G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation

Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
12/2002
12/24/2002	US6498760 Semiconductor device having test mode
12/24/2002	US6498757 Structure to inspect high/low of memory cell threshold voltage using current mode sense amplifier
12/24/2002	US6498756 Semiconductor memory device having row repair circuitry
12/24/2002	US6498755 Semiconductor storage device conducting a late-write operation and controlling a test read-operation to read data not from a data latch circuit but from a memory core circuit regardless of whether a preceding address and a present address match each other
12/19/2002	WO2002101749A1 Methods and apparatus for analyzing and repairing memory
12/19/2002	WO2002045094A3 Method and apparatus for built-in self-repair of memory storage arrays
12/19/2002	US20020194559 Method for test-writing to the cell array of a semiconductor memory
12/19/2002	US20020194558 Method and system to optimize test cost and disable defects for scan and BIST memories
12/19/2002	US20020194557 Built-in self test circuit using linear feedback shift register
12/19/2002	US20020194552 Storage device, data processing system and data writing and readout method
12/19/2002	US20020194546 Synchronous semiconductor memory device capable of reducing test cost and method of testing the same
12/19/2002	US20020194545 Method of testing embedded memory array and embedded memory controller for use therewith
12/19/2002	US20020194539 Automatic timing analyzer
12/19/2002	US20020194447 Reconfigurable multi-chip modules
12/19/2002	US20020194420 Semiconductor redundant memory provided in common
12/19/2002	US20020191472 Semiconductor memory device operating with low power consumption
12/19/2002	US20020191470 Architecture, method(s) and circuitry for low power memories
12/19/2002	US20020191469 Semiconductor device and method of the semiconductor device
12/19/2002	US20020191468 Fuse circuit using anti-fuse and method for searching for failed address in semiconductor memory
12/19/2002	US20020191462 Controller for delay locked loop circuits
12/19/2002	US20020191454 Memory chip having a test mode and method for checking memory cells of a repaired memory chip
12/19/2002	US20020191447 Semiconductor integrated circuit
12/19/2002	US20020191440 Externally triggered leakage detection and repair in a flash memory device
12/19/2002	US20020191438 Semiconductor device with improved latch arrangement
12/19/2002	US20020190708 Memory device tester and method for testing reduced power states
12/19/2002	US20020190310 Eeprom cell testing circuit
12/19/2002	DE10220328A1 Schaltung zur Taktsignalerzeugung, zugehörige integrierte Schaltkreisbauelemente und Auffrischtaktsteuerverfahren Circuit for clock signal generation, associated integrated circuit devices and Auffrischtaktsteuerverfahren
12/19/2002	DE10121131C1 Datenspeicher Data storage
12/18/2002	EP1116114B1 Technique for detecting memory part failures and single, double, and triple bit errors
12/18/2002	CN1386283A Integrated circuit containing SRAM memory and method of testing same
12/18/2002	CN1385859A Electric resistance cross-point memory utilizing checking amplifier demarcating method on chip
12/18/2002	CN1096681C Redundancy circuit and method of semiconductor memory device
12/18/2002	CN1096639C Digital storage system and method having alternating deferred updating of mirrored storage disks
12/17/2002	US6496953 Calibration method and apparatus for correcting pulse width timing errors in integrated circuit testing
12/17/2002	US6496952 Semiconductor integrated circuit device, method of manufacturing the device, and computer readable medium
12/17/2002	US6496951 Method for testing signal integrity in a data storage system
12/17/2002	US6496950 Testing content addressable static memories
12/17/2002	US6496947 Built-in self repair circuit with pause for data retention coverage
12/17/2002	US6496946 Electronic control apparatus with memory validation and method
12/17/2002	US6496876 System and method for storing a tag to identify a functional storage location in a memory device
12/17/2002	US6496433 Semiconductor device and semiconductor device testing method
12/17/2002	US6496432 Method and apparatus for testing a write function of a dual-port static memory cell
12/17/2002	US6496431 Semiconductor integrated circuit
12/17/2002	US6496430 Semiconductor memory circuit having selective redundant memory cells
12/17/2002	US6496429 Semiconductor memory device
12/17/2002	US6496428 Semiconductor memory
12/17/2002	US6496427 Nonvolatile semiconductor memory device
12/17/2002	US6496426 Redundancy circuit of semiconductor memory device
12/17/2002	US6496425 Multiple bit line column redundancy
12/17/2002	US6496413 Semiconductor memory device for effecting erasing operation in block unit
12/17/2002	US6496027 System for testing integrated circuit devices
12/17/2002	US6495856 Semiconductor device having a test pattern same as conductive pattern to be tested and method for testing semiconductor device for short-circuit
12/12/2002	WO2002099814A1 Non-volatile semiconductor storage device and production method thereof
12/12/2002	WO2002067263A3 Contact system comprising a dielectric antifuse for an ic-memory element and method for producing one such contact system
