| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 10/05/2004 | US6801457 Non-volatile semiconductor memory |
| 10/05/2004 | US6801048 Device and method for testing integrated circuit dice in an integrated circuit module |
| 10/05/2004 | US6800919 Semiconductor device having a redundancy function |
| 10/05/2004 | US6800883 CMOS basic cell and method for fabricating semiconductor integrated circuit using the same |
| 10/05/2004 | US6800817 Semiconductor component for connection to a test system |
| 10/05/2004 | US6800493 Pre-erase manufacturing method |
| 09/30/2004 | WO2004053888A3 Zone boundary adjustment for defects in non-volatile memories |
| 09/30/2004 | WO2004025404A9 Method and apparatus for server share migration and server recovery using hierarchical storage management |
| 09/30/2004 | US20040194062 Data storage system and method for testing the same |
| 09/30/2004 | US20040193992 Method and apparatus for preventing and recovering from TLB corruption by soft error |
| 09/30/2004 | US20040193984 Signature Cell |
| 09/30/2004 | US20040193966 Semiconductor device |
| 09/30/2004 | US20040192045 Apparatus and methods for maskless pattern generation |
| 09/30/2004 | US20040190414 Digital signal processing method, data recording and reproducing apparatus, and data recording medium that are resistant to burst errors |
| 09/30/2004 | US20040190357 Redundant memory structure using bad bit pointers |
| 09/30/2004 | US20040190355 Semiconductor device and method for testing semiconductor device |
| 09/30/2004 | US20040190353 Input buffer of semiconductor memory device |
| 09/30/2004 | US20040190349 Circuit and method for decreasing the required refresh rate of DRAM devices |
| 09/30/2004 | US20040190348 Automatic reference voltage regulation in a memory device |
| 09/30/2004 | US20040190338 Structure for testing NAND flash memory and method of testing NAND flash memory |
| 09/30/2004 | US20040190331 Testing embedded memories in an integrated circuit |
| 09/30/2004 | US20040190325 Ferroelectric memory device having test memory cell |
| 09/30/2004 | US20040189364 Integrated circuit devices having improved duty cycle correction and methods of operating the same |
| 09/30/2004 | US20040189337 Current mirror based multi-channel leakage current monitor circuit and method |
| 09/30/2004 | US20040188716 Non-volatile memory and accelerated test method for address decoder by added modified dummy memory cells |
| 09/30/2004 | DE69333557T2 Halbleiterspeicheranordnung A semiconductor memory device |
| 09/30/2004 | DE69333548T2 Halbleiterspeicheranordnung A semiconductor memory device |
| 09/30/2004 | DE19930169B4 Testeinrichtung und Verfahren zum Prüfen eines Speichers Test device and method for testing a memory |
| 09/30/2004 | DE10310570B3 Testing dynamic memory circuit involves reading out first and second memory cells in sequence so first and second switching devices are switched number of times during testing of cells |
| 09/29/2004 | EP1463063A1 Signature cell |
| 09/29/2004 | EP1461689A2 Method and test device for detecting addressing errors in control devices |
| 09/29/2004 | EP1129415B1 Automatic generation of user definable memory bist circuitry |
| 09/29/2004 | EP1125203B1 Column redundancy circuit with reduced signal path delay |
| 09/29/2004 | EP0715249B1 Methods of and system for reserving storage space for data migration in a redundant hierarchic data storage system by dynamically computing maximum storage space for mirror redundancy |
| 09/29/2004 | EP0706127B1 Method and system for detecting data loss in a hierarchic data storage system |
| 09/29/2004 | CN1532934A Integrated circuit with detecting circuit |
| 09/29/2004 | CN1532843A Detecting method of memory module and device for executing said method |
| 09/29/2004 | CN1532842A 半导体器件 Semiconductor devices |
| 09/29/2004 | CN1532837A Error corrector |
| 09/28/2004 | US6799293 Sparse byte enable indicator for high speed memory access arbitration method and apparatus |
| 09/28/2004 | US6799291 Method and system for detecting a hard failure in a memory array |
| 09/28/2004 | US6799290 Data path calibration and testing mode using a data bus for semiconductor memories |
| 09/28/2004 | US6799289 On-board testing circuit and method for improving testing of integrated circuits |
| 09/28/2004 | US6799288 Detecting and mitigating memory device latchup in a data processor |
| 09/28/2004 | US6799134 Characterization of self-timed sequential circuits |
| 09/28/2004 | US6798703 Semiconductor memory device having improved replacement efficiency of defective word lines by redundancy word lines |
| 09/28/2004 | US6798702 Semiconductor memory device capable of testing data line redundancy replacement circuit |
| 09/28/2004 | US6798701 Semiconductor integrated circuit device having data input/output configuration variable |
| 09/28/2004 | US6798679 Semiconductor memory module |
| 09/23/2004 | WO2004081950A1 Semiconductor integrated circuit and method for testing built-in memory mounted on semiconductor integrated circuit |
