| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 07/29/2003 | US6600684 Semiconductor storage device |
| 07/29/2003 | US6600680 Circuit configuration and method for determining a time constant of a storage capacitor of a memory cell in a semiconductor memory |
| 07/29/2003 | US6600676 Nonvolatile semiconductor memory device with a ROM block settable in the write or erase inhibit mode |
| 07/29/2003 | US6600337 Line segmentation in programmable logic devices having redundancy circuitry |
| 07/24/2003 | US20030140299 Error detection in storage data |
| 07/24/2003 | US20030140290 Synchronous semiconductor device, and inspection system and method for the same |
| 07/24/2003 | US20030140289 Dual port RAM |
| 07/24/2003 | US20030137888 Techniques of recovering data from memory cells affected by field coupling with adjacent memory cells |
| 07/24/2003 | US20030137876 Nonvolatile semiconductor memory device |
| 07/24/2003 | US20030137864 System and method for determining the logic state of a memory cell in a magnetic tunnel junction memory device |
| 07/24/2003 | US20030137305 Methods for evaluating and fabricating semiconductor device and apparatus and program for evaluating the same |
| 07/24/2003 | US20030136976 Nonvolatile semiconductor memory with a page mode |
| 07/24/2003 | DE10211136C1 Electronic module test method with successive write-in and read-out of information in memory cell device using 2 different clock frequencies |
| 07/23/2003 | EP1329904A2 Magnetoresistive random access memory devices |
| 07/23/2003 | EP1329903A1 Semiconductor memory which enters a test mode by applying a command sequence at a read access |
| 07/23/2003 | EP1329899A2 Semiconductor memory device, data processor, and method of determining frequency |
| 07/23/2003 | EP1329898A2 Techniques of recovering data from memory cells affected by field coupling with adjacent memory cells |
| 07/23/2003 | EP1192544B1 Error correction circuit and method for a memory device |
| 07/23/2003 | CN1432153A Dual-ported cams for simultaneous operation flash memory |
| 07/23/2003 | CN1115694C Non-volatile memory device and its detection method |
| 07/22/2003 | US6598198 Deinterleaving device that releases a plurality of types of interleaving simultaneously |
| 07/22/2003 | US6598190 Memory device generator for generating memory devices with redundancy |
| 07/22/2003 | US6598171 Integrated circuit I/O using a high performance bus interface |
| 07/22/2003 | US6598112 Method and apparatus for executing a program using primary, secondary and tertiary memories |
| 07/22/2003 | US6597609 Non-volatile memory with test rows for disturb detection |
| 07/22/2003 | US6597608 Coding cell of nonvolatile ferroelectric memory device and operating method thereof, and column repair circuit of nonvolatile ferroelectric memory device having the coding cell and method for repairing column |
| 07/22/2003 | US6597607 Semiconductor memory device and its operation method |
| 07/22/2003 | US6597603 Dual mode high voltage power supply for providing increased speed in programming during testing of low voltage non-volatile memories |
| 07/22/2003 | US6597362 Integrated circuit having lithographical cell array interconnections |
| 07/22/2003 | US6597206 256 Meg dynamic random access memory |
| 07/22/2003 | US6597054 Reduced pitch laser redundancy fuse bank structure |
| 07/17/2003 | WO2003058630A1 Multi-mode synchronous memory device and method of operating and testing same |
| 07/17/2003 | WO2003050552B1 Testing current perpendicular to plane giant magnetoresistance multilayer devices |
| 07/17/2003 | US20030135808 Disk array system and its control method |
| 07/17/2003 | US20030135801 Mode entry circuit and method |
| 07/17/2003 | US20030135800 Method for creating defect management information in an recording medium, and apparatus and medium based on said method |
| 07/17/2003 | US20030135795 Integrated circuit and method for operating a test configuration with an integrated circuit |
| 07/17/2003 | US20030135794 Method for apparatus for tracking errors in a memory system |
| 07/17/2003 | US20030135793 Method and apparatus for dynamic degradation detection |
| 07/17/2003 | US20030135702 Microcomputer for accessing a replacing block area preset in a nonvolatile memory in place of a replaced block area accessed in the nonvolatile memory |
| 07/17/2003 | US20030134442 Test structure and method for flash memory tunnel oxide quality |
| 07/17/2003 | US20030133351 Semiconductor memory device allowing increase in capacity and operation speed with a suppressed layout area |
| 07/17/2003 | US20030133350 Semiconductor memory device |
| 07/17/2003 | US20030133340 NAND flash memory and method of erasing, programming, and copy-back programming thereof |
| 07/17/2003 | US20030133338 Semiconductor device, nonvolatile semiconductor memory, system including a plurality of semiconductor devices or nonvolatile semiconductor memories, electric card including semiconductor device or nonvolatile semiconductor memory, and electric device with which this electric card can be used |
| 07/17/2003 | US20030133336 Method and apparatus for dynamically hiding a defect in an embedded memory |
| 07/17/2003 | US20030133335 Semiconductor memory device |