12/12/2002	WO2002027729A3 Writable tracking cells
12/12/2002	US20020188902 Test system algorithmic program generators
12/12/2002	US20020188900 Test method and test system for semiconductor device
12/12/2002	US20020188899 Memory control circuit
12/12/2002	US20020188898 Tester built-in semiconductor integrated circuit device
12/12/2002	US20020188897 Method for repairing hardware faults in memory chips
12/12/2002	US20020188893 Series connected TC unit type ferroelectric RAM and test method thereof
12/12/2002	US20020187602 Method of manufacturing semiconductor device
12/12/2002	US20020186606 Device and method for repairing a semiconductor memory
12/12/2002	US20020186605 Device and method for margin testing a semiconductor memory by applying a stressing voltage simultaneously to complementary and true digit lines
12/12/2002	US20020186604 Fail repair circuit of nonvolatile ferroelectric memory device and method for repairing the same
12/12/2002	US20020186603 Mode control circuit for semiconductor device and semiconductor memory device having the mode control circuit
12/12/2002	US20020186602 Semiconductor device capable of adjusting internal potential
12/12/2002	US20020186600 Column repair circuit and method of using nonvolatile ferroelectric memory device
12/12/2002	US20020186589 Nonvolatile semiconductor memory device
12/12/2002	DE10158310A1 Schaltung und Verfahren zur Spaltenreparatur bei einem nichtflüchtigen ferroelektrischen Speicher Circuit and method for column repair in a non-volatile ferroelectric memory
12/12/2002	DE10126610A1 Semiconducting memory chip has at least one contact that passes through from one side of semiconducting chip to opposite side
12/12/2002	DE10126599A1 Speicherbaustein, Verfahren zum Aktivieren einer Speicherzelle und Verfahren zum Reparieren einer defekten Speicherzelle Memory device, method of activating a memory cell and method for repairing a defective memory cell
12/12/2002	DE10126591A1 Testvorrichtung für dynamische Speichermodule Test apparatus for dynamic memory modules
12/12/2002	DE10126301A1 Memory component with test mode has address circuit that activates defective memory cell instead of specified replacement cell if signal from test circuit and address of defective cell applied
12/12/2002	DE10125921A1 Arrangement for reducing number of fuses in semiconducting device has decompressor between fuse and fuse latch devices for reading states of fuses of activated master fuse
12/12/2002	DE10125028A1 Semiconducting memory with commonly usable cutout devices has activation device for activating redundant column line as replacement line for defective lines
12/12/2002	DE10125022A1 Dynamischer Speicher und Verfahren zum Testen eines dynamischen Speichers Dynamic memory and method for testing a dynamic memory
12/12/2002	DE10124923A1 Testverfahren zum Testen eines Datenspeichers Test method for testing a data store
12/12/2002	DE10122081A1 Verfahren und Vorrichtung zum Kalibrieren eines Testsystems für eine integrierte Halbleiterschaltung Method and apparatus for calibrating a test system for a semiconductor integrated circuit
12/12/2002	DE10119125C1 Verfahren zum Vergleich der Adresse eines Speicherzugriffs mit einer bereits bekannten Adresse einer fehlerhaften Speicherzelle A method for comparing the address of a memory access to a known address of a defective memory cell
12/11/2002	EP1265255A1 Method and device for failure analysis of physical part objects which are arranged in a physical object in matrix form, computer readable storage medium and computer program element
12/11/2002	EP1163680B1 Device and method for carrying out the built-in self-test of an electronic circuit
12/11/2002	EP0704801B1 Memory architecture for solid state disc
12/11/2002	CN1096111C Speciofic part searching method and device for memory LSIC
12/11/2002	CN1096083C Semi-conductor memory device
12/11/2002	CN1096080C Semiconductor memory device having dual word line configuration
12/10/2002	US6493839 Apparatus and method for testing memory in a microprocessor
12/10/2002	US6493836 Method and apparatus for scheduling and using memory calibrations to reduce memory errors in high speed memory devices
12/10/2002	US6493829 Semiconductor device enable to output a counter value of an internal clock generation in a test mode
12/10/2002	US6493808 Device and process for testing a reprogrammable nonvolatile memory
12/10/2002	US6493647 Method and apparatus for exercising external memory with a memory built-in self-test
12/10/2002	US6493414 Die information logic and protocol
12/10/2002	US6493283 Architecture, method (s) and circuitry for low power memories
12/10/2002	US6493279 Semiconductor device capable of simple measurement of oscillation frequency
12/10/2002	US6492923 Test system and testing method using memory tester
12/10/2002	US6492832 Methods for testing a group of semiconductor devices simultaneously, and devices amenable to such methods of testing
12/10/2002	US6492727 Semiconductor device
12/10/2002	US6492721 High-voltage signal detecting circuit
12/10/2002	US6492706 Programmable pin flag
12/05/2002	WO2002097822A1 Semiconductor test apparatus

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