Patents
Sitemap › G11 - Information storage › G11C - Static stores › G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
12/2003
12/25/2003US20030236648 Memory defect redress analysis treating method, and memory testing apparatus performing the method
12/25/2003US20030235097 Test structure for the measurement of contact to gate distance in non-volatile memory devices and corresponding test method
12/25/2003US20030235094 Semiconductor memory device with built-in self-diagnostic function and semiconductor device having the semiconductor memory device
12/25/2003US20030235092 Self-repair method for nonvolatile memory devices using a supersecure architecture, and nonvolatile memory device
12/25/2003US20030235090 Semiconductor memory device with reduced package test time
12/25/2003US20030235088 Low cost high density rectifier matrix memory
12/24/2003WO2003107355A1 Method and apparatus for soft defect detection in a memory
12/24/2003WO2003107354A1 Ram memory circuit with several banks and an auxiliary device for testing
12/24/2003WO2003071554A3 Non-volatile redundancy adresses memory
12/24/2003CN1132246C Acceleration test method of semiconductor memory
12/24/2003CN1132193C Device for testing multiple memory chips of one crystal plate
12/24/2003CN1132192C Circuit device and method for automatically checking and determining short-circuit of word-line or position-line
12/24/2003CN1132187C Row redundancy block architecture of random memory
12/23/2003US6668348 Memory-mounting integrated circuit and test method thereof
12/23/2003US6668347 Built-in self-testing for embedded memory
12/23/2003US6668345 Synchronous semiconductor allowing replacement with redundant memory cell while maintaining access time
12/23/2003US6668344 Semiconductor integrated circuit with memory redundancy circuit
12/23/2003US6668341 Storage cell with integrated soft error detection and correction
12/23/2003US6668331 Apparatus and method for successively generating an event to establish a total delay time that is greater than can be expressed by specified data bits in an event memory
12/23/2003US6667928 Semiconductor device in which a chip is supplied either a first voltage or a second voltage
12/23/2003US6667925 Semiconductor device having temperature detecting function, testing method, and refresh control method of semiconductor storage device having temperature detecting function
12/23/2003US6667919 Semiconductor memory device and test method thereof using row compression test mode
12/23/2003US6667918 Self-repair of embedded memory arrays
12/23/2003US6667917 System and method for identification of faulty or weak memory cells under simulated extreme operating conditions
12/23/2003US6667916 Mode control circuit for semiconductor device and semiconductor memory device having the mode control circuit
12/23/2003US6667915 Semiconductor memory device having redundancy structure with defect relieving function
12/23/2003US6667913 Semiconductor memory device
12/23/2003US6667905 Semiconductor integrated circuit
12/23/2003US6667898 Method for measuring bias voltage of sense amplifier in memory device
12/18/2003WO2003105157A1 Semiconductor memory device with test mode to monitor internal timing control signals at 1/0
12/18/2003WO2002075926B1 Antifuse reroute of dies
12/18/2003WO2002071407A3 Asynchronous, high-bandwidth memory component using calibrated timing elements
12/18/2003US20030233611 Method of handling unreadable blocks during rebuilding of a RAID device
12/18/2003US20030233604 Memory device test system and method
12/18/2003US20030233208 Test system for circuits
12/18/2003US20030231534 Data latch circuit having anti-fuse elements
12/17/2003EP1158526B1 Nonvolatile semiconductor memory device having electrically and collectively erasable characteristics
12/17/2003EP0768599B1 On-line disk array reconfiguration
12/17/2003CN1462451A Integrated circuit with self-test device for embedded non-volatile memory and related test method
12/17/2003CN1461998A Flash storage device with all-in-one rotation casing
12/16/2003US6665830 System and method for building a checksum
12/16/2003US6665823 Method and apparatus for monitoring component latency drifts
12/16/2003US6665816 Data shift register
12/16/2003US6665226 Semiconductor integrated circuit device and method of manufacturing thereof
12/16/2003US6665221 Multiple bit line column redundancy with primary local and global bit lines and redundant local and global bit lines
12/16/2003US6665220 Column redundancy for content addressable memory
12/16/2003US6665214 On-chip erase pulse counter for efficient erase verify BIST (built-in-self-test) mode
12/11/2003WO2003103049A1 Semiconductor memory element and its lifetime operation starting device
12/11/2003WO2003102964A1 Method for collecting failure information for a memory using embedded test controller
