| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 06/27/2013 | US20130163355 Memory device |
| 06/27/2013 | US20130163347 Semiconductor device |
| 06/27/2013 | US20130163312 Sram timing tracking circuit |
| 06/26/2013 | EP2608212A1 Semiconductor integrated circuit and method of testing semiconductor integrated circuit |
| 06/26/2013 | EP2608211A1 Method of testing a flash memory |
| 06/26/2013 | EP2608207A1 Semiconductor device with through-silicon vias |
| 06/26/2013 | CN203026141U Flash board for test |
| 06/26/2013 | CN103180909A Registers with full scan capability |
| 06/26/2013 | CN103177773A Chip for improving pad test coverage and related method thereof |
| 06/26/2013 | CN103177772A Flash memory test method |
| 06/26/2013 | CN103177771A Recoverable multilayer memory chip stack and method |
| 06/26/2013 | CN103177770A Memory structure, repair system and method for testing the same |
| 06/26/2013 | CN103177769A Method and device for optimizing mistake correcting mechanism |
| 06/26/2013 | CN103177768A BIST (Built In Self Test) address scanning circuit of memorizer and scanning method thereof |
| 06/26/2013 | CN102201268B Device and method for increasing the test efficiency of chip |
| 06/26/2013 | CN101128803B Enabling special modes within a digital device |
| 06/25/2013 | US8473823 Encoding device and decoding device |
| 06/25/2013 | US8473816 Data verification using checksum sidefile |
| 06/25/2013 | US8473815 Methods and systems of a flash memory controller and an error correction code (ECC) controller using variable-length segmented ECC data |
| 06/25/2013 | US8473814 MLC self-RAID flash data protection scheme |
| 06/25/2013 | US8473813 Methods of cell population distribution assisted read margining |
| 06/25/2013 | US8473810 Memory chip having a security function and for which reading and writing of data is controlled by an authenticated controller |
| 06/25/2013 | US8473809 Data coding for improved ECC efficiency |
| 06/25/2013 | US8473808 Semiconductor memory having non-standard form factor |
| 06/25/2013 | US8473791 Redundant memory to mask DRAM failures |
| 06/25/2013 | US8472265 Repairing circuit for memory circuit and method thereof and memory circuit using the same |
| 06/20/2013 | WO2013090520A1 Dynamic error handling using parity and redundant rows |
| 06/20/2013 | WO2013090500A2 Propeller pump and pump station |
| 06/20/2013 | WO2013089950A1 Read bias management to reduce read errors for phase change memory |
| 06/20/2013 | WO2013089715A1 Storage of codeword portions |
| 06/20/2013 | US20130159814 Semiconductor storage device, nonvolatile semiconductor memory test method, and medium |
| 06/20/2013 | US20130159798 Non-volatile memory device and operating method thereof |
| 06/20/2013 | US20130159797 Apparatus and methods for indicating the health of removable storage devices |
| 06/20/2013 | US20130155796 Fabrication and testing method for nonvolatile memory devices |
| 06/20/2013 | US20130155795 Methodology for Recovering Failed Bit Cells in an Integrated Circuit Memory |
| 06/20/2013 | US20130155794 Repairable multi-layer memory chip stack and method thereof |
| 06/20/2013 | US20130155759 Test Structures, Methods of Manufacturing Thereof, Test Methods, and MRAM Arrays |
| 06/20/2013 | DE102009010886B4 Erkennung der Verzögerungszeit in einem eingebauten Speicherselbsttest unter Anwendung eines Ping-Signals Detecting the delay time in a built-in memory self-test using a Ping signal |
| 06/19/2013 | EP2605272A1 Semiconductor storage device |
| 06/19/2013 | EP2198430B1 Storage subsystem capable of adjusting ecc settings based on monitored conditions |
| 06/19/2013 | CN103165194A Method and apparatus for rapid detection of large-capacity NOR Flash |
| 06/19/2013 | CN103165193A Low redundancy strengthening method for detecting and correcting two-bit errors of storage and circuit device |
| 06/19/2013 | CN103165192A SRAM (Static Random Access Memory) single event latch-up effect testing system and method |
| 06/19/2013 | CN103165191A Parameter dynamic calibration circuit and devices capable of dynamically calibrating parameters |
| 06/19/2013 | CN101814922B Multi-bit error correcting method and device based on BCH (Broadcast Channel) code and memory system |
| 06/19/2013 | CN101458969B Semiconductor memory system and wear-leveling method thereof |
| 06/19/2013 | CN101366009B Data processing system and a method for the operation thereof |
| 06/18/2013 | US8468439 Speed-optimized computation of cyclic redundancy check codes |
| 06/18/2013 | US8468425 Register error correction of speculative data in an out-of-order processor |
