Patents
Sitemap › G11 - Information storage › G11C - Static stores › G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
03/2014
03/20/2014US20140082456 Data storage device with intermediate ecc stage
03/20/2014US20140082445 Probeless testing of pad buffers on wafer
03/20/2014US20140082440 Method and apparatus of measuring error correction data for memory
03/20/2014US20140078843 Semiconductor device and test method thereof
03/20/2014US20140078842 Post package repairing method, method of preventing multiple activation of spare word lines, and semiconductor memory device including fuse programming circuit
03/20/2014US20140078841 Programmable memory built in self repair circuit
03/20/2014DE112012002843T5 Anpassungsfähige Mehrbit-Fehlerkorrektur in Speichern mit begrenzter Lebensdauer Adaptive multi-bit error correction in memories with limited lifetime
03/20/2014DE10337284B4 Integrierter Speicher mit einer Schaltung zum Funktionstest des integrierten Speichers sowie Verfahren zum Betrieb des integrierten Speichers Integrated memory having a circuit for a function test of the integrated memory and method of operating the built-in memory
03/20/2014DE102010021516B4 Fehlerkorrekturcodes für erhöhte Speicherkapazität in Mehrpegelspeichereinrichtungen Error correction codes for increased storage capacity in the multi-level memory devices
03/19/2014EP2709110A1 Measuring cell damage for wear leveling in a non-volatile memory
03/19/2014CN103650058A Method and system for controlling loss of reliability of non-volatile memory
03/19/2014CN103646670A Method and device for evaluating performances of storage system
03/19/2014CN103646669A Method and device for detecting reliability of removable storage device
03/19/2014CN101494090B Memory access control method
03/18/2014US8677217 Data input / output control device and semiconductor memory device system
03/18/2014US8677216 Stacked semiconductor memory device and related error-correction method
03/18/2014US8677214 Encoding data utilizing a zero information gain function
03/18/2014US8677213 Electronic device comprising error correction coding device and electronic device comprising error correction decoding device
03/18/2014US8677211 Data bus inversion using spare error correction bits
03/18/2014US8677203 Redundant data storage schemes for multi-die memory systems
03/18/2014US8677197 Test apparatus
03/18/2014US8677196 Low cost production testing for memory
03/18/2014US8675432 Semiconductor device capable of being tested after packaging
03/18/2014US8675431 Semiconductor memory device and defective cell relieving method
03/13/2014WO2014039164A1 On chip dynamic read level scan and error detection for non-volatile storage
03/13/2014US20140075252 Erased Page Confirmation in Multilevel Memory
03/13/2014US20140075251 Chip capable of improving test coverage of pads and related method thereof
03/13/2014US20140071772 Leakage measurement systems
03/13/2014US20140071736 Testing signal development on a bit line in an sram
03/13/2014US20140070819 Technique for Determining Performance Characteristics Of Electronic Devices And Systems
03/13/2014DE10015370B4 Halbleiterspeicherbauelement mit aktivierbaren und deaktivierbaren Wortleitungen Semiconductor memory device with and deactuable word lines
03/12/2014EP2705432A1 Control circuit and method for testing a memory element
03/12/2014CN103632732A Memory control device, non-volatile memory, and memory control method
03/12/2014CN103632731A Semiconductor devices including redundancy cells
03/12/2014CN103632730A Solid-state drive retention monitor using reference blocks
03/12/2014CN103632729A Semiconductor memory device and system having redundancy cells
03/12/2014CN103632728A Semiconductor memory device and method of testing the same
03/12/2014CN103632727A Memory detection method
03/12/2014CN103632710A Semiconductor memory device
03/12/2014CN103632699A Three-dimensional memory containing address/data converter chip
03/12/2014CN102411995B Detection circuit and method for memory cell match line of content addressable memory
03/12/2014CN102376371B Method for testing semiconductor memory device
03/12/2014CN102306503B Method and system for detecting false capacity memory
03/12/2014CN102237143B Reconstruction method, system and reconstruction device for block information provided in flash memory
03/12/2014CN101755305B Memory device and method for operating memory unit
03/12/2014CN101473383B Memory equipment with error correction capability and high efficiency part words write operation
03/11/2014US8671330 Storage device, electronic device, and data error correction method
03/11/2014US8671329 Low overhead and timing improved architecture for performing error checking and correction for memories and buses in system-on-chips, and other circuits, systems and processes
