Patents
Sitemap › G11 - Information storage › G11C - Static stores › G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
10/2002
10/17/2002DE10156722A1 Halbleiterspeichervorrichtung mit Redundanzsystem A semiconductor memory device with redundant system
10/17/2002DE10121182C1 Magnetoresistive semiconductor memory has memory cell in one plane replaced by redundant magnetoresistive memory cell of different plane
10/17/2002DE10115880A1 Test circuit for testing synchronous memory circuit compares generated test data with data read from memory circuit, outputs display signal indicating whether memory circuit is functional
10/17/2002DE10115293A1 Verfahren zum Kennzeichnen eines integrierten Schaltkreises und integrierter Schaltkreis Method for marking an integrated circuit and integrated circuit
10/17/2002DE10113458A1 Test circuit has decoder clocked by high frequency clock signal that generates internal control signals for test circuit depending on control signals applied to control signal input bus
10/16/2002EP1249843A2 Test method for serial access memory and corresponding serial memory
10/16/2002EP1248978A2 Data memory
10/16/2002EP0766258B1 Dram signal margin test method
10/15/2002US6467056 Semiconductor integrated circuit and method of checking memory
10/15/2002US6467053 Captured synchronous DRAM fails in a working environment
10/15/2002US6467048 Apparatus, method and system for using cache memory as fail-over memory
10/15/2002US6466506 Semiconductor memory device capable of repairing small leak failure
10/15/2002US6466496 Semiconductor integrated circuit having circuit for data transmission distance measurement and memory processing system with the same
10/15/2002US6466495 Electronic circuit, test-apparatus assembly, and method for outputting a data item
10/15/2002US6466494 Semiconductor integrated circuit device with memory circuit
10/15/2002US6466493 Memory configuration having redundant memory locations and method for accessing redundant memory locations
10/15/2002US6466490 Semiconductor memory circuit
10/15/2002US6466478 Non-volatile semiconductor memory device
10/15/2002US6466472 Common module for DDR SDRAM and SDRAM
10/15/2002US6466053 Antifuse reroute of dies
10/15/2002US6466039 Ferroelectric film property measuring device, measuring method therefor and measuring method for semiconductor memory units
10/10/2002WO2002080184A2 On-chip circuits for high speed memory testing with a slow memory tester
10/10/2002WO2002080183A2 Memory cell structural test
10/10/2002WO2002078896A1 Methods and systems for processing a device, methods and systems for modeling same and the device
10/10/2002WO2002078895A1 High-speed, precision, laser-based method and system
10/10/2002US20020147949 Alternating current built in self test (AC BIST) with variable data receiver voltage reference for performing high-speed AC memory subsystem self-test
10/10/2002US20020147946 Method and system for automatic test report generation from memory device reliabilty testing
10/10/2002US20020147877 Synchronous memory device
10/10/2002US20020147564 Digital temperature sensor (DTS) system to monitor temperature in a memory subsystem
10/10/2002US20020145933 Semiconductor memory device and method for selecting multiple word lines in a semiconductor memory device
10/10/2002US20020145926 Integrated clock generator, particularly for driving a semiconductor memory with a test signal
10/10/2002US20020145925 Semiconductor device capable of simple measurement of oscillation frequency
10/10/2002US20020145922 Processing apparatus and information storage apparatus and method
10/10/2002US20020145921 Shared redundancy for memory having column addressing
10/10/2002US20020145911 Method for programming a reference cell
10/10/2002US20020145907 Non-volatile semiconductor memory device having word line defect check circuit
10/10/2002US20020145450 Word line testability improvement
10/10/2002US20020145138 Semiconductor integrated circuit device
10/10/2002DE10119144C1 Semiconductor memory module testing method involves transmitting additional information along with addresses of defect locations in memory bank, to external test device
10/10/2002DE10115879C1 Test data generator for integrated circuit, has test unit that generates multi-row register selection control data vector having number of control data equivalent to frequency multiplication factor of input clock signal
10/10/2002DE10115614A1 Current supply for semiconducting component involves supplying component from normal current generator in production development phase alternatively/additionally to standby generator
10/10/2002DE10115613A1 Integrated circuit, especially memory component, has at least two test circuits that can be connected to connector field via selection switch
