| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 01/10/2002 | US20020003725 Logic consolidated semiconductor memory device having memory circuit and logic circuit integrated in the same chip |
| 01/10/2002 | US20020003433 Method and apparatus for testing semiconductor devices |
| 01/10/2002 | US20020003279 Semiconductor memory device having row repair circuitry |
| 01/09/2002 | EP1169677A1 Programmable read-only memory and method for operating said read-only memory |
| 01/08/2002 | US6338154 Apparatus and method for generating addresses in a built-in self memory testing circuit |
| 01/08/2002 | US6337829 Semiconductor memory device and method for repairing thereof |
| 01/08/2002 | US6337828 Semiconductor memory device having function of supplying stable power supply voltage |
| 01/08/2002 | US6337820 Dynamic memory device performing stress testing |
| 01/08/2002 | US6337819 Semiconductor device having on-chip terminal with voltage to be measured in test |
| 01/08/2002 | US6337818 Semiconductor memory device having a redundancy construction |
| 01/08/2002 | US6337817 Semiconductor device having redundancy circuit |
| 01/08/2002 | US6337816 Column redundancy circuit for semiconductor memory |
| 01/08/2002 | US6337815 Semiconductor memory device having redundant circuit |
| 01/08/2002 | US6337814 Semiconductor memory device having reference potential generating circuit |
| 01/08/2002 | US6337812 Semiconductor device |
| 01/03/2002 | WO2002001719A2 Method and apparatus for testing high performance circuits |
| 01/03/2002 | US20020001904 Semiconductor memory device including spare memory cell |
| 01/03/2002 | US20020001896 Column redundancy circuit |
| 01/03/2002 | US20020001253 Integrated circuit device which outputs data after a latency period transpires |
| 01/03/2002 | US20020001252 Semiconductor memory device and method of operation having delay pulse generation |
| 01/03/2002 | US20020001246 Semiconductor memory device |
| 01/03/2002 | US20020001242 Dynamic memory circuit including spare cells |
| 01/03/2002 | US20020001241 Redundancy memory circuit |
| 01/03/2002 | US20020001237 Non-volatile memory device with configurable row redundancy |
| 01/03/2002 | US20020001236 Memory circuit with dynamic redundancy |
| 01/03/2002 | US20020001235 Semiconductor memory device allowing effective detection of leak failure |
| 01/03/2002 | US20020001233 Read protection circuit of nonvolatile memory |
| 01/03/2002 | US20020000867 Fuse latch having multiplexers with reduced sizes and lower power consumption |
| 01/03/2002 | US20020000837 256 meg dynamic random access memory |
| 01/03/2002 | US20020000832 Programmable circuit with preview function |
| 01/03/2002 | US20020000582 Semiconductor device including voltage down converter allowing tuning in short period of time and reduction of chip area |
| 01/03/2002 | CA2410432A1 Method and apparatus for testing high performance circuits |
| 01/02/2002 | EP1168369A2 Synchronous semiconductor memory device |
| 01/02/2002 | EP1168365A2 Negative-voltage bias circuit |
| 01/02/2002 | EP1168362A2 Flash memory with improved erasability and its circuitry |
| 01/02/2002 | EP1168356A1 Circuit for equalization of different voltages on connection lines in integrated semiconductor devices |
| 01/02/2002 | EP1168179A1 Dynamic memory with spare cells |
| 01/02/2002 | EP0932904B1 Overvoltage detection circuit for test mode selection |
| 01/02/2002 | CN1329337A Method for repairing defect of dynamic random access internal memory and state display |
| 01/02/2002 | CN1329254A Method and equipment for testing semiconductor device |
| 01/01/2002 | US6336202 Data storage system, storage medium and method of controlling a data storage system |
| 01/01/2002 | US6335902 Semiconductor memory device provided with generating means for internal clock signal for special mode |
| 01/01/2002 | US6335897 Semiconductor memory device including redundancy circuit adopting latch cell |
| 01/01/2002 | US6335891 Device and method for reducing standby current in a memory device by disconnecting bit line load devices in unused columns of the memory device from a supply voltage |
| 01/01/2002 | US6335888 Margin-range apparatus for a sense amp's voltage-pulling transistor |
| 01/01/2002 | US6335887 Semiconductor memory device allowing switching of word configuration |
| 01/01/2002 | US6335886 Semiconductor memory device including spare memory cell |
| 01/01/2002 | US6335876 Semiconductor memory and method of testing the same |
| 01/01/2002 | US6335875 Memory circuit/logic circuit integrated device capable of reducing term of works |
| 01/01/2002 | US6335652 Method and apparatus for the replacement of non-operational metal lines in DRAMS |
