| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 02/18/2004 | CN1139251C Detection-digital-signal processor in digital video-disk reproducing device |
| 02/17/2004 | US6694495 Method of analyzing static current test vectors for semiconductor integrated circuits |
| 02/17/2004 | US6694490 DIMM and method for producing a DIMM |
| 02/17/2004 | US6694468 Method and apparatus to test memory |
| 02/17/2004 | US6694461 System and method for testing integrated memories |
| 02/17/2004 | US6694460 Semiconductor memory device having deterioration determining function |
| 02/17/2004 | US6694448 SRAM row redundancy |
| 02/17/2004 | US6693846 Command controller for an integrated circuit memory device and test circuitry thereof |
| 02/17/2004 | US6693845 Semiconductor device having PLL-circuit |
| 02/17/2004 | US6693834 Device and method for detecting alignment of bit lines and bit line contacts in DRAM devices |
| 02/17/2004 | US6693833 Device and method for repairing a semiconductor memory |
| 02/17/2004 | US6693831 Apparatus of repairing memory cell and method therefor |
| 02/17/2004 | US6693829 Testing method for a reading operation in a non volatile memory |
| 02/17/2004 | US6693818 Semiconductor storage apparatus |
| 02/17/2004 | US6693437 Method and apparatus for identifying state-dependent, defect-related leakage currents in memory circuits |
| 02/12/2004 | WO2002075336A9 Test system algorithmic program generators |
| 02/12/2004 | US20040030972 Semiconductor memory device having time reduced in testing of memory cell data reading or writing, or testing of sense amplifier performance |
| 02/12/2004 | US20040030971 Flash memory |
| 02/12/2004 | US20040030970 Test platform device and method for testing embedded memory of system on chip |
| 02/12/2004 | US20040030957 Various methods and apparatuses to track failing memory locations to enable implementations for invalidating repeatedly failing memory locations |
| 02/12/2004 | US20040030955 Diagnostic memory interface test |
| 02/12/2004 | US20040030512 Characterization of self-timed sequential circuits |
| 02/12/2004 | US20040029301 Method and device for detecting whether the alignment of bit line contacts and active areas in DRAM devices is normal |
| 02/12/2004 | US20040027898 Semiconductor memory device and its test method as well as test circuit |
| 02/12/2004 | US20040027895 Semiconductor memory device and method for testing semiconductor memory device |
| 02/12/2004 | US20040027887 Device for margin testing a semiconductor memory by applying a stressing voltage simultaneously to complementary and true digit lines |
| 02/12/2004 | US20040027882 Semiconductor memory device and control method therefor |
| 02/12/2004 | US20040027881 Memory card enabling simplified test process and memory card test method |
| 02/12/2004 | US20040027880 Memory circuit with redundant memory cell array allowing simplified shipment tests and reduced power consumptions |
| 02/12/2004 | US20040027878 Row decoder in flash memory and erase method of flash memory cell using the same |
| 02/12/2004 | US20040027863 Semiconductor memory device with shift redundancy circuits |
| 02/12/2004 | US20040027855 Dynamic sub-array group selection scheme |
| 02/12/2004 | US20040027190 Clamp circuit with fuse options |
| 02/12/2004 | US20040026716 Semiconductor integrated circuit device |
| 02/12/2004 | DE19737838B4 Halbleiterspeichereinrichtung A semiconductor memory device |
| 02/12/2004 | DE10315246A1 Halbleiter-Speichermodul A semiconductor memory module |
| 02/12/2004 | DE10136544B4 Integrierter dynamischer Speicher und Betriebsverfahren Integrated dynamic memory and operating procedures |
| 02/11/2004 | EP1388865A2 Semiconductor memory device and control method therefor |
| 02/11/2004 | EP1388150A1 Integrated circuit with self-test device for an embedded non-volatile memory and related test method |
| 02/11/2004 | CN1475015A Memory module and memory component with built-in self test function |
| 02/11/2004 | CN1474416A Semiconductor storage of shortening detection time |
| 02/10/2004 | US6691289 Semiconductor integrated circuit including circuit for selecting embedded tap cores |
| 02/10/2004 | US6691276 Method for detecting and correcting failures in a memory system |
| 02/10/2004 | US6691272 Testing of high speed DDR interface using single clock edge triggered tester data |
| 02/10/2004 | US6691265 Method for creating defect management information in an recording medium, and apparatus and medium based on said method |
| 02/10/2004 | US6691264 Built-in self-repair wrapper methodology, design flow and design architecture |
| 02/10/2004 | US6691252 Cache test sequence for single-ported row repair CAM |
| 02/10/2004 | US6690611 Cancellation of redundant elements with a cancel bank |