| 07/17/2003 | US20030133334 Thin film magnetic memory device having redundancy repair function |
| 07/17/2003 | US20030133333 Self-healing MRAM |
| 07/17/2003 | US20030133330 Circuit and method for reducing leakage current in a row driver circuit in a flash memory during a standby mode of operation |
| 07/16/2003 | EP1327249A2 Method to descramble the data mapping in memory circuits |
| 07/16/2003 | EP1327193A2 Burst read incorporating output based redundancy |
| 07/16/2003 | CN1430227A Semiconductor integral circuit device with internal potential generating circuit which capable of regulating internal power patential by external |
| 07/16/2003 | CN1114927C Redundancy circuit of storage device and method for access redundancy address |
| 07/16/2003 | CN1114925C Semiconductor storage device having function of inhibiting leakage electric-current redundancy of fault storag unit |
| 07/15/2003 | US6594788 Method of analyzing a relief of failure cell in a memory and memory testing apparatus having a failure relief analyzer using the method |
| 07/15/2003 | US6594777 Semiconductor memory device |
| 07/15/2003 | US6594192 Integrated volatile and non-volatile memory |
| 07/15/2003 | US6594186 Semiconductor memory and burn-in method for the same |
| 07/15/2003 | US6594177 Redundancy circuit and method for replacing defective memory cells in a flash memory device |
| 07/15/2003 | US6593763 Module test socket for test adapters |
| 07/15/2003 | US6593590 Electrical measuring instruments comprising substrates, chips, transistors used for detection of leakage currents in electronic apparatus |
| 07/10/2003 | WO2003056566A1 Semiconductor storage device, test method therefor, and test circuit therefor |
| 07/10/2003 | US20030131294 Stuck-at fault scan chain diagnostic method |
| 07/10/2003 | US20030131196 Cache memory capable of selecting size thereof and processor chip having the same |
| 07/10/2003 | US20030128618 Flash EEprom system |
| 07/10/2003 | US20030128615 Integrated circuit having aligned fuses and methods for forming and programming the fuses |
| 07/10/2003 | US20030128614 Semiconductor memory device having refresh size setting circuit |
| 07/10/2003 | US20030128613 Semiconductor memory device capable of measuring a period of an internally produced periodic signal |
| 07/10/2003 | US20030128607 Semiconductor memory device and electronic instrument using the same |
| 07/10/2003 | US20030128606 Method and apparatus to ensure functionality and timing robustness in soi circuits |
| 07/10/2003 | US20030128594 Bias distribution network for digital multilevel nonvolatile flash memory |
| 07/10/2003 | US20030128593 Semiconductor storage apparatus |
| 07/10/2003 | US20030128589 Method and architecture to calibrate read operations in synchronous flash memory |
| 07/10/2003 | US20030128585 Semiconductor memory device having faulty cells |
| 07/10/2003 | US20030128578 Magnetoresistive random access memory (MRAM) with on-chip automatic determination of optimized write current method and apparatus |
| 07/10/2003 | US20030128577 Weak current generation |
| 07/10/2003 | US20030128573 Semiconductor memory system having dynamically delayed timing for high-speed data transfers |
| 07/10/2003 | US20030128045 Apparatus and method for testing semiconductor storage device |
| 07/09/2003 | EP1326259A1 Method and apparatus for verification of a gate oxide fuse element |
| 07/09/2003 | EP1326082A1 Integrated circuit with configurable scan path |
| 07/09/2003 | EP0833348B1 Method and circuit for checking multilevel programming of floating-gate nonvolatile memory cells, particlarly flash cells |
| 07/09/2003 | CN1428788A Semiconductor memory |
| 07/08/2003 | US6591393 Masking error detection/correction latency in multilevel cache transfers |
| 07/08/2003 | US6591385 Method and apparatus for inserting programmable latency between address and data information in a memory tester |
| 07/08/2003 | US6591384 Comparable circuits for parallel testing DRAM device |
| 07/08/2003 | US6591329 Flash memory system for restoring an internal memory after a reset event |
| 07/08/2003 | US6591213 Systems for providing zero latency, non-modulo looping and branching of test pattern data for automatic test equipment |
| 07/08/2003 | US6590825 Non-volatile flash fuse element |
| 07/08/2003 | US6590823 Refresh-circuit-containing semiconductor memory device |
| 07/08/2003 | US6590820 Sense amplifier with reference cell circuit |
| 07/08/2003 | US6590818 Method and apparatus for soft defect detection in a memory |
| 07/08/2003 | US6590817 6F2 DRAM array with apparatus for stress testing an isolation gate and method |
| 07/08/2003 | US6590816 Integrated memory and method for testing and repairing the integrated memory |
| 07/08/2003 | US6590815 Semiconductor memory device and method for its test |
| 07/08/2003 | US6590814 Semiconductor memory device and redundancy method thereof |
| 07/08/2003 | US6590811 Higher program VT and faster programming rates based on improved erase methods |
| 07/08/2003 | US6590799 On-chip charge distribution measurement circuit |
| 07/08/2003 | US6590434 Delay time controlling circuit and method for controlling delay time |
| 07/08/2003 | US6590256 EEPROM cell testing circuit |