Patents
Sitemap › G11 - Information storage › G11C - Static stores › G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
09/2014
09/30/2014US8850291 Data input and output method of NAND flash memory and embedded system using the same
09/30/2014US8850290 Error rate threshold for storage of data
09/30/2014US8850289 Quality based priority data processing with soft guaranteed iteration
09/30/2014US8850288 Throughput-sensitive redundancy encoding schemes for data storage
09/30/2014US8850281 Digital signatures
09/30/2014US8850277 Detecting random telegraph noise induced failures in an electronic memory
09/30/2014US8850276 Systems and methods for efficient data shuffling in a data processing system
09/30/2014US8850275 Encoding apparatus, decoding apparatus, and encoding and decoding system
09/30/2014US8848473 Semiconductor device and test method thereof
09/30/2014US8848472 Fabrication and testing method for nonvolatile memory devices
09/30/2014US8848471 Method for optimizing refresh rate for DRAM
09/30/2014US8848470 Memory operation upon failure of one of two paired memory devices
09/30/2014US8848469 Semiconductor device and testing method thereof
09/30/2014US8848460 Semiconductor device having plural data buses and plural buffer circuits connected to data buses
09/30/2014US8848455 Nonvolatile memory device and method for manufacturing the same
09/30/2014US8848449 Memory device and method for driving memory device
09/30/2014US8848443 Semiconductor memory device and repair method thereof
09/30/2014US8848442 Multi-bit-per-cell flash memory device with non-bijective mapping
09/30/2014US8848428 Memory architectures having dense layouts
09/30/2014US8848422 Variable resistance nonvolatile memory device and driving method thereof
09/30/2014US8848416 Semiconductor storage device with wiring that conserves space
09/30/2014US8847619 Apparatus and methods for through substrate via test
09/30/2014US8847221 Stacked semiconductor device and method of testing the same
09/25/2014WO2014148404A1 Semiconductor memory device
09/25/2014WO2014146574A1 Storage device data access method and storage device
09/25/2014US20140289574 Dram retention test method for dynamic error correction
09/25/2014US20140286114 Semiconductor Device, Method for Inspecting the Same, and Method for Driving the Same
09/25/2014US20140286113 Semiconductor device having roll call circuit
09/25/2014US20140286102 Method of Optimizing Solid State Drive Soft Retry Voltages
09/25/2014DE112011106076T5 Generischer Adressen-Scrambler für Speicherschaltungs-Testengine Generic address scramble for memory circuit testing engine
09/25/2014DE10250875B4 Vorrichtung und Verfahren zum Konfigurieren einer integrierten Schaltung mit eingebettetem Speicher Apparatus and method for configuring an integrated circuit with embedded memory
09/25/2014DE102007063638B4 Elektroniksteuerung Electronic control
09/25/2014DE102004060579B4 Verfahren und Vorrichtung zum Steuern von Auffrischzyklen eines Mehrzyklusauffrischschemas bei einem dynamischen Speicher Method and apparatus for controlling a refresh of a dynamic memory in Mehrzyklusauffrischschemas
09/24/2014EP2780912A1 Non-volatile storage with broken word line screen and data recovery
09/24/2014EP2780812A1 Apparatuses and methods for storing validity masks and operating apparatuses
09/24/2014EP2780798A1 Storage device firmware and manufacturing software
09/23/2014US8844023 Password protected built-in test mode for memories
09/23/2014US8843806 Dynamic graduated memory device protection in redundant array of independent memory (RAIM) systems
09/23/2014US8843805 Memory error protection using addressable dynamic ram data locations
09/23/2014US8843804 Adjusting a dispersal parameter of dispersedly stored data
09/23/2014US8843803 Utilizing local memory and dispersed storage memory to access encoded data slices
09/23/2014US8843794 Method, system and apparatus for evaluation of input/output buffer circuitry
09/23/2014US8843778 Dynamically calibrated DDR memory controller
09/23/2014US8842486 Integrated circuit chip and semiconductor memory device
09/18/2014US20140281811 Object oriented memory in solid state devices
09/18/2014US20140281772 Detecting effect of corrupting event on preloaded data in non-volatile memory
09/18/2014US20140281771 Method and device for optimizing log likelihood ratio (llr) used for nonvolatile memory device and for correcting errors in nonvolatile memory device
