| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 04/12/2000 | EP0992810A2 Burn-in testing device |
| 04/11/2000 | US6049899 Soft errors handling in EEPROM devices |
| 04/11/2000 | US6049898 Failure-data storage system |
| 04/11/2000 | US6049890 Disk array system and its control method |
| 04/11/2000 | US6049846 Integrated circuit having memory which synchronously samples information with respect to external clock signals |
| 04/11/2000 | US6049505 Method and apparatus for generating memory addresses for testing memory devices |
| 04/11/2000 | US6049495 Auto-programmable current limiter to control current leakage due to bitline to wordline short |
| 04/11/2000 | US6049489 Methods using a data read latch circuit in a semiconductor device |
| 04/11/2000 | CA2219844C Method and apparatus for testing multi-port memory |
| 04/06/2000 | WO2000019443A2 Circuit for generating a reference voltage for reading out from a ferroelectric memory |
| 04/05/2000 | EP0990236A1 Storage cell system and method for testing the function of storage cells |
| 04/05/2000 | EP0946988A4 Memory redundancy circuit using single polysilicon floating gate transistors as redundancy elements |
| 04/05/2000 | CN1249828A Memory with redundancy circuit |
| 04/05/2000 | CN1249519A Non-volatile memory device and its testing method |
| 04/05/2000 | CN1249465A Method and device for storage of reference information |
| 04/04/2000 | US6047393 Memory testing apparatus |
| 04/04/2000 | US6047386 Apparatus for scan test of SRAM for microprocessors having full scan capability |
| 04/04/2000 | US6047344 Semiconductor memory device with multiplied internal clock |
| 04/04/2000 | US6046955 Semiconductor memory device with testable spare columns and rows |
| 04/04/2000 | US6046947 Integrated circuit memory devices having direct access mode test capability and methods of testing same |
| 04/04/2000 | US6046946 Method and apparatus for testing multi-port memory using shadow read |
| 04/04/2000 | US6046945 DRAM repair apparatus and method |
| 04/04/2000 | US6046939 Nonvolatile semiconductor memory with fast data programming and erasing function using ECC |
| 04/04/2000 | US6046926 Ferroelectric memory and screening method therefor |
| 04/04/2000 | US6046621 Differential signal generator with dynamic beta ratios |
| 04/04/2000 | US6046421 PCB Adapter for a test connector assembly for an automatic memory module handler for testing electronic memory modules |
| 03/30/2000 | WO2000017902A1 Fuse circuit having zero power draw for partially blown condition |
| 03/30/2000 | WO2000017753A1 Technique for detecting memory part failures and single, double, and triple bit errors |
| 03/30/2000 | DE19844101A1 Schaltungsanordnung zur Generierung einer Referenzspannung für das Auslesen eines ferroelektrischen Speichers Circuit arrangement for generating a reference voltage for reading out a ferroelectric memory |
| 03/30/2000 | CA2316977A1 Fuse circuit having zero power draw for partially blown condition |
| 03/29/2000 | EP0989495A1 Electronic circuit for protecting data contained in a semiconductor device |
| 03/29/2000 | EP0616335B1 Nonvolatile semiconductor memory device having a status register and test method for the same |
| 03/29/2000 | EP0596198B1 Flash eprom with erase verification and address scrambling architecture |
| 03/29/2000 | CN1050924C 半导体存储装置 The semiconductor memory device |
| 03/28/2000 | US6044484 Method and circuit for error checking and correction in a decoding device of compact disc-read only memory drive |
| 03/28/2000 | US6044481 Programmable universal test interface for testing memories with different test methodologies |
| 03/28/2000 | US6044426 Memory system having memory devices each including a programmable internal register |
| 03/28/2000 | US6044029 Device and method for repairing a memory array by storing each bit in multiple memory cells in the array |
| 03/28/2000 | US6044028 Semiconductor storage device and electronic equipment using the same |
| 03/23/2000 | DE19843470A1 Integrated memory with self-repair function |
| 03/23/2000 | DE19843435A1 Burn-in test arrangement for semiconductor memory devices |
| 03/22/2000 | EP0987759A2 Electrical fuses in semiconductors |
| 03/22/2000 | EP0987717A1 Method and apparatus for testing dynamic random access memory |
| 03/22/2000 | EP0986786A1 Device for saving the configuration of a redundant system |
| 03/22/2000 | CN1248335A Flash memory system |
| 03/22/2000 | CN1248334A Flash memory system |
| 03/21/2000 | US6041428 Connection matrix for a microcontroller emulation chip |
| 03/21/2000 | US6041426 Built in self test BIST for RAMS using a Johnson counter as a source of data |
| 03/21/2000 | US6041422 Fault tolerant memory system |
| 03/21/2000 | US6041009 Apparatus for stabilizing an antifuse used for a memory device |
| 03/21/2000 | US6041006 Semiconductor memory device |
