Patents
Sitemap › G11 - Information storage › G11C - Static stores › G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
06/2014
06/03/2014US8745453 Circuits, architectures, apparatuses, systems, methods, algorithms, software and firmware for using reserved cells to indicate defect positions
06/03/2014US8745452 Resistive memory device and test systems and methods for testing the same
06/03/2014US8745450 Fully-buffered dual in-line memory module with fault correction
06/03/2014US8743644 Semiconductor integrated circuit having array E-fuse and driving method thereof
06/03/2014US8743637 Memory device including redundant memory cell block
06/03/2014US8743633 Integrated semiconductor device
05/2014
05/30/2014WO2014043574A3 Reference cell repair scheme
05/29/2014US20140149810 System and method of reducing test time via address aware bist circuitry
05/29/2014US20140146626 Addressing, Command Protocol, and Electrical Interface for Non-Volatile Memories Utilized in Recording Usage Counts
05/29/2014US20140146625 Redundancy system for non-volatile memory
05/29/2014US20140146624 Memory modules and memory systems
05/29/2014US20140146613 Operating method of memory having redundancy circuitry
05/28/2014DE102004014242B4 Integrierter Baustein mit mehreren voneinander getrennten Substraten Integrated module with several separate substrates
05/28/2014CN103824600A 存储器测试方法及装置 Method and apparatus for memory test
05/28/2014CN103824599A 改变存储器装置中的部分数据的存储器控制器及其方法 Changing the memory device in the data portion of the memory controller and method
05/28/2014CN103824598A 错误检查及校正方法以及错误检查及校正电路 Error checking and correction, and error checking and correcting circuit
05/28/2014CN103824592A 使用模数转换器的非易失性存储器强健启动 Non-volatile memory using the ADC to start strong
05/28/2014CN103824575A 基于谐波比率的缺陷分类器 Based on Harmonic Ratio defect classification
05/27/2014US8738996 Method and system for ceasing access to memory cells of flash memory when less than a maximum number of correctable errors for an error correction code exists
05/27/2014US8738995 Memory subsystem having a first portion to store data with error correction code information and a second portion to store data without error correction code information
05/27/2014US8738994 Memory controller, memory system, and operating method
05/27/2014US8738993 Memory device on the fly CRC mode
05/27/2014US8738987 Memory controller and memory management method
05/27/2014US8738977 Yield-enhancing device failure analysis
05/27/2014US8738976 Memory error detecting apparatus and method
05/27/2014US8737150 Semiconductor device and production method thereof
05/27/2014US8737149 Semiconductor device performing stress test
05/27/2014US8737148 Selective retirement of blocks
05/27/2014US8737118 Semiconductor memory device and test method therefor
05/27/2014US8736291 Methods for defect testing of externally accessible integrated circuit interconnects
05/22/2014WO2014078863A1 Magnetoresistive random memory tester comprising electromagnet vertical to wafer for application of magnetic field to memory
05/22/2014WO2014078695A1 Memory segment remapping to address fragmentation
05/22/2014WO2014077980A1 Three-dimensional flash memory system
05/22/2014WO2014077154A1 Semiconductor device
05/22/2014US20140143619 Memory test with in-line error correction code logic
05/22/2014US20140143617 Flash interface error injector
05/22/2014US20140143616 Defect scan and manufacture test
05/22/2014US20140140155 Semiconductor device and method including redundant bit line provided to replace defective bit line
05/22/2014US20140140153 Repair control circuit and semiconductor memory device including the same
05/21/2014CN103814410A 具有包括专用冗余区域的层的存储系统 Having a layer comprising a dedicated redundant area of ​​the storage system
05/21/2014CN103811080A 存储器测试系统以及存储器测试方法 Memory test system and memory test methods
05/21/2014CN103811079A 半导体器件的测试方法和半导体测试装置 Test method for semiconductor devices and semiconductor testing device
05/21/2014CN103811078A 闪存的数据修复方法 Flash data recovery methods
05/21/2014CN103811077A 闪存中的资料补偿方法 Flash compensation method of data
05/21/2014CN103811076A 存储模块、具有其的存储系统及其读写方法 Storage module having the same storage system and method for reading and writing
05/21/2014CN103811075A 错误检测和纠正装置及方法、失配检测装置及存储器系统 Error detection and correction apparatus and method, mismatch detection device and memory system
05/21/2014CN103811074A 闪存的储存状态决定方法及其相关系统 A method of determining the state of the flash memory storage system and its associated
05/21/2014CN103811072A 一种高可靠性NAND Flash的读取方法及其系统 A highly reliable NAND Flash reading method and system
05/21/2014CN103811071A 一种高可靠性NAND Flash的读取方法及其系统 A highly reliable NAND Flash reading method and system
05/21/2014CN103811070A 一种高可靠性NAND Flash的读取方法及其系统 A highly reliable NAND Flash reading method and system
