| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 07/17/2014 | DE112012004439T5 Speichergestützte intrinsische Fingerabdruck-Identifikation mit einem Fuzzy-Algorithmus und einem dynamischen Schlüssel Memory-based intrinsic fingerprint identification with a fuzzy algorithm and a dynamic key |
| 07/16/2014 | CN203721203U 能够测试闪存键合效果的测试装置 To test the effect of the flash memory testing apparatus bond |
| 07/16/2014 | CN203721202U 多单元封装存储器的测试装置 Multi-unit package test device memory |
| 07/16/2014 | CN103928057A 一种测量阻变存储器激活能的方法 A measure of the activation energy of the resistive memory |
| 07/16/2014 | CN103928052A 存储系统及其操作方法 Storage system and method of operation |
| 07/16/2014 | CN102354531B 识别具有较差的亚阈斜率或较弱的跨导的非易失存储器元件的方法 The method of identification has poor subthreshold slope or weak transconductance of the non-volatile memory element of |
| 07/16/2014 | CN102007546B 三端可多次编程存储器位单元及阵列架构 Three-terminal programmable memory bit cell and multiple array architecture |
| 07/15/2014 | US8782496 Memory controller, semiconductor memory apparatus and decoding method |
| 07/15/2014 | US8782495 Non-volatile memory and methods with asymmetric soft read points around hard read points |
| 07/15/2014 | US8782494 Reproducing data utilizing a zero information gain function |
| 07/15/2014 | US8782493 Correcting data in a memory |
| 07/15/2014 | US8782492 Updating data stored in a dispersed storage network |
| 07/15/2014 | US8782491 Detecting intentional corruption of data in a dispersed storage network |
| 07/15/2014 | US8782490 Data storage device and program method that modifies arrangement of program data to eliminate interfering data patterns |
| 07/15/2014 | US8782488 Systems and methods for back step data decoding |
| 07/15/2014 | US8782487 Systems and methods for locating and correcting decoder mis-corrections |
| 07/15/2014 | US8782478 Non-volatile memory (NVM) with imminent error prediction |
| 07/15/2014 | US8782477 High-speed serial interface bridge adapter for signal integrity verification |
| 07/15/2014 | US8782476 Memory and test method for memory |
| 07/15/2014 | US8782474 Advanced converters for memory cell sensing and methods |
| 07/15/2014 | US8780617 Semiconductor memory device and method of performing burn-in test on the same |
| 07/10/2014 | US20140195867 Memory testing with selective use of an error correction code decoder |
| 07/10/2014 | US20140195852 Memory testing of three dimensional (3d) stacked memory |
| 07/10/2014 | US20140195191 Voltage testing device and method for memory |
| 07/10/2014 | US20140192602 Defective memory column replacement with load isolation |
| 07/09/2014 | EP2751809A2 Memory refresh methods and apparatuses |
| 07/09/2014 | CN103915120A 内存条的电压测试装置及方法 Voltage test device and method of memory |
| 07/09/2014 | CN103915119A 数据储存装置以及快闪存储器控制方法 Flash memory data storage device and control method |
| 07/09/2014 | CN102540059B 数字半导体器件的测试装置及方法 Test apparatus and method for a digital semiconductor device |
| 07/09/2014 | CN102339648B 一种检错/纠错校验模块的检测方法及装置 Method and apparatus for detecting an error detection / correction calibration module |
| 07/08/2014 | US8775906 Efficient storage of meta-bits within a system memory |
| 07/08/2014 | US8775905 Memory system and operation method thereof |
| 07/08/2014 | US8775904 Efficient storage of meta-bits within a system memory |
| 07/08/2014 | US8775902 Memory controller and storage device |
| 07/08/2014 | US8775901 Data recovery for defective word lines during programming of non-volatile memory arrays |
| 07/08/2014 | US8775893 Variable parity encoder |
| 07/08/2014 | US8775881 Embedded processor |
| 07/08/2014 | US8775880 Shared fuse wrapper architecture for memory repair |
| 07/08/2014 | US8773932 Built-in self-test circuit applied to high speed I/O port |
| 07/08/2014 | US8773931 Method of detecting connection defects of memory and memory capable of detecting connection defects thereof |
| 07/08/2014 | US8773930 Built-in test circuit and method |
| 07/08/2014 | US8773155 MUT for testing memory modules |
| 07/08/2014 | CA2636237C Method and apparatus for recording high-speed input data into a matrix of memory devices |
| 07/03/2014 | WO2014105170A1 Error detection and correction apparatus and method |
| 07/03/2014 | WO2014105131A1 Input/output delay testing for devices utilizing on-chip delay generation |
| 07/03/2014 | WO2014066462A3 Apparatus and method for reforming resistive memory cells |
| 07/03/2014 | US20140189451 Addressing, Command Protocol, and Electrical Interface for Non-volatile Memories Utilized in Recording Usage Counts |
| 07/03/2014 | US20140189450 Hierarchical, Distributed Built-in Self-Repair Solution |
| 07/03/2014 | US20140189448 Decreasing power supply demand during bist initializations |
| 07/03/2014 | US20140185399 Test mediation device and system and method for testing memory device |
