| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 05/23/2000 | US6067262 Redundancy analysis for embedded memories with built-in self test and built-in self repair |
| 05/23/2000 | US6067261 Timing of wordline activation for DC burn-in of a DRAM with the self-refresh |
| 05/23/2000 | US6067260 Synchronous semiconductor memory device having redundant circuit of high repair efficiency and allowing high speed access |
| 05/23/2000 | US6067259 Method and device for repairing arrays with redundancy |
| 05/23/2000 | US6067255 Merged memory and logic (MML) integrated circuits including independent memory bank signals and methods |
| 05/23/2000 | US6067250 Method and apparatus for localizing point defects causing leakage currents in a non-volatile memory device |
| 05/23/2000 | US6067248 Nonvolatile semiconductor memory with single-bit and multi-bit modes of operation and method for performing programming and reading operations therein |
| 05/18/2000 | WO2000028547A1 Semiconductor storage device and test system |
| 05/18/2000 | DE19908157A1 Memory test circuit has latching unit and matrix control unit for activating respective matrices |
| 05/17/2000 | EP1001432A1 Method of testing random-access memory |
| 05/17/2000 | EP1000395A1 Apparatus and method for memory error detection and error reporting |
| 05/16/2000 | US6065146 Error correcting memory |
| 05/16/2000 | US6065143 Semiconductor memory device capable of fast testing without externally considering address scramble or data scramble |
| 05/16/2000 | US6065142 ROM testing circuit |
| 05/16/2000 | US6065141 Self-diagnosable semiconductor memory device having a redundant circuit and semiconductor apparatus having the same in which the memory device cannot be accessed from outside the semiconductor apparatus |
| 05/16/2000 | US6065134 Method for repairing an ASIC memory with redundancy row and input/output lines |
| 05/16/2000 | US6065090 Memory management apparatus that replaces defective storage locations with functional storage locations |
| 05/16/2000 | US6064617 Method and apparatus for strobing antifuse circuits in a memory device |
| 05/16/2000 | US6064609 Semiconductor memory device with true/complement redundancy scheme |
| 05/16/2000 | US6064608 Semiconductor memory device and methods for inspecting and manufacturing the same |
| 05/16/2000 | US6064607 Semiconductor memory device with predecoder |
| 05/16/2000 | US6064601 Integrated circuit memory devices and controlling methods that simultaneously activate multiple column select lines during a write cycle of a parallel bit test mode |
| 05/16/2000 | CA2059143C Processing unit for a computer and a computer system incorporating such a processing unit |
| 05/16/2000 | CA2019581C Non-volatile counter |
| 05/11/2000 | WO2000026789A1 Levelizing transfer delays for a channel of memory devices in a memory subsystem |
| 05/11/2000 | WO2000026784A1 Column redundancy circuit with reduced signal path delay |
| 05/11/2000 | WO2000026783A1 Storage device for storing data and method for operating storage devices for data storage |
| 05/10/2000 | EP0711447B1 Programmable logic device with verify circuitry for classifying fuse link states as validly closed, validly open or invalid |
| 05/10/2000 | EP0698273B1 Memory iddq-testable through cumulative word line activation |
| 05/10/2000 | CN1252604A Memory element testing circuit |
| 05/10/2000 | CN1252562A Single chip microprocessor with improved detectable inner mounted electrisity, erasable, programmble read-only memory |
| 05/09/2000 | US6061815 Programming utility register to generate addresses in algorithmic pattern generator |
| 05/09/2000 | US6061813 Memory test set |
| 05/09/2000 | US6061808 Semiconductor memory device having a multibit test mode |
| 05/09/2000 | US6061290 Method and apparatus for simultaneous memory subarray testing |
| 05/09/2000 | US6061285 Semiconductor memory device capable of executing earlier command operation in test mode |
| 05/09/2000 | US6061282 Semiconductor memory having an improved test circuit |
| 05/09/2000 | US6061281 Redundancy method and semiconductor circuit |
| 05/09/2000 | US6060899 Semiconductor device with test circuit |
| 05/09/2000 | US6059450 Edge transition detection circuitry for use with test mode operation of an integrated circuit memory device |
| 05/04/2000 | DE19952272A1 System with test device for testing components embedded on integrated circuit (IC), such as system-chip circuit uses hardware in IC itself with only minimum additional hardware needed for testing process |
| 05/04/2000 | DE19951750A1 Test system for multiple memory integrated circuit has device for sequential selection of test circuits and hence reduction in overall testing time |
| 05/04/2000 | DE19951534A1 Integrated semiconductor circuit with large capacity memory with reduced packing size a number for testing patterns |
| 05/04/2000 | DE19947976A1 Semiconductor device e.g. application specific integrated circuit chip, includes macro cell distributed to periphery functional block on semiconductor chip |
| 05/04/2000 | DE19920603A1 Redundancy determining method and circuit for semiconductor memory determining redundancy memory cell in array |
| 05/03/2000 | EP0997913A1 Method and circuit for testing virgin memory cells in a multilevel memory device |
| 05/03/2000 | EP0642135B1 A nonvolatile semiconductor memory and its test method |
| 05/02/2000 | US6058495 Multi-bit test circuit in semiconductor memory device and method thereof |
| 05/02/2000 | US6058489 On-line disk array reconfiguration |
