| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 01/28/2014 | US8637366 Nonvolatile memory cell without a dielectric antifuse having high- and low-impedance states |
| 01/23/2014 | WO2014012325A1 Method and device for checking nand flash memory chip |
| 01/23/2014 | US20140026012 Semiconductor memory device and method for operating the same |
| 01/23/2014 | US20140026006 Multi-site testing of computer memory devices and serial io ports |
| 01/23/2014 | US20140026005 Macro and command execution from memory array |
| 01/23/2014 | US20140026004 Systems and Methods for Defect Scanning |
| 01/23/2014 | US20140022836 Semiconductor memory device having resistive memory cells and method of testing the same |
| 01/22/2014 | EP2686850A1 Methods, devices, and systems for data sensing |
| 01/22/2014 | CN103531251A Multi-chip packaging system |
| 01/22/2014 | CN103531250A Circuit for testing pulse parameters of RRAM (resistive random access memory) device |
| 01/22/2014 | CN103531249A Device applied to nonvolatile memory test and method thereof |
| 01/22/2014 | CN103531248A Method for testing RRAM (resistive random access memory) pulse parameters |
| 01/22/2014 | CN103531247A 测试装置 Testing device |
| 01/22/2014 | CN103531246A Quick memory error correction method with reading replacing writing |
| 01/22/2014 | CN103531245A Method for detecting bit line in non-volatile memory device |
| 01/21/2014 | USRE44726 Data inversion register technique for integrated circuit memory testing |
| 01/21/2014 | US8635511 Data processing apparatus, control device and data storage device |
| 01/21/2014 | US8635510 Non-systematic coded error correction |
| 01/21/2014 | US8635509 Method of operating memory controller and memory system including the memory controller |
| 01/21/2014 | US8635397 Data writing method and system |
| 01/21/2014 | US8634264 Apparatuses, integrated circuits, and methods for measuring leakage current |
| 01/21/2014 | US8634263 Integrated circuit having memory repair information storage and method therefor |
| 01/21/2014 | US8634262 Word line driving signal control circuit, semiconductor memory apparatus having the same, and word line driving method |
| 01/21/2014 | US8634261 Semiconductor memory device and method of operating the same |
| 01/21/2014 | US8634170 Semiconductor integrated circuit |
| 01/16/2014 | WO2013141955A3 Wash-off resistant epoxy adhesive composition and pre-gelled adhesive |
| 01/16/2014 | US20140016416 Semiconductor memory device and method of testing the same |
| 01/15/2014 | CN103514963A Memory and method for testing the same |
| 01/15/2014 | CN103514962A Error-tolerant memories |
| 01/15/2014 | CN103514961A Self-repairing memory |
| 01/15/2014 | CN103514960A Memory device |
| 01/15/2014 | CN103514959A Memory architecture and associated serial direct access circuit |
| 01/15/2014 | CN103514958A Method for detecting service life of EMMC (embedded multi-media card) chip |
| 01/15/2014 | CN103514957A SSD testing method and system thereof |
| 01/15/2014 | CN103514956A Semiconductor memory unit and testing method thereof |
| 01/15/2014 | CN102332288B Memory circuit and method for reading data by applying same |
| 01/15/2014 | CN101667457B System and method for burning chips |
| 01/14/2014 | US8631306 Method and memory system using a priori probability information to read stored data |
| 01/14/2014 | US8631303 Distributed storage network for modification of a data object |
| 01/14/2014 | US8631301 Dynamic electronic correction code feedback to extend memory device lifetime |
| 01/14/2014 | US8631288 Methods, devices, and systems for data sensing in a memory system |
| 01/14/2014 | US8630137 Dynamic trim method for non-volatile memory products |
| 01/09/2014 | US20140013170 Scalable prediction failure analysis for memory used in modern computers |
| 01/09/2014 | US20140013169 Generic address scrambler for memory circuit test engine |
| 01/09/2014 | US20140013044 Computer system having function of detecting working state of memory bank |
| 01/09/2014 | US20140010031 Method for estimating channel characteristics of nonvolatile memory device |
| 01/09/2014 | DE102004014454B4 Integrierte Schaltung Integrated circuit |
| 01/08/2014 | EP2681741A1 System and method for bonded configuration pad continuity check |
| 01/08/2014 | CN103502964A Control circuit and method for testing a memory element |
| 01/08/2014 | CN103502826A 输入电路 The input circuit |
