| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 01/29/2004 | US20040017692 Memory circuit with dynamic redundancy |
| 01/29/2004 | US20040017664 Semiconductor memory module |
| 01/29/2004 | US20040017219 System on chip (SOC) and method of testing and/or debugging the system on chip |
| 01/29/2004 | DE10318183A1 Permanente Chip-ID unter Verwendung eines FeRAM Permanent chip ID using a FeRAM |
| 01/29/2004 | DE10313365A1 Genauigkeitsbestimmung bei Bitleitungsspannungmessungen Accuracy in determination Bitleitungsspannungmessungen |
| 01/29/2004 | DE10218787B3 System und Verfahren zum Funktionstest von Halbleiterspeicherchips System and method for function test of semiconductor memory chips |
| 01/29/2004 | DE10121309B4 Testschaltung zum Testen einer zu testenden Schaltung Test circuitry for testing a circuit to be tested |
| 01/28/2004 | EP1385203A2 Nonvolatile solid-state magnetic memory, method for controlling coercive force of nonvolatile solid-state magnetic memory, and method for recording in nonvolatile solid-state magnetic memory |
| 01/28/2004 | CN1471168A Semiconductor storage module |
| 01/28/2004 | CN1471164A 半导体器件 Semiconductor devices |
| 01/28/2004 | CN1136583C Semiconductor memory device |
| 01/28/2004 | CN1136582C Internal-circuit timed external regulation circuit and method therefor |
| 01/28/2004 | CN1136579C Memory circuits and redundancy scheme used therein |
| 01/27/2004 | US6684356 Self-test ram using external synchronous clock |
| 01/27/2004 | US6684355 Memory testing apparatus and method |
| 01/27/2004 | US6684353 Reliability monitor for a memory array |
| 01/27/2004 | US6684352 Read control system and method for testing word oriented SRAM with macros |
| 01/27/2004 | US6684345 Flash EEprom system |
| 01/27/2004 | US6684285 Synchronous integrated circuit device |
| 01/27/2004 | US6684173 System and method of testing non-volatile memory cells |
| 01/27/2004 | US6683767 Semiconductor integrated circuit |
| 01/27/2004 | US6683602 Display control apparatus and electronic appliance |
| 01/27/2004 | US6683470 DC testing apparatus and semiconductor testing apparatus |
| 01/27/2004 | US6682981 Stress controlled dielectric integrated circuit fabrication |
| 01/22/2004 | US20040015807 Semiconductor device and semiconductor integrated circuit |
| 01/22/2004 | US20040015771 Error correction for non-volatile memory |
| 01/22/2004 | US20040015764 Intelligent binning for electrically repairable semiconductor chips |
| 01/22/2004 | US20040015758 Method and device for testing configuration memory cells in programmable logic devices (PLDS) |
| 01/22/2004 | US20040015757 Test circuit and method for testing an integrated memory circuit |
| 01/22/2004 | US20040015756 Diagonal testing method for flash memories |
| 01/22/2004 | US20040015755 Scalable scatter/gather I/O testing tool |
| 01/22/2004 | US20040015754 Apparatus and method for dynamically repairing a semiconductor memory |
| 01/22/2004 | US20040015674 Contiguous block addressing scheme |
| 01/22/2004 | US20040015667 System and method for providing one-time programmable memory with fault tolerance |
| 01/22/2004 | US20040015651 Method and apparatus of local word-line redundancy in CAM |
| 01/22/2004 | US20040015314 System and method for the functional testing of semiconductor memory chips |
| 01/22/2004 | US20040015313 Method for testing a device and a test configuration including a device with a test memory |
| 01/22/2004 | US20040013161 Temperature detecting circuit |
| 01/22/2004 | US20040013028 Repair circuit |
| 01/22/2004 | US20040013016 Semiconductor circuit device capable of accurately testing embedded memory |
| 01/22/2004 | US20040013015 Semiconductor integrated circuit |
| 01/22/2004 | US20040013007 Cluster based redundancy scheme for semiconductor memories |
| 01/22/2004 | US20040013000 Nonvolatile semiconductor memory and method of operating the same |
| 01/22/2004 | US20040012996 Memory system |
| 01/22/2004 | US20040012991 Semiconductor memory module |
| 01/22/2004 | US20040012070 Electrical fuse programming control circuit |
| 01/22/2004 | DE10320625A1 On-Chip-Komprimierung von Ladungsverteilungsdaten On-chip compression of charge distribution data |
| 01/22/2004 | DE10320624A1 Beschleunigte Ermüdungsprüfung Accelerated Fatigue Test |
| 01/22/2004 | DE10230949A1 Integrierter Mikrocontroller-Baustein und Verfahren zur Funktionsüberprüfung eines integrierten Speichers des Mikrocontroller-Bausteins Integrated microcontroller module and method for functional verification of an integrated memory of the microcontroller block |
