| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 08/12/2014 | US8804447 Semiconductor memory device for controlling write recovery time |
| 08/12/2014 | US8804445 Oscillato based on a 6T SRAM for measuring the bias temperature instability |
| 08/12/2014 | US8804423 Multi-bit-per-cell flash memory device with non-bijective mapping |
| 08/12/2014 | US8804395 Semiconductor device, control method thereof and data processing system |
| 08/07/2014 | WO2014120903A1 Nonvolatile logic array with built-in test result signal |
| 08/07/2014 | WO2014120604A1 Mram self-repair with bist logic |
| 08/07/2014 | WO2014120529A1 Error detection and correction of one-time programmable elements |
| 08/07/2014 | WO2014120228A1 Ram refresh rate |
| 08/07/2014 | US20140223246 Memory, memory controller, memory system, method of memory, memory controller and memory system |
| 08/07/2014 | US20140223245 Volatile memory device and methods of operating and testing volatile memory device |
| 08/07/2014 | US20140219041 Storage device and data processing method thereof |
| 08/07/2014 | US20140219037 Non-volatile semiconductor memory device and semiconductor device |
| 08/07/2014 | US20140219023 Bad Column Management with Bit Information in Non-Volatile Memory Systems |
| 08/07/2014 | US20140219022 Smart bridge for memory core |
| 08/07/2014 | US20140219000 Otp cell array including protected area, semiconductor memory device including the same, and method of programming the same |
| 08/06/2014 | CN103971753A 一种自动测试闪存的系统及方法 An automatic test system and method for flash memory |
| 08/06/2014 | CN103971752A 一种基于静态随机存储器的辐照偏置系统 A static random access memory of the irradiation system based on the bias |
| 08/06/2014 | CN103971751A 以选择性二进制及非二进制解码在闪存中进行检测和解码 Binary and non-binary to selectively detect and decode the decoding in the flash memory |
| 08/06/2014 | CN103971750A 一种ram的9相邻单元敏感故障检测方法 One kind of ram 9 unit adjacent sensitive fault detection method |
| 08/06/2014 | CN103971749A 非挥发性存储器存储单元特性评估方法 Non-volatile memory cell characteristics evaluation methods |
| 08/06/2014 | CN103971748A 一种存储卡检测电路和方法 A memory card detection circuit and method |
| 08/06/2014 | CN103971742A 具有内建测试驱动器的非易失性逻辑阵列 Has a built-in test drive nonvolatile logic arrays |
| 08/06/2014 | CN102063940B 非易失存储器和存储系统 Non-volatile memory and storage system |
| 08/06/2014 | CN102027549B 测试具有易受由偏置温度不稳定性所造成的阈值电压偏移影响的场效应晶体管的存储器装置 Memory means having a test subject to the threshold voltage shift by the influence caused by bias temperature instability of the field effect transistor |
| 08/05/2014 | US8799748 Non-volatile semiconductor memory device performing multi-level storage operation |
| 08/05/2014 | US8799747 Data hardening to compensate for loss of data retention characteristics in a non-volatile memory |
| 08/05/2014 | US8799746 Erasure coding and replication in storage clusters |
| 08/05/2014 | US8799745 Storage control apparatus and error correction method |
| 08/05/2014 | US8799744 Nonvolatile semiconductor memory and memory system |
| 08/05/2014 | US8799743 Error correction in multiple semiconductor memory units |
| 08/05/2014 | US8799732 Methodology for correlated memory fail estimations |
| 08/05/2014 | US8799727 Arithmetic processing apparatus and method of controlling arithmetic processing apparatus |
| 08/05/2014 | US8799726 Method and apparatus for testing high capacity/high bandwidth memory devices |
| 08/05/2014 | US8799725 Macro and command execution from memory array |
| 08/05/2014 | US8799724 Methods and systems for storing data in memory using zoning |
| 08/05/2014 | US8799704 Semiconductor memory component having a diverting circuit |
| 08/05/2014 | US8797815 Measuring device and a measuring method with histogram formation |
| 08/05/2014 | US8797814 Multi-test apparatus and method for testing a plurailty of semiconductor chips |
| 08/05/2014 | US8797813 Method and apparatus for memory power and/or area reduction |
| 08/05/2014 | US8797792 Non-reversible state at a bitcell having a first magnetic tunnel junction and a second magnetic tunnel junction |
| 07/31/2014 | WO2014116903A1 Non-volatile memory programming data preservation |
| 07/31/2014 | WO2014116301A1 Joint rewriting and error correction in write-once memories |
| 07/31/2014 | US20140215291 Systems and methods for error detection and correction in a memory module which includes a memory buffer |
| 07/31/2014 | US20140211582 Semiconductor Device Performing Stress Test |
| 07/31/2014 | US20140211581 Process variation skew in an sram column architecture |
| 07/31/2014 | US20140211580 Systems and methods for testing and assembling memory modules |
| 07/31/2014 | US20140211579 Apparatus, method and system to determine memory access command timing based on error detection |
| 07/31/2014 | US20140211576 Nonvolatile Logic Array with Built-In Test Drivers |
| 07/31/2014 | US20140211572 Nonvolatile Logic Array with Built-In Test Result Signal |
