Patents
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
08/2013
08/28/2013EP2631911A1 Offset compensation for sense amplifiers
08/28/2013CN203165474U Mass production tester of USB (universal serial bus) slave device
08/28/2013CN101785066B Programmable diagnostic memory module
08/27/2013US8522115 Flash memory device and memory system comprising same
08/27/2013US8522114 Memory controller and memory system
08/27/2013US8522090 Automated scan testing of a system-on-chip (SoC)
08/27/2013US8522089 Method of testing asynchronous modules in semiconductor device
08/22/2013WO2013123437A1 Memory bit repair scheme
08/22/2013US20130219247 Method for Accessing Flash Memory and Associated Flash Memory Controller
08/22/2013US20130219235 Memory system and test method thereof
08/22/2013US20130215696 Anti-fuse circuit of semiconductor device and methods of testing internal circuit block thereof
08/22/2013US20130215695 Self-repairing memory
08/22/2013US20130215671 Memory bit repair scheme
08/22/2013DE102004051345B4 Halbleiter-Bauelement, Verfahren zum Ein- und/oder Ausgeben von Testdaten, sowie Speichermodul A semiconductor device, method for mounting and / or outputting of test data, and memory module
08/21/2013CN103258574A Architecture and method for remote memory system diagnostic and optimization
08/21/2013CN103258573A Aging plate
08/21/2013CN101842850B Systematic error correction for multi-level flash memory
08/20/2013US8516343 Apparatus, system, and method for retiring storage regions
08/20/2013US8516342 Triple parity technique for enabling efficient recovery from triple failures in a storage array
08/20/2013US8516340 Data system for interfacing with a remote data storage facility using compressive sensing and associated methods
08/20/2013US8516339 Method of and circuit for correcting adjacent bit errors in a memory
08/20/2013US8516315 Testing of non stuck-at faults in memory
08/20/2013US8514643 Test mode initialization device and method
08/15/2013WO2013077929A3 Retention based intrinsic fingerprint identification featuring a fuzzy algorithm and a dynamic key
08/15/2013US20130212444 Methodology for correlated memory fail estimations
08/15/2013US20130208548 Method and Apparatus for Copying Data With A Memory Array Having Redundant Memory
08/14/2013CN203134385U Memory limit test device
08/14/2013CN203134384U Universal serial bus (USB) disk black colloid testing tool
08/14/2013CN103247347A Method and system for providing smart memory architecture
08/14/2013CN103247346A Measure initialization path for delay line structure and method for performing measure initialization
08/14/2013CN103247345A Quick-flash memory and detection method for failure memory cell of quick-flash memory
08/14/2013CN101529526B Method for estimating and reporting the life expectancy of flash-disk memory
08/14/2013CN101529524B Limited use data storing device
08/14/2013CN101286358B System and device with error detection/correction process and method outputting data
08/13/2013US8510637 Data reading method, memory storage apparatus and memory controller thereof
08/13/2013US8510636 Dynamic read channel calibration for non-volatile memory devices
08/13/2013US8510635 Method for evaluating failure rate
08/13/2013US8510634 Methods of data handling
08/13/2013US8510633 Semiconductor storage device and method of operating the same
08/13/2013US8510632 Control method for a semiconductor memory device
08/13/2013US8510630 Nibble encoding for improved reliability of non-volatile memory
08/13/2013US8510629 Memory module on which regular chips and error correction chips are mounted
08/13/2013US8510628 Method and apparatuses for customizable error correction of memory
08/13/2013US8510615 Virtual repair of digital media
08/13/2013US8510614 Bad block identification methods
08/13/2013US8510613 Control method of non-volatile semiconductor device
08/13/2013US8510612 Disabling outbound drivers for a last memory buffer on a memory channel
08/13/2013US8510611 Computer apparatus
08/13/2013US8510609 Apparatus and method for rate dematching in a communication system
08/13/2013US8509016 Methods and memory devices for repairing memory cells
08/08/2013WO2013116776A1 Method of embedding configuration data in a non-configuration document