| 02/10/2004 | US6690610 Enhanced fuse configurations for low-voltage flash memories |
| 02/10/2004 | US6690241 Ring oscillator having variable capacitance circuits for frequency adjustment |
| 02/10/2004 | US6690193 One-time end-user-programmable fuse array circuit and method |
| 02/10/2004 | US6688369 Fabric light control window covering |
| 02/05/2004 | WO2004012196A2 Semiconductor memory device and method for initializing the same |
| 02/05/2004 | WO2003092012A3 Flexible redundancy for memories |
| 02/05/2004 | US20040025095 Apparatus and methods for providing enhanced redundancy for an on-die cache |
| 02/05/2004 | US20040025094 Masking error detection/correction latency in multilevel cache transfers |
| 02/05/2004 | US20040024957 Window-based flash memory storage system and management and access methods thereof |
| 02/05/2004 | US20040022249 Semiconductor memory device having faulty cells |
| 02/05/2004 | US20040022115 Semiconductor memory device with improved test mode |
| 02/05/2004 | US20040022110 Semiconductor memory device storing redundant replacement information with small occupation area |
| 02/05/2004 | US20040022101 Method for testing a semiconductor memory having a plurality of memory banks |
| 02/05/2004 | US20040022099 FIFO memory and semiconductor device |
| 02/05/2004 | US20040022098 Semiconductor memory |
| 02/05/2004 | US20040022093 Semiconductor memory device having improved replacement efficiency of defective word lines by redundancy word lines |
| 02/05/2004 | US20040022092 Defects detection |
| 02/05/2004 | US20040022087 Semiconductor memory device |
| 02/05/2004 | US20040022086 Embedded recall apparatus and method in nonvolatile memory |
| 02/05/2004 | DE10231680A1 Integrated memory with registers for storing data patterns for normal and test operation has enhanced registers for internal test pattern data |
| 02/05/2004 | DE10231419A1 Signal calibration device and process to evaluate signals from signal producing circuits and adjust one to give a required comparison |
| 02/05/2004 | DE10122081B4 Verfahren zum Kalibrieren eines Testsystems für eine integrierte Halbleiterschaltung und kalibrierbares Testystem A method for calibrating a test system for a semiconductor integrated circuit and calibratable Testystem |
| 02/04/2004 | EP1387361A2 Semiconductor memory device |
| 02/04/2004 | EP1387284A2 Computer system with nand flash memory for booting and data storage |
| 02/04/2004 | EP1386398A2 Antifuse reroute of dies |
| 02/04/2004 | EP0907128B1 Storage devices, and data processing systems and methods |
| 02/04/2004 | CN1473336A Memory management logic for expanding utilization of read-only memories |
| 02/04/2004 | CN1472810A Semiconductor integrated circuits |
| 02/03/2004 | US6687867 Method for testing a memory array |
| 02/03/2004 | US6687862 Apparatus and method for fast memory fault analysis |
| 02/03/2004 | US6687861 Memory tester with enhanced post decode |
| 02/03/2004 | US6687648 Method of predicting reliabilty of oxide-nitride-oxide based non-volatile memory |
| 02/03/2004 | US6687174 Semiconductor memory device capable of switching output data width |
| 02/03/2004 | US6687173 Circuit for testing ferroelectric capacitor in FRAM |
| 02/03/2004 | US6687171 Flexible redundancy for memories |
| 02/03/2004 | US6687170 System and method for storing parity information in fuses |
| 02/03/2004 | US6687157 Circuits and methods for identifying a defective memory cell via first, second and third wordline voltages |
| 02/03/2004 | US6687150 Reference voltage generation for memory circuits |
| 02/03/2004 | US6686790 Low current redundancy anti-fuse method and apparatus |
| 02/03/2004 | US6686786 Voltage generator stability indicator circuit |
| 02/03/2004 | US6686776 Digital data coincidence determining circuit |
| 01/29/2004 | WO2004010437A1 Built-in-self-test of flash memory cells |
| 01/29/2004 | WO2004010321A2 Processor array |
| 01/29/2004 | WO2003054888A3 Non-volatile memory and method for operating a non-volatile memory |
| 01/29/2004 | US20040019841 Internally generating patterns for testing in an integrated circuit device |
| 01/29/2004 | US20040019838 Method, circuit and system for determining burn-in reliability from wafer level burn-in |
| 01/29/2004 | US20040017716 Dynamic RAM-and semiconductor device |
| 01/29/2004 | US20040017710 Test key for detecting overlap between active area and deep trench capacitor of a DRAM and detection method thereof |
| 01/29/2004 | US20040017709 Active restore weak write test mode |
| 01/29/2004 | US20040017708 Computer system with NAND flash memory for booting and storage |
| 01/29/2004 | US20040017705 A Semiconductor memory device having improved arrangement for replacing failed bit lines |
| 01/29/2004 | US20040017703 Semiconductor memory device |