| 07/03/2014 | US20140185398 Hybrid latch and fuse scheme for memory repair |
| 07/03/2014 | US20140185397 Hybrid latch and fuse scheme for memory repair |
| 07/03/2014 | US20140185393 Design for test (dft) read speed through transition detector in built-in self-test (bist) sort |
| 07/03/2014 | US20140185380 Semiconductor memory device having faulty cells |
| 07/02/2014 | CN103903651A 双线串行端口内建自测电路及其通讯方法 BIST circuit wire serial port and communication method |
| 07/01/2014 | US8769389 Techniques for rate matching and de-rate matching |
| 07/01/2014 | US8769378 Controller, a method of operating the controller and a memory system |
| 07/01/2014 | US8769376 Memory cell supply voltage control based on error detection |
| 07/01/2014 | US8769375 Data storage device related method of operation |
| 07/01/2014 | US8769374 Multi-write endurance and error control coding of non-volatile memories |
| 07/01/2014 | US8769361 Cost estimation for device testing |
| 07/01/2014 | US8769356 Bad page management in memory device or system |
| 07/01/2014 | US8769355 Using built-in self test for preventing side channel security attacks on multi-processor systems |
| 07/01/2014 | US8769354 Memory architecture and associated serial direct access circuit |
| 07/01/2014 | US8769353 Memory card |
| 07/01/2014 | US8767490 Electrical fuse rupture circuit |
| 07/01/2014 | US8767489 Semiconductor memory device for improving repair efficiency |
| 07/01/2014 | US8767488 Content addressable memory having half-column redundancy |
| 07/01/2014 | US8767486 Output driver circuit, output driver system and semiconductor memory device |
| 07/01/2014 | US8767485 Operation method of a supply voltage generation circuit used for a memory array |
| 07/01/2014 | US8767434 E-fuse array circuit |
| 06/26/2014 | WO2014100136A1 Programmable built-in-self tester (bist) in memory controller |
| 06/26/2014 | WO2014099381A1 Tuning of floating gate select transistor in nand-string |
| 06/26/2014 | WO2014099169A1 Virtual boundary codes in a data image of a read-write memory device |
| 06/26/2014 | WO2014099065A1 Log-likelihood ratio and lumped log-likelihood ratio generation for data storage systems |
| 06/26/2014 | WO2014098890A1 Memory module having error correction logic |
| 06/26/2014 | WO2014060884A4 Global data establishment for storage arrays controlled by plurality of nodes |
| 06/26/2014 | US20140181619 Data distribution utilizing unique read parameters in a dispersed storage system |
| 06/26/2014 | US20140181613 Memory controller method and system compensating for memory cell data losses |
| 06/26/2014 | US20140181602 Modeling memory arrays for test pattern analysis |
| 06/26/2014 | US20140177365 Semiconductor apparatus, test method using the same and muti chips system |
| 06/26/2014 | US20140177364 One-time programmable memory and test method thereof |
| 06/26/2014 | US20140177363 Method and system for automated device testing |
| 06/26/2014 | US20140177362 Memory Interface Supporting Both ECC and Per-Byte Data Masking |
| 06/25/2014 | CN103890849A 用于具有受控的可平均和可隔离电压参考的mram的系统和方法 Systems and methods may mean having a controlled and isolated voltage reference for mram |
| 06/25/2014 | CN103886917A 存储芯片测试机 Memory chip tester |
| 06/25/2014 | CN103886916A 输入位宽可伸缩的编码/编解码存储系统 The input bit width of the scalable encoding / codec storing system |
| 06/25/2014 | CN103886915A 用于校正包括邻近2比特错误的3比特错误的电路和方法 2 for correcting the bit errors comprises three adjacent bit errors circuit and method |
| 06/25/2014 | CN103886914A 通道控制电路以及具有通道控制电路的半导体器件 Channel control circuit and a control circuit having a channel semiconductor device |
| 06/25/2014 | CN103886913A Sram读取时间自测试电路及测试方法 Sram reading time in self-test circuit and test method |
| 06/25/2014 | CN103886912A 具有参数的半导体存储器件和半导体系统及其测试方法 A semiconductor memory device and semiconductor systems and test method parameters |
| 06/25/2014 | CN103886911A 半导体装置、利用它的测试方法以及多芯片系统 A semiconductor device, using its test method, and multi-chip system |
| 06/25/2014 | CN103886883A 一种对有损视频监控数据进行恢复的方法及系统 Kind of lossy video surveillance data recovery method and system |
| 06/25/2014 | CN102194526B 检测系统及检测方法 Detection system and detection method |
| 06/25/2014 | CN102063943B Nand闪存参数自动检测系统 Nand Flash parameter automatic detection system |
| 06/25/2014 | CN101379566B 用于修复高速缓存阵列中单元的装置、系统和方法 Means for repairing the cache array elements, the system and method |
| 06/24/2014 | US8762821 Method of correcting adjacent errors by using BCH-based error correction coding |
| 06/24/2014 | US8762815 Systems and methods for data decoder state preservation during extended delay processing |
| 06/24/2014 | US8762814 Method for enhancing error correction capability, and associated memory device and controller thereof |
| 06/24/2014 | US8762813 Configurable coding system and method of multiple ECCS |