| 09/23/2004 | WO2004081949A1 Dc test instrument and semiconductor test instrument |
| 09/23/2004 | WO2004081948A1 Test for weak sram cells |
| 09/23/2004 | WO2004061853A3 Method of address individual memory devices on a memory module |
| 09/23/2004 | WO2004061689A3 Two dimensional data eye centering for source synchronous data transfers |
| 09/23/2004 | WO2002095802A3 Methods and apparatus for semiconductor testing |
| 09/23/2004 | US20040187067 Method for optimizing UDMA transfer signals using CRC errors |
| 09/23/2004 | US20040187066 Method of and apparatus for reading recording medium, harddisk controller |
| 09/23/2004 | US20040187051 Memory error generating method, apparatus and computer program product |
| 09/23/2004 | US20040187050 Test structure and method for accurate determination of soft error of logic components |
| 09/23/2004 | US20040187046 Method of timing calibration using slower data rate pattern |
| 09/23/2004 | US20040186956 Configurable width buffered module |
| 09/23/2004 | US20040185587 Method of testing ion implantation energy in ion implantation equipment |
| 09/23/2004 | US20040184344 Semiconductor wafer, semiconductor chip, and manufacturing method of semiconductor device |
| 09/23/2004 | US20040184329 Semiconductor device having redundancy circuit |
| 09/23/2004 | US20040184328 Semiconductor integrated circuit capable of testing with small scale circuit configuration |
| 09/23/2004 | US20040184327 Semiconductor memory device and test method |
| 09/23/2004 | US20040184315 Thin film magnetic memory device provided with program element |
| 09/23/2004 | US20040184312 MRAM signal size increasing apparatus and methods |
| 09/23/2004 | US20040184307 Semiconductor device |
| 09/23/2004 | US20040184304 Semiconductor memory device |
| 09/23/2004 | US20040184303 Memory circuit and method for operating the same |
| 09/23/2004 | DE10341767A1 Halbleitervorrichtung, bei der eine nicht korrekte Bestimmung des Durchschmelzzustandes einer Sicherung unwahrscheinlich ist A semiconductor device in which an incorrect determination of the melting state of a fuse is unlikely |
| 09/22/2004 | EP1459323A1 Multi-mode synchronous memory device and method of operating and testing same |
| 09/22/2004 | EP1459081A1 Compact ate with timestamp system |
| 09/22/2004 | CN1530665A Method for testing dynamic memory circuit and testing circuit |
| 09/22/2004 | CN1530663A 微型计算机 Microcomputers |
| 09/22/2004 | CN1168111C Fuse circuit having zero powder draw for partially blown condition |
| 09/22/2004 | CN1168097C Semiconductor device with test circuit capable of inhibiting enlargement of circuit scale |
| 09/22/2004 | CN1168005C Treating method and system for local defect internal memory |
| 09/21/2004 | US6795943 Semiconductor device with test mode |
| 09/21/2004 | US6795942 Built-in redundancy analysis for memories with row and column repair |
| 09/21/2004 | US6795940 Method of and apparatus for executing diagnostic testing of a ROM |
| 09/21/2004 | US6795362 Power controlling method for semiconductor storage device and semiconductor storage device employing same |
| 09/21/2004 | US6795355 Semiconductor integrated circuit device with internal potential generating circuit allowing external tuning of internal power supply potential |
| 09/21/2004 | US6795352 Nonvolatile semiconductor memory having page mode with a plurality of banks |
| 09/21/2004 | US6795350 Circuit and method for tuning a reference bit line loading to a sense amplifier by optionally cutting a capacitive reference bit line |
| 09/21/2004 | US6795326 Flash array implementation with local and global bit lines |
| 09/21/2004 | US6794904 Semiconductor integrated circuit device including logic gate that attains reduction of power consumption and high-speed operation |
| 09/21/2004 | US6794891 Semiconductor integrated circuit |
| 09/21/2004 | US6794679 Semiconductor device that can measure timing difference between input and output signals |
| 09/21/2004 | US6794678 Semiconductor integrated circuit device, method of testing semiconductor integrated circuit device and method of manufacturing semiconductor integrated circuit device |
| 09/16/2004 | WO2004079816A1 Semiconductor device test instrument |
| 09/16/2004 | WO2004079575A1 Data management method for slash memory medium |
| 09/16/2004 | US20040181733 Assisted memory system |
| 09/16/2004 | US20040181729 Probeless testing of pad buffers on wafer |
| 09/16/2004 | US20040181726 Method and system for alternating between programs for execution by cells of an integrated circuit |
| 09/16/2004 | US20040181724 System for storing device test information on a semiconductor device using on-device logic for determination of test results |
| 09/16/2004 | US20040181716 System and method for testing memory |
| 09/16/2004 | US20040181637 Memory test circuit with data expander |
| 09/16/2004 | US20040181627 Device and method for recording block status information |