03/11/2014US8671328 Error correction code techniques for matrices with interleaved codewords
03/11/2014US8671317 Built-in self test circuit and designing apparatus
03/11/2014US8670283 Controller to detect malfunctioning address of memory device
03/11/2014US8670282 Redundancy circuits and operating methods thereof
03/06/2014US20140068360 Systems and methods for testing memory
03/06/2014US20140068358 Systems and Methods for Non-Zero Syndrome Based Processing
03/06/2014US20140063999 Non-volatile memory device and electronic apparatus
03/06/2014US20140063998 Nonvolatile memory device and operating method thereof
03/06/2014US20140063997 Dram refresh
03/06/2014US20140063996 Semiconductor memory device
03/06/2014US20140063995 Memory and memory system including the same
03/06/2014US20140063994 Memory and memory system including the same
03/06/2014US20140063993 Repair system for repairing defect using e fuses and method of controlling the same
03/06/2014US20140063944 Semiconductor memory device and method of operating the same
03/06/2014US20140063905 Semiconductor memory device capable of measuring write current and method for measuring write current
03/06/2014DE102013109235A1 Flash-Speichersystem mit Detektor für anormale Wortleitung und Verfahren zum Erfassen einer anormalen Wortleitung Flash memory system with detector for abnormal word line and method for detecting an abnormal word line
03/05/2014EP2704151A2 Semiconductor device and memory test method
03/05/2014CN103617811A Error correction circuit of SRAM (Static Random Access Memory)-type memory
03/05/2014CN103617810A Test structure and test method for embedded memory
03/05/2014CN102354537B Method for testing chip of phase change memory
03/05/2014CN102197438B System and method for recovering solid state drive data
03/05/2014CN101404183B Semiconductor storage device
03/04/2014US8667372 Memory controller and method of controlling memory
03/04/2014US8667370 Systems and methods for arbitrating use of processor memory
03/04/2014US8667369 Memory controller and operating method of memory controller
03/04/2014US8667368 Method and apparatus for reading NAND flash memory
03/04/2014US8667367 Memory cell supply voltage control based on error detection
03/04/2014US8667366 Efficient use of physical address space for data overflow and validation
03/04/2014US8667354 Computer memory test structure
03/04/2014US8667348 Data writing method for non-volatile memory module and memory controller and memory storage apparatus using the same
03/04/2014US8667347 Active calibration for high-speed memory devices
03/04/2014US8667346 Semiconductor integrated circuit device, method of controlling the semiconductor integrated circuit device and information processing system
03/04/2014US8667345 Burn-in method for embedded multi media card, and test board using the same, and embedded multi media card tested by the same
03/04/2014US8667341 Apparatus and method for determining interleaved address of turbo interleaver
02/2014
02/27/2014WO2014031366A1 Read threshold estimation in analog memory cells using simultaneous multi-voltage sense
02/27/2014US20140059406 Reduced level cell mode for non-volatile memory
02/27/2014US20140059398 Adaptive error correction for non-volatile memories
02/27/2014US20140056088 Method of identifying damaged bitline address in non-volatile memory device
02/27/2014US20140056084 Integrated circuit and memory device
02/27/2014US20140056082 Semiconductor devices including redundancy cells
02/27/2014DE102005035444B4 Verfahren zum Testen der Betriebsbrauchbarkeit von Bitleitungen in einer DRAM-Speichervorrichtung A method for testing the operating utility of bit lines in a DRAM memory device
02/26/2014CN102354534B Method for detecting connection fault in memory and memory capable of being detected
02/26/2014CN102298973B Anti-radiation fault-secure type memory device and anti-radiation fault-secure method thereof
02/26/2014CN102203867B Volatile memory elements with soft error upset immunity
02/25/2014US8661321 Parallel processing error detection and location circuitry for configuration random-access memory
02/25/2014US8661320 Independent orthogonal error correction and detection
02/25/2014US8661319 Memory system
02/25/2014US8661318 Memory management in a non-volatile solid state memory device
02/25/2014US8661315 Efuse devices, correction methods thereof, and methods for operating efuse devices
02/25/2014US8661301 Method for dodging bad page and bad block caused by suddenly power off
02/25/2014US8661285 Dynamically calibrated DDR memory controller
02/20/2014WO2014028183A1 Fractional redundant array of silicon independent elements
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