Patents
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
04/2013
04/04/2013WO2013047213A1 Non-volatile resistance network aggregate and non-volatile logic gate having enhanced fault tolerance using same
04/04/2013US20130086440 Generic march element based memory built-in self test
04/04/2013US20130083612 Memory device including repair circuit and repair method thereof
04/03/2013EP2575140A1 Semiconductor chip, semiconductor device, and method of measuring the same
04/03/2013CN202855313U Improved structure of footstand for detecting memorizer module
04/03/2013CN103021471A Memory and memorizing method thereof
04/03/2013CN103021470A Sampling phase correction method and storage system using the same
04/03/2013CN103021469A Universal single event effect detecting method of memory circuit
04/03/2013CN103021468A Error message recording method and redundancy substituting method for memory
04/03/2013CN103021467A 故障诊断电路 Troubleshooting Circuit
04/03/2013CN103021460A Setting data storage for semiconductor devices including memory devices and systems
04/03/2013CN101964876B Solid-state imaging device
04/03/2013CN101859606B Method and equipment for adjusting reference unit threshold parameter and testing system
04/03/2013CN101529520B Memory bus output driver of a multi-bank memory device and method thereof
04/02/2013US8413029 Error correction capability adjustment of LDPC codes for storage device testing
04/02/2013US8413017 Method for transmitting a data transfer block and method and system for transferring a data transfer block
04/02/2013US8413016 Nonvolatile memory device and controller for judging a normal or anomalous condition of an error-corrected bit pattern
04/02/2013US8413015 Nonvolatile memory controller with scalable pipelined error correction
04/02/2013US8413014 Cycle slip detection and correction
04/02/2013US8413013 Memory system
04/02/2013US8413010 Data storage device employing high quality metrics when decoding logical block address appended to a data sector
04/02/2013US8412989 Tap time division multiplexing with scan test
04/02/2013US8412987 Non-volatile memory to store memory remap information
04/02/2013US8412879 Hybrid implementation for error correction codes within a non-volatile memory system
04/02/2013US8411520 Semiconductor memory device and method of reducing consumption of standby current therein
04/02/2013US8411519 Selective retirement of blocks
03/2013
03/28/2013WO2013042972A2 Flash memory storage unit capable of verifying reliability using a bypass path, and a system and method for verifying reliability of the flash memory storage unit using same
03/28/2013US20130080858 Method of reading data from a non-volatile memory and devices and systems to implement same
03/28/2013US20130080847 Memory hard macro partition optimization for testing embedded memories
03/28/2013US20130077422 Integrated solution for identifying malfunctioning components within memory devices
03/28/2013US20130077421 Failure diagnosis circuit
03/28/2013US20130077420 Semiconductor memory device and defective cell relieving method
03/28/2013US20130077419 Data generation apparatus
03/27/2013CN202838977U Simple and portable storage medium information detection and backup device
03/27/2013CN202838976U EDAC (Error Detection And Correction)-module-based fault-tolerant device of triple modular redundancy to storage
03/27/2013CN103003886A Detection of broken word-lines in memory arrays
03/27/2013CN103000230A Nonvolatile memory IP core test and verify exploitation system
03/27/2013CN103000229A Testing card
03/27/2013CN103000228A Storage device test method and system
03/27/2013CN103000227A Method for carrying out failure model modeling upon non-volatile memory product
03/27/2013CN103000226A Detection method for detecting defect through random access memory chip address pin
03/27/2013CN102998957A Imaging box chip restoration method
03/27/2013CN102998956A Imaging box chip restoration device
03/27/2013CN101796589B Memory controller self-calibration for removing systemic influence
03/27/2013CN101630534B Method and device for testing reliability of nonvolatile memories
03/27/2013CN101601094B Reading memory cells using multiple thresholds
03/27/2013CN101599305B Storage system with data-restoring function and data-restoring method thereof
03/27/2013CN101540205B Method for scanning flash memory
03/27/2013CN101540202B Method and system for quickly screening flash memory medium