| 01/01/2002 | US6335209 Method for testing semiconductor memory devices, and apparatus and system for testing semiconductor memory |
| 12/27/2001 | US20010056567 Address parity error processing method, and apparatus and storage for the method |
| 12/27/2001 | US20010056558 Configuration memory integrated circuit |
| 12/27/2001 | US20010056557 Semiconductor integrated circuit device including semiconductor memory with tester circuit capable of analyzing redundancy repair |
| 12/27/2001 | US20010056527 Storage system |
| 12/27/2001 | US20010056521 Information processing system with memory element performance-dependent memory control |
| 12/27/2001 | US20010055236 Semiconductor memory that enables high speed operation |
| 12/27/2001 | US20010055233 Semiconductor memory device |
| 12/27/2001 | US20010055230 Semiconductor memory and memory board therewith |
| 12/27/2001 | US20010055229 Semiconductor memory device and testing system and testing method |
| 12/27/2001 | US20010055228 Semiconductor memory device having a redundancy construction |
| 12/27/2001 | US20010055226 Semiconductor integrated circuit device allowing accurate evaluation of access time of memory core contained therein and access time evaluating method |
| 12/27/2001 | US20010055219 Semiconductor integrated circuit |
| 12/27/2001 | US20010055218 256 meg dynamic random access memory |
| 12/27/2001 | US20010055022 Serial access memory and data write/read method |
| 12/27/2001 | US20010054909 Integrated circuit device having a burn-in mode for which entry into and exit from can be controlled |
| 12/27/2001 | US20010054760 Semiconductor integrated circuit |
| 12/26/2001 | CN1328688A Circuir for generating reference voltage for reading out from ferroelectric memory |
| 12/25/2001 | US6333888 Semiconductor memory device |
| 12/25/2001 | US6333887 Circuits and methods for selectively coupling redundant elements into an integrated circuit |
| 12/25/2001 | US6333880 Semiconductor memory device capable of detecting high-voltage test command signal |
| 12/25/2001 | US6333879 Semiconductor device operable in a plurality of test operation modes |
| 12/25/2001 | US6333878 Semiconductor memory device having program circuit |
| 12/25/2001 | US6333877 Static type semiconductor memory device that can suppress standby current |
| 12/25/2001 | US6333876 Semiconductor memory device |
| 12/25/2001 | US6333872 Self-test method for testing read stability in a dual-port SRAM cell |
| 12/25/2001 | US6333864 Power supply adjusting circuit and a semiconductor device using the same |
| 12/25/2001 | US6333667 Antifuse programming circuit |
| 12/25/2001 | US6333666 Antifuse circuit being programmable by using no connection pin |
| 12/25/2001 | US6333530 Semiconductor memory device having redundancy function |
| 12/25/2001 | US6333517 Semiconductor integrated circuit device equipped with power make-up circuit used in burn-in test after packaging and method for testing the same |
| 12/20/2001 | WO2001097231A1 Fail analyzer |
| 12/20/2001 | WO2001097226A2 Semiconductor memory having segmented row repair |
| 12/20/2001 | WO2001097032A1 Secure eeprom comprising an error correction circuit |
| 12/20/2001 | WO2001067248A3 Digital memory circuit |
| 12/20/2001 | US20010054165 Memory device having redundant cells |
| 12/20/2001 | US20010054164 Semiconductor memory device allowing mounting of built-in self test circuit without addition of interface specification |
| 12/20/2001 | US20010054141 Microsequencer with nested loop counters |
| 12/20/2001 | US20010054136 Storage system |
| 12/20/2001 | US20010053960 Adjustment method for reducing channel skew of test system |
| 12/20/2001 | US20010053102 Device with integrated SRAM memory and method of testing such a device |
| 12/20/2001 | US20010053101 Semiconductor memory having segmented row repair |
| 12/20/2001 | US20010053086 Semiconductor memory device with memory test circuit |
| 12/20/2001 | US20010052792 Semiconductor integrated circuit device including logic gate that attains reduction of power consumption and high-speed operation |
| 12/20/2001 | US20010052789 Integrated circuit configuration for testing transistors, and a semiconductor wafer having such a circuit configuration |
| 12/20/2001 | US20010052633 Semiconductor device |
| 12/20/2001 | US20010052599 Semiconductor memory device including plurality of global data lines in parallel arrangement with low parasitic capacitance, and fabrication method thereof |
| 12/20/2001 | DE10063623A1 Semiconductor memory has select drive circuit which selectively drives dummy word line transistor, while operating in test mode |
| 12/20/2001 | DE10028145A1 Integrierte Schaltungsanordnung zum Testen von Transistoren An integrated circuit device for testing transistors |
| 12/19/2001 | EP1164589A1 Storage device having an error correction function |