| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 06/05/2013 | CN101923902B Method, system and device for error correcting multilevel codes |
| 06/05/2013 | CN101903956B Self-timed error correcting code evaluation system and method |
| 06/05/2013 | CN101861626B Method and device for testing a working memory |
| 06/05/2013 | CN101652753B Pilot placement for non-volatile memory |
| 06/05/2013 | CN101202116B Semiconductor memory device and method for repairing the same |
| 06/04/2013 | US8458568 Systems and methods for memory devices |
| 06/04/2013 | US8458566 Method for performing copy back operations and flash storage device |
| 06/04/2013 | US8458565 Flash-based EEPROM emulation using error correction control |
| 06/04/2013 | US8458564 Programming management data for a memory |
| 06/04/2013 | US8458562 Secondary memory element for non-volatile memory |
| 06/04/2013 | US8458538 Latency detection in a memory built-in self-test by using a ping signal |
| 06/04/2013 | US8458537 Nonvolatile semiconductor memory device |
| 06/04/2013 | US8458536 Data recovery in solid state memory devices |
| 06/04/2013 | US8458287 Erasure coded storage aggregation in data centers |
| 06/04/2013 | US8456934 DRAM device with built-in self-test circuitry |
| 05/30/2013 | US20130139034 Error correction in a storage element array |
| 05/30/2013 | US20130139012 Apparatus, methods, and system of nand defect management |
| 05/30/2013 | US20130139010 Circuit and method for efficient memory repair |
| 05/30/2013 | US20130135953 Semiconductor memory device |
| 05/30/2013 | US20130135952 Semiconductor memory device and method of testing the same |
| 05/30/2013 | US20130135951 Systems and methods for testing and assembling memory modules |
| 05/30/2013 | CA2852883A1 Retention based intrinsic fingerprint identification featuring a fuzzy algorithm and a dynamic key |
| 05/29/2013 | EP2551855A3 Device and method for testing a storage of an electronic device |
| 05/29/2013 | DE102011087133A1 Semiconductor device has comparison logic to which switching signal lines which are associated to global control function on output side of pixel array are connected |
| 05/29/2013 | DE102011087132A1 Semiconductor component for use in light run-time camera, has monitoring decoders attached to address decoders, and comparison logics for connecting address and monitoring decoders, where monitoring decoders comprise test functionality |
| 05/29/2013 | DE102006046359B4 Halbleiterspeicher und Verfahren zum Testen von Halbleiterspeichern A semiconductor memory and method for testing semiconductor memories |
| 05/29/2013 | DE10154649B4 Halbleiterspeicherbauelement mit redundanten Zellen The semiconductor memory device with redundant cells |
| 05/29/2013 | CN202957048U Memory identification code correcting device |
| 05/29/2013 | CN103124182A File download and streaming system |
| 05/29/2013 | CN101930799B Non-volatile memory with error checking/correcting circuit and methods thereof for reading and writing data |
| 05/29/2013 | CN101322317B Apparatus and method for channel interleaving in communications system |
| 05/28/2013 | US8453022 Apparatus and methods for generating row-specific reading thresholds in flash memory |
| 05/23/2013 | WO2013074528A1 Non-volatile storage with broken word line screen and data recovery |
| 05/23/2013 | WO2013074455A1 Storage device firmware and manufacturing software |
| 05/23/2013 | WO2013074420A1 Apparatuses and methods for storing validity masks and operating apparatuses |
| 05/23/2013 | WO2013042972A3 Flash memory storage unit capable of verifying reliability using a bypass path, and a system and method for verifying reliability of the flash memory storage unit using same |
| 05/23/2013 | US20130132785 Double data rate signal testing assistant device |
| 05/23/2013 | US20130128679 Redundancy system for non-volatile memory |
| 05/23/2013 | US20130128665 Non-volatile storage with broken word line screen and data recovery |
| 05/22/2013 | CN103117094A Method for testing flash memory |
| 05/22/2013 | CN103117093A Scrubbing method for resisting soft error accumulative effect of interleaved SRAM |
| 05/22/2013 | CN103117092A Digital delay chain calibration method |
| 05/22/2013 | CN101752012B Error correcting controller, flash memory chip system thereof and error correcting method |
| 05/22/2013 | CN101645309B Non-volatile storage device and control method thereof |
| 05/22/2013 | CN101246738B Memory system with backup circuit and programming method |
| 05/21/2013 | US8448048 Flash memory device and related programming method |
| 05/21/2013 | US8448047 Storage device, storage control device, data transfer intergrated circuit, and storage control method |
| 05/21/2013 | US8448045 Outer code error correction |
| 05/21/2013 | US8448044 Retrieving data from a dispersed storage network in accordance with a retrieval threshold |
