| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 09/16/2004 | US20040180455 Method and apparatus for determining burn-in reliability from wafer level burn-in |
| 09/16/2004 | US20040179421 Semiconductor memory device capable of generating variable clock signals according to modes of operation |
| 09/16/2004 | US20040179417 Self trimming voltage generator |
| 09/16/2004 | US20040179413 Automated test method |
| 09/16/2004 | US20040179412 Circuit technique for column redundancy fuse latches |
| 09/16/2004 | US20040179411 Method and apparatus for hermetic sealing of assembled die |
| 09/16/2004 | US20040179409 Method and device for detecting whether the alignment of bit line contacts and active areas in DRAM devices is normal |
| 09/16/2004 | US20040179408 Microcomputer |
| 09/16/2004 | US20040179385 Ferroelectric memory and method of testing the same |
| 09/16/2004 | US20040178404 Multiple bit chalcogenide storage device |
| 09/16/2004 | DE4332618B4 Einbrenntestschaltung für eine Halbleiterspeichervorrichtung Einbrenntestschaltung for a semiconductor memory device |
| 09/16/2004 | DE10310140A1 Integrated device tester, has connection locations arranged in groups, with control connections connected to control bus, and address and command connections for each location |
| 09/16/2004 | DE10308333A1 Burn-in system for semiconductor devices on wafer plane, has power supplies connected to input contacts of contacting device, and with signal contacts connected to measuring contacts |
| 09/15/2004 | EP1456757A2 Penalty free address decoding scheme |
| 09/15/2004 | EP1158531B1 Semiconductor memory device |
| 09/15/2004 | CN1529852A Improved error correction scheme for use in flase memory allowing bit alterablity |
| 09/14/2004 | US6792567 System and method for correcting soft errors in random access memory devices |
| 09/14/2004 | US6792565 Address conversion device for nonvolatile memory |
| 09/14/2004 | US6792373 Methods and apparatus for semiconductor testing |
| 09/14/2004 | US6791891 Method of testing the thin oxide of a semiconductor memory cell that uses breakdown voltage |
| 09/14/2004 | US6791890 Semiconductor memory device reading data based on memory cell passing current during access |
| 09/14/2004 | US6791880 Non-volatile memory read circuit with end of life simulation |
| 09/14/2004 | US6791874 Memory device capable of calibration and calibration methods therefor |
| 09/14/2004 | US6791872 Method and article for concentrating fields at sense layers |
| 09/14/2004 | US6791865 Memory device capable of calibration and calibration methods therefor |
| 09/14/2004 | US6791858 Power reduction in CMOS imagers by trimming of master current reference |
| 09/14/2004 | US6791857 Method and article for concentrating fields at sense layers |
| 09/14/2004 | US6791855 Redundant array architecture for word replacement in CAM |
| 09/14/2004 | US6791370 Apparatus and method for adjusting clock skew |
| 09/14/2004 | US6791367 Hardware and software programmable fuses for memory repair |
| 09/09/2004 | US20040177309 Familial correction with non-familial double bit error detection |
| 09/09/2004 | US20040177302 Apparatus for testing semiconductor integrated circuit |
| 09/09/2004 | US20040177298 Device and method for testing integrated circuit dice in an integrated circuit module |
| 09/09/2004 | US20040177296 Semiconductor testing circuit, semiconductor storage device, and semiconductor testing method |
| 09/09/2004 | US20040177295 Method for compressing high repetitivity data, in particular data used in memory device testing |
| 09/09/2004 | US20040177292 Structure and method for detecting errors in a multilevel memory device with improved programming granularity |
| 09/09/2004 | US20040177217 Status register to improve initialization of a synchronous memory |
| 09/09/2004 | US20040177216 Nonvolatile memory and method of address management |
| 09/09/2004 | US20040177210 Method and apparatus for multi-functional inputs of a memory device |
| 09/09/2004 | US20040174764 Content addressable memory with redundant repair function |
| 09/09/2004 | US20040174759 Yield and speed enhancement of semiconductor integrated circuits using post fabrication transistor mismatch compensation circuitry |
| 09/09/2004 | US20040174753 Semiconductor integrated circuit apparatus and circuit board and information readout method |
| 09/09/2004 | US20040174747 Non-volatile semiconductor memory device and memory system using the same |
| 09/09/2004 | US20040174738 Method and apparatus for testing a CAM addressed cache |
| 09/09/2004 | US20040174204 Semiconductor device unlikely to make incorrect determination of fuse blow |
| 09/09/2004 | DE10307027A1 Memory component repair method for determining a repair solution for a memory device in a test system tests areas of the memory device in sequence for error data |
| 09/09/2004 | DE10060438B4 Testanordnung zum parallelen Test einer Mehrzahl von integrierten Schaltkreisen und Testverfahren Test arrangement for parallel testing of a plurality of integrated circuits and test procedures |
| 09/08/2004 | CN1527948A Low-jitter clock for test system |
| 09/08/2004 | CN1527373A Apparatus for testing integrated module and method for operating the testing device |
