Patents
Sitemap › G11 - Information storage › G11C - Static stores › G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
12/2013
12/25/2013EP2677684A1 Method for testing the operation of PUFs
12/25/2013CN102915770B Method for reducing inter-crosstalk of internal data of flash memory chip, flash memory storage system and controller thereof
12/25/2013CN102915767B Method, device and system for improving SSD (solid state disk) response speed on basis of data compressibility
12/25/2013CN101901629B Nonvolatile memory protecting system and method
12/25/2013CN101430929B Method and device for irreversibly programming and reading nonvolatile memory cells
12/24/2013US8615690 Controller of memory device and method for operating the same
12/24/2013US8615689 Correcting errors in longitudinal position (LPOS) words
12/24/2013US8615688 Method and system for iteratively testing and repairing an array of memory cells
12/24/2013DE112004001781B4 Schaltung und Verfahren zum Codieren von in einem nichtflüchtigen Speicherarray zu speichernden Daten Circuit and method of encoding to be stored in a nonvolatile memory array data
12/19/2013WO2013186377A1 Method for recording data, method for detecting errors of access to a memory, and associated device
12/19/2013WO2012065018A8 Estimating wear of non-volatile, solid state memory
12/19/2013US20130336077 Semiconductor memory device and method for testing same
12/19/2013US20130336076 Memory device, operation method thereof, and memory system having the same
12/19/2013DE112006002300B4 Vorrichtung zum Stapeln von DRAMs Device for stacking DRAMs
12/19/2013DE102012105159A1 Fehlertolerante Speicher Fault-tolerant memory
12/19/2013DE102007044110B4 Verfahren und Schaltung zum Einstellen der Phasenverschiebung Method and circuit for adjusting the phase shift
12/18/2013CN103460294A Measurement initialization circuitry
12/18/2013CN103456370A Monitoring device of memorizer
12/18/2013CN103456369A Repair control circuit and semiconductor integrated circuit using the same
12/18/2013CN103456368A Methods and apparatus for temporarily storing parity information for data stored in a storage device
12/18/2013CN103456367A Stress-based techniques for detecting an imminent readfailure in a non-volatile memory array
12/18/2013CN103456366A Semiconductor memory device including self-contained test unit and test method thereof
12/18/2013CN103456349A Audio player fixing device
12/18/2013CN103455436A RAM (random access memory) detection method and system
12/18/2013CN103454575A System, PCBA board and method for achieving PCBA board testing
12/17/2013US8612832 Mechanisms and techniques for providing cache tags in dynamic random access memory
12/17/2013US8612830 Method of correcting error of flash memory device, and, flash memory device and storage system using the same
12/17/2013US8612829 Communication apparatus
12/17/2013US8612828 Error correction mechanisms for 8-bit memory devices
12/17/2013US8612824 Semiconductor memory device and controlling method
12/17/2013US8612813 Circuit and method for efficient memory repair
12/17/2013US8612812 Semiconductor memory device, test circuit, and test operation method thereof
12/17/2013US8612811 Defective-ratio predicting method, defective-ratio predicting program, managing method for semiconductor manufacturing apparatus, and manufacturing method for semiconductor device
12/17/2013US8611164 Device and method for detecting resistive defect
12/12/2013WO2013184855A1 Memory with bank-conflict-resolution (bcr) module including cache
12/12/2013WO2013183827A1 Method and circuit for correcting errors in interfered channel environment and a flash memory device using the same
12/12/2013US20130332802 Semiconductor storage device, nonvolatile semiconductor memory test method, and medium
12/12/2013US20130332800 Secondary memory to store error correction information
12/12/2013US20130332798 Correcting data in a memory
12/12/2013US20130332785 Testing of non stuck-at faults in memory
12/12/2013US20130332784 Apparatus and method for testing a memory
12/12/2013US20130332783 Integrity of an address bus
12/12/2013US20130332769 In-field block retiring
12/12/2013US20130329510 Stacked device remapping and repair
12/12/2013US20130329509 Semiconductor memory device having redundant fuse circuit
12/12/2013US20130329508 Methods And Devices For Determining Logical To Physical Mapping On An Integrated Circuit
12/11/2013CN103440882A Apparatus and method for testing setup/hold time
12/11/2013CN101937726B Fast data eye retraining for a memory
