| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 05/07/2013 | US8438429 Storage control apparatus and storage control method |
| 05/07/2013 | US8438358 System-on-chip with memory speed control core |
| 05/07/2013 | US8437212 Semiconductor memory apparatus, memory system, and programming method thereof |
| 05/07/2013 | US8437209 Integrated circuit |
| 05/07/2013 | US8437208 Redundant memory array for replacing memory sections of main memory |
| 05/02/2013 | WO2013060972A1 Method of compensating for the corruption of a memory of an electronic computer |
| 05/02/2013 | US20130111301 Block management method, memory controller and memory storage device thereof |
| 05/02/2013 | US20130111283 Systems and Methods for Testing Memories |
| 05/02/2013 | US20130111282 Fast parallel test of sram arrays |
| 05/02/2013 | US20130111281 Integrated circuit, test circuit, and method of testing |
| 05/02/2013 | US20130107649 Semiconductor device including test circuit and burn-in test method |
| 05/01/2013 | EP2587489A1 Systems and methods for testing memories |
| 05/01/2013 | EP2587488A1 Integrated circuit, test circuit, testing apparatus and method of testing |
| 05/01/2013 | EP2587487A1 File system and control method thereof |
| 05/01/2013 | EP2586031A2 Method and apparatus for training a memory signal via an error signal of a memory |
| 05/01/2013 | CN202917182U Micro SD card test bench |
| 05/01/2013 | CN1551244B Non-volatile memory with error correction for page copy operation and method thereof |
| 05/01/2013 | CN103077749A Redundant fault-tolerant built-in self-repairing method suitable for static stage random access memory |
| 05/01/2013 | CN103077748A Static random access memory merged built-in self-test method |
| 05/01/2013 | CN103077747A Electrically erasable programmable read-only memory (EEPROM) modeling method and boundary scan test program loading method |
| 05/01/2013 | CN103077743A Burn-in method for embedded multi media card, and test board using the same, and embedded multi media card tested by the same |
| 05/01/2013 | CN102110483B Test circuit of EEPROM (electrically erasable programmable read-only memory) and test method thereof |
| 05/01/2013 | CN101989466B Device and method for data interception and time sequence drifting detection of interface of synchronous dynamic random access memory |
| 05/01/2013 | CN101859605B Method using flaw flash memory |
| 05/01/2013 | CN101651448B Method and system for protecting data information of power amplifier |
| 05/01/2013 | CN101562051B Flash memory medium scan method |
| 04/30/2013 | US8433980 Fast, low-power reading of data in a flash memory |
| 04/30/2013 | US8433979 Nested multiple erasure correcting codes for storage arrays |
| 04/30/2013 | US8433977 Storage device implementing data path protection by encoding large host blocks into sub blocks |
| 04/30/2013 | US8433976 Row column interleavers and deinterleavers with efficient memory usage |
| 04/30/2013 | US8433972 Systems and methods for constructing the base matrix of quasi-cyclic low-density parity-check codes |
| 04/30/2013 | US8433960 Semiconductor memory and method for testing the same |
| 04/30/2013 | US8432760 Method of screening static random access memories for unstable memory cells |
| 04/30/2013 | US8432758 Device and method for storing error information of memory |
| 04/25/2013 | WO2013059808A1 System and method for mram having controlled averagable and isolatable voltage reference |
| 04/25/2013 | WO2013033107A3 Memory refresh methods and apparatuses |
| 04/25/2013 | US20130103993 Asynchronous memory element for scanning |
| 04/25/2013 | US20130103992 Burn-In Method for Embedded Multi Media Card, and Test Board Using the Same, and Embedded Multi Media Card Tested by the Same |
| 04/25/2013 | US20130100752 Method of restoring reconstructed memory spaces |
| 04/24/2013 | EP2584563A2 Memory device in particular extra array configured therein for configuration and redundancy information |
| 04/24/2013 | EP2583177A1 Method of protecting a configurable memory against permanent and transient errors and related device |
| 04/24/2013 | CN103069498A Detection of word-line leakage in memory arrays: current based approach |
| 04/24/2013 | CN103065690A System and method for reducing starting current of storage system |
| 04/24/2013 | CN103065689A Integrated circuit chip and semiconductor memory device |
| 04/24/2013 | CN103065688A Method of inspecting memory cell |
| 04/24/2013 | CN103065687A A method of parallel detection for RAM production defects in an integrated circuit |
| 04/24/2013 | CN103065683A Memory system and method for recording/reproducing data thereof |
| 04/24/2013 | CN102074273B Memory homeostasis total dosage effect experiment testing method |