05/21/2014CN103811059A 一种非挥发存储器参考校准电路与方法 A non-volatile memory and method with reference to calibration circuit
05/21/2014CN103811058A 基于忆阻的非易失性存储器、读写擦除操作方法及测试电路 Memristive based nonvolatile memory, reading and writing the erase operation method and the test circuit
05/21/2014CN102426861B 一种测试ddr3数据有效窗口的方法和装置 Method and apparatus for testing the data valid window ddr3
05/21/2014CN101635162B 堆叠存储器模块和系统 The stacked memory modules and systems
05/20/2014US8732557 Data protection across multiple memory blocks
05/20/2014US8732555 Addressing variations in bit error rates amongst data storage segments
05/20/2014US8732554 Data storage device and method for checking and correcting errors
05/20/2014US8732553 Memory system and control method thereof
05/20/2014US8732552 Block management method, memory controller and memory storage device thereof
05/20/2014US8732551 Memory controller with automatic error detection and correction
05/20/2014US8732538 Programmable data storage management
05/20/2014US8730747 Semiconductor device including semiconductor memory circuit
05/20/2014US8730720 Nonvolatile memory cell operating by increasing order in polycrystalline semiconductor material
05/15/2014WO2014074390A1 Memory repair using external tags
05/15/2014US20140136909 Testing of srams
05/15/2014US20140133254 Test method of semiconductor device and semiconductor test apparatus
05/15/2014US20140133253 System and Method for Memory Testing
05/15/2014US20140133249 Apparatuses, integrated circuits, and methods for measuring leakage current
05/15/2014US20140133247 Semiconductor memory device and method for testing the same
05/15/2014DE102013112194A1 Testverfahren für eine Halbleitervorrichtung und Halbleitertestvorrichtung Test method for a semiconductor device, and semiconductor testing device
05/14/2014CN103794253A 一种Nand闪存和读取其配置信息的方法和装置 A method and apparatus Nand Flash and read its configuration information
05/14/2014CN103793335A 存储控制设备、存储设备、信息处理系统及存储控制方法 Storage control device, a storage device, an information processing system and storage control method
05/14/2014CN102436842B 存储器储存装置、存储器控制器与产生对数似然比的方法 A memory storage device, a memory controller and method for generating a log-likelihood ratio
05/14/2014CN102339647B 一种检错/纠错校验模块的检测方法及装置 Method and apparatus for detecting an error detection / correction calibration module
05/14/2014CN102201264B 基于量值的检测并对硬盘缺陷区域进行分类的方法 The method is based on the classification and hard to detect defective area money
05/14/2014CN101667462B 适于内存的修复模块,使用其的修复装置及其修复方法 Memory module suitable for repair, using the same method for prosthetic devices and repair
05/13/2014US8726139 Unified data masking, data poisoning, and data bus inversion signaling
05/13/2014US8726130 Dynamic buffer management in a NAND memory controller to minimize age related performance degradation due to error correction
05/13/2014US8726129 Methods of writing and recovering erasure coded data
05/13/2014US8726128 Non-volatile memory module, non-volatile memory processing system, and non-volatile memory managing method thereof
05/13/2014US8726127 Utilizing a dispersed storage network access token module to access a dispersed storage network memory
05/13/2014US8726120 Storing encoded data slices in a dispersed storage unit
05/13/2014US8726107 Measurement of latency in data paths
05/13/2014US8726106 Semiconductor device having redundant select line to replace regular select line
05/13/2014US8724418 Memory cell of semiconductor memory device and method for driving the same
05/13/2014US8724417 Semiconductor system and device, and method for controlling refresh operation of stacked chips
05/13/2014US8724414 System and method to select a reference cell
05/13/2014US8724409 Semiconductor integrated circuit
05/08/2014WO2014070200A1 Selective error correcting code and memory access granularity switching
05/08/2014WO2014070160A1 Repairing a memory device
05/08/2014WO2014068756A1 Semiconductor integrated circuit, semiconductor storage device, and method for controlling semiconductor storage device
05/08/2014US20140129883 Hardware-based memory initialization
05/08/2014US20140126314 Memory Architecture With Local And Global Control Circuitry
05/08/2014US20140126313 Chip with embedded non-volatile memory and testing method therefor
05/08/2014US20140126312 Sense amplifier soft-fail detection circuit
05/08/2014US20140126308 Integrated circuit and memory device
05/08/2014US20140126304 Memory system and operating method thereof
05/08/2014US20140126302 Memory device and test method thereof
05/08/2014US20140126301 Memory device and test method thereof
05/07/2014EP2727115A2 Rank-specific cyclic redundancy check
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