Patents
Sitemap › G11 - Information storage › G11C - Static stores › G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
10/2014
10/28/2014US8874997 System and method for combining pilot data with user data using a control module external to a memory
10/28/2014US8874996 Memory device having reconfigurable refresh timing
10/28/2014US8874995 Partial-maximum distance separable (PMDS) erasure correcting codes for storage arrays
10/28/2014US8874993 Memory management in a non-volatile solid state memory device
10/28/2014US8874992 Systems and methods to initiate updating of reference voltages
10/28/2014US8874991 Appending data to existing data stored in a dispersed storage network
10/28/2014US8874990 Pre-fetching data segments stored in a dispersed storage network
10/28/2014US8874989 Memory system capable of increasing data transfer efficiency
10/28/2014US8874986 Storage device including error correction function and error correction method
10/28/2014US8874979 Three dimensional(3D) memory device sparing
10/28/2014US8874832 AD HOC flash memory reference cells
10/28/2014US8873320 DRAM repair architecture for wide I/O DRAM based 2.5D/3D system chips
10/28/2014US8873319 Address output circuit and semiconductor memory device
10/28/2014US8873318 Mechanisms for built-in self repair of memory devices using failed bit maps and obvious repairs
10/28/2014US8873313 Semiconductor apparatus
10/28/2014US8873309 Apparatus and method for repairing resistive memories and increasing overall read sensitivity of sense amplifiers
10/28/2014US8873308 Signal processing circuit
10/28/2014US8873305 Semiconductor memory device having data compression test circuit
10/28/2014US8873288 Simultaneous sensing of multiple wordlines and detection of NAND failures
10/28/2014US8873286 Managing non-volatile media
10/28/2014US8873272 Semiconductor memory apparatus and test circuit therefor
10/28/2014US8872542 Semiconductor device and semiconductor device control method
10/28/2014US8872531 Semiconductor device and test apparatus including the same
10/23/2014US20140317473 Implementing ecc redundancy using reconfigurable logic blocks
10/23/2014US20140317469 Memory device for performing error correction code operation and redundancy repair operation
10/23/2014US20140317460 Memory device with background built-in self-repair using background built-in self-testing
10/23/2014US20140313841 Integrated circuit with programmable storage cell array and boot-up operation method thereof
10/23/2014US20140313840 Integrated circuit and memory device
10/23/2014US20140313834 Retention optimized memory device using predictive data inversion
10/23/2014US20140313826 Off-die charge pump that supplies multiple flash devices
10/21/2014US8869009 Read commands specifying error performance
10/21/2014US8869008 Adaptation of analog memory cell read thresholds using partial ECC syndromes
10/21/2014US8869007 Three dimensional (3D) memory device sparing
10/21/2014US8869006 Partial-maximum distance separable (PMDS) erasure correcting codes for storage arrays
10/21/2014US8869005 Error correction in a stacked memory
10/21/2014US8869004 Memory storage device, memory controller thereof, and data transmission method thereof
10/21/2014US8869003 Method, apparatus, computer program product and device providing semi-parallel low density parity check decoding using a block structured parity check matrix
10/21/2014US8868992 Robust memory link testing using memory controller
10/21/2014US8868991 Memory devices, testing systems and methods
10/21/2014US8868990 Semiconductor memory device and information processing apparatus including the same
10/21/2014US8867293 Semiconductor memory device changing refresh interval depending on temperature
10/21/2014US8867290 Apparatuses, integrated circuits, and methods for measuring leakage current
10/21/2014US8867289 Chip with embedded non-volatile memory and testing method therefor
10/21/2014US8867288 Memory device and test method thereof
10/21/2014US8867287 Test circuit and method of semiconductor memory apparatus
10/21/2014US8867282 Semiconductor apparatus with open bit line structure
10/21/2014US8867255 Semiconductor device and method of operation
10/21/2014US8866303 Semiconductor device with configurable through-silicon vias
10/16/2014US20140310576 Semiconductor memory device
10/16/2014US20140310575 Semiconductor memory device
10/16/2014US20140310574 Green eMMC Device (GeD) Controller with DRAM Data Persistence, Data-Type Splitting, Meta-Page Grouping, and Diversion of Temp Files for Enhanced Flash Endurance
