Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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08/28/2013 | EP2631911A1 Offset compensation for sense amplifiers |
08/28/2013 | CN203165474U Mass production tester of USB (universal serial bus) slave device |
08/28/2013 | CN101785066B Programmable diagnostic memory module |
08/27/2013 | US8522115 Flash memory device and memory system comprising same |
08/27/2013 | US8522114 Memory controller and memory system |
08/27/2013 | US8522090 Automated scan testing of a system-on-chip (SoC) |
08/27/2013 | US8522089 Method of testing asynchronous modules in semiconductor device |
08/22/2013 | WO2013123437A1 Memory bit repair scheme |
08/22/2013 | US20130219247 Method for Accessing Flash Memory and Associated Flash Memory Controller |
08/22/2013 | US20130219235 Memory system and test method thereof |
08/22/2013 | US20130215696 Anti-fuse circuit of semiconductor device and methods of testing internal circuit block thereof |
08/22/2013 | US20130215695 Self-repairing memory |
08/22/2013 | US20130215671 Memory bit repair scheme |
08/22/2013 | DE102004051345B4 Halbleiter-Bauelement, Verfahren zum Ein- und/oder Ausgeben von Testdaten, sowie Speichermodul A semiconductor device, method for mounting and / or outputting of test data, and memory module |
08/21/2013 | CN103258574A Architecture and method for remote memory system diagnostic and optimization |
08/21/2013 | CN103258573A Aging plate |
08/21/2013 | CN101842850B Systematic error correction for multi-level flash memory |
08/20/2013 | US8516343 Apparatus, system, and method for retiring storage regions |
08/20/2013 | US8516342 Triple parity technique for enabling efficient recovery from triple failures in a storage array |
08/20/2013 | US8516340 Data system for interfacing with a remote data storage facility using compressive sensing and associated methods |
08/20/2013 | US8516339 Method of and circuit for correcting adjacent bit errors in a memory |
08/20/2013 | US8516315 Testing of non stuck-at faults in memory |
08/20/2013 | US8514643 Test mode initialization device and method |
08/15/2013 | WO2013077929A3 Retention based intrinsic fingerprint identification featuring a fuzzy algorithm and a dynamic key |
08/15/2013 | US20130212444 Methodology for correlated memory fail estimations |
08/15/2013 | US20130208548 Method and Apparatus for Copying Data With A Memory Array Having Redundant Memory |
08/14/2013 | CN203134385U Memory limit test device |
08/14/2013 | CN203134384U Universal serial bus (USB) disk black colloid testing tool |
08/14/2013 | CN103247347A Method and system for providing smart memory architecture |
08/14/2013 | CN103247346A Measure initialization path for delay line structure and method for performing measure initialization |
08/14/2013 | CN103247345A Quick-flash memory and detection method for failure memory cell of quick-flash memory |
08/14/2013 | CN101529526B Method for estimating and reporting the life expectancy of flash-disk memory |
08/14/2013 | CN101529524B Limited use data storing device |
08/14/2013 | CN101286358B System and device with error detection/correction process and method outputting data |
08/13/2013 | US8510637 Data reading method, memory storage apparatus and memory controller thereof |
08/13/2013 | US8510636 Dynamic read channel calibration for non-volatile memory devices |
08/13/2013 | US8510635 Method for evaluating failure rate |
08/13/2013 | US8510634 Methods of data handling |
08/13/2013 | US8510633 Semiconductor storage device and method of operating the same |
08/13/2013 | US8510632 Control method for a semiconductor memory device |
08/13/2013 | US8510630 Nibble encoding for improved reliability of non-volatile memory |
08/13/2013 | US8510629 Memory module on which regular chips and error correction chips are mounted |
08/13/2013 | US8510628 Method and apparatuses for customizable error correction of memory |
08/13/2013 | US8510615 Virtual repair of digital media |
08/13/2013 | US8510614 Bad block identification methods |
08/13/2013 | US8510613 Control method of non-volatile semiconductor device |
08/13/2013 | US8510612 Disabling outbound drivers for a last memory buffer on a memory channel |
08/13/2013 | US8510611 Computer apparatus |
08/13/2013 | US8510609 Apparatus and method for rate dematching in a communication system |
08/13/2013 | US8509016 Methods and memory devices for repairing memory cells |