| 03/21/2000 | US6041003 Circuit and method for memory device with defect current isolation |
| 03/21/2000 | US6041002 Semiconductor memory device and method of testing the same |
| 03/21/2000 | US6041000 Initialization for fuse control |
| 03/21/2000 | US6040999 Semiconductor memory device |
| 03/21/2000 | US6040913 Method to determine light scattering efficiency of pigments |
| 03/16/2000 | DE19935990A1 Single chip microcomputer for testing EEPROM built-in wafer by external tester |
| 03/15/2000 | EP0986066A2 Ferroelectric memory and method of testing the same |
| 03/15/2000 | CN1247625A Method for minimizing access time for semiconductor memories |
| 03/14/2000 | US6038680 Failover memory for a computer system |
| 03/14/2000 | US6038195 Synchronous memory device having a delay time register and method of operating same |
| 03/14/2000 | US6038191 Circuit for reducing stand-by current induced by defects in memory array |
| 03/14/2000 | US6038189 Semiconductor device allowing external setting of internal power supply voltage generated by a voltage down converter at the time of testing |
| 03/14/2000 | US6038183 Semiconductor memory device having burn-in mode operation stably accelerated |
| 03/14/2000 | US6038182 Integrated circuit memory devices and testing methods including selectable input/output channels |
| 03/14/2000 | US6038181 Efficient semiconductor burn-in circuit and method of operation |
| 03/14/2000 | US6038180 Semiconductor memory capable of detecting memory cells with small margins as well as sense amplifier |
| 03/14/2000 | US6038179 Multiple repair size redundancy |
| 03/14/2000 | US6038175 Erase verifying apparatus in serial flash memory having redundancy and method thereof |
| 03/14/2000 | US6037799 Circuit and method for selecting a signal |
| 03/14/2000 | US6037792 Burn-in stress test mode |
| 03/09/2000 | WO2000013186A1 Method and system for timing control in the testing of rambus memory modules |
| 03/09/2000 | WO2000013087A1 Method for repairing faulty storage cells of an integrated memory |
| 03/09/2000 | WO2000005723A3 Integrated circuit comprising a self-test device for executing a self-test of the integrated circuit |
| 03/09/2000 | DE19937820A1 Mixed IC tester used in testing mixed IC comprising of logic portion and memory portion |
| 03/08/2000 | EP0983550A2 Increasing memory performance in flash memory devices by performing simultaneous write operation to multiple devices |
| 03/08/2000 | EP0426185B1 Data redundancy and recovery protection |
| 03/08/2000 | CN1246682A Deinterlacing device |
| 03/08/2000 | CN1246617A Signal processing device with nonvolatile memory and programmed method of nonvolatile memory |
| 03/07/2000 | US6035432 System for remapping defective memory bit sets |
| 03/07/2000 | US6035431 Semiconductor integrated circuit with test device |
| 03/07/2000 | US6035420 Method of performing an extensive diagnostic test in conjunction with a bios test routine |
| 03/07/2000 | US6035411 Method for multiple verticle and/or horizontal levels of memory redundancy |
| 03/07/2000 | US6035365 Dual clocked synchronous memory device having a delay time register and method of operating same |
| 03/07/2000 | US6034918 Method of operating a memory having a variable data output length and a programmable register |
| 03/07/2000 | US6034916 Data masking circuits and methods for integrated circuit memory devices, including data strobe signal synchronization |
| 03/07/2000 | US6034914 Semiconductor memory device having column redundancy function |
| 03/07/2000 | US6034907 Semiconductor integrated circuit device with built-in test circuit for applying stress to timing generator in burn-in test |
| 03/07/2000 | US6034905 Apparatus for testing semiconductor memory device |
| 03/07/2000 | US6034904 Semiconductor memory device having selection circuit for arbitrarily setting a word line to selected state at high speed in test mode |
| 03/07/2000 | US6034903 Semiconductor memory device with identification fuse |
| 03/07/2000 | US6034880 Embedded memory device and method of performing a burn-in process on the embedded memory device |
| 03/07/2000 | US6034536 Redundancy circuitry for logic circuits |
| 03/02/2000 | WO2000011678A1 Memory supervision |
| 03/02/2000 | WO2000011676A1 An embedded dram architecture with local data drivers and programmable number of data read and data write lines |
| 03/02/2000 | WO2000011674A1 Method and apparatus for built-in self test of integrated circuits |
| 03/02/2000 | WO2000011566A1 Automatic generation of user definable memory bist circuitry |
| 03/02/2000 | WO2000011554A1 A system and method for identification of transformation of memory device addresses |
| 03/02/2000 | WO2000011489A1 Method of manufacturing ic cards |
| 03/02/2000 | DE19838861A1 Verfahren zur Reparatur von defekten Speicherzellen eines integrierten Speichers A method for repairing defective memory cells of an integrated memory |