| 07/31/2014 | US20140211567 Low-Pin-Count Non-Volatile Memory Embedded in a Integrated Circuit without any Additional Pins for Access |
| 07/31/2014 | US20140211551 Mram self-repair with bist logic |
| 07/31/2014 | US20140211550 Read circuit for memory |
| 07/31/2014 | US20140211540 Method and apparatus for read measurement of a plurality of resistive memory cells |
| 07/31/2014 | DE102004020875B4 Verfahren und Vorrichtung zum Maskieren bekannter Ausfälle während Speichertestauslesungen Method and apparatus for masking known failures during congestion Stored readings |
| 07/30/2014 | CN102543213B Eeprom芯片的数据检错方法 Data Eeprom chip error detection method |
| 07/30/2014 | CN101477838B 一种与非快闪记忆体状态检测装置、系统及电子设备 One kind of the non-detecting state flash memory devices, systems and electronic devices |
| 07/29/2014 | US8793556 Systems and methods for reclaiming flash blocks of a flash drive |
| 07/29/2014 | US8793555 Method of controlling a semiconductor storage device |
| 07/29/2014 | US8793554 Switchable on-die memory error correcting engine |
| 07/29/2014 | US8793549 Low-cost design for register file testability |
| 07/29/2014 | US8793544 Channel marking for chip mark overflow and calibration errors |
| 07/29/2014 | US8793543 Adaptive read comparison signal generation for memory systems |
| 07/29/2014 | US8793540 Test apparatus and test method |
| 07/29/2014 | US8793430 Electronic system having memory with a physical block having a sector storing data and indicating a move status of another sector of the physical block |
| 07/29/2014 | US8792292 Providing row redundancy to solve vertical twin bit failures |
| 07/29/2014 | US8792288 Nonvolatile logic array with built-in test drivers |
| 07/24/2014 | WO2014113787A1 Scan chain in an integrated circuit |
| 07/24/2014 | WO2014113161A1 Determining soft data using a classification code |
| 07/24/2014 | US20140208174 Storage control system with data management mechanism and method of operation thereof |
| 07/24/2014 | US20140204693 Applying a voltage-delay correction to a non-defective memory block that replaces a defective memory block based on the actual location of the non-defective memory block |
| 07/24/2014 | US20140204687 System and method for performing address-based sram access assists |
| 07/24/2014 | US20140204671 Systems and methods of updating read voltages |
| 07/24/2014 | US20140204666 Robust Initialization with Phase Change Memory Cells in Both Configuration and Array |
| 07/23/2014 | EP2756502A1 Memory system with a layer comprising a dedicated redundancy area |
| 07/23/2014 | EP2756499A1 Improving sram cell writability |
| 07/23/2014 | CN103943152A 存储器的快速内建自测试系统及方法 Fast memory built-in self testing system and method |
| 07/23/2014 | CN103943151A 内存测试方法 Memory Test Methods |
| 07/23/2014 | CN103943150A 高性能和高可靠性闪存存储器的潜在的缓慢擦除位的动态检测方法 Dynamic test method potentially slow erasure bit high performance and reliability of flash memory |
| 07/23/2014 | CN102436850B 检测读取操作对临近单元干扰的方法 The method of detecting a read operation on the adjacent cell interference |
| 07/23/2014 | CN102426858B 一种检测存储单元漏电流的方法及系统 Method and system for detecting the memory cell drain current |
| 07/22/2014 | US8788909 Probabilistic error correction in multi-bit-per-cell flash memory |
| 07/22/2014 | US8788908 Data storage system having multi-bit memory device and on-chip buffer program method thereof |
| 07/22/2014 | US8788898 Remote testing system |
| 07/22/2014 | US8788894 Method of enhancing error correction performance and storage device using the method |
| 07/22/2014 | US8788893 Semiconductor device and memory device |
| 07/22/2014 | US8788891 Bitline deletion |
| 07/22/2014 | US8787133 Recording apparatus, recording method, and sparing destination selecting method |
| 07/22/2014 | US8787101 Stacked device remapping and repair |
| 07/22/2014 | US8787100 Non-volatile memory device generating a reset pulse based on a set pulse, and method of operating the same |
| 07/22/2014 | US8787079 Reading data from multi-level cell memory |
| 07/22/2014 | US8787074 Static random access memory test structure |
| 07/22/2014 | US8787065 Apparatuses and methods for determining stability of a memory cell |
| 07/22/2014 | US8786972 Magnetic recording disk drive with method for recovery of data from failed data sectors |
| 07/17/2014 | US20140201580 Systems and methods to update reference voltages in response to data retention in non-volatile memory |
| 07/17/2014 | US20140201579 Methods and circuits for disrupting integrated circuit function |
| 07/17/2014 | US20140198593 Redundancy circuit and semiconductor memory device including the same |
| 07/17/2014 | US20140198592 Fault Masking Method for Non-Volatile Memories |
| 07/17/2014 | US20140198581 Method of storing data in nonvolatile memory device and method of testing nonvolatile memory device |
| 07/17/2014 | US20140198580 Data path integrity verification |
| 07/17/2014 | US20140198573 Memory system and method of operation thereof |