12/11/2013CN101740138B Method and system for testing access time delay of memory
12/11/2013CN101536109B Method of error correction in mbc flash memory
12/10/2013US8607124 System and method for setting a flash memory cell read threshold
12/10/2013US8607123 Control circuit capable of identifying error data in flash memory and storage system and method thereof
12/10/2013US8607121 Selective error detection and error correction for a memory interface
12/10/2013US8607120 Semiconductor memory device for performing additional ECC correction according to cell pattern and electronic system including the same
12/10/2013US8607110 I-R voltage drop screening when executing a memory built-in self test
12/10/2013US8607105 Memory test circuit and memory test techniques
12/10/2013US8605526 Memory reliability verification techniques
12/10/2013CA2709424C Adapting word line pulse widths in memory systems
12/05/2013WO2013180893A1 Threshold voltage adjustment for a select gate transistor in a stacked non-volatile memory device
12/05/2013WO2013180714A1 Local error detection and global error correction
12/05/2013WO2013179594A1 Semiconductor storage device
12/05/2013US20130326296 Nonvolatile memory device and error correction methods thereof
12/05/2013US20130326295 Semiconductor memory device including self-contained test unit and test method thereof
12/05/2013US20130326294 3-D Memory and Built-In Self-Test Circuit Thereof
12/05/2013US20130326293 Memory error test routine
12/05/2013US20130326292 Memories and methods for performing column repair
12/05/2013US20130325206 Data processing device, microcontroller, and self-diagnosis method of data processing device
12/05/2013US20130322176 On-chip memory testing
12/05/2013US20130322171 Methods of operating nonvolatile memory devices that support efficient error detection
12/05/2013US20130322160 Memory device to correct defect cell generated after packaging
12/04/2013EP2669895A2 Stress-based techniques for detecting an imminent readfailure in a non-volatile memory array
12/04/2013CN103426482A Memory controller, storage device and error correction method
12/04/2013CN101996685B Error control method of storage management data and error controller
12/04/2013CN101765889B Backup line assignment device, memory saving device, backup line assignment method, memory manufacturing method
12/03/2013US8601348 Error checking addressable blocks in storage
12/03/2013US8601346 System and method for generating parity data in a nonvolatile memory controller by using a distributed processing technique
12/03/2013US8601332 Systems and methods for monitoring a memory system
12/03/2013US8601331 Defective memory block remapping method and system, and memory device and processor-based system using same
12/03/2013US8601330 Device and method for repair analysis
12/03/2013US8601329 Test apparatus and test method
12/03/2013US8601327 Semiconductor memory device
12/03/2013US8599630 Semiconductor integrated circuit including column redundancy fuse block
11/2013
11/28/2013US20130315007 Test circuit and method of semiconductor memory apparatus
11/28/2013US20130314992 Semiconductor memory and method of controlling the same
11/27/2013CN103413571A Memory and method realizing error detection and error correction through utilizing memory
11/27/2013CN103413570A Side edge terminal board of internal memory detector
11/27/2013CN101727989B NAND FLASH memory chip test system
11/26/2013US8595599 Data decoding method and apparatus and receiver and communication system applying the same
11/26/2013US8595597 Adjustable programming speed for NAND memory devices
11/26/2013US8595596 Method and apparatus for dispersed storage of streaming data
11/26/2013US8595595 Identifying lost write errors in a raid array
11/26/2013US8595594 Data processing method, memory controller, and memory storage device
11/26/2013US8595592 Memory system
11/26/2013US8595591 Interference-aware assignment of programming levels in analog memory cells
11/26/2013US8595572 Data storage device with metadata command
11/26/2013US8593894 Semiconductor memory device having fuse elements programmed by irradiation with laser beam
11/21/2013WO2013171806A1 Semiconductor storage device and control method of nonvolatile memory
11/21/2013WO2013170382A1 A power up detection system for a memory device
11/21/2013US20130311854 Semiconductor storage device and control method of nonvolatile memory
11/21/2013US20130308402 Test flow to detect a latent leaky bit of a non-volatile memory
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