| 01/22/2004 | DE10229164A1 Speicherbaustein mit einem Datengenerator und einer Testlogik und Verfahren zum Testen von Speicherzellen eines Speicherbausteins Memory device with a data generator and a test logic and method for testing memory cells of a memory block |
| 01/21/2004 | EP1383135A2 System and method for providing one-time programmable memory with fault tolerance |
| 01/21/2004 | EP1383050A1 Method and apparatus for detecting duplicate entries in a look-up table |
| 01/21/2004 | CN1469396A Memory independent on testing group function and system for replacing fault stored word |
| 01/21/2004 | CN1469395A Semiconductor storing device with remedial circuit |
| 01/21/2004 | CN1469394A Diagonal test method of flash memory |
| 01/21/2004 | CN1469387A Magnetic random access storage device |
| 01/21/2004 | CN1469381A Memory element, method of repairing its defect memory unit automatically and method of its access |
| 01/21/2004 | CN1135699C Voltage detection circuit and internal voltage clamp circuit |
| 01/21/2004 | CN1135567C Block selective line selective circuit for semiconductor memory device |
| 01/21/2004 | CN1135561C 半导体存储器 Semiconductor memory |
| 01/21/2004 | CN1135559C Semiconductor memory device |
| 01/21/2004 | CN1135475C Semiconductor memory circuit having shift redundancy circuits |
| 01/21/2004 | CN1135395C IC testing apparatus and malfunction preventing method of IC test apparatus |
| 01/20/2004 | US6681359 Semiconductor memory self-test controllable at board level using standard interface |
| 01/20/2004 | US6681358 Parallel testing of a multiport memory |
| 01/20/2004 | US6681357 MISR simulation tool for memory BIST application |
| 01/20/2004 | US6681350 Method and apparatus for testing memory cells for data retention faults |
| 01/20/2004 | US6681340 Efficient implementation of error correction code scheme |
| 01/20/2004 | US6680873 Semiconductor device having electric fuse element |
| 01/20/2004 | US6680871 Method and apparatus for testing memory embedded in mask-programmable logic device |
| 01/20/2004 | US6680861 Ferroelectric memory and a test method thereof |
| 01/20/2004 | US6680857 Unit-architecture with implemented limited bank-column-select repairability |
| 01/15/2004 | WO2004005949A1 Hierarchical test methodology for multi-core chips |
| 01/15/2004 | WO2004005946A2 Electronic circuit with test unit for testing interconnects |
| 01/15/2004 | WO2003071853A3 Removable memory media with integral indicator light |
| 01/15/2004 | WO2002086719A3 Improved error correction scheme for use in flash memory allowing bit alterability |
| 01/15/2004 | US20040010760 Dimm and method for producing a dimm |
| 01/15/2004 | US20040010738 Range splitting read/write methods for CD-MRW |
| 01/15/2004 | US20040010737 Layout for a semiconductor memory device having redundant elements |
| 01/15/2004 | US20040010659 External storage subsystem |
| 01/15/2004 | US20040010658 External storage subsystem |
| 01/15/2004 | US20040010642 External storage subsystem |
| 01/15/2004 | US20040010641 External storage subsystem |
| 01/15/2004 | US20040010640 External storage subsystem |
| 01/15/2004 | US20040010639 External storage subsystem |
| 01/15/2004 | US20040008562 Semiconductor memory device |
| 01/15/2004 | US20040008560 Synchronous semiconductor memory device having a desired-speed test mode |
| 01/15/2004 | US20040008559 Method for checking the refresh function of an information memory |
| 01/15/2004 | US20040008554 Non-volatile semiconductor memory device |
| 01/15/2004 | US20040008553 Testing memory using a stress signal |
| 01/15/2004 | US20040008550 Circuits and methods for screening for defective memory cells in semiconductor memory devices |
| 01/15/2004 | US20040008549 Self-repair method for nonvolatile memory devices with erasing/programming failure, and relative nonvolatile memory device |
| 01/15/2004 | US20040008546 Circuit and method for tuning a reference bit line loading to a sense amplifier by optionally cutting a capacitive reference bit line |
| 01/15/2004 | US20040008052 Semiconductor testing apparatus and semiconductor testing method |
| 01/15/2004 | US20040007746 Electrically programmable three-dimensional memory-based self-test |
| 01/15/2004 | DE10303654A1 Integrierte Halbleiterschaltung mit eingebauter Selbsttestfunktion und zugehöriges System A semiconductor integrated circuit with built-in self-test function and associated system |
| 01/14/2004 | CN1467808A Semiconductor memory device with reduced package test time |
| 01/14/2004 | CN1467746A Semiconductor memory device with improved saving rate for defective chips |
| 01/14/2004 | CN1467740A Thin film magnetic memory device having redundant configuration |
| 01/14/2004 | CN1467637A Semiconductor integrated circuit with built-in self-test function and system including the same |