| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 03/14/2002 | US20020031004 Ferroelectric storage device and test method thereof |
| 03/14/2002 | US20020030539 Clamp circuit with fuse options |
| 03/14/2002 | US20020030270 Semiconductor device |
| 03/14/2002 | DE10110111A1 Zuverlässig arbeitende Programmierschaltung mit niedrigem Standby-Strom und Halbleiterspeichervorrichtung mit dieser Programmierschaltung Reliable working programmer with low standby power and semiconductor memory device with this programming circuit |
| 03/14/2002 | DE10044537A1 Detecting short-circuits between memory cells on wafer by measuring conductivity between contacted conductive tracks |
| 03/14/2002 | DE10043218A1 Schaltungsanordnung und Verfahren zur Alterungsbeschleunigung bei einem MRAM Circuit arrangement and method for accelerating aging in an MRAM |
| 03/14/2002 | DE10042223A1 Testing integrated semiconducting circuit involves connecting monitor circuit to data pins and simultaneously evaluating state of semiconducting circuit in monitor circuit |
| 03/14/2002 | DE10041688A1 Integrierter Speicher mit Speicherzellen in mehreren Speicherzellenblöcken und Verfahren zum Betrieb eines solchen Speichers Integrated memory having memory cells in a plurality of memory cell blocks and method for operating such a memory, |
| 03/13/2002 | EP1187339A1 Interleave address generator |
| 03/13/2002 | EP1186901A2 Method and device for generating digital signal pattern |
| 03/13/2002 | EP1185985A1 Method and integrated circuit for bit line soft programming (blisp) |
| 03/13/2002 | EP1027707B1 Method for testing the bus terminals of writable-readable integrated electronic integrated circuits, especially of memory chips |
| 03/13/2002 | EP0884734B1 Nonvolatile semiconductor memory |
| 03/13/2002 | EP0554453B1 Semiconductor storage device |
| 03/12/2002 | US6357027 On chip data comparator with variable data and compare result compression |
| 03/12/2002 | US6357023 Connector assembly for testing memory modules from the solder-side of a PC motherboard with forced hot air |
| 03/12/2002 | US6357022 Testing memory modules on a solder-side adaptor board attached to a PC motherboard |
| 03/12/2002 | US6356521 Information recording method and apparatus |
| 03/12/2002 | US6356498 Selective power distribution circuit for an integrated circuit |
| 03/12/2002 | US6356491 Method and circuit for rapidly equilibrating paired digit lines of a memory device during testing |
| 03/12/2002 | US6356490 Semiconductor device, testing device thereof and testing method thereof |
| 03/12/2002 | US6356487 Memory device having data path containing dual mode flip-flop used for normal operation and for internal testing |
| 03/07/2002 | WO2002019339A1 Semiconductor storage device, its testing method, and test circuit |
| 03/07/2002 | WO2002019112A1 Fuse configurations for low-voltage flash memories |
| 03/07/2002 | WO2001086660A8 Integrated circuit containing sram memory and method of testing same |
| 03/07/2002 | WO2001063311A3 Method and system for wafer and device-level testing of an integrated circuit |
| 03/07/2002 | US20020029365 Information processing apparatus |
| 03/07/2002 | US20020029360 Method and apparatus for data compression in memory devices |
| 03/07/2002 | US20020029123 Semiconductor device and semiconductor device testing method |
| 03/07/2002 | US20020027815 Cancellation of redundant elements with a cancel bank |
| 03/07/2002 | US20020027814 Nonvolatile semiconductor memory device |
| 03/07/2002 | US20020027813 Redundancy mapping in a multichip semiconductor package |
| 03/07/2002 | US20020027812 Semiconductor integrated circuit device with memory circuit |
| 03/07/2002 | US20020027811 Semiconductor memory device |
| 03/07/2002 | US20020027801 Semiconductor integrated circuit |
| 03/07/2002 | US20020027795 Semiconductor memory device having a circuit for testing memories |
| 03/07/2002 | US20020027794 Method for performing write and read operations in a passive matrix memory, and apparatus for performing the method |
| 03/07/2002 | US20020027462 Integrated circuit having a timing circuit, and method for adjustment of an output signal from the timing circuit |
| 03/07/2002 | US20020027264 MOSFET technology for programmable address decode and correction |
| 03/07/2002 | US20020027233 Semiconductor device, microcomputer and flash memory |
| 03/07/2002 | US20020027226 Semiconductor integrated circuit device equipped with power make-up circuit used in burn-in test after packaging and method for testing the same |
| 03/07/2002 | DE10125344A1 Event supported semiconductor test system with modular architecture for embedded and operating system independent memory testing where testing patterns can be specified in higher level languages |
| 03/07/2002 | DE10034878A1 DRAM checking method for quality inspection, involves storing test results in non-volatile memory area of DRAM |
| 03/06/2002 | EP1184876A2 Semiconductor memory |
| 03/06/2002 | EP1184875A2 Circuit and method for accelerating the aging of a MRAM |
| 03/06/2002 | EP1184868A2 Semiconductor memory |
| 03/06/2002 | EP1184788A2 Nonvolatile semiconductor memory device |
| 03/06/2002 | EP1183604A2 Test interface for electronic circuirts |
| 03/06/2002 | EP1088274B1 Verification of compatibility between modules |
