| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
|---|
| 07/01/2004 | US20040125686 Address counter strobe test mode device |
| 07/01/2004 | US20040125684 Semiconductor memory device and address conversion circuit |
| 07/01/2004 | US20040125676 Semiconductor device |
| 07/01/2004 | US20040125675 Semiconductor device verification system and method |
| 07/01/2004 | US20040125674 Semiconductor integrated circuit device |
| 07/01/2004 | US20040125669 Flash memory device capable of repairing a word line |
| 07/01/2004 | US20040125667 Semiconductor memory device and method for testing the same |
| 07/01/2004 | US20040125666 Method and apparatus for restoring defective memory cells |
| 07/01/2004 | US20040125665 Low latency fifo circuit for mixed clock systems |
| 07/01/2004 | US20040125638 Option fuse circuit using standard cmos manufacturing process |
| 07/01/2004 | US20040125634 256 meg dynamic random access memory |
| 07/01/2004 | US20040124863 Method and probe card configuration for testing a plurality of integrated circuits in parallel |
| 07/01/2004 | US20040124859 Semiconductor device testing apparatus, semiconductor device testing system, and semiconductor device testing method for measuring and trimming the output impedance of driver devices |
| 07/01/2004 | DE10024875B4 Bauteilhaltersystem zur Verwendung mit Testvorrichtungen zum Testen elektronischer Bauteile Component holder system for use with test apparatus for testing electronic components |
| 06/30/2004 | EP1434238A2 Integrated circuit with programmable fuse array |
| 06/30/2004 | EP1434134A2 Self-reparable semiconductor and method thereof |
| 06/30/2004 | EP1433183A1 DATA WRITING APPARATUS, DATA WRITING METHOD, AND PROGRAM |
| 06/30/2004 | CN1509479A Circuit and method for test and repair |
| 06/30/2004 | CN1509478A Test method for testing data memory |
| 06/30/2004 | CN1508807A Semiconductor storage apparatus |
| 06/30/2004 | CN1508693A High-speed programmable non-volatile semiconductor storage device |
| 06/30/2004 | CN1508558A Method and system for feedback circulation detection on non-scanning storage element |
| 06/29/2004 | US6757857 Alternating current built in self test (AC BIST) with variable data receiver voltage reference for performing high-speed AC memory subsystem self-test |
| 06/29/2004 | US6757854 Detecting faults in dual port FIFO memories |
| 06/29/2004 | US6757853 Semiconductor memory, memory device, and memory card |
| 06/29/2004 | US6757852 Self resetting high speed redundancy circuit and method thereof |
| 06/29/2004 | US6757849 System and method for developing customized integration tests and network peripheral device evaluations |
| 06/29/2004 | US6757845 Method and apparatus for testing a storage device |
| 06/29/2004 | US6757842 Flash EEprom system |
| 06/29/2004 | US6757840 Device and method for configuring a cache tag in accordance with burst length |
| 06/29/2004 | US6757800 Increasing the memory performance of flash memory devices by writing sectors simultaneously to multiple flash memory devices |
| 06/29/2004 | US6757209 Memory cell structural test |
| 06/29/2004 | US6757207 Refresh miss detect circuit for self-refreshing DRAM |
| 06/29/2004 | US6757205 Device with integrated SRAM memory and method of testing such a device |
| 06/29/2004 | US6757204 Circuit device having a fuse |
| 06/29/2004 | US6757203 Semiconductor storage device |
| 06/29/2004 | US6757195 Flash memory having enhanced yield and having enhanced reliability in redundant and dummy circuits |
| 06/29/2004 | US6756856 Clock generation circuits and integrated circuit memory devices for controlling a clock period based on temperature and methods for using the same |
| 06/29/2004 | US6756836 256 Meg dynamic random access memory |
| 06/29/2004 | US6756805 System for testing integrated circuit devices |
| 06/29/2004 | US6756804 Semiconductor integrated circuit device |
| 06/29/2004 | US6756259 Gate insulating structure for power devices, and related manufacturing process |
| 06/24/2004 | WO2004053888A2 Zone boundary adjustment for defects in non-volatile memories |
| 06/24/2004 | WO2004025404A3 Method and apparatus for server share migration and server recovery using hierarchical storage management |
| 06/24/2004 | US20040123207 Two dimensional data eye centering for source synchronous data transfers |
| 06/24/2004 | US20040123203 Method and test circuit for testing memory internal write enable |
| 06/24/2004 | US20040123202 Mechanisms for detecting silent errors in streaming media devices |
| 06/24/2004 | US20040123200 Instruction-based built-in self-test (BIST) of external memory |
| 06/24/2004 | US20040123192 Built-in self-test (BIST) of memory interconnect |
| 06/24/2004 | US20040123181 Self-repair of memory arrays using preallocated redundancy (PAR) architecture |
