| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 02/20/2003 | US20030034544 Microcomputer |
| 02/19/2003 | EP1284498A2 System and method to screen defect related reliability failures in CMOS SRAMS |
| 02/19/2003 | CN1398431A Semiconductor device |
| 02/19/2003 | CN1398407A 半导体集成电路器件 The semiconductor integrated circuit device |
| 02/19/2003 | CN1397951A Semiconductor storage and method of driving same |
| 02/18/2003 | US6523145 Method and apparatus for testing a contents-addressable-memory-type structure using a simultaneous write-thru mode |
| 02/18/2003 | US6523144 Intelligent binning for electrically repairable semiconductor chips and method |
| 02/18/2003 | US6523143 Memory testing apparatus |
| 02/18/2003 | US6523135 Built-in self-test circuit for a memory device |
| 02/18/2003 | US6523132 Flash EEprom system |
| 02/18/2003 | US6523049 Circuit and method for determining greater than or equal to three out of sixty-six |
| 02/18/2003 | US6522598 Synchronous semiconductor memory device having improved operational frequency margin at data input/output |
| 02/18/2003 | US6522595 Methods for forming and programming aligned fuses disposed in an integrated circuit |
| 02/18/2003 | US6522591 Semiconductor memory circuit |
| 02/18/2003 | US6522590 Semiconductor memory device |
| 02/18/2003 | US6522567 Semiconductor memory device and semiconductor integrated device using the same |
| 02/18/2003 | US6521958 MOSFET technology for programmable address decode and correction |
| 02/13/2003 | WO2003012796A2 Method for sharing redundant rows between banks for improved repari efficiency |
| 02/13/2003 | US20030033573 Memory card and memory controller |
| 02/13/2003 | US20030033572 Memory system and method of using same |
| 02/13/2003 | US20030033567 Memory card and memory controller |
| 02/13/2003 | US20030033566 Internal cache for on chip test data storage |
| 02/13/2003 | US20030033561 Apparatus for testing memories with redundant storage elements |
| 02/13/2003 | US20030033557 Semiconductor memory testing device |
| 02/13/2003 | US20030033471 Window-based flash memory storage system and management and access methods thereof |
| 02/13/2003 | US20030031082 Clock synchronous semiconductor memory device |
| 02/13/2003 | US20030031075 Semiconductor integrated circuit device and method of manufacturing thereof |
| 02/13/2003 | US20030031069 Semiconductor memory device capable of applying stress voltage to bit line pair |
| 02/13/2003 | US20030031063 Semiconductor integrated circuit and electronic apparatus including the same |
| 02/13/2003 | US20030031061 Circuit and method for repairing column in semiconductor memory device |
| 02/13/2003 | US20030031051 Non-volatile memory |
| 02/13/2003 | US20030031049 Nonvolatile semiconductor memory device having electrically and collectively erasable characteristics |
| 02/13/2003 | US20030031039 Method and apparatus for adjusting control circuit pull-up margin for content addressable memory (CAM) |
| 02/13/2003 | US20030030135 Semiconductor device that can have a defective bit found during or after packaging process repaired |
| 02/13/2003 | US20030030073 Semiconductor integrated circuit device |
| 02/12/2003 | EP0859317B1 Method for protecting information in printing apparatus |
| 02/12/2003 | CN1396658A 半导体集成电路 The semiconductor integrated circuit |
| 02/12/2003 | CN1396599A Semiconductor memory device for reading data and error correction in refresh operating procedure |
| 02/11/2003 | US6519726 Semiconductor device and testing method of the same |
| 02/11/2003 | US6519725 Diagnosis of RAMS using functional patterns |
| 02/11/2003 | US6519719 Method and apparatus for transferring test data from a memory array |
| 02/11/2003 | US6519716 Electronic device initialization with dynamic selection of access time for non-volatile memory |
| 02/11/2003 | US6519202 Method and apparatus to change the amount of redundant memory column and fuses associated with a memory device |
| 02/11/2003 | US6519194 Semiconductor memory device with a rapid packet data input, capable of operation check with low speed tester |
| 02/11/2003 | US6519193 Semiconductor integrated circuit device having spare word lines |
| 02/11/2003 | US6519192 Semiconductor memory device having a large band width and allowing efficient execution of redundant repair |
| 02/11/2003 | US6519185 Flash EEprom system |
| 02/11/2003 | US6519171 Semiconductor device and multichip module |
| 02/11/2003 | US6518746 Integrated circuit device having a burn-in mode for which entry into and exit from can be controlled |
| 02/11/2003 | US6518073 Method for testing semiconductor memory devices, and apparatus and system for testing semiconductor memory devices |
| 02/06/2003 | WO2003010775A1 Nonvolatile memory |
| 02/06/2003 | US20030028835 Semiconductor integrated circuit |
| 02/06/2003 | US20030028834 Method for sharing redundant rows between banks for improved repair efficiency |
