| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 05/07/2014 | CN103782345A 在可编程元件不被信任的情况下的存储器管芯的自禁用 In the case of programmable elements of the memory is not to be trusted since the disabled die |
| 05/07/2014 | CN103779332A 具有内置自维护块的集成电路芯片的堆叠芯片模块 With built-in self-maintenance blocks stacked integrated circuit chip chip module |
| 05/07/2014 | CN103778970A 闪存存储器工作性能仿真方法和装置 Flash memory performance simulation method and apparatus |
| 05/07/2014 | CN103778969A 存储器负载能力测试装置 Memory load capacity testing device |
| 05/07/2014 | CN103778968A 结合多张快闪记忆卡的固态硬盘的检测装置及其方法 SSDs combine multiple detection apparatus and method for flash memory cards of |
| 05/07/2014 | CN103778967A 边界扫描测试接口电路 Boundary scan test interface circuit |
| 05/07/2014 | CN103778966A 堆叠芯片模块及其制造和维修方法 Stacked chip module and its manufacturing and repair methods |
| 05/07/2014 | CN103778965A 非挥发性存储装置中的毁损位线地址的取得方法 The method of obtaining the non-volatile memory device damage bit line address |
| 05/07/2014 | CN103778946A 具有软错误翻转抗扰性的易失性存储器元件 Volatile memory element having a soft error immunity of flip |
| 05/07/2014 | CN102522123B 利用数据产生器模块来提高存储设备读写测试效率的方法 Methods The data generator module to improve the efficiency of the storage device reading and writing tests |
| 05/07/2014 | CN102347084B 参考单元阈值电压的调整方法、装置和测试系统 Method of adjusting the threshold voltage of the reference cell, the apparatus and the test system |
| 05/07/2014 | CN102290106B 一种相变存储单元阵列的测试装置 A phase change memory cell array, the test device |
| 05/07/2014 | CN101916591B 半导体集成电路器件 The semiconductor integrated circuit device |
| 05/07/2014 | CN101882467B Ecc参数可配置的存储器控制装置 Ecc parameters configurable memory controller |
| 05/07/2014 | CN101794625B 存储器系统、存储器测试系统及其测试方法 Memory system memory test system and test method |
| 05/07/2014 | CN101369464B 非易失性存储器件、系统及其操作方法 A nonvolatile memory device, system and method of operation |
| 05/06/2014 | US8719680 Method and apparatus for reading data from non-volatile memory |
| 05/06/2014 | US8719670 Coding architecture for multi-level NAND flash memory with stuck cells |
| 05/06/2014 | US8719669 Error correction decoder and error correction method thereof |
| 05/06/2014 | US8719668 Non-volatile storage system compensating prior probability for low-density parity check codes |
| 05/06/2014 | US8719667 Method for adding redundancy data to a distributed data storage system and corresponding device |
| 05/06/2014 | US8719666 Key extraction in an integrated circuit |
| 05/06/2014 | US8719665 Programming error correction code into a solid state memory device with varying bits per cell |
| 05/06/2014 | US8719664 Memory protection cache |
| 05/06/2014 | US8719663 Cross-decoding for non-volatile storage |
| 05/06/2014 | US8719662 Memory device with error detection |
| 05/06/2014 | US8719661 Transparent and lightweight recovery from hardware memory errors |
| 05/06/2014 | US8719660 Apparatus and methods for indicating the health of removable storage devices |
| 05/06/2014 | US8719659 Storage apparatus and fault diagnosis method |
| 05/06/2014 | US8719658 Accessing memory during parallel turbo decoding |
| 05/06/2014 | US8719648 Interleaving of memory repair data compression and fuse programming operations in single fusebay architecture |
| 05/06/2014 | US8719647 Read bias management to reduce read errors for phase change memory |
| 05/06/2014 | US8719646 Non-volatile memory (NVM) reset sequence with built-in read check |
| 05/06/2014 | US8718967 Flexible storage interface tester with variable parallelism and firmware upgradeability |
| 05/06/2014 | US8717839 Semiconductor device having plural penetration electrodes penetrating through semiconductor substrate and testing method thereof |
| 05/06/2014 | US8717837 Memory module |
| 05/06/2014 | US8717815 Compensation of back pattern effect in a memory device |
| 05/01/2014 | WO2014066462A2 Apparatus and method for reforming resistive memory cells |
| 05/01/2014 | WO2014065967A1 Adaptive error correction codes for data storage systems |
| 05/01/2014 | US20140122948 Memory test system and memory test method |
| 05/01/2014 | US20140119144 Technique to Operate Memory in Functional Mode Under LBIST Test |
| 05/01/2014 | US20140119143 Semiconductor device, control method thereof and data processing system |
| 05/01/2014 | US20140119131 Memory device redundancy management system |
| 05/01/2014 | US20140119108 Memory system including nonvolatile memory and method of operating nonvolatile memory |
| 04/30/2014 | DE102008056215B4 Reset-Generator, Schutzeinrichtung umfassend einen Rest-Generator, Verfahren zum Schutz vertraulicher Daten und Verfahren zum Prüfen eines Registers Reset generator protection device comprising a radical generator, procedures to protect sensitive data and method for testing a register |
| 04/30/2014 | CN103765522A Rank-specific cyclic redundancy check |
| 04/30/2014 | CN103765521A System and method for testing fuse blow reliability for integrated circuits |
| 04/30/2014 | CN103761988A SSD (solid state disk) and data movement method |
