Patents
Sitemap › G11 - Information storage › G11C - Static stores › G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
09/2014
09/09/2014US8832507 Systems and methods for generating dynamic super blocks
09/09/2014US8832506 Bit error rate based wear leveling for solid state drive memory
09/09/2014US8830749 Semiconductor memory device and method for controlling the same
09/09/2014US8830746 Optimized threshold search in analog memory cells using separator pages of the same type as read pages
09/09/2014US8830743 Method of operating memory controller, memory controller, memory device and memory system
09/09/2014US8830728 Resistance change memory device and current trimming method thereof
09/09/2014US8830727 Multi-level memory cell with continuously tunable switching
09/09/2014US8829933 Semiconductor apparatus and probe test method thereof
09/04/2014WO2014133912A1 Reram forming with reset and iload compensation
09/04/2014US20140250348 Controller and Method for Interfacing Between a Host Controller in a Host and a Flash Memory Device
09/04/2014US20140247679 Semiconductor storage device and testing method
09/04/2014US20140247678 Programmable memory repair scheme
09/04/2014US20140247677 Method of accessing semiconductor memory and semiconductor circuit
09/04/2014DE102012102080B4 Speicherschaltung, integrierte Schaltung und Verfahren mit Fehlerkorrekturen Memory circuit, integrated circuit and method with error correction
09/02/2014US8826100 Adjustable memory allocation based on error correction
09/02/2014US8826098 Data signatures to determine successful completion of memory backup
09/02/2014US8826097 Memory scrubbing
09/02/2014US8826086 Memory card test interface
09/02/2014US8826059 Apparatus and method for buffering data between memory controller and DRAM
09/02/2014US8825978 Memory apparatus
09/02/2014US8825948 Memory controller with emulative internal memory buffer
09/02/2014US8824238 Memory device with bi-directional tracking of timing constraints
09/02/2014US8824236 Memory access control device and manufacturing method
09/02/2014US8824228 Integrated circuit chip and memory device
09/02/2014US8824227 Parallel test circuit and method of semiconductor memory apparatus
09/02/2014US8824226 Providing capacitors to improve radiation hardening in memory elements
09/02/2014US8824219 Power source circuit and semiconductor memory circuit using the same
08/2014
08/28/2014WO2014128246A1 Method and device for storing and reading reliable information in a nand array
08/28/2014US20140245089 Semiconductor memory device
08/28/2014US20140245088 Semiconductor test device and semiconductor test method
08/28/2014US20140245087 Semiconductor Integrated Circuit with Bist Circuit
08/28/2014US20140241086 Memory structure
08/28/2014US20140241085 Semiconductor memory device for performing disable operation using anti-fuse and method thereof
08/28/2014US20140241084 Method and apparatus for repairing defective memory cells
08/28/2014US20140241076 Semiconductor memory device, method of testing the same and method of operating the same
08/28/2014US20140241059 Method and device for storing and reading reliable information in a nand array
08/28/2014US20140241043 Electronic device and method for operating electronic device
08/28/2014DE10334387B4 System zum Überwachen interner Spannungen auf einer integrierten Schaltung A system for monitoring internal voltages on an integrated circuit
08/28/2014DE102011010946B4 Halbleitervorrichtung und Verfahren zum Identifizieren und Korrigieren eines Bitfehlers in einer FRAM-Speichereinheit einer Halbleitervorrichtung A semiconductor device and method of identifying and correcting a bit error in a FRAM memory unit of a semiconductor device
08/27/2014EP2770507A2 Memory circuits, method for accessing a memory and method for repairing a memory
08/27/2014EP2769381A1 System and method for mram having controlled averagable and isolatable voltage reference
08/26/2014US8819522 Storage device array system, information processing apparatus, storage device array control method, and program
08/26/2014US8819521 Systems and methods for short media defect detection using non-binary coded information
08/26/2014US8819509 Integrated circuit, test circuit, and method of testing
08/26/2014US8819505 Data processor having disabled cores
08/26/2014US8819504 Nonvolatile memory device and method for operating the same
08/26/2014US8819503 Apparatus and method for determining an operating condition of a memory cell based on cycle information