03/27/2013CN101421797B Non-volatile memory and method with redundancy data buffered in remote buffer circuits
03/27/2013CN101241768B Memory device employing dual clocking for generating systematic code and method thereof
03/26/2013US8407563 Low-complexity soft-decision decoding of error-correction codes
03/26/2013US8407562 Systems and methods for compressing data in non-volatile semiconductor memory drives
03/26/2013US8407561 Formulaic flexible collision-free memory accessing for parallel turbo decoding with quadratic polynomial permutation (QPP) interleave
03/26/2013US8407560 Systems and methods for encoding information for storage in an electronic memory and for decoding encoded information retrieved from an electronic memory
03/26/2013US8407559 Monitoring memory
03/26/2013US8407538 Semiconductor package
03/26/2013US8406072 System and method of reference cell testing
03/21/2013WO2013040065A1 Improving sram cell writability
03/21/2013WO2013039319A2 Semiconductor storage device having multiple host interface units for increased bandwidth
03/21/2013WO2013037048A1 Memory system with a layer comprising a dedicated redundancy area
03/21/2013US20130070548 Semiconductor memory device correcting fuse data and method of operating the same
03/21/2013US20130070547 Memory system with a layer comprising a dedicated redundancy area
03/21/2013US20130070546 Nonvolatile semiconductor memory device
03/21/2013US20130070545 Semiconductor integrated circuit
03/20/2013EP2569773A1 Memory device having a local current sink
03/20/2013CN102985978A Bulk transfer of storage devices using manual loading
03/20/2013CN102985975A LDPC erasure decoding for flash memories
03/20/2013CN102982849A ECC (Error Correcting Code) decoding control method for data storage
03/20/2013CN102982848A Memory system
03/20/2013CN102982847A Testing system and testing method for parasitic parameters of static random access memory
03/20/2013CN102169727B Random walk based solid state disk abrasion balancing method
03/20/2013CN101996686B Method and device for writing test data into memory
03/20/2013CN101989709B One-touch clamp for testing internal memory module
03/20/2013CN101923512B Three-layer flash-memory devices, intelligent storage switch and three-layer controllers
03/20/2013CN101847446B Integrated circuit and method
03/20/2013CN101752013B Testing device
03/20/2013CN101697285B Method and system for debugging hardware of memory device
03/20/2013CN101593563B Memory chip and method for operating the same
03/19/2013US8402348 Systems and methods for variable data processing using a central queue
03/19/2013US8402347 Error correction code for unidirectional memory
03/19/2013US8402346 N-way parity technique for enabling recovery from up to N storage device failures
03/19/2013US8402345 Methods and apparatus for providing multilevel coset coding and probabilistic error correction
03/19/2013US8402341 Method and system for providing low density parity check (LDPC) encoding and decoding
03/19/2013US8402326 Integrated circuit having memory array including ECC and column redundancy and method of operating same
03/19/2013US8401038 False lock detection for physical layer frame synchronization
03/19/2013US8400854 Identifying at-risk data in non-volatile storage
03/19/2013US8400668 Apparatus and method of scanning and/or printing an image
03/14/2013US20130067295 File download and streaming system
03/14/2013US20130064027 Memory and Method of Adjusting Operating Voltage thereof
03/14/2013US20130064026 Technology of memory repair after stacking of three-dimensional integrated circuit
03/13/2013CN1591697B Method and apparatus for checking IC signal output
03/13/2013CN102969029A Field-repair system and method
03/13/2013CN102969028A Method, system, and flash memory of ECC dynamic adjustment
03/13/2013CN102969027A On-chip memory debugging method and device based on memory built-in self-test
03/13/2013CN102969026A Mobile storage device detection method and apparatus based on data processing system
03/13/2013CN102969024A Self-repair system and method
03/13/2013CN102142283B Method for testing nonvolatile memory
03/13/2013CN101848000B Decoding method, encoding method and starting control system
03/13/2013CN101763903B Flash memory controller, error correction code controller therein, and the methods and systems thereof
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