08/08/2013 | WO2013116776A1 Method of embedding configuration data in a non-configuration document |
08/08/2013 | WO2013115783A1 Memory module buffer data storage |
08/08/2013 | WO2013114230A1 Erasure correcting codes for storage arrays |
08/08/2013 | WO2013113426A1 Device and method to perform a parallel memory test |
08/08/2013 | US20130205179 Integrated circuit with memory built-in self test (mbist) circuitry having enhanced features and methods |
08/08/2013 | US20130205178 System and method for auditing memory cards |
08/08/2013 | US20130205177 Memory card cleaner and method of utilization |
08/08/2013 | US20130201776 Built-in test circuit and method |
08/08/2013 | DE102004034184B4 Dynamischer Direktzugriffsspeicher Dynamic random access memory |
08/08/2013 | CA2861410A1 Erasure correcting codes for storage arrays |
08/07/2013 | CN1877743B Demonstration system for phase-change memory cell array and visual demonstration method therefor |
08/07/2013 | CN103237252A Method and device for burning set-top box storage chips |
08/07/2013 | CN103236271A Memory for reinforcing single event upset based on triple modular redundancy, and reinforcing method |
08/07/2013 | CN102013274B Self-test circuit and method for storage |
08/07/2013 | CN101908383B Test apparatus and test method |
08/07/2013 | CN101553879B Method and device for testing memory |
08/06/2013 | US8504899 Data transfer method and information processing apparatus |
08/06/2013 | US8504898 Storage apparatus, controller and data accessing method thereof |
08/06/2013 | US8504897 Memory controller |
08/06/2013 | US8504896 Method of operating nonvolatile memory device and nonvolatile memory device for implementing the same |
08/06/2013 | US8504895 Using damping factors to overcome LDPC trapping sets |
08/06/2013 | US8504884 Threshold voltage techniques for detecting an imminent read failure in a memory array |
08/06/2013 | US8504883 System and method for testing integrated circuits |
08/06/2013 | US8503260 Semiconductor memory device, method of testing the same and system of testing the same |
08/06/2013 | US8503259 Memory test method and memory test device |
08/06/2013 | US8503237 System and method for data recovery in a solid state storage device |
08/06/2013 | US8503235 Nonvolatile memory with faulty cell registration |
08/01/2013 | WO2013112336A2 Programming and erasure schemes for analog memory cells |
08/01/2013 | US20130194884 Synchronous Global Controller For Enhanced Pipelining |
08/01/2013 | US20130194883 Operating method and data read method in nonvolatile memory device |
08/01/2013 | US20130194876 Built-in self-test circuit applied to high speed i/o port |
07/31/2013 | EP2620946A2 Adaptive programming and erasure methods for analog memory cells |
07/31/2013 | EP2619765A1 Registers with full scan capability |
07/31/2013 | CN103229299A Nonvolatile memory element, production method therefor, nonvolatile memory unit, and design assistance method for nonvolatile memory element |
07/31/2013 | CN103226982A Semiconductor device including semiconductor memory circuit |
07/31/2013 | CN101593562B Method and circuit for testing a multi-chip package |
07/31/2013 | CN101512666B Non-volatile memory and method for linear estimation of initial programming voltage |
07/31/2013 | CN101211668B Static state random memorizer capable of getting reading current structure and method for measuring static state random memorizer |
07/30/2013 | US8499285 Method of logging stack trace information |
07/30/2013 | US8499229 Method and apparatus for reading data from flash memory |
07/30/2013 | US8499221 Accessing coded data stored in a non-volatile memory |
07/30/2013 | US8499220 Systems and methods for re-designating memory regions as error code corrected memory regions |
07/30/2013 | US8499217 Memory device and error control codes decoding method |
07/30/2013 | US8499215 Multi-level cell memory devices and methods of storing data in and reading data from the memory devices |
07/30/2013 | US8499207 Memory devices and method for error test, recordation and repair |
07/30/2013 | US8498169 Code-based differential charging of bit lines of a sense amplifier |
07/25/2013 | WO2013110016A1 Method and apparatus for testing one time programmable (otp) arrays |
07/25/2013 | WO2013109003A1 Method and apparatus for estimating yield of static ram |
07/25/2013 | US20130188410 Method and apparatus for testing one time programmable (otp) arrays |
07/24/2013 | CN103219048A Memory module testing device |