08/26/2014US8819391 Memory controller with enhanced block management techniques
08/26/2014US8819367 Accelerated translation power recovery
08/26/2014US8819332 Nonvolatile storage device performing periodic error correction during successive page copy operations
08/26/2014US8817561 Method for estimating channel characteristics of nonvolatile memory device
08/26/2014US8817560 Semiconductor memory device having redundant fuse circuit
08/26/2014US8817559 Semiconductor device and manufacturing method thereof
08/21/2014US20140237320 Memory system
08/21/2014US20140237307 Generic address scrambler for memory circuit test engine
08/21/2014US20140237298 Methods, systems, and computer readable media for early detection of potential flash failures using an adaptive system level algorithm based on flash program verify
08/21/2014US20140237287 Implementing raid in solid state memory
08/21/2014US20140233335 Semiconductor devices
08/21/2014US20140233314 Memory cell coupling compensation
08/19/2014US8812936 Using slow response memory device on a fast response interface
08/19/2014US8812935 Using a data ECC to detect address corruption
08/19/2014US8812934 Techniques for storing bits in memory cells having stuck-at faults
08/19/2014US8812933 Memory system and operating method thereof
08/19/2014US8812931 Memory system with ECC-unit and further processing arrangement
08/19/2014US8812920 Test mode signal generation circuit
08/19/2014US8812919 Method and apparatus for evaluating and optimizing a signaling system
08/19/2014US8812918 Method and apparatus for evaluating and optimizing a signaling system
08/19/2014US8812917 Method and device for row and column interleaving of blocks of variable size
08/19/2014US8811101 SIP semiconductor system
08/19/2014US8811100 Cell array and memory device including the same
08/19/2014US8811076 Systems and methods of updating read voltages
08/19/2014US8809734 Methods and systems for thermal-based laser processing a multi-material device
08/14/2014WO2014124218A1 OPTIMIZING fuseROM USAGE FOR MEMORY REPAIR
08/14/2014US20140229798 Efficient data storage in multi-plane memory devices
08/14/2014US20140229777 Autorecovery after manufacturing/system integration
08/14/2014US20140229776 Dynamic hard error detection
08/14/2014US20140226423 Device
08/14/2014US20140226422 Semiconductor memory device and method of testing the same
08/13/2014CN203773959U 无线记忆卡测试装置 Wireless memory card test device
08/13/2014CN103988263A 用以减少相变存储器的读取错误的读取偏置管理 To reduce the reading error of the phase change memory read bias Management
08/13/2014CN103988182A 使用奇偶校验和冗余行的动态错误处理 Using dynamic redundant row parity and error handling
08/13/2014CN103985417A 一种基于fpga的tcam板级bist方法及其系统 An fpga based tcam method and system board level bist
08/13/2014CN103985416A 向存储单元格施加偏置信号以反转存储器单元格的阻抗漂移 Ge Shijia bias signal to the memory cell in the memory cell impedance inversion drift
08/13/2014CN103985410A 一种存储装置及用于存储装置的数据访问方法 A storage device and a data storage device access method for
08/13/2014CN103984506A 闪存存储设备数据写的方法和系统 Flash memory storage device and system data write method
08/13/2014CN102543214B Sonos存储器工艺中在线监控ono膜质量的方法 Sonos memory processes ono film quality online monitoring method
08/13/2014CN102486939B 存储器的联合测试行动组测试方法和装置 Joint Test Action Group Test Method and apparatus for memory
08/12/2014US8806318 Fault position determining circuit, storage device and information processing apparatus
08/12/2014US8806303 Apparatuses, systems, devices, and methods of replacing at least partially non-functional portions of memory
08/12/2014US8806302 Semiconductor memory device and data processing method thereof
08/12/2014US8806301 Data writing method for a flash memory, and controller and storage system using the same
08/12/2014US8806300 Storage subsystem
08/12/2014US8806299 Method and apparatus for compressing data sectors in storage drive
08/12/2014US8806296 Scheduled or gradual redundancy encoding schemes for data storage
08/12/2014US8806295 Mis-correction and no-correction rates for error control
08/12/2014US8806294 Error detection within a memory
08/12/2014US8806285 Dynamically allocatable memory error mitigation
08/12/2014US8806284 Method for bit-error rate testing of resistance-based RAM cells using a reflected signal
08/12/2014US8806283 Automatic and on-demand testing of non-volatile storage devices
08/12/2014US8806095 Electronic measuring device and method of converting serial data to parallel data for storage using the same
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