Patents
Sitemap › G11 - Information storage › G11C - Static stores › G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
06/2003
06/19/2003US20030112675 Semiconductor memory device
06/19/2003US20030112665 Semiconductor memory device, data processor, and method of determining frequency
06/19/2003US20030112664 Semiconductor storage device and information apparatus
06/19/2003US20030112662 Nonvolatile semiconductor memory having page mode with a plurality of banks
06/19/2003US20030112661 Writable tracking cells
06/19/2003US20030112648 Saving content addressable memory power through conditional comparisons
06/19/2003US20030112029 Built-in self repair for an integrated circuit
06/19/2003US20030112028 Test circuit arrangement and method for testing a multiplicity of transistors
06/18/2003EP1320105A2 Semiconductor memory device
06/18/2003EP1125202B1 Storage device for storing data and method for operating storage devices for data storage
06/18/2003CN1111870C Semiconductor memory capable of testing regardless of spare unit configuration
06/18/2003CN1111869C Semiconductor memory device
06/18/2003CN1111868C Semiconductor integrated circuit device capable of externally monitoring internal voltage
06/18/2003CN1111867C Fuse restoring circuit
06/17/2003US6581174 On-chip testing circuit and method for integrated circuits
06/17/2003US6581172 On-board testing circuit and method for improving testing of integrated circuits
06/17/2003US6581171 Circuit configuration for the burn-in test of a semiconductor module
06/17/2003US6581132 Flash memory system including a memory manager for managing data
06/17/2003US6581128 Storage system
06/17/2003US6580649 Semiconductor memory device
06/17/2003US6580648 Memory circuit
06/17/2003US6580644 Flash memory device capable of checking memory cells for failure characteristics
06/17/2003US6580631 256 Meg dynamic random access memory
06/12/2003US20030110431 Scanning an allowed value into a group of latches
06/12/2003US20030110427 Semiconductor test system storing pin calibration data in non-volatile memory
06/12/2003US20030110426 Apparatus and method for error logging on a memory module
06/12/2003US20030110425 I/O compression circuit for a semiconductor memory device
06/12/2003US20030110424 System and method for testing a column redundancy of an integrated circuit memory
06/12/2003US20030110411 Flash EEprom system
06/12/2003US20030110349 System and method for storing parity information in fuses
06/12/2003US20030107951 Compact ate with time stamp system
06/12/2003US20030107941 Semiconductor memory device and electronic instrument
06/12/2003US20030107940 Row access information transfer device using internal wiring of a memory cell array
06/12/2003US20030107939 Refresh apparatus for semiconductor memory device, and refresh method thereof
06/12/2003US20030107937 Asynchronous FIFO memory having built-in self test logic
06/12/2003US20030107931 Method of verifying a semiconductor integrated circuit apparatus, which can sufficiently evaluate a reliability of a non-destructive fuse module after it is assembled
06/12/2003US20030107930 Semiconductor device with flexible redundancy system
06/12/2003US20030107929 Semiconductor device with flexible redundancy system
06/12/2003US20030107928 Semiconductor device
06/12/2003US20030107926 Semiconductor device provided with memory chips
06/12/2003US20030107925 Apparatus for random access memory array self-repair
06/12/2003US20030107920 Method and architecture to calibrate read operations in synchronous flash memory
06/12/2003US20030107918 Nonvolatile memory device
06/12/2003US20030107092 Flash array implementation with local and global bit lines
06/11/2003CN1423284A Semiconductor integrated circuit comprising storage macro
06/11/2003CN1423279A Semiconductor storage device reading data according to current passing through storage anit while accessing
06/10/2003US6578169 Data failure memory compaction for semiconductor test system
06/10/2003US6578100 Storage system having plural buses
06/10/2003US6578091 Circuit arrangement and method for checking data
06/10/2003US6577551 Semiconductor integrated circuit having a built-in data storage circuit for nonvolatile storage of control data
06/10/2003US6577547 Semiconductor memory device
06/10/2003US6577546 Semiconductor integrated circuit and operating method
06/10/2003US6577545 Integrated circuit memory devices having efficient multi-row address test capability and methods of operating same