| 06/18/2013 | US8468424 Method for decoding data in non-volatile storage using reliability metrics based on multiple reads |
| 06/18/2013 | US8468423 Data verification using checksum sidefile |
| 06/18/2013 | US8468422 Prediction and prevention of uncorrectable memory errors |
| 06/18/2013 | US8468421 Memory system for error checking fetch and store data |
| 06/18/2013 | US8468419 High-reliability memory |
| 06/18/2013 | US8468415 Error recovery storage along a memory string |
| 06/18/2013 | US8468400 Method for detecting flash program failures |
| 06/18/2013 | US8468399 Cache logic verification apparatus and cache logic verification method |
| 06/18/2013 | US8468304 Concentrated parity technique for handling double failures and enabling storage of more than one parity block per stripe on a storage device of a storage array |
| 06/18/2013 | US8467258 Method and apparatus for bit cell repair |
| 06/13/2013 | US20130151914 Flash array built in self test engine with trace array and flash metric reporting |
| 06/13/2013 | US20130151913 Expedited Memory Drive Self Test |
| 06/13/2013 | US20130148451 Memory device including redundant memory cell block |
| 06/13/2013 | US20130148431 On-chip memory testing |
| 06/13/2013 | US20130148405 Semiconductor memory device and method of performing burn-in test on the same |
| 06/13/2013 | US20130147700 Redundancy shift register circuit for driver circuit in active matrix type liquid crystal display device |
| 06/12/2013 | CN103151079A Method to detect random-access memory (RAM) production defects |
| 06/12/2013 | CN103151078A Memorizer Error detection and correction code generation method |
| 06/12/2013 | CN103151069A Memory systems and block copy methods thereof |
| 06/12/2013 | CN101814323B Verification circuit and method of phase change memory array |
| 06/11/2013 | US8464136 Data transfer protection apparatus for flash memory controller |
| 06/11/2013 | US8464135 Adaptive flash interface |
| 06/11/2013 | US8464133 Media content distribution in a social network utilizing dispersed storage |
| 06/11/2013 | US8464132 Method for accessing flash memory and associated memory device |
| 06/11/2013 | US8464109 Pad switch cells selectively coupling test leads to test pads |
| 06/11/2013 | US8464106 Computer system with backup function and method therefor |
| 06/11/2013 | US8462571 DRAM and method for testing the same in the wafer level burn-in test mode |
| 06/11/2013 | US8462570 Memory address repair without enable fuses |
| 06/11/2013 | US8462566 Memory module with termination component |
| 06/06/2013 | WO2013080309A1 Semiconductor memory apparatus and test method |
| 06/06/2013 | WO2013078673A1 Method for checking memory code of printed circuit board |
| 06/06/2013 | US20130145233 Memory module and semiconductor storage device |
| 06/06/2013 | US20130145225 Code checking method for a memory of a printed circuit board |
| 06/06/2013 | US20130141996 Method and apparatus for memory fault tolerance |
| 06/06/2013 | US20130141995 Method and apparatus for memory fault tolerance |
| 06/06/2013 | US20130141987 Latch Based Memory Device |
| 06/05/2013 | CN202976859U SD card (Secure Digital) detection circuit in PLC (Programmable Logic Controller) |
| 06/05/2013 | CN103137215A Providing low-latency error correcting code capability for memory |
| 06/05/2013 | CN103137214A Storage device, error correction method and storage system |
| 06/05/2013 | CN103137213A Storage control device with low density parity check code coding capacity and method |
| 06/05/2013 | CN103137212A Synchronous dynamic random access memory (SDRAM) testing method |
| 06/05/2013 | CN103137211A Simulation testing system of non-volatile memory (NVM) built-in self-testing circuit |
| 06/05/2013 | CN103137210A DDR signal testing auxiliary tool |
| 06/05/2013 | CN103137209A Non-welded road system and method for test patch random access memory (RAM) |
| 06/05/2013 | CN103137208A Hot/cold test equipment for nand flash memory with dehumidifying function |
| 06/05/2013 | CN103137199A Memory system, data storage device, memory card, and solid state drive |
| 06/05/2013 | CN103137159A Direct-to-disc fault-tolerant method for videos in hard-disk based digital video recorder and device thereof |
| 06/05/2013 | CN103136068A Nonvolatile memory with error correction function for page copy operation and method thereof |
| 06/05/2013 | CN102592420B Wireless sensor network testing node with microdrive and data synchronizing capacity |
| 06/05/2013 | CN102024502B Flash device testing method and device as well as board and network equipment |
| 06/05/2013 | CN101937722B Memory device and relevant test method thereof |