| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 09/25/2013 | CN103325423A Data automatically-comparing test circuit of non-volatile memory |
| 09/25/2013 | CN103325422A SRAM timing sequence test circuit and test method |
| 09/25/2013 | CN103325421A Non-volatile memory checkerboard test circuit and detection method thereof |
| 09/25/2013 | CN103325420A Memory control circuit, method, and system |
| 09/25/2013 | CN103325411A Single event upset resisting reinforcing system and method used for FPGA (Field Programmable Gate Array) |
| 09/25/2013 | CN101697490B Decoding method applied to Reed-Solomon code-based ECC module |
| 09/24/2013 | US8543874 Macro and command execution from memory array |
| 09/24/2013 | US8543873 Multi-site testing of computer memory devices and serial IO ports |
| 09/24/2013 | US8543863 Efficiency of hardware memory access using dynamically replicated memory |
| 09/24/2013 | US8543801 Booting method using a backup memory in place of a failed main memory |
| 09/24/2013 | US8542545 Repairing soft failures in memory cells in SRAM arrays |
| 09/19/2013 | WO2013138190A1 Physical page, logical page, and codeword correspondence |
| 09/19/2013 | WO2013138083A1 Error protection for memory devices |
| 09/19/2013 | WO2013138028A1 Techniques for accessing column selecting shift register with skipped entries in non-volatile memories |
| 09/19/2013 | WO2013137851A1 Distributed codeword portions |
| 09/19/2013 | US20130246867 Test circuit, memory system, and test method of memory system |
| 09/19/2013 | US20130242679 Semiconductor memory device for controlling write recovery time |
| 09/18/2013 | CN103310853A Power supply switching circuit with built-in self test |
| 09/18/2013 | CN103310852A MBIST (Memory Built In Self Test) controller structure system based on IEEE (Institute of Electrical and Electronics Engineers) 1500 standard and compatible with SRAM/ROM (Static Random Access Memory/Read Only Memory) |
| 09/18/2013 | CN103310851A Self-repairing SRAM (Static Random Access Memory) controller design for DTMB (Digital Terrestrial Multimedia Broadcasting) demodulation chip |
| 09/18/2013 | CN103310850A Built-in self-test structure and method for on-chip network resource node storage device |
| 09/18/2013 | CN103310849A Test circuit, memory system, and test method of memory system |
| 09/18/2013 | CN103310848A Method and apparatus using memory |
| 09/18/2013 | CN102332309B DRAM (Dynamic Random Access Memory) source synchronization test method and circuit |
| 09/18/2013 | CN101645310B Flash memory equipment, method and system for managing flash memory |
| 09/17/2013 | US8539315 Semiconductor storage device, nonvolatile semiconductor memory test method, and medium |
| 09/17/2013 | US8539313 System and method of data encoding |
| 09/17/2013 | US8539311 System and method for data recovery in multi-level cell memories |
| 09/17/2013 | US8539309 System and method for responding to error detection |
| 09/17/2013 | US8539289 Memory testing system and method of computing device |
| 09/17/2013 | US8539126 Capacitive multidrop bus compensation |
| 09/17/2013 | US8537628 Test mode control circuit in semiconductor memory device and test mode entering method thereof |
| 09/17/2013 | US8537601 Memory controller with selective data transmission delay |
| 09/12/2013 | WO2013134071A1 Apparatuses and methods for combining error coding and modulation schemes |
| 09/12/2013 | WO2013134066A1 Apparatuses and methods including error correction code organization |
| 09/12/2013 | WO2013134053A1 Voltage mode sensing for low power flash memory |
| 09/12/2013 | WO2013132806A1 Nonvolatile logic integrated circuit and nonvolatile register error bit correction method |
| 09/12/2013 | WO2013132532A1 Semiconductor storage device having nonvolatile semiconductor memory |
| 09/12/2013 | US20130235685 Semiconductor memory device and method of screening the same |
| 09/12/2013 | US20130235677 Circuit for parallel bit test of semiconductor memory device |
| 09/12/2013 | US20130235649 Direct relative measurement of memory durability |
| 09/12/2013 | DE10197113B3 Verfahren zum Aktivieren eines speziellen Programmiermodus eines Speichers und Einrichtung mit einem Speicher mit speziellem Programmiermodus A method for activating a special programming mode of a memory device with a memory and with a special programming mode |
| 09/12/2013 | DE10151609B4 Schaltung für einen elektronischen Halbleiterbaustein Circuit for an electronic semiconductor device |
| 09/11/2013 | CN203192417U Reading-speed measuring circuit based on automatic and periodic reading operation |
| 09/11/2013 | CN103295650A Test method, power supply device, power supply evaluation device and simulation method |
| 09/11/2013 | CN103295649A Method for improving reliability of a nonvolatile memory |
| 09/11/2013 | CN103295648A Storage device unit restoring device and method and storage device system comprising device |