06/10/2003US6577544 Semiconductor device having redundancy circuit
06/10/2003US6577543 Semiconductor integrated circuit including a plurality of macros that can be operated although their operational voltages are different from each other
06/10/2003US6577534 Non-volatile semiconductor memory device having a low defective rate
06/10/2003US6577156 Method and apparatus for initializing an integrated circuit using compressed data from a remote fusebox
06/05/2003WO2003046925A2 Built-in self-testing for double data rate input/output interface
06/05/2003WO2003046717A2 Method and test device for detecting addressing errors in control devices
06/05/2003US20030106010 Memory circuit having parity cell array
06/05/2003US20030106001 Semiconductor integrated circuit including memory macro
06/05/2003US20030106000 Circuit for inspecting a data error
06/05/2003US20030105999 Apparatus for random access memory array self-test
06/05/2003US20030104636 Method and article for concentrating fields at sense layers
06/05/2003US20030103405 Voltage detection level correction circuit and semiconductor device
06/05/2003US20030103396 Semiconductor memory device capable of switching output data width
06/05/2003US20030103395 Semiconductor memory device reading data based on memory cell passing current during access
06/05/2003US20030103394 Semiconductor storage device and method for remedying defects of memory cells
06/05/2003US20030103379 Semiconductor memory device
06/05/2003US20030103368 Refresh-free dynamic semiconductor memory device
06/05/2003US20030102885 Semiconductor integrated circuit and method for testing the same
06/05/2003US20030102881 Method and apparatus for reducing the current consumption of an electronic circuit
06/05/2003US20030102879 Device picker in handler
06/04/2003EP1316967A1 Test of a semiconductor memory device comprising twin-cells each for storing a bit in ordinary and in inverted form
06/04/2003EP1316966A2 Memory circuit having compressed testing function
06/04/2003EP1316964A2 Non-volatile semiconductor memory device and memory system using the same
06/04/2003EP1316963A2 Non-volatile semiconductor memory device and memory system using the same
06/04/2003CN1421931A 半导体集成电路及其测试方法 Semiconductor integrated circuit and test methods
06/04/2003CN1421871A Storage circuit with odd-even check unit array
06/04/2003CN1421870A Semiconductor storage device
06/04/2003CN1421868A Storage circuit with test compression function
06/04/2003CN1421864A Thin film magnetic memory with redundant structure
06/04/2003CN1110856C Semiconductor integrated circuit and method for testing synchronous dynamic random memory core
06/04/2003CN1110809C Memory read method and circuit for error checking and correction in decoding device
06/03/2003US6574764 Algorithmically programmable memory tester with history FIFO's that aid in error analysis and recovery
06/03/2003US6574761 On-line testing of the programmable interconnect network in field programmable gate arrays
06/03/2003US6574759 Method for verifying and improving run-time of a memory test
06/03/2003US6574757 Integrated circuit semiconductor device having built-in self-repair circuit for embedded memory and method for repairing the memory
06/03/2003US6574746 System and method for improving multi-bit error protection in computer memory systems
06/03/2003US6574745 Loosely coupled mass storage computer cluster
06/03/2003US6574626 Method and apparatus for administration of extended memory
06/03/2003US6574159 Semiconductor memory device and testing method therefor
06/03/2003US6574158 Method and system for measuring threshold of EPROM cells
06/03/2003US6574157 Modular memory structure having adaptable redundancy circuitry
06/03/2003US6574156 Device and method for repairing a semiconductor memory
06/03/2003US6574155 Redundant multiplexer for a semiconductor memory configuration
06/03/2003US6574153 Asynchronous, high-bandwidth memory component using calibrated timing elements
06/03/2003US6574141 Differential redundancy multiplexor for flash memory devices
06/03/2003US6574132 Circuit configuration for equalizing different voltages on line runs in integrated semiconductor circuits
06/03/2003US6573613 Semiconductor memory device having cell plate electrodes allowing independent power supply for each redundant replacement unit
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