09/18/2014US20140281770 Method of reading data from a nonvolatile memory device, nonvolatile memory device, and method of operating a memory system
09/18/2014US20140281769 Memory system and memory controller
09/18/2014US20140281768 Retention logic for non-volatile memory
09/18/2014US20140281767 Recovery strategy that reduces errors misidentified as reliable
09/18/2014US20140281766 Probability-based remedial action for read disturb effects
09/18/2014US20140281765 Memory card
09/18/2014US20140281764 Data path memory test
09/18/2014US20140278160 Estimation method, estimation device, and inspection device for variable resistance element, and nonvolatile memory device
09/18/2014US20140269124 Memory with bit line current injection
09/18/2014US20140269123 Semiconductor memory device and refresh method thereof
09/18/2014US20140269122 System and method for integrated circuit memory repair
09/18/2014US20140269109 Method of operating memory device, memory device using the same, and memory system including the device
09/18/2014US20140269074 Management of non-volatile memory
09/18/2014US20140269072 Storage device
09/18/2014US20140269065 NAND Flash Memory
09/18/2014US20140269059 Shifting cell voltage based on grouping of solid-state, non-volatile memory cells
09/18/2014US20140269025 Memory with redundant sense amplifier
09/18/2014US20140269017 Process corner sensor for bit-cells
09/17/2014EP2779169A1 Apparatus and methods for prolonging service life of sold-state memory device in a digital video recorder
09/17/2014EP2777046A1 Defective word line detection
09/16/2014US8839161 Semiconductor device
09/16/2014US8839076 Encoding a data word for writing the encoded data word in a multi-level solid state memory
09/16/2014US8839075 Interference-aware assignment of programming levels in analog memory cells
09/16/2014US8839074 On chip data recovery for non-volatile storage
09/16/2014US8839073 Zero-one balance management in a solid-state disk controller
09/16/2014US8839072 Access control apparatus, storage apparatus, and method
09/16/2014US8839071 Semiconductor memory devices that are configured to analyze read failures and related methods of operating such devices
09/16/2014US8839058 Multi-site testing of computer memory devices and serial IO ports
09/16/2014US8839057 Integrated circuit and method for testing memory on the integrated circuit
09/16/2014US8839054 Read only memory (ROM) with redundancy
09/16/2014US8839053 Error correcting pointers for non-volatile storage
09/16/2014US8838925 Method for securely storing data in a memory of a portable data carrier
09/16/2014US8837243 Deeply pipelined integrated memory built-in self-test (BIST) system and method
09/16/2014US8837241 Semiconductor memory device
09/16/2014US8837240 Semiconductor memory device and defective cell relieving method
09/16/2014US8837215 Operating method and data read method in nonvolatile memory device
09/12/2014WO2014137629A1 Magnetic automatic test equipment (ate) memory tester employing temperature control and test method
09/11/2014US20140258797 Built-in-self-test (bist) test time reduction
09/11/2014US20140254297 Method and apparatus for memory repair
09/11/2014US20140254296 Bit Based Fuse Repair
09/11/2014US20140254272 Simultaneous sensing of multiple wordlines and detection of nand failures
09/11/2014US20140254251 Magnetic automatic test equipment (ate) memory tester device and method employing temperature control
09/09/2014US8832638 Package test devices having a printed circuit board
09/09/2014US8832531 Adaptive over-provisioning in memory systems
09/09/2014US8832530 Techniques associated with a read and write window budget for a two level memory system
09/09/2014US8832529 Device and method for testing a memory of an electric tool
09/09/2014US8832528 Apparatus, system, and method to increase data integrity in a redundant storage system
09/09/2014US8832527 Method of storing system data, and memory controller and memory storage apparatus using the same
09/09/2014US8832526 Data reading method, memory controller, and memory storage device
09/09/2014US8832522 Memory system and method using partial ECC to achieve low power refresh and fast access to data
09/09/2014US8832521 Apparatus and method for processing optical information using low density parity check code
09/09/2014US8832509 Semiconductor system and data training method thereof
09/09/2014US8832508 Apparatus and methods for testing writability and readability of memory cell arrays
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