1999 | US5956279 Static random access memory device with burn-in test circuit |
| 09/21/1999 | US5956278 Semiconductor circuit device with internal power supply circuit |
| 09/21/1999 | US5956277 Circuit and method for performing tests on memory array cells using external sense amplifier reference current |
| 09/21/1999 | US5956276 Semiconductor memory having predecoder control of spare column select lines |
| 09/21/1999 | US5956275 Memory-cell array and a method for repairing the same |
| 09/21/1999 | US5954831 Method for testing a memory device |
| 09/21/1999 | US5954830 Method and apparatus for achieving higher performance data compression in ABIST testing by reducing the number of data outputs |
| 09/21/1999 | US5954828 Non-volatile memory device for fault tolerant data |
| 09/21/1999 | US5954822 Disk array apparatus that only calculates new parity after a predetermined number of write requests |
| 09/21/1999 | US5954804 Synchronous memory device having an internal register |
| 09/21/1999 | US5954435 Memory apparatus and data processor using the same |
| 09/21/1999 | US5954205 Circuit board handling and testing apparatus |
| 09/16/1999 | WO1999046778A2 High speed memory test system with intermediate storage buffer and method of testing |
| 09/16/1999 | WO1999046675A2 State copying method for software update |
| 09/16/1999 | DE19819254A1 Semiconductor DRAM component with integral test circuit |
| 09/16/1999 | DE19810814A1 Software processing device with software actualization function |
| 09/16/1999 | CA2347549A1 High speed memory test system with intermediate storage buffer and method of testing |
| 09/15/1999 | CN1045133C Semiconductor memory apparatus |
| 09/14/1999 | US5953745 Redundant memory array |
| 09/14/1999 | US5953737 Method and apparatus for performing erase operations transparent to a solid state storage system |
| 09/14/1999 | US5953282 Circuit for generating switching control signal |
| 09/14/1999 | US5953279 Fuse option circuit for memory device |
| 09/14/1999 | US5953273 Semiconductor integrated circuit device having confirmable self-diagnostic function |
| 09/14/1999 | US5953272 Data invert jump instruction test for built-in self-test |
| 09/14/1999 | US5953271 Semiconductor memory device allowing acceleration testing, and a semi-finished product for an integrated semiconductor device that allows acceleration testing |
| 09/14/1999 | US5953270 Column redundancy circuit for a memory device |
| 09/14/1999 | US5953269 Method and apparatus for remapping addresses for redundancy |
| 09/14/1999 | US5953268 Memory block replacement system and replacement method for a semiconductor memory |
| 09/14/1999 | US5953267 Synchronous dynamic random access memory for stabilizing a redundant operation |
| 09/14/1999 | US5953266 Device and method for repairing a memory array by storing each bit in multiple memory cells in the array |
| 09/14/1999 | US5953264 Redundant memory cell selecting circuit having fuses coupled to memory cell group address and memory cell block address |
| 09/14/1999 | US5953261 Semiconductor memory device having data input/output circuit of small occupied area capable of high-speed data input/output |
| 09/14/1999 | US5953258 Data transfer in a memory device having complete row redundancy |
| 09/14/1999 | US5953253 Word addressable floating-gate memory comprising a reference voltage generator circuit for the verification of the contents of a word |
| 09/14/1999 | US5952844 Apparatus for testing semiconductor IC (integrated circuit) |
| 09/14/1999 | US5951702 For an integrated circuit |
| 09/14/1999 | US5951692 Single-chip memory system having a redundancy judging circuit |
| 09/14/1999 | US5951655 External storage subsystem having independent access paths for permitting independent access from a host and a storage device to respective cache memories |
| 09/10/1999 | WO1999044752A2 Circuit and method for specifying performance parameters in integrated circuits |
| 09/10/1999 | WO1999027431A9 A memory redundancy allocation system and a method of redundancy allocation |
| 09/08/1999 | EP0940753A2 Semiconductor memory device |
| 09/08/1999 | EP0940752A1 Method for error correction in a multilevel semiconductor memory |
| 09/08/1999 | CN1227952A Semiconductor memory device incorporating redundancy memory cells having uniform layout |
| 09/08/1999 | CN1227950A Method for creating defect management information in recording medium, and apparatus and medium based on said method |
| 09/07/1999 | US5950181 Apparatus and method for detecting and assessing a spatially discrete dot pattern |
| 09/07/1999 | US5950145 Low voltage test mode operation enable scheme with hardware safeguard |
| 09/07/1999 | US5949731 Semiconductor memory device having burn-in mode operation stably accelerated |
| 09/07/1999 | US5949726 Bias scheme to reduce burn-in test time for semiconductor memory while preventing junction breakdown |
| 09/07/1999 | US5949725 Method and apparatus for reprogramming a supervoltage circuit |
| 09/07/1999 | US5949724 Burn-in stress circuit for semiconductor memory device |
| 09/07/1999 | US5949723 Fast single ended sensing with configurable half-latch |
| 09/07/1999 | US5949703 Semiconductor memory device in which data in programmable ROM can be apparently rewritten |
| 09/07/1999 | US5949701 Memory circuit with a connection layout and a method for testing and a wiring design apparatus |
| 09/07/1999 | US5948115 Event phase modulator for integrated circuit tester |
| 09/07/1999 | US5948114 Integrated circuit binary data output interface for multiplexed output of internal binary information elements from input/output pads |
| 09/02/1999 | WO1999044113A2 Increasing the memory performance of flash memory devices by writing sectors simultaneously to multiple flash memory devices |
| 09/01/1999 | EP0939403A2 High-speed error correcting apparatus with efficient data transfer |
| 09/01/1999 | EP0842515A4 Memory system having non-volatile data storage structure for memory control parameters and method |
| 09/01/1999 | CN1227386A Semiconductor memory device |