12/11/2003WO2003102963A1 An integrated circuit having a memory device, and a method of testing such an integrated circuit
12/11/2003US20030229832 Method and apparatus for providing a preselected voltage to test or repair a semiconductor device
12/11/2003US20030229831 Pad connection structure of embedded memory devices and related memory testing method
12/11/2003US20030229824 Device for semiconductor memory repair
12/11/2003US20030227806 Semiconductor memory device
12/11/2003US20030227307 Auto-adjustment of self-refresh frequency
12/11/2003DE20315712U1 Storage arrangement for e.g. silicon chip memory cards has data compression-decompression module that is provided between host-controller interface and flash-controller interface and that is connected to microprocessor
12/11/2003DE10226585C1 Random-access memory circuit with in-built testing aid for rapid parallel testing of all memory banks
12/10/2003EP1369878A1 System for testing a group of functionally independent memories and for replacing failing memory words
12/10/2003EP1369700A2 Distributed interface for parallel testing of multiple devices using a single tester channel
12/10/2003EP1368812A2 Circuit and method for test and repair
12/10/2003CN1461011A Internal power supply voltage controller with two standard voltage generation circuit
12/10/2003CN1461010A Semiconductor storage device
12/09/2003US6662325 Apparatus for on-line circuit debug using JTAG and shadow scan in a microprocessor
12/09/2003US6662315 Parallel test in asynchronous memory with single-ended output path
12/09/2003US6662136 Digital temperature sensor (DTS) system to monitor temperature in a memory subsystem
12/09/2003US6661735 Semiconductor memory device
12/09/2003US6661729 Semiconductor device having test mode
12/09/2003US6661719 Wafer level burn-in for memory integrated circuit
12/09/2003US6661718 Testing device for testing a memory
12/09/2003US6661692 Semiconductor integrated circuit
12/09/2003US6661688 Method and article for concentrating fields at sense layers
12/04/2003WO2003100791A1 Increasing the effectiveness of error correction codes and operating multi-level memory systems by using information about the quality of the stored data
12/04/2003US20030226090 System and method for preventing memory access errors
12/04/2003US20030226079 Scan-path flip-flop circuit for integrated circuit memory
12/04/2003US20030226078 Apparatus and method for programmable fuse repair to support dynamic relocate and improved cache testing
12/04/2003US20030226076 PC and ATE integrated chip test equipment
12/04/2003US20030226074 Test device, test system and method for testing a memory circuit
12/04/2003US20030226073 Method for collecting failure information for a memory using an embedded test controller
12/04/2003US20030226064 Semiconductor memory device
12/04/2003US20030223535 Lithography device for semiconductor circuit pattern generator
12/04/2003US20030223297 Semiconductor device and method for testing the same
12/04/2003US20030223294 Integrated circuit reset circuitry
12/04/2003US20030223286 Flash memory apparatus having single body type rotary cover
12/04/2003US20030223282 Redundancy circuit and method for semiconductor memory devices
12/04/2003US20030223276 Semiconductor memory device having the operating voltage of the memory cell controlled
12/04/2003US20030223269 Thin film magnetic memory device having redundant configuration
12/04/2003US20030223260 Semiconductor device removing disconnection defect in fuse element of its program circuit to stably perform coincidence comparison operation
12/04/2003US20030222283 Semiconductor integrated circuit and testing method thereof
12/04/2003US20030221496 Inspection device and inspection method of dielectric film, and method of manufacturing semiconductor device
12/03/2003EP1367599A2 Redundancy circuit and method for semiconductor memory devices
12/03/2003EP1367598A1 Testing method and device for non volatile memories having a LPC (low pin count) communication serial interface
12/03/2003EP1367597A1 Test structure for the measurement of contact to gate distance in non-volatile memory devices and corresponding test method
12/03/2003EP1367497A2 Flash memory apparatus having single body type rotary cover
12/03/2003EP1367404A2 Scan-path flip-flop circuit for integrated circuit memory
12/03/2003EP1366497A2 Higher program vt and faster programming rates based on improved erase methods
12/03/2003EP1226444B1 Multi-stage algorithmic pattern generator for testing ic chips
12/03/2003CN1460269A At-speed built-in self testing of multi-port compact SRAMS
12/03/2003CN1459860A 半导体器件 Semiconductor devices
12/03/2003CN1459801A Method for analyzing poor state
12/03/2003CN1459798A Semiconductor storage needing to renovate work
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