| 02/06/2003 | US20030028826 System and method for developing customized integration tests and network peripheral device evaluations |
| 02/06/2003 | US20030028712 Semiconductor memory |
| 02/06/2003 | US20030028710 Semiconductor memory |
| 02/06/2003 | US20030028704 Memory controller, flash memory system having memory controller and method for controlling flash memory device |
| 02/06/2003 | US20030028342 Method for the defect analysis of memory modules |
| 02/06/2003 | US20030026162 Calibration method and memory system |
| 02/06/2003 | US20030026161 Semiconductor memory |
| 02/06/2003 | US20030026148 Method and apparatus for testing a CAM addressed cache |
| 02/06/2003 | US20030026147 Fuse box including make-link and redundant address decoder having the same, and method for repairing defective memory cell |
| 02/06/2003 | US20030026143 Method for automating the construction of data stores for storing complex relational and hierarchical data and optimising the access and update of the data therein method for defining look and feel of a user interface obviating the requirement to write programming language code |
| 02/06/2003 | US20030026142 Semiconductor memory having a defective memory cell relieving circuit |
| 02/06/2003 | US20030026140 Semiconductor memory having multiple redundant columns with offset segmentation boundaries |
| 02/06/2003 | US20030026139 Semiconductor module including semiconductor memory device shiftable to test mode as well as semiconductor memory device used therein |
| 02/06/2003 | US20030026136 Semiconductor memory device and method for testing the same |
| 02/06/2003 | US20030026135 Data-shifting scheme for utilizing multiple redundant elements |
| 02/06/2003 | US20030026131 Redundancy circuit and method for replacing defective memory cells in a flash memory device |
| 02/06/2003 | US20030026129 Redundancy circuit and method for flash memory devices |
| 02/06/2003 | US20030026119 Semiconductor integrated circuit device having internal synchronizing circuit responsive to test mode signal |
| 02/06/2003 | US20030025730 Method for defining look and feel of a user interface obviating the requirement to write programming language code |
| 02/06/2003 | US20030025191 Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor device |
| 02/05/2003 | EP1282138A1 Redundancy circuit and method for flash memory devices |
| 02/05/2003 | EP1282137A1 Redundancy circuit and method for replacing defective memory cells in a flash memory device |
| 02/05/2003 | EP1282133A1 Semiconductor memory |
| 02/05/2003 | EP1282040A2 Data storage method for use in a magnetoresistive solid-state storage device |
| 02/04/2003 | US6516431 Semiconductor device |
| 02/04/2003 | US6516430 Test circuit for semiconductor device with multiple memory circuits |
| 02/04/2003 | US6516256 Apparatus for storing data in a motor vehicle |
| 02/04/2003 | US6515937 Test circuit for testing semiconductor memory |
| 02/04/2003 | US6515933 Semiconductor device and semiconductor storage device testing method |
| 02/04/2003 | US6515928 Semiconductor memory device having a plurality of low power consumption modes |
| 02/04/2003 | US6515923 Memory array organization and related test method particularly well suited for integrated circuits having write-once memory arrays |
| 02/04/2003 | US6515922 Memory module |
| 02/04/2003 | US6515921 Semiconductor storage device having redundancy circuit for replacement of defect cells under tests |
| 02/04/2003 | US6515920 Semiconductor data storing circuit device, method of checking the device and method of relieving the device from defective cell |
| 02/04/2003 | US6515905 Nonvolatile semiconductor memory device having testing capabilities |
| 01/30/2003 | WO2003009304A2 Duty-cycle-efficient sram cell test |
| 01/30/2003 | US20030023932 Method and apparatus for parity error recovery |
| 01/30/2003 | US20030023928 Manufacturing test for a fault tolerant magnetoresistive solid-state storage device |
| 01/30/2003 | US20030023927 Method for error correction decoding in a magnetoresistive solid-state storage device |
| 01/30/2003 | US20030023926 Magnetoresistive solid-state storage device and data storage methods for use therewith |
| 01/30/2003 | US20030023925 Manufacturing test for a fault tolerant magnetoresistive solid-state storage device |
| 01/30/2003 | US20030023924 Data storage method for use in a magnetoresistive solid-state storage device |
| 01/30/2003 | US20030023923 Error correction coding and decoding in a solid-state storage device |
| 01/30/2003 | US20030023922 Fault tolerant magnetoresistive solid-state storage device |
| 01/30/2003 | US20030023911 Method for error correction decoding in an MRAM device (historical erasures) |
| 01/30/2003 | US20030023909 Interleave address generator |
| 01/30/2003 | US20030023902 Recording test information to identify memory cell errors |