| 04/24/2013 | CN102033160B Silicon wafer-level frequency testing method |
| 04/24/2013 | CN101989465B Circuit and method for solving pressureproof problem during using of testing Pad |
| 04/24/2013 | CN101677023B Test mode signal generator for semiconductor memory and method of generating test mode signals |
| 04/24/2013 | CN101512661B Combined distortion estimation and error correction coding for memory devices |
| 04/23/2013 | US8429514 Dynamic load balancing of distributed parity in a RAID array |
| 04/23/2013 | US8429500 Methods and apparatus for computing a probability value of a received value in communication or storage systems |
| 04/23/2013 | US8429499 Disk drive and method for data conversion process in a disk drive |
| 04/23/2013 | US8429498 Dual ECC decoder |
| 04/23/2013 | US8429496 Semiconductor memory device and error correcting method |
| 04/23/2013 | US8429495 Error detection and correction codes for channels and memories with incomplete error characteristics |
| 04/23/2013 | US8429494 Nonvolatile random access memory and nonvolatile memory system |
| 04/23/2013 | US8429493 Memory device with internal signap processing unit |
| 04/23/2013 | US8429492 Error correcting code predication system and method |
| 04/23/2013 | US8429489 Data retrieval from a storage device using a combined error correction and detection approach |
| 04/23/2013 | US8429470 Memory devices, testing systems and methods |
| 04/23/2013 | US8429469 Method and apparatus for remotely verifying memory integrity of a device |
| 04/23/2013 | US8427894 Implementing single bit redundancy for dynamic SRAM circuit with any bit decode |
| 04/23/2013 | US8427893 Redundancy memory cell access circuit and semiconductor memory device including the same |
| 04/18/2013 | US20130097473 Flash memory |
| 04/18/2013 | US20130094315 Static random access memory test structure |
| 04/18/2013 | US20130094314 Sram power reduction through selective programming |
| 04/18/2013 | US20130094281 Method for measuring data retention characteristic of resistive random access memory device |
| 04/18/2013 | DE102010002309B4 Verfahren zur Überprüfung der Funktionsfähigkeit eines Speicherelements Method for checking the operability of a memory element |
| 04/17/2013 | CN103052993A Solution for full speed, parallel dut testing |
| 04/17/2013 | CN103052992A Variable resistance nonvolatile memory device and driving method thereof |
| 04/17/2013 | CN103052990A Resistance variable nonvolatile memory device, and driving method therefor |
| 04/17/2013 | CN101826368B Data scanning method and scanning device |
| 04/17/2013 | CN101752011B Data storage method used for multichannel non-volatile solid storage device |
| 04/17/2013 | CN101752009B Adjusting method for operating voltage of SRAM (static random access memory) |
| 04/17/2013 | CN101226776B Performance control of an integrated circuit |
| 04/16/2013 | US8423875 Collecting failure information on error correction code (ECC) protected data |
| 04/16/2013 | US8423867 Advanced data encoding with reduced erasure count for solid state drives |
| 04/16/2013 | US8423864 Receiving apparatus, receiving method, program, and receiving system |
| 04/16/2013 | US8423842 Test apparatus and test method for testing a memory device |
| 04/16/2013 | US8423841 Method and systems for memory testing and test data reporting during memory testing |
| 04/16/2013 | US8423840 Pattern generator |
| 04/16/2013 | US8423839 Memory repair system and method |
| 04/16/2013 | US8423837 High reliability and low power redundancy for memory |
| 04/16/2013 | US8422323 Multi-bit test circuit of semiconductor memory apparatus |
| 04/11/2013 | WO2013051862A1 Direct memory access without main memory in a semiconductor storage device-based system |
| 04/11/2013 | US20130091405 Independent orthogonal error correction and detection |
| 04/11/2013 | US20130091394 Data processing apparatus and validity verification method |
| 04/11/2013 | US20130091329 Reduced latency memory column redundancy repair |
| 04/10/2013 | CN103038830A Non-regular parity distribution detection via metadata tag |
| 04/10/2013 | CN103035302A Test apparatus and test method |
| 04/10/2013 | CN103035301A Testing method and testing device for parameters of memory bar |
| 04/10/2013 | CN103035300A Modeling method and boundary scan test method for DDR2 memory |
| 04/10/2013 | CN103035281A Temperature control self-refreshing method based on unit electric leakage detection |
| 04/10/2013 | CN101667837B ECC controller based on Reed-Solomon codes |
| 04/09/2013 | US8418030 Storage system with data recovery function and method thereof |
| 04/09/2013 | US8418028 Chien search device and Chien search method |
| 04/09/2013 | US8418005 Methods, apparatus and articles of manufacture to diagnose temperature-induced memory errors |