| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 04/16/2014 | CN103730168A Method for detecting data storage apparatus |
| 04/16/2014 | CN103730167A Virtual hard disk |
| 04/16/2014 | CN102214486B Hybrid self-test circuit structure |
| 04/15/2014 | US8700975 Storage system and storage control apparatus |
| 04/15/2014 | US8700974 Memory system controller having seed controller using multiple parameters |
| 04/15/2014 | US8700972 Adaptive ultra-low voltage memory |
| 04/15/2014 | US8700961 Controller and method for virtual LUN assignment for improved memory bank mapping |
| 04/10/2014 | WO2014054345A1 Semiconductor device |
| 04/10/2014 | US20140098622 Memory Controller That Enforces Strobe-To-Strobe Timing Offset |
| 04/10/2014 | US20140098620 Semiconductor memory device |
| 04/10/2014 | US20140098604 Immunity of Phase Change Material to Disturb in the Amorphous Phase |
| 04/10/2014 | DE102013016694A1 Codieren und Decodieren redundanter Bits zum Vornehmen von Anpassungen für Speicherzellen mit Haftfehlern Encoding and decoding redundant bits for making adjustments for memory cells with stuck-at faults |
| 04/09/2014 | CN203535964U Single-event latchup testing machine for SRAM (Static Random Access Memory) chips |
| 04/09/2014 | CN103714863A System and method for testing distribution of current of flash memory unit |
| 04/09/2014 | CN103714862A Memory identification correction device |
| 04/09/2014 | CN103714861A Method and apparatus for diagnosing a fault of a memory |
| 04/09/2014 | CN103714856A Memory system and read reclaim method thereof |
| 04/09/2014 | CN103714846A Semiconductor device and operating method thereof |
| 04/09/2014 | CN101976583B Polarity driven dynamic on-die termination |
| 04/09/2014 | CN101950586B Storage controller and method for controlling data reading |
| 04/08/2014 | US8694866 MDS array codes with optimal building |
| 04/08/2014 | US8694865 Data storage device configured to reduce buffer traffic and related method of operation |
| 04/08/2014 | US8694864 Parallel processing error detection and location circuitry for configuration random-access memory |
| 04/08/2014 | US8694863 High-speed memory system |
| 04/08/2014 | US8694862 Data processing apparatus using implicit data storage data storage and method of implicit data storage |
| 04/08/2014 | US8694861 Memory device repair apparatus, systems, and methods |
| 04/08/2014 | US8694860 System and method for data read of a synchronous serial interface NAND |
| 04/08/2014 | US8694858 Memory controller and operating method of memory controller |
| 04/08/2014 | US8694857 Systems and methods for error detection and correction in a memory module which includes a memory buffer |
| 04/08/2014 | US8694856 Physically unclonable function with tamper prevention and anti-aging system |
| 04/08/2014 | US8694855 Error correction code technique for improving read stress endurance |
| 04/08/2014 | US8694854 Read threshold setting based on soft readout statistics |
| 04/08/2014 | US8694853 Read commands for reading interfering memory cells |
| 04/08/2014 | US8694841 Methods and devices for preventing potential media errors from growing thermal asperities |
| 04/08/2014 | US8694840 Memory test isolation logic bank with separate test enable input |
| 04/08/2014 | US8694839 Method and system for testing chips |
| 04/08/2014 | US8694838 Cache memory, processor, and production methods for cache memory and processor |
| 04/08/2014 | US8693279 Synchronous global controller for enhanced pipelining |
| 04/08/2014 | US8693271 Method of stressing static random access memories for pass transistor defects |
| 04/08/2014 | US8693270 Semiconductor apparatus |
| 04/03/2014 | WO2014051625A1 Dynamically selecting between memory error detection and memory error correction |
| 04/03/2014 | WO2014051611A1 Systems for and methods of extending lifetime of non-volatile memory |
| 04/03/2014 | WO2014051462A1 Method for recovering recordings in a storage device and system for implementing same |
| 04/03/2014 | WO2014050049A1 Semiconductor device having plural memory units and test method therefor |
| 04/03/2014 | US20140095962 Semiconductor device and operating method thereof |
| 04/03/2014 | US20140095949 Method and apparatus for diagnosing a fault of a memory using interim time after execution of an application |
| 04/03/2014 | US20140095948 Memory testing in a data processing system |
| 04/03/2014 | US20140095947 Functional memory array testing with a transaction-level test engine |
| 04/03/2014 | US20140095946 Transaction-level testing of memory i/o and memory device |
| 04/03/2014 | US20140092693 Semiconductor device and operating method thereof |
| 04/03/2014 | DE10026993B4 Flash-Speicherbauelement mit einer neuen Redundanzansteuerschaltung Flash memory device with a new Redundanzansteuerschaltung |