| 01/08/2014 | CN103500586A Method and device for detecting capacity of storage device |
| 01/08/2014 | CN102508730B Non-volatile memory module, memory processing system and memory management method thereof |
| 01/08/2014 | CN101615420B Flash memory storing device with data correction function |
| 01/07/2014 | US8627181 Storage apparatus, storage controller, and method for managing locations of error correcting code blocks in array |
| 01/07/2014 | US8627180 Memory controller ECC |
| 01/07/2014 | US8627178 Adjusting data dispersal in a dispersed storage network |
| 01/07/2014 | US8627177 Retrieving data from a dispersed storage network in accordance with a retrieval threshold |
| 01/07/2014 | US8627175 Opportunistic decoding in memory systems |
| 01/07/2014 | US8627174 Memory devices and systems including error-correction coding and methods for error-correction coding |
| 01/07/2014 | US8627158 Flash array built in self test engine with trace array and flash metric reporting |
| 01/07/2014 | US8627157 Storing apparatus |
| 01/07/2014 | US8625371 Memory component with terminated and unterminated signaling inputs |
| 01/07/2014 | US8625363 Semiconductor memory device |
| 01/03/2014 | WO2014003982A1 Bad block management mechanism |
| 01/03/2014 | WO2014003966A1 No-touch stress testing of memory i/o interfaces |
| 01/02/2014 | US20140006902 Semiconductor device including ecc circuit |
| 01/02/2014 | US20140006886 Memory and method for testing the same |
| 01/02/2014 | US20140006885 Memory architecture and associated serial direct access circuit |
| 01/02/2014 | US20140006863 Test circuit of semiconductor memory apparatus and semiconductor memory system including the same |
| 01/02/2014 | US20140003174 Integrated circuit chip and memory device having the same |
| 01/02/2014 | US20140003173 Cell array and memory device including the same |
| 01/02/2014 | US20140003170 Integrated circuit chip and memory device |
| 01/02/2014 | US20140002199 Ring oscillator and semiconductor device |
| 01/02/2014 | DE102004051345B9 Halbleiter-Bauelement, Verfahren zum Ein- und/oder Ausgeben von Testdaten, sowie Speichermodul A semiconductor device, method for mounting and / or outputting of test data, and memory module |
| 01/01/2014 | CN203376979U Side terminal plate of internal memory detector |
| 01/01/2014 | CN103493142A System and method for bonded configuration pad continuity check |
| 01/01/2014 | CN103493139A Methods, devices, and systems for data sensing |
| 01/01/2014 | CN103491367A Testing method and testing device applied to television system |
| 01/01/2014 | CN103489486A Memory device and redundancy method thereof |
| 01/01/2014 | CN103489485A Flash memory quality detection method and device |
| 01/01/2014 | CN102394114B BCH code error correction method capable of adaptive error correction |
| 01/01/2014 | CN102084430B Method and apparatus for repairing high capacity/high bandwidth memory devices |
| 01/01/2014 | CN102027548B Non-volatile multilevel memory with adaptive setting of reference voltage levels for programming, verifying and reading |
| 12/31/2013 | US8621330 High rate locally decodable codes |
| 12/31/2013 | US8621328 Wear-focusing of non-volatile memories for improved endurance |
| 12/31/2013 | US8621326 Error correction circuit and error correction method |
| 12/31/2013 | US8621325 Packet switching system |
| 12/31/2013 | US8621323 Pipelined data relocation and improved chip architectures |
| 12/31/2013 | US8621297 Scan path switches selectively connecting input buffer and test leads |
| 12/31/2013 | US8621294 Apparatus, methods, and system of NAND defect management |
| 12/31/2013 | US8621293 Blind and decision directed multi-level channel estimation |
| 12/31/2013 | US8621292 Device and method for testing semiconductor device |
| 12/31/2013 | US8621291 Semiconductor device and data processing system including the same |
| 12/31/2013 | US8621290 Memory system that supports probalistic component-failure correction with partial-component sparing |
| 12/31/2013 | US8621177 Non-volatile memory and method with phased program failure handling |
| 12/31/2013 | US8619481 Switched interface stacked-die memory architecture |
| 12/31/2013 | US8618541 Semiconductor apparatus |
| 12/26/2013 | US20130346829 Flash memory device and storage control method |
| 12/26/2013 | US20130346813 Memory testing support method and memory testing support apparatus |
| 12/26/2013 | US20130343112 Method for preconditioning thin film storage array for data retention |