| 05/21/2013 | US8448043 Overwritable nonvolatile memory device and related data write method |
| 05/21/2013 | US8448042 Data processing device and a method for error detection and error correction |
| 05/21/2013 | US8446790 Circuit for supplying a reference voltage in a semiconductor memory device for testing an internal voltage generator therein |
| 05/21/2013 | US8446788 Programmable memory repair scheme |
| 05/21/2013 | US8446787 Replacing defective memory blocks in response to external addresses |
| 05/21/2013 | US8446765 Semiconductor memory device having memory block configuration |
| 05/16/2013 | WO2013070915A1 Defective word line detection |
| 05/16/2013 | US20130124932 Solid-State Disk Manufacturing Self Test |
| 05/16/2013 | US20130124931 Transmission error detector for flash memory controller |
| 05/16/2013 | US20130121097 Address output circuit and semiconductor memory device |
| 05/16/2013 | DE10359648B4 Sockel-Einrichtung zur Verwendung beim Test von Halbleiter-Bauelementen, sowie Vorrichtung und Verfahren zum Beladen einer Sockel-Einrichtung mit einem entsprechenden Halbleiter-Bauelement Socket apparatus for use in testing of semiconductor devices, as well as apparatus and method for loading a socket device with a corresponding semiconductor device |
| 05/15/2013 | EP2591473A1 Detection of word-line leakage in memory arrays: current based approach |
| 05/15/2013 | EP2591472A1 Detection of broken word-lines in memory arrays |
| 05/15/2013 | CN103106927A Dead pixel correction method and device |
| 05/14/2013 | USRE44218 Semiconductor memory device for controlling write recovery time |
| 05/14/2013 | US8443264 Disk array apparatus, a disk array apparatus control method and a program for a disk array apparatus |
| 05/14/2013 | US8443262 Adaptive memory scrub rate |
| 05/14/2013 | US8443260 Error correction in copy back memory operations |
| 05/14/2013 | US8443259 Apparatus, system, and method for using multi-level cell solid-state storage as single level cell solid-state storage |
| 05/14/2013 | US8443258 Memory device including memory controller |
| 05/14/2013 | US8443244 Blind and decision directed multi-level channel estimation |
| 05/14/2013 | US8441876 Memory module including parallel test apparatus |
| 05/10/2013 | WO2013066042A1 Asynchronous data shift and backup between asymmetric data sources |
| 05/10/2013 | WO2013063777A1 Triple parity encoding to facilitate data recovery |
| 05/10/2013 | WO2013039319A3 Semiconductor storage device having multiple host interface units for increased bandwidth |
| 05/09/2013 | US20130117636 Semiconductor memory device and system having redundancy cells |
| 05/09/2013 | US20130117617 Semiconductor test device and method of generating address scramble using the same |
| 05/09/2013 | US20130117616 Adaptive Read Comparison Signal Generation for Memory Systems |
| 05/09/2013 | US20130117615 Semiconductor memory device and system having redundancy cells |
| 05/09/2013 | US20130114360 Method for detecting permanent faults of an address decoder of an electronic memory device |
| 05/09/2013 | US20130114359 Input/output circuit and method of semiconductor apparatus and system with the same |
| 05/09/2013 | US20130114351 Semiconductor device, semiconductor system having the same and operating method thereof |
| 05/09/2013 | US20130114347 Semiconductor memory device and semiconductor system |
| 05/08/2013 | CN202930050U General testing device for USB (Universal Serial Bus) flash disks |
| 05/08/2013 | CN202930048U Flash memory and storage device comprising flash memory |
| 05/08/2013 | CN103093834A Method for testing reliability of flash memory |
| 05/08/2013 | CN103093833A Semiconductor device, semiconductor system having the semiconductor device and method operation for the same |
| 05/08/2013 | CN103093832A Failure testing method of embedded flash memory |
| 05/08/2013 | CN103093831A Built-in self trim for non-volatile memory reference current |
| 05/08/2013 | CN103093830A Semiconductor memory device and semiconductor system |
| 05/08/2013 | CN103093829A Memory test system and memory test method |
| 05/08/2013 | CN103093828A Semiconductor memory apparatus and test circuit thereof |
| 05/08/2013 | CN103093827A Starting a field device |
| 05/08/2013 | CN101849263B Reducing the impact of interference during programming |
| 05/08/2013 | CN101510448B Error detecting/correcting scheme for memories |
| 05/07/2013 | US8438457 Nonvolatile memory apparatus, memory controller, and memory system |
| 05/07/2013 | US8438456 Method and apparatus for dispersed storage of streaming data |
| 05/07/2013 | US8438454 Semiconductor memory device and controlling method |
| 05/07/2013 | US8438453 Low latency read operation for managed non-volatile memory |
| 05/07/2013 | US8438433 Registers with full scan capability |
| 05/07/2013 | US8438431 Support element office mode array repair code verification |