| 04/02/2014 | CN103700408A Method for detecting memory |
| 04/02/2014 | CN103700407A Aviation application-based verification method for domestic storages |
| 04/02/2014 | CN102610268B Method for synchronizing data strobe signal in double data rate 3(DDR3) using oscilloscope |
| 04/02/2014 | CN102163460B Frequency-based approach for detection and classification of hard-disc defect regions |
| 04/02/2014 | CN101641747B Semiconductor memory device |
| 04/01/2014 | US8689081 Techniques for embedded memory self repair |
| 04/01/2014 | US8689080 Preemptive memory repair based on multi-symbol, multi-scrub cycle analysis |
| 04/01/2014 | US8689077 Memory controller method and system compensating for memory cell data losses |
| 04/01/2014 | US8689065 Semiconductor memory apparatus including data compression test circuit |
| 04/01/2014 | US8689064 Apparatus and method for self-test in a multi-rank memory module |
| 04/01/2014 | US8687447 Semiconductor memory apparatus and test method using the same |
| 04/01/2014 | US8687446 Semiconductor device with self refresh test mode |
| 04/01/2014 | US8687443 Semiconductor apparatus |
| 03/27/2014 | WO2014047225A1 Substitute redundant memory |
| 03/27/2014 | WO2014046887A1 Block and page level bad bit line and bits screening method for non-volatile memory |
| 03/27/2014 | WO2014046103A1 Semiconductor device having dual rescue detection circuit |
| 03/27/2014 | WO2014045993A1 Semiconductor device, semiconductor wafer, and semiconductor-wafer testing method |
| 03/27/2014 | WO2014044810A1 I/o cell calibration |
| 03/27/2014 | US20140085996 Readout circuit and semiconductor device |
| 03/27/2014 | US20140085995 Method, apparatus and system for determining a count of accesses to a row of memory |
| 03/27/2014 | US20140085994 Integrated circuitry, chip, method for testing a memory device, method for manufacturing an integrated circuit and method for manufacturing a chip |
| 03/27/2014 | DE19501537B4 Multibit-Testschaltung für ein Halbleiterspeicherbauelement Multi-bit test circuit for a semiconductor memory device |
| 03/27/2014 | DE102013110540A1 Integrierte schaltung, chip, verfahren zum testen einer speichervorrichtung, verfahren zur herstellung einer integrierten schaltung und verfahren zur herstellung eines chips An integrated circuit, chip, method for testing a memory device, methods of making an integrated circuit and method of manufacturing a chip |
| 03/26/2014 | EP2711800A1 I/O cell calibration |
| 03/26/2014 | CN103680640A Laser simulation single particle effect back irradiation test method for memory circuit |
| 03/26/2014 | CN103680639A Periodic self-checking recovery method of random access memory |
| 03/26/2014 | CN103680638A Flash memory controller and controlling methods therefor |
| 03/26/2014 | CN103680637A Flash memory system having abnormal wordline detector and abnormal wordline detection method |
| 03/26/2014 | CN103680629A Operation method of memory and integrated circuit having memory |
| 03/26/2014 | CN103680619A Memory device and integrated circuit |
| 03/26/2014 | CN103680614A Semiconductor memory device and method of operating same |
| 03/26/2014 | CN103680612A Method for optimizing reading and writing performances of electrically erasable nonvolatile memory |
| 03/26/2014 | CN103680591A Decoder circuit, memory device and multi-valued fuse circuit |
| 03/26/2014 | CN103675633A Semiconductor device and detection method thereof |
| 03/26/2014 | CN102231286B Test method of DRAM (dynamic random access memory) |
| 03/26/2014 | CN102226947B Controllable test vector generator based on linear feedback shift register |
| 03/26/2014 | CN101661799B Programmable self-test for random access memories |
| 03/26/2014 | CN101512665B Non-volatile memory and method for reduced erase/write cycling during trimming of initial programming voltage |
| 03/25/2014 | US8683456 Test partitioning for a non-volatile memory |
| 03/25/2014 | US8683297 Systems and methods of generating a replacement default read threshold |
| 03/25/2014 | US8683296 Accelerated erasure coding system and method |
| 03/25/2014 | US8683295 Hybrid drive writing extended error correction code symbols to disk for data sectors stored in non-volatile semiconductor memory |
| 03/25/2014 | US8683294 Efficient encoding of homed data |
| 03/25/2014 | US8683292 Method and system for providing low density parity check (LDPC) coding for scrambled coded multiple access (SCMA) |
| 03/25/2014 | US8683291 High throughput frame check sequence module architecture |
| 03/25/2014 | US8683290 Save area for retaining corrected data |
| 03/25/2014 | US8683277 Defect detection using pattern matching on detected data |
| 03/25/2014 | US8683276 Apparatus and method for repairing an integrated circuit |
| 03/20/2014 | WO2014043574A2 Reference cell repair scheme |