| 09/11/2013 | CN103295647A Data duplication method and device of memory array with redundancy memory |
| 09/11/2013 | CN103295646A Built-in self-test circuit applied on high-speed output/input end |
| 09/11/2013 | CN103295645A Scanning detection method and system for dynamic memory |
| 09/11/2013 | CN103295644A 存储器装置 The memory device |
| 09/10/2013 | US8533578 Error detection in a content addressable memory (CAM) and method of operation |
| 09/10/2013 | US8533572 Error correcting code logic for processor caches that uses a common set of check bits |
| 09/10/2013 | US8533571 Lossy coding of signals |
| 09/10/2013 | US8533570 Magnetic recording apparatus |
| 09/10/2013 | US8533569 Apparatus, system, and method for managing data using a data pipeline |
| 09/10/2013 | US8533568 LDPC encoding methods and apparatus |
| 09/10/2013 | US8533566 Method and apparatus for storing data |
| 09/10/2013 | US8533565 Cache controller and cache controlling method |
| 09/10/2013 | US8533563 Memory read-out |
| 09/10/2013 | US8533562 Data protection after possible write abort or erase abort |
| 09/10/2013 | US8533550 Method and system to improve the performance and/or reliability of a solid-state drive |
| 09/10/2013 | US8533541 Verification support of circuit blocks having independent clock domains |
| 09/06/2013 | WO2013130230A1 Saving of data in cases of word-line to word-line short in memory arrays |
| 09/05/2013 | US20130232393 Error detection and correction codes for channels and memories with incomplete error characteristics |
| 09/05/2013 | US20130232386 Memory devices, testing systems and methods |
| 09/05/2013 | US20130232385 Latency Detection in a Memory Built-In Self-Test by Using a Ping Signal |
| 09/05/2013 | US20130229886 Repair device and method for integrated circuit structured arrays |
| 09/05/2013 | US20130229883 Systems, memories, and methods for repair in open digit memory architectures |
| 09/05/2013 | US20130229877 Memory with bit line current injection |
| 09/04/2013 | CN203179556U Non-welding in-circuit chip RAM (random access memory) detection system |
| 09/04/2013 | CN103280243A Display method of memory multi-bit upset based on word line segmentation |
| 09/04/2013 | CN103280242A Configurable background refreshing method suitable for performing EDAC (Error Detection And Correction) on on-chip memory |
| 09/04/2013 | CN103280241A Test circuit and test method of memorizer |
| 09/04/2013 | CN103280240A Detecting method of memory multi-bit upset based on word line segmentation |
| 09/04/2013 | CN102306504B Sample collecting method and method for predicting health condition of copying equipment |
| 09/04/2013 | CN101615433B Storage device and testing method thereof |
| 09/03/2013 | US8527841 Apparatus, system, and method for using multi-level cell solid-state storage as reduced-level cell solid-state storage |
| 09/03/2013 | US8527840 System and method for restoring damaged data programmed on a flash device |
| 09/03/2013 | US8527839 On-the-fly repair method for memory |
| 09/03/2013 | US8527837 Selective error control coding in memory devices |
| 09/03/2013 | US8527836 Rank-specific cyclic redundancy check |
| 09/03/2013 | US8527835 Method for secure data transfer |
| 09/03/2013 | US8527820 Semiconductor device and test method thereof |
| 09/03/2013 | US8527819 Data storage in analog memory cell arrays having erase failures |
| 09/03/2013 | US8526254 Test cells for an unprogrammed OTP memory array |
| 09/03/2013 | US8526253 Method of screening static random access memories for pass transistor defects |
| 09/03/2013 | US8526252 Quiescent testing of non-volatile memory array |
| 08/29/2013 | WO2013126109A1 Temperature based compensation during verify operations for non-volatile storage |
| 08/29/2013 | US20130227362 Systems and methods of using dynamic data for wear leveling in solid-state devices |
| 08/29/2013 | US20130227361 Hardwired remapped memory |
| 08/29/2013 | US20130227342 Systems and methods for storing and retrieving a defect map in a dram component |
| 08/29/2013 | US20130223172 Self-repair integrated circuit and repair method |
| 08/29/2013 | US20130223171 Semiconductor Device Capable of Rescuing Defective Characteristics Occurring After Packaging |
| 08/29/2013 | US20130223170 Semiconductor memory device |
| 08/29/2013 | US20130223168 Deeply pipelined integrated memory built-in self-test (bist) system and method |
| 08/29/2013 | US20130223159 Memory with variable strength sense amplifier |
| 08/29/2013 | DE102013101441A1 Memory system transfers error address detected by test apparatus to memory device, and stores detected error address in non volatile memory device |
| 08/29/2013 | DE102013100030A1 Halbleitervorrichtung, die in der Lage ist, nach dem Häusen auftretende defekte Eigenschaften zu retten A semiconductor device which is able to save occurring after the defective housings properties |
| 08/28/2013 | EP2631915A2 Programming a memory with varying bits per cell |