| 05/02/2000 | US6058062 Semiconductor memory circuit |
| 05/02/2000 | US6058056 Data compression circuit and method for testing memory devices |
| 05/02/2000 | US6058055 System for testing memory |
| 05/02/2000 | US6058053 Semiconductor memory device capable of high speed operation and including redundant cells |
| 05/02/2000 | US6058052 Redundancy scheme providing improvements in redundant circuit access time and integrated circuit layout area |
| 05/02/2000 | US6058047 Semiconductor memory device having error detection and correction |
| 04/27/2000 | DE19950347A1 Pattern generator for high speed testing of semiconductor circuits by generation and addressing of odd and even data and its delivery to the test component |
| 04/27/2000 | DE19848090A1 Einrichtung zur Speicherung von Daten in einem Kraftfahrzeug Means for storing data in a motor vehicle |
| 04/26/2000 | EP0996064A1 One-time programmable memory cell |
| 04/26/2000 | EP0995637A1 Device for storing data in a motor vehicle |
| 04/26/2000 | EP0883878B1 Circuit arrangement for a programmable non-volatile memory |
| 04/26/2000 | EP0722609B1 Circuitry and method for selecting a drain programming voltage for a nonvolatile memory |
| 04/25/2000 | US6055655 Semiconductor integrated circuit device and method of testing the same |
| 04/25/2000 | US6055654 Method and apparatus for reading compressed test data from memory devices |
| 04/25/2000 | US6055653 Method and apparatus for testing gang memory modules |
| 04/25/2000 | US6055615 Pipeline memory access using DRAM with multiple independent banks |
| 04/25/2000 | US6055611 Method and apparatus for enabling redundant memory |
| 04/25/2000 | US6055209 Synchronous semiconductor memory device exhibiting an operation synchronous with an externally inputted clock signal |
| 04/25/2000 | US6055204 Circuits, systems, and methods for re-mapping memory column redundancy |
| 04/25/2000 | US6055200 Variable test voltage circuits and methods for ferroelectric memory devices |
| 04/25/2000 | US6055199 Test circuit for a semiconductor memory device and method for burn-in test |
| 04/25/2000 | US6055198 Device to check the end of a test |
| 04/25/2000 | US6055197 Semiconductor memory device with simultaneously activated elements and a redundancy scheme thereof |
| 04/25/2000 | US6055196 Semiconductor device with increased replacement efficiency by redundant memory cell arrays |
| 04/25/2000 | US6054918 Self-timed differential comparator |
| 04/25/2000 | US6054885 Semiconductor device and testing apparatus thereof |
| 04/20/2000 | DE19951205A1 Test pattern generator for high-speed semiconductor memory test, generating test patterns based on control instructions read from address produced by address expander |
| 04/20/2000 | DE19948388A1 Testing memory embedded in integrated circuit chip including microprocessor by generating memory test pattern based on object code of assembler test program |
| 04/20/2000 | DE19947827A1 Storing and maintaining data by erasing data from first storage device by overwriting with predetermined value when error is detected |
| 04/20/2000 | DE19947441A1 Test system for electric parts, comprising notification unit which notifies host computer if all auxiliary processors produce interrupt signals |
| 04/20/2000 | DE19926129A1 Photo receiver array testing method, writing charges into integration capacitors of selected photo receivers, reading charges, and comparing corresponding digital values with expected values |
| 04/19/2000 | EP0994420A2 Integrated circuit i/o using a high performance bus interface |
| 04/19/2000 | EP0994417A2 Circuit and method for testing data |
| 04/19/2000 | EP0834124A4 Parallel testing of cpu cache and instruction units |
| 04/19/2000 | EP0525068B1 Semiconductor memory device |
| 04/19/2000 | CN1251198A Optical disc recording/reproducing method, optical disc, and optical disc device |
| 04/18/2000 | US6052817 Data storage system including data randomizer responsive to address of selected data storage location |
| 04/18/2000 | US6052816 Programmable ROM and parity programmable ROM having a correction coding circuit |
| 04/18/2000 | US6052806 Method and apparatus for testing an integrated circuit device |
| 04/18/2000 | US6052798 System and method for remapping defective memory locations |
| 04/18/2000 | US6052767 Semiconductor device having redundant memory cell arrays and serially accessing addresses |
| 04/18/2000 | US6052322 Memory circuit voltage regulator |
| 04/18/2000 | US6052321 Circuit and method for performing test on memory array cells using external sense amplifier reference current |
| 04/18/2000 | US6052320 Integrated circuit memory devices having highly integrated merged data test capability and methods of testing same |
| 04/18/2000 | US6052318 Repairable semiconductor memory circuit having parrel redundancy replacement wherein redundancy elements replace failed elements |
| 04/13/2000 | WO1999039354A3 Event phase modulator for integrated circuit tester |
| 04/13/2000 | DE19945025A1 Storage and maintenance method for data in memory, involving overwriting information on disc with specific code |
| 04/13/2000 | DE19841470A1 Error testing method of RAM especially for mobile radio equipment |
| 04/12/2000 | EP0993033A1 Gate insulating structure for power devices, and related manufacturing process |
| 04/12/2000 | EP0992998A1 Nonvolatile memory device and inspection method thereof |
| 04/12/2000 | EP0992994A1 Optical disc recording/reproducing method, optical disc, and optical disc device |