| 09/08/2004 | CN1527325A Semiconductor device beyond misrecognition of occuring cut-off of fuse |
| 09/08/2004 | CN1165906C Error correction apparatus |
| 09/08/2004 | CN1165845C Method and apparatus for leveizing transfer delays for channel of memory devices in memory subsystem |
| 09/07/2004 | US6789137 Semiconductor memory device allowing reduction of I/O terminals |
| 09/07/2004 | US6788610 Semiconductor memory device and method for selecting multiple word lines in a semiconductor memory device |
| 09/07/2004 | US6788609 Storage device employing a flash memory |
| 09/07/2004 | US6788598 Test key for detecting overlap between active area and deep trench capacitor of a DRAM and detection method thereof |
| 09/07/2004 | US6788597 Memory device having programmable column segmentation to increase flexibility in bit repair |
| 09/07/2004 | US6788596 Failed cell address programming circuit and method for programming failed cell address |
| 09/07/2004 | US6788595 Embedded recall apparatus and method in nonvolatile memory |
| 09/07/2004 | US6788594 Asynchronous, high-bandwidth memory component using calibrated timing elements |
| 09/07/2004 | US6788593 Asynchronous, high-bandwidth memory component using calibrated timing elements |
| 09/07/2004 | US6788575 Nonvolatile memory |
| 09/07/2004 | US6788568 Thin film magnetic memory device capable of conducting stable data read and write operations |
| 09/07/2004 | US6788228 Addressing device for selecting regular and redundant elements |
| 09/07/2004 | US6788132 Voltage and time control circuits |
| 09/07/2004 | US6788090 Method and apparatus for inspecting semiconductor device |
| 09/07/2004 | US6788087 Integrated circuit having a test circuit, and method of decoupling a test circuit in an integrated circuit |
| 09/07/2004 | US6788081 Motherboard memory slot ribbon cable and apparatus |
| 09/07/2004 | US6788070 Fault tolerant semiconductor system |
| 09/07/2004 | US6787801 Wafer with additional circuit parts in the kerf area for testing integrated circuits on the wafer |
| 09/02/2004 | WO2004075257A2 Memory having variable refresh control and method therefor |
| 09/02/2004 | WO2004075256A2 Variable refresh control for a memory |
| 09/02/2004 | WO2004075203A1 Shift redundant circuit, method for controlling shift redundant circuit, and semiconductor memory device |
| 09/02/2004 | WO2004074851A2 Memory repair analysis method and circuit |
| 09/02/2004 | WO2004051669A3 Method and apparatus for replacing defective rows in a semiconductor memory array |
| 09/02/2004 | US20040172576 Data writing apparatus, data writing method, and program |
| 09/02/2004 | US20040170072 Method and apparatus for coordinating memory operations among diversely-located memory components |
| 09/02/2004 | US20040170069 Apparatus and method for testing redundant memory elements |
| 09/02/2004 | US20040170067 Semiconductor memory device permitting control of internal power supply voltage in packaged state |
| 09/02/2004 | US20040170064 Flash EEprom system |
| 09/02/2004 | US20040170060 Semiconductor storage device preventing data change due to accumulative disturbance |
| 09/02/2004 | US20040170059 Automatic programming time selection for one time programmable memory |
| 09/02/2004 | US20040170057 Non volatile memory device including a predetermined number of sectors |
| 09/02/2004 | US20040170044 Semiconductor integrated circuit device |
| 09/02/2004 | DE69726219T2 Verfahren und Vorrichtung zur Prüfung einer Speicher-integrierten Schaltung Method and apparatus for testing a memory-integrated circuit |
| 09/02/2004 | DE102004004308A1 Halbleiterbaustein und Testschaltung zum effektiven Ausführen eines Verifizierungstests für nichtflüchtige Speicherzellen Semiconductor device and test circuit for effectively performing a verification test for non-volatile memory cells |
| 09/01/2004 | EP1453062A1 Built-in testing methodology in flash memory |
| 09/01/2004 | EP1451827A1 Dual mode high voltage power supply for providing increased speed in programming during testing of low voltage non-volatile memories |
| 09/01/2004 | CN1525569A Semiconductor memory device having dual word line configuration |
| 09/01/2004 | CN1525491A Memory module, test system and method for testing one and complex number memory module |
| 09/01/2004 | CN1525490A Method for testing semiconductor memory device and test circuit for semiconductor memory device |
| 09/01/2004 | CN1525488A Semiconductor storage device preventing data change due to accumulative disturbance |
| 09/01/2004 | CN1525187A Apparatus for testing semiconductor integrated circuit |
| 08/31/2004 | US6785860 Error-correcting code adapted for memories that store multiple bits per storage cell |
| 08/31/2004 | US6785858 Semiconductor device capable of adjusting timing of input waveform by tester with high accuracy |
| 08/31/2004 | US6785856 Internal self-test circuit for a memory array |
| 08/31/2004 | US6785853 Integration type input circuit and method of testing it |
| 08/31/2004 | US6785852 Memory device redundant repair analysis method, recording medium and apparatus |
| 08/31/2004 | US6785837 Fault tolerant memory system utilizing memory arrays with hard error detection |
| 08/31/2004 | US6785765 Status register to improve initialization of a synchronous memory |