| 04/30/2014 | CN101931415B Encoding device and method, decoding device and method as well as error correction system |
| 04/30/2014 | CN101751981B Method for protecting the safety of storing data in flash memory storing device |
| 04/30/2014 | CN101540204B Method for scanning flash memory medium |
| 04/30/2014 | CN101310343B Memory diagnosis device |
| 04/29/2014 | US8713410 Data storage apparatus, memory control apparatus and method for controlling flash memories |
| 04/29/2014 | US8713409 Bit error mitigation |
| 04/29/2014 | US8713408 Methods of operating non-volatile memory devices during write operation interruption, non-volatile memory devices, memories and electronic systems operating the same |
| 04/29/2014 | US8713406 Erasing a non-volatile memory (NVM) system having error correction code (ECC) |
| 04/29/2014 | US8713405 Method and apparatus for allocating erasure coded data to disk storage |
| 04/29/2014 | US8713404 Controller interface providing improved data reliability |
| 04/29/2014 | US8713387 Channel marking for chip mark overflow and calibration errors |
| 04/29/2014 | US8713386 Device for increasing chip testing efficiency and method thereof |
| 04/29/2014 | US8713385 Error scanning in flash memory |
| 04/29/2014 | US8713384 Semiconductor apparatus |
| 04/29/2014 | US8713382 Control apparatus and control method |
| 04/29/2014 | US8713381 Systems and methods of using dynamic data for wear leveling in solid-state devices |
| 04/29/2014 | US8713374 Memory device and method for repairing a semiconductor memory |
| 04/29/2014 | US8711646 Architecture, system and method for testing resistive type memory |
| 04/29/2014 | US8711645 Victim port-based design for test area overhead reduction in multiport latch-based memories |
| 04/29/2014 | US8711638 Using storage cells to perform computation |
| 04/29/2014 | US8711604 Non-volatile semiconductor memory and data processing method in non-volatile semiconductor memory |
| 04/24/2014 | WO2014062554A1 Apparatus and method for repairing resistive memories and increasing overall read sensitivity of sense amplifiers |
| 04/24/2014 | WO2014060884A1 Global data establishment for storage arrays controlled by plurality of nodes |
| 04/24/2014 | WO2014060096A1 Method for managing a flash memory |
| 04/24/2014 | US20140115411 Apparatus, methods, and system of nand defect management |
| 04/24/2014 | US20140112085 Switched interface stacked-die memory architecture |
| 04/24/2014 | US20140110660 Nonvolatile memory cell without a dielectric antifuse having high- and low-impedance states |
| 04/24/2014 | DE102007046954B4 Steuerung der Spannungsversorgung einer Speicherzelle aufgrund von Fehlerermittlung Controlling the voltage supply of a memory cell due to error detection |
| 04/23/2014 | CN103745755A Space memory error detection method with high efficiency and high availability |
| 04/23/2014 | CN103745754A Fault detection method of nonvolatile memory of microprocessor in motor control system |
| 04/23/2014 | CN103745753A Error correction method and system based on flash memory |
| 04/23/2014 | CN103745752A Memory built-in self-testing method as well as memory error inspection method |
| 04/23/2014 | CN103745751A Failure alarming method and device |
| 04/23/2014 | CN102201266B 半导体存储器装置 The semiconductor memory device |
| 04/23/2014 | CN101807428B Memory circuit |
| 04/23/2014 | CN101636794B Sharing routing of a test signal with an alternative power supply to combinatorial logic for low power design |
| 04/23/2014 | CN101615428B Non-volatile memory and method for controlling a plurality of detection circuits in the non-volatile memory |
| 04/22/2014 | US8707134 Data storage apparatus and apparatus and method for controlling nonvolatile memories |
| 04/22/2014 | US8707133 Method and apparatus to reduce a quantity of error detection/correction bits in memory coupled to a data-protected processor port |
| 04/22/2014 | US8707132 Information processing apparatus, information processing method, and storage medium |
| 04/22/2014 | US8707130 Multilevel semiconductor memory, write/read method thereto/therefrom and storage medium storing write/read program |
| 04/22/2014 | US8707123 Variable barrel shifter |
| 04/22/2014 | US8707112 Refresh of non-volatile memory cells based on fatigue conditions |
| 04/22/2014 | US8705300 Memory array circuitry with stability enhancement features |
| 04/22/2014 | US8705298 Method and apparatus for memory fault tolerance |
| 04/22/2014 | US8705268 Quantifying the read and write margins of memory bit cells |
| 04/17/2014 | US20140108886 Pipelined Data Relocation and Improved Chip Architectures |
| 04/17/2014 | US20140104936 Latch-based memory array |
| 04/17/2014 | US20140104929 Method and apparatus managing worn cells in resistive memories |
| 04/16/2014 | CN103733263A Bit scan circuit and method in non-volatile memory |
| 04/16/2014 | CN103733260A Non-volatile memory saving cell information in a non-volatile memory array |
| 04/16/2014 | CN103730169A Systems and methods for storing information |