| 03/06/2002 | EP0778584B1 Semiconductor integrated circuit device with large-scale memory and controller embedded on one semiconductor chip, and method of testing the device |
| 03/06/2002 | CN1339163A Method for functionally testing memory cells of an integrated semiconductor memory |
| 03/05/2002 | US6353910 Method and apparatus for implementing error correction coding (ECC) in a dynamic random access memory utilizing vertical ECC storage |
| 03/05/2002 | US6353570 Row redundancy circuit using a fuse box independent of banks |
| 03/05/2002 | US6353565 Semiconductor device, semiconductor memory device and test-mode entry method |
| 03/05/2002 | US6353564 Method of testing a memory array |
| 03/05/2002 | US6353563 Built-in self-test arrangement for integrated circuit memory devices |
| 03/05/2002 | US6353562 Integrated semiconductor memory with redundant units for memory cells |
| 02/28/2002 | WO2002017324A1 Integrated memory comprising memory locations in several memory location blocks, and method for operating a memory of this type |
| 02/28/2002 | WO2002017078A2 Burst read incorporating output based redundancy |
| 02/28/2002 | US20020026613 Semiconductor device capable of adjusting timing of input waveform by tester with high accuracy |
| 02/28/2002 | US20020026608 Method for checking the functioning of memory cells of an integrated semiconductor memory |
| 02/28/2002 | US20020026607 Medium reading apparatus |
| 02/28/2002 | US20020026606 On-chip testing circuit and method for integrated circuits |
| 02/28/2002 | US20020025608 Memory module, method of manufacturing the memory module, and test connector using the memory module |
| 02/28/2002 | US20020024879 Semiconductor integrated circuit device provided with a logic circuit and a memory circuit and being capable of efficient interface between the same |
| 02/28/2002 | US20020024878 Circuit for generating address of semiconductor memory device |
| 02/28/2002 | US20020024877 Latched column select enable driver |
| 02/28/2002 | US20020024873 Dynamic semiconductor memory device having excellent charge retention characteristics |
| 02/28/2002 | US20020024869 Semiconductor device |
| 02/28/2002 | US20020024868 Semiconductor memory device having a second voltage supplier supplying transfer gates with a second voltage higher than a first voltage |
| 02/28/2002 | US20020024862 Nonvolatile semiconductor memory test circuit and method, nonvolatile semiconductor memory and method for fabricating nonvolatile semiconductor memory |
| 02/28/2002 | US20020024861 Methods for alternate bitline stress testing |
| 02/28/2002 | US20020024860 Semiconductor memory device capable of high speed plural parallel test, method of data writing therefor and parallel tester |
| 02/28/2002 | US20020024859 Semiconductor memory device having a large band width and allowing efficient execution of redundant repair |
| 02/28/2002 | US20020024858 Semiconductor having mechanism capable of operating at high speed |
| 02/28/2002 | US20020024855 Column redundancy for prefetch |
| 02/28/2002 | US20020024847 Semiconductor device having memory |
| 02/28/2002 | US20020024844 Non-volatile semiconductor memory device |
| 02/28/2002 | US20020024843 Non-volatile semiconductor memory device having a low defective rate |
| 02/28/2002 | US20020024839 Ferroelectric memory |
| 02/28/2002 | US20020024837 Semiconductor memory device and semiconductor integrated device using the same |
| 02/28/2002 | US20020024330 Semiconductor integrated circuit allowing internal voltage to be measured and controlled externally |
| 02/28/2002 | US20020024062 Semiconductor integrated circuit |
| 02/28/2002 | US20020024059 MIS semiconductor device having improved gate insulating film reliability |
| 02/28/2002 | DE10105505A1 Integrated circuit for testing DRAM, has judging circuit which detects normal condition of DRAM, when divided test data input for every predetermined number of bits correspond to excepted level |
| 02/28/2002 | DE10039350A1 Integrierte Schaltung, Testaufbau und Verfahren zum Testen von integrierten Schaltungen An integrated circuit test set-up and method for testing integrated circuits |
| 02/27/2002 | EP1182669A2 Non-volatile semiconductor memory device |
| 02/27/2002 | EP1182667A2 System and method for secure high-temperature operation of a flash memory |
| 02/27/2002 | EP0784847B1 A memory device |
| 02/27/2002 | CN1338073A Storage system comprising means managing a storage unit with anti-wear and anti-wear management of a storage unit |
| 02/27/2002 | CN1337715A Integrated storage with storage unit having magnetic resistance storage effect |
| 02/27/2002 | CN1337714A Integrated storage with storage unit having magnetic-resistance storage effect |
| 02/26/2002 | US6351837 High speed built-in self-test circuit for DRAMS |
| 02/26/2002 | US6351834 Apparatus for testing semiconductor device |
| 02/26/2002 | US6351833 Address generator |
| 02/26/2002 | US6351827 Voltage and clock margin testing of memory-modules using an adapter board mounted to a PC motherboard |
| 02/26/2002 | US6351428 Programmable low voltage decode circuits with ultra-thin tunnel oxides |
| 02/26/2002 | US6351424 Cancellation of redundant elements with a cancel bank |
| 02/26/2002 | US6351405 Pad for integrated circuit device which allows for multiple probing and reliable bonding and integrated circuit device including the pad |
| 02/26/2002 | US6351180 Clamp circuit with fuse options |