10/09/2002EP1248269A1 Semiconductor memory device and method for selecting multiple word lines in a semiconductor memory device
10/09/2002EP0862762B1 Semiconductor memory device having error detection and correction
10/09/2002CN1092387C Semiconductor memory device capable of simultaneously designating multibit test mode and special test mode
10/08/2002US6463584 State copying method for software update
10/08/2002US6463563 Single symbol correction double symbol detection code employing a modular H-matrix
10/08/2002US6463558 Semiconductor memory device
10/08/2002US6463557 Weak bit testing
10/08/2002US6462996 Semiconductor integrated circuit device having internal synchronizing circuit responsive to test mode signal
10/08/2002US6462995 Semiconductor memory device capable of recovering defective bit and a system having the same semiconductor memory device
10/08/2002US6462994 Semiconductor memory device with redundancy logic cell and repair method
10/08/2002US6462993 Semiconductor integrated circuit
10/08/2002US6462992 Flash EEprom system
10/08/2002US6462988 Highly compact EPROM and flash EEPROM devices
10/08/2002US6462985 Non-volatile semiconductor memory for storing initially-setting data
10/08/2002US6462608 Low current redundancy anti-fuse apparatus
10/03/2002US20020144199 Integration type input circuit and method of testing it
10/03/2002US20020144196 Method for testing a non-volatile memory
10/03/2002US20020141281 Memory device which samples data after an amount of time transpires
10/03/2002US20020141276 Memory addressing structural test
10/03/2002US20020141273 Address generating circuit
10/03/2002US20020141264 Semiconductor memory device with efficient and reliable redundancy processing
10/03/2002US20020141263 Semiconductor memory
10/03/2002US20020141262 Semiconductor memory device
10/03/2002US20020141261 Semiconductor device having test mode
10/03/2002US20020141260 Built-in programmable self-diagnostic circuit for sram unit
10/03/2002US20020141259 Memory cell structural test
10/03/2002US20020141258 Semiconductor device
10/03/2002US20020141254 Memory device having programmable column segmentation to increase flexibility in bit repair
10/03/2002US20020141252 Semiconductor memory having mirroring function
10/03/2002US20020141247 Semiconductor device having chip selection circuit and method of generating chip selection signal
10/03/2002US20020141246 Output buffer capable of adjusting current drivability and semiconductor integrated circuit device having the same
10/03/2002US20020141241 Testing method for a reading operation in a non volatile memory
10/03/2002US20020141227 Semiconductor device in which storage electrode of capacitor is connected to gate electrode of fet and inspection method thereof
10/02/2002EP1246202A2 Semiconductor memory device
10/02/2002EP1246201A2 Semiconductor memory
10/02/2002EP1246200A2 Semiconductor memory device
10/02/2002EP0961289B1 Flash memory with improved erasability and its circuitry
10/02/2002EP0823685B1 Cache memory capable of using faulty tag memory
10/02/2002EP0709765B1 Method and system for selecting data for migration in a hierarchic data storage system using frequency distribution tables
10/02/2002DE10114776C1 Anordnung zum Test eines integrierten Halbleiterspeichers An arrangement for testing an integrated semiconductor memory,
10/02/2002CN1091925C 存储器设备 Memory device
10/01/2002US6460152 High speed memory test system with intermediate storage buffer and method of testing
10/01/2002US6460145 Storage device data processing system and data writing and readout method
10/01/2002US6460110 Semiconductor memory
10/01/2002US6460091 Address decoding circuit and method for identifying individual addresses and selecting a desired one of a plurality of peripheral macros
10/01/2002US6459652 Semiconductor memory device having echo clock path
10/01/2002US6459648 Fault-tolerant address logic for solid state memory
10/01/2002US6459643 Semiconductor integrated circuit
10/01/2002US6459642 Semiconductor memory device
10/01/2002US6459640 Nonvolatile semiconductor memory and automatic erasing/writing method thereof
10/01/2002US6459638 Built-in programmable self-diagnostic circuit for SRAM unit
10/01/2002US6459637 Zero margin enable controlling apparatus and method of sense amplifier adapted to semiconductor memory device
10/01/2002US6459636 Mode selection circuit for semiconductor memory device
10/01/2002US6459634 Circuits and methods for testing memory cells along a periphery of a memory array
10/01/2002US6459633 Redundant encoding for buried metal fuses
10/01/2002US6459632 Semiconductor memory device having redundancy function
10/01/2002US6459631 Configuration for implementing redundancy for a memory chip
10/01/2002US6459630 Semiconductor memory device having replacing defective columns with redundant columns
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