10/16/2014US20140307515 Circuit arrangement, a method for testing a supply voltage provided to a test circuit, and a method for repairing a voltage source
10/14/2014US8862967 Statistical distribution based variable-bit error correction coding
10/14/2014US8862965 Decoding failure management
10/14/2014US8862964 Data storage in analog memory cells using a non-integer number of bits per cell
10/14/2014US8862963 Nonvolatile memory, memory controller, nonvolatile memory accessing method, and program
10/14/2014US8862953 Memory testing with selective use of an error correction code decoder
10/14/2014US8862952 Prioritized memory scanning for data storage systems
10/14/2014US8862863 Methods and apparatuses for master-slave detection
10/14/2014US8861293 Immunity of phase change material to disturb in the amorphous phase
10/14/2014US8861292 Semiconductor device having redundant word lines and redundant bit lines
10/14/2014US8861277 Method of using non-volatile memories for on-DIMM memory address list storage
10/14/2014US8861272 System and method for data recovery in a solid state storage device using optimal reference voltage values of a related storage element
10/14/2014US8860452 Tester to test a plurality of semiconductor devices and test system including the same
10/09/2014WO2014163995A1 Non-volatile storage with shared bit lines and programmable select transistors
10/09/2014US20140304561 Shared fuse wrapper architecture for memory repair
10/09/2014US20140304449 Multi-core processor having disabled cores
10/09/2014US20140301149 Semiconductor memory device having compression test mode
10/09/2014US20140301143 Techniques for controlling recycling of blocks of memory
10/09/2014DE112012005617T5 Speicherung von Daten in Speichermodulpuffern Storing data in memory module buffers
10/09/2014DE112011106030T5 Selbstreparaturlogik für eine Stapelspeicherarchitektur Auto repair logic for a stack architecture
10/09/2014DE10235380B4 Verfahren zur dynamischen Speicherverwaltung A method for dynamic memory management
10/07/2014US8856622 Apparatus and method for encoding data for storage in multi-level nonvolatile memory
10/07/2014US8856621 Memory controller for nonvolatile memory device, memory system comprising memory controller, and related methods of operation
10/07/2014US8856620 Dynamic graduated memory device protection in redundant array of independent memory (RAIM) systems
10/07/2014US8856619 Storing data across groups of storage nodes
10/07/2014US8856618 Scalable repair block error correction for sequential multiple data blocks in a magnetic data storage device
10/07/2014US8856617 Sending a zero information gain formatted encoded data slice
10/07/2014US8856616 Two dimensional encoding for non-volatile memory blocks
10/07/2014US8856615 Data storage device tracking log-likelihood ratio for a decoder based on past performance
10/07/2014US8856614 Semiconductor memory device detecting error
10/07/2014US8856613 Semiconductor storage device, memory control device, and control method of semiconductor memory
10/07/2014US8856603 Method for detecting and correcting errors for a memory whose structure shows dissymmetrical behavior, corresponding memory and its use
10/07/2014US8856464 Systems for two-dimensional main memory including memory modules with read-writeable non-volatile memory devices
10/07/2014US8854909 Semiconductor memory device and method of testing the same
10/07/2014US8854908 System and method for memory access in server communications
10/07/2014US8854906 Nonvolatile memory device with improved integrated ratio
10/07/2014US8854882 Configuring storage cells
10/07/2014US8854877 Nonvolatile semiconductor memory device and method of reusing same
10/07/2014US8854854 Memory module and memory system
10/02/2014WO2014159263A1 Determining read voltages for reading memory
10/02/2014WO2014158915A1 Process corner sensor for bit-cells
10/02/2014WO2014158657A1 Selective self-reference read
10/02/2014WO2014158130A1 Memory device having error correction logic
10/02/2014US20140298121 Analysis support apparatus, analysis support method, and computer product
10/02/2014US20140298120 Circuit and Method for Testing Memory Devices
10/02/2014US20140298109 Information processing device, computer-readable recording medium, and method
10/02/2014US20140298090 Data recovery in a solid state storage system
10/02/2014US20140298088 Data conditioning to improve flash memory reliability
09/2014
09/30/2014US8850292 Flash memory system and read method in flash memory system
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