G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation

Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
12/2004
12/07/2004	US6829181 Semiconductor memory, method of testing semiconductor memory, and method of manufacturing semiconductor memory
12/07/2004	US6829178 Nonvolatile memory device
12/07/2004	US6829176 Apparatus and method for dynamically repairing a semiconductor memory
12/07/2004	US6829167 Error recovery for nonvolatile memory
12/02/2004	WO2004105045A1 Test of ram address decoder for resistive open defects
12/02/2004	WO2004105044A1 Testing integrated circuits
12/02/2004	WO2004105043A1 Testing ram address decoder for resistive open defects
12/02/2004	WO2004105040A2 Universally accessible fully programmable memory built-in self-test (mbist) system and method
12/02/2004	WO2004104997A1 Method of error correction coding, and apparatus for and method of recording data using the coding method
12/02/2004	WO2004104840A2 Memory with bit swapping on the fly and testing
12/02/2004	WO2004063758A3 Semiconductor test system storing pin calibration data, commands and other data in non-volatile memory
12/02/2004	WO2004021022A3 Integrated circuit with embedded identification code
12/02/2004	US20040243912 Method and apparatus for detecting and correcting errors in stored information
12/02/2004	US20040243910 Packet data recovery system
12/02/2004	US20040243909 Error detection, documentation, and correction in a flash memory device
12/02/2004	US20040243892 Method, system, and program for improved device blocking and suspension
12/02/2004	US20040243891 Failure analysis method of semiconductor device
12/02/2004	US20040243890 Method and architecture for detecting random and systematic transistor degradation for transistor reliability evaluation in high-density memory
12/02/2004	US20040243879 DRAM memory page operation method and its structure
12/02/2004	US20040243784 Method and apparatus for generating generic descrambled data patterns for testing ECC protected memory
12/02/2004	US20040240308 Static random access memory (SRAM) unit and method for operating the same
12/02/2004	US20040240286 Method of preparing to test a capacitor
12/02/2004	US20040240285 Method and apparatus for data compression in memory devices
12/02/2004	US20040240284 Method and apparatus for data compression in memory devices
12/02/2004	US20040240283 Sub-column-repair-circuit
12/02/2004	US20040240282 Memory device with built-in error-correction capabilities
12/02/2004	US20040240268 Semiconductor memory device having flexible column redundancy scheme
12/02/2004	US20040240262 Integrated circuit, in particular integrated memory, and methods for operating an integrated circuit
12/02/2004	US20040240255 Memory device
12/02/2004	US20040240253 Flash memory sector tagging for consecutive sector erase or bank erase
12/02/2004	US20040240249 Redundancy fuse circuit
12/02/2004	US20040239544 Circuit, apparatus and method for improved current distribution of output drivers enabling improved calibration efficiency and accuracy
12/02/2004	US20040239363 Integrated circuit that can be externally tested through a normal signal output pin
12/02/2004	US20040239361 System used to test plurality of duts in parallel and method thereof
12/02/2004	US20040238899 Integrated semiconductor memory and method for reducing leakage currents in an integrated semiconductor memory
12/02/2004	DE69729771T2 Integrierte Schaltung mit einer eingebauten Selbsttestanordnung An integrated circuit having a built-in self-test assembly
12/02/2004	DE10297587T5 Halbleiter-Prüfvorrichtung Semiconductor test apparatus
12/02/2004	DE10297437T5 Prüfvorrichtung Tester
12/01/2004	EP1000395B1 Apparatus and method for memory error detection and error reporting
12/01/2004	EP0766092B1 Testable circuit with multiple identical circuit blocks
12/01/2004	CN1551244A Non-volatile memory with error correction for page copy operation and method thereof
12/01/2004	CN1551243A Apparatus and method for managing bad blocks in a flash memory
12/01/2004	CN1551242A Semiconductor storage device
12/01/2004	CN1551230A Integrated memory circuit with redundant circuit and method for substituting memory zone
12/01/2004	CN1551225A Built-in self test system and method
12/01/2004	CN1551223A Memory device with test mode for controlling of bitline sensing margin time
12/01/2004	CN1551187A Method for creating defect management information in an recording medium, and apparatus and medium based on said method
12/01/2004	CN1178228C Non-volatile semiconductor memory
12/01/2004	CN1178068C CGROM detection device and method
11/2004
11/30/2004	US6826720 Testing board for semiconductor memory, method of testing semiconductor memory and method of manufacturing semiconductor memory