08/08/2013WO2013115783A1 Memory module buffer data storage
08/08/2013WO2013114230A1 Erasure correcting codes for storage arrays
08/08/2013WO2013113426A1 Device and method to perform a parallel memory test
08/08/2013US20130205179 Integrated circuit with memory built-in self test (mbist) circuitry having enhanced features and methods
08/08/2013US20130205178 System and method for auditing memory cards
08/08/2013US20130205177 Memory card cleaner and method of utilization
08/08/2013US20130201776 Built-in test circuit and method
08/08/2013DE102004034184B4 Dynamischer Direktzugriffsspeicher Dynamic random access memory
08/08/2013CA2861410A1 Erasure correcting codes for storage arrays
08/07/2013CN1877743B Demonstration system for phase-change memory cell array and visual demonstration method therefor
08/07/2013CN103237252A Method and device for burning set-top box storage chips
08/07/2013CN103236271A Memory for reinforcing single event upset based on triple modular redundancy, and reinforcing method
08/07/2013CN102013274B Self-test circuit and method for storage
08/07/2013CN101908383B Test apparatus and test method
08/07/2013CN101553879B Method and device for testing memory
08/06/2013US8504899 Data transfer method and information processing apparatus
08/06/2013US8504898 Storage apparatus, controller and data accessing method thereof
08/06/2013US8504897 Memory controller
08/06/2013US8504896 Method of operating nonvolatile memory device and nonvolatile memory device for implementing the same
08/06/2013US8504895 Using damping factors to overcome LDPC trapping sets
08/06/2013US8504884 Threshold voltage techniques for detecting an imminent read failure in a memory array
08/06/2013US8504883 System and method for testing integrated circuits
08/06/2013US8503260 Semiconductor memory device, method of testing the same and system of testing the same
08/06/2013US8503259 Memory test method and memory test device
08/06/2013US8503237 System and method for data recovery in a solid state storage device
08/06/2013US8503235 Nonvolatile memory with faulty cell registration
08/01/2013WO2013112336A2 Programming and erasure schemes for analog memory cells
08/01/2013US20130194884 Synchronous Global Controller For Enhanced Pipelining
08/01/2013US20130194883 Operating method and data read method in nonvolatile memory device
08/01/2013US20130194876 Built-in self-test circuit applied to high speed i/o port
07/2013
07/31/2013EP2620946A2 Adaptive programming and erasure methods for analog memory cells
07/31/2013EP2619765A1 Registers with full scan capability
07/31/2013CN103229299A Nonvolatile memory element, production method therefor, nonvolatile memory unit, and design assistance method for nonvolatile memory element
07/31/2013CN103226982A Semiconductor device including semiconductor memory circuit
07/31/2013CN101593562B Method and circuit for testing a multi-chip package
07/31/2013CN101512666B Non-volatile memory and method for linear estimation of initial programming voltage
07/31/2013CN101211668B Static state random memorizer capable of getting reading current structure and method for measuring static state random memorizer
07/30/2013US8499285 Method of logging stack trace information
07/30/2013US8499229 Method and apparatus for reading data from flash memory
07/30/2013US8499221 Accessing coded data stored in a non-volatile memory
07/30/2013US8499220 Systems and methods for re-designating memory regions as error code corrected memory regions
07/30/2013US8499217 Memory device and error control codes decoding method
07/30/2013US8499215 Multi-level cell memory devices and methods of storing data in and reading data from the memory devices
07/30/2013US8499207 Memory devices and method for error test, recordation and repair
07/30/2013US8498169 Code-based differential charging of bit lines of a sense amplifier
07/25/2013WO2013110016A1 Method and apparatus for testing one time programmable (otp) arrays
07/25/2013WO2013109003A1 Method and apparatus for estimating yield of static ram
07/25/2013US20130188410 Method and apparatus for testing one time programmable (otp) arrays
07/24/2013CN103219048A Memory module testing device
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