| 06/24/2004 | US20040120212 Data transfer system capable of transferring data at high transfer speed |
| 06/24/2004 | US20040120202 Block redundancy implementation in heirarchical RAM'S |
| 06/24/2004 | US20040120196 Semiconductor integrated circuit device capable of shortening period required for performing data retention test |
| 06/24/2004 | US20040120192 Semiconductor memory device including power generation circuit implementing stable operation |
| 06/24/2004 | US20040120181 Semiconductor device |
| 06/24/2004 | US20040120178 Test mode circuit of semiconductor memory device |
| 06/24/2004 | US20040119523 Repair circuit |
| 06/24/2004 | US20040119494 Programmable power adjust for microelectronic devices |
| 06/24/2004 | US20040119489 Apparatus and method for testing circuit modules |
| 06/24/2004 | US20040119139 Semiconductor device having a redundancy function |
| 06/24/2004 | DE69333373T2 Nichtflüchtiger Halbleiterspeicher mit elektrisch und gemeinsam löschbaren Eigenschaften A non-volatile semiconductor memory having electrically and collectively erasable characteristics |
| 06/24/2004 | DE10256692A1 Testing method for testing connection between semiconductor element and carrier with testing effected immediately after loading semiconductor element on carrier |
| 06/23/2004 | EP1431771A2 Probeless testing of pad buffers on a wafer |
| 06/23/2004 | EP1327249B1 Method to descramble the data mapping in memory circuits |
| 06/23/2004 | EP1036364A4 Alignment of cluster address to block addresses within a semiconductor non-volatile mass storage memory |
| 06/23/2004 | CN1507050A Semiconductor device with unloading circuit for removing defect part |
| 06/23/2004 | CN1507028A Testing apparatus, system and method for testing contact between semiconductor and carrier |
| 06/23/2004 | CN1507026A Method and system for observing all signals inside programmable digital IC chip |
| 06/23/2004 | CN1506975A Memory device having page buffer with double-register |
| 06/23/2004 | CN1506834A Memory controller with interlaced image memory mode |
| 06/23/2004 | CN1506813A Reliably and safelf refreshing and recovering firmware from large scale memory equipment |
| 06/23/2004 | CN1506691A 半导体器件及其测试方法 Semiconductor device and test methods |
| 06/23/2004 | CN1155093C Semiconductor storage device possessing redundancy function |
| 06/23/2004 | CN1154966C TFT/LCD and its active data line repair method |
| 06/22/2004 | US6754869 Method and device for testing set-up time and hold time of signals of a circuit with clocked data transfer |
| 06/22/2004 | US6754866 Testing of integrated circuit devices |
| 06/22/2004 | US6754865 Integrated circuit |
| 06/22/2004 | US6754864 System and method to predetermine a bitmap of a self-tested embedded array |
| 06/22/2004 | US6754860 Method for creating defect management information in an recording medium, and apparatus and medium based on said method |
| 06/22/2004 | US6754857 Method of testing cache memory |
| 06/22/2004 | US6754849 Method of and apparatus for testing CPU built-in RAM mixed LSI |
| 06/22/2004 | US6754797 Address converter apparatus and method to support various kinds of memory chips and application system thereof |
| 06/22/2004 | US6754605 Method and system for automating data storage array components testing with integrated work order dispatching |
| 06/22/2004 | US6754127 Semiconductor integrated circuit device having internal synchronizing circuit responsive to test mode signal |
| 06/22/2004 | US6754126 Semiconductor memory |
| 06/22/2004 | US6754125 Method and device for refreshing reference cells |
| 06/22/2004 | US6754117 System and method for self-testing and repair of memory modules |
| 06/22/2004 | US6754116 Test of a semiconductor memory having a plurality of memory banks |
| 06/22/2004 | US6754115 Nonvolatile semiconductor memory device with backup memory block |
| 06/22/2004 | US6754114 Semiconductor device having redundancy circuit |
| 06/22/2004 | US6754113 Topography correction for testing of redundant array elements |
| 06/22/2004 | US6754103 Method and apparatus for programming and testing a non-volatile memory cell for storing multibit states |
| 06/22/2004 | US6754094 Circuit and method for testing a ferroelectric memory device |
| 06/22/2004 | US6753718 Auto fusing circuit |
| 06/22/2004 | US6753713 System and method for expanding a pulse width |
| 06/18/2004 | CA2414632A1 Method and circuit for collecting memory failure information |
| 06/17/2004 | WO2004051704A2 System and method for expanding a pulse width |
| 06/17/2004 | WO2004051669A2 Method and apparatus for replacing defective rows in a semiconductor memory array |
| 06/17/2004 | WO2004051481A1 Data recovery techniques in storage systems |
| 06/17/2004 | US20040117723 Error correction scheme for memory |