11/30/2004	US6826712 Memory device having redundant cells
11/30/2004	US6826116 Semiconductor memory device including page latch circuit
11/30/2004	US6826111 On chip scrambling
11/30/2004	US6826103 Auto-tuneable reference circuit for flash EEPROM products
11/30/2004	US6826101 Semiconductor device and method for testing the same
11/30/2004	US6826099 2T2C signal margin test mode using a defined charge and discharge of BL and /BL
11/30/2004	US6826098 Semiconductor memory having multiple redundant columns with offset segmentation boundaries
11/30/2004	US6826086 Method, apparatus and system for erasing and writing a magnetic random access memory
11/30/2004	US6826081 Nonvolatile semiconductor memory device, nonvolatile semiconductor memory device-integrated system, and defective block detecting method
11/30/2004	US6826066 Semiconductor memory module
11/30/2004	US6825682 Test configuration for the functional testing of a semiconductor chip
11/25/2004	WO2004102631A2 Reference current generator, and method of programming, adjusting and/or operating same
11/25/2004	WO2004102216A2 Test systems and methods
11/25/2004	WO2004075256A3 Variable refresh control for a memory
11/25/2004	US20040237022 System and method for providing error check and correction in memory systems
11/25/2004	US20040237010 Soft errors handling in EEPROM devices
11/25/2004	US20040237009 Memory implementation for handling integrated circuit fabrication faults
11/25/2004	US20040236910 Memory card having a buffer memory for storing testing instruction
11/25/2004	US20040236532 Integrated circuit with parameter measurement
11/25/2004	US20040233770 Dynamic ram-and semiconductor device
11/25/2004	US20040233767 Method and system of fault patterns oriented defect diagnosis for memories
11/25/2004	US20040233745 Dynamic memory and method for testing a dynamic memory
11/25/2004	US20040233742 Apparatus and method for adusting clock skew
11/25/2004	US20040233740 Semiconductor memory
11/25/2004	US20040233738 Apparatus and method for reducing test resources in testing DRAMS
11/25/2004	US20040233729 Semiconductor memory device and portable electronic apparatus including the same
11/25/2004	US20040233720 Non-volatile semiconductor memory device
11/25/2004	US20040233719 Semiconductor memory device and portable electronic apparatus
11/25/2004	US20040233715 Channel erase type nonvolatile semiconductor memory device and electronic card and electronic apparatus using the device
11/25/2004	US20040233706 Variable refresh control for a memory
11/25/2004	US20040233703 Flash memory device having column predecoder capable of selecting all column selection transistors and stress test method thereof
11/25/2004	US20040233699 Non-volatile semiconductor memory device
11/25/2004	US20040233698 Semiconductor memory device with standby current failure judging function and method for judging standby current failure
11/25/2004	US20040232938 Method and apparatus for testing semiconductor devices using the back side of a circuit board
11/25/2004	US20040232937 Semiconductor integrated circuit device
11/25/2004	EP1620859A2 Reference current generator, and method of programming, adjusting and/or operating same
11/25/2004	DE10318771A1 Integrated memory circuit with redundancy circuit for replacing memory area with address by redundant memory area has deactivation memory element for enabling/inhibiting replacement of memory area
11/24/2004	EP1480271A1 Method of analysis of the quality of contacts and vias in multi-level metallisation fabrication processes of semiconductor devices, and corresponding test chip architecture
11/24/2004	EP1480228A1 Method and device for at-speed storage of faults for built-in self-repair (BISR) of embedded-RAMs
11/24/2004	EP1480227A1 Testing integrated circuits with fault dictionary
11/24/2004	EP1479025A2 Methods and apparatus for semiconductor testing
11/23/2004	US6823485 Semiconductor storage device and test system
11/23/2004	US6823424 Rebuild bus utilization
11/23/2004	US6823293 Hierarchical power supply noise monitoring device and system for very large scale integrated circuits
11/23/2004	US6822914 Circuits and methods for generating high frequency extended test pattern data from low frequency test pattern data input to an integrated circuit memory device
11/23/2004	US6822912 Semiconductor device
11/23/2004	US6822890 Methods for storing data in non-volatile memories
11/23/2004	US6822888 Semiconductor memory cell and memory array using a breakdown phenomena in an ultra-thin dielectric
11/23/2004	US6822259 Method of detecting and distinguishing stack gate edge defects at the source or drain junction
11/18/2004	WO2004099987A1 Logic analyzer data retrieving circuit and its retrieving method

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