| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 07/28/2005 | US20050162920 Circuit and method for reducing leakage current in a row driver circuit in a flash memory during a standby mode of operation |
| 07/28/2005 | US20050162915 Method and apparatus for identifying short circuits in an integrated circuit device |
| 07/28/2005 | US20050162902 Storage device employing a flash memory |
| 07/28/2005 | US20050162901 Storage device employing a flash memory |
| 07/28/2005 | US20050162900 Storage device employing a flash memory |
| 07/28/2005 | US20050162899 Storage device employing a flash memory |
| 07/28/2005 | US20050162182 Internally generating patterns for testing in an integrated circuit device |
| 07/28/2005 | US20050162176 Test device for wafer testing digital semiconductor circuits |
| 07/28/2005 | DE10361024A1 Test process for an integrated semiconductor memory has control signals to switch between normal and test operation and testing between data read in and select transistor blocking |
| 07/28/2005 | DE102004034357A1 Prüfkarten Trägerelement Test cards support element |
| 07/28/2005 | DE102004018028A1 Electronic circuit testing method in which electronic circuits to be tested are compared with a reference circuit by application of test signals and comparison of the resultant output signals |
| 07/28/2005 | DE102004014243A1 Integrated chip with functional circuit especially memory and test circuit has output circuit for error data that is high resistance if no error arises |
| 07/27/2005 | EP1556868A1 Automated wear leveling in non-volatile storage systems |
| 07/27/2005 | EP1433183B1 Data writing apparatus, data writing method, and program |
| 07/27/2005 | CN1647273A Interconnection structure and methods |
| 07/27/2005 | CN1647045A Methods for storing data in non-volatile memories |
| 07/27/2005 | CN1645614A Semiconductor device |
| 07/27/2005 | CN1212666C Semiconductor memory |
| 07/26/2005 | US6922803 Test method of semiconductor intergrated circuit and test pattern generator |
| 07/26/2005 | US6922802 Method for creating defect management information in an recording medium, and apparatus and medium based on said method |
| 07/26/2005 | US6922800 Test sequences generated by automatic test pattern generation and applicable to circuits with embedded multi-port RAMs |
| 07/26/2005 | US6922799 Semiconductor memory device and testing system and testing method |
| 07/26/2005 | US6922798 Apparatus and methods for providing enhanced redundancy for an on-die cache |
| 07/26/2005 | US6922752 Storage system using fast storage devices for storing redundant data |
| 07/26/2005 | US6922750 Semiconductor memory device capable of simultaneously reading data and refreshing data |
| 07/26/2005 | US6922649 Multiple on-chip test runs and repairs for memories |
| 07/26/2005 | US6922366 Self-repair method for nonvolatile memory devices using a supersecure architecture, and nonvolatile memory device |
| 07/26/2005 | US6922355 Thin film magnetic memory device capable of conducting stable data read and write operations |
| 07/26/2005 | US6922352 FeRAM having test circuit and method for testing the same |
| 07/21/2005 | WO2005066975A1 Flexible and area efficient column redundancy for non-volatile memories |
| 07/21/2005 | WO2005066974A1 Adaptive deterministic grouping of blocks into multi-block units |
| 07/21/2005 | WO2005066972A1 Non-volatile memory and method with block management system |
| 07/21/2005 | WO2005066970A2 Robust data duplication and improved update method in a multibit non-volatile memory |
| 07/21/2005 | WO2005066780A2 Managing external memory updates for fault detection in redundant multithreading systems using speculative memory support |
| 07/21/2005 | US20050160344 Method of recording/reproducing data on storage medium |
| 07/21/2005 | US20050160333 Embedded micro computer unit (MCU) for high-speed testing using a memory emulation module and a method of testing the same |
| 07/21/2005 | US20050160332 Semiconductor integrated circuit |
| 07/21/2005 | US20050160310 Integrated Redundancy Architecture and Method for Providing Redundancy Allocation to an Embedded Memory System |
| 07/21/2005 | US20050157578 Semiconductor memory device |
| 07/21/2005 | US20050157572 Semiconductor memory having a defective memory cell relieving circuit |
| 07/21/2005 | US20050157570 Semiconductor device |
| 07/21/2005 | US20050157565 Semiconductor device for detecting memory failure and method thereof |
| 07/21/2005 | US20050157530 Ferroelectric memory |
| 07/21/2005 | US20050157440 Burn-in board having an indirect fuse |
| 07/21/2005 | US20050156934 System featuring memory modules that include an integrated circuit buffer devices |
| 07/21/2005 | US20050156616 Integrated circuit device |
| 07/21/2005 | US20050156605 Circuits for transistor testing |
| 07/21/2005 | US20050156265 Lithography device for semiconductor circuit pattern generation |
| 07/21/2005 | DE69825078T2 Speicherprüfsystem mit einer Einrichtung für eine Prüffolgenoptimierung und Verfahren für diesen Vorgang The memory test system comprising a device for a method for this operation and Prüffolgenoptimierung |
| 07/21/2005 | DE10359648A1 Loader head device for loading a header/adapter device with a corresponding semiconductor component loads a burn-in header/burn-in adapter device with a corresponding semiconductor component |
| 07/21/2005 | DE10358038A1 Integrierte Schaltung zur Speicherung von Betriebsparametern An integrated circuit for storage of operating parameters |
| 07/21/2005 | DE102004060644A1 Direktzugriffsspeicher unter Verwendung von Vorladezeitgebern in einem Testmodus Random access memory using Vorladezeitgebern in a test mode |
| 07/21/2005 | DE102004060579A1 Verfahren und Vorrichtung zum Steuern von Auffrischzyklen eines Mehrzyklusauffrischschemas bei einem dynamischen Speicher Method and apparatus for controlling a refresh of a dynamic memory in Mehrzyklusauffrischschemas |
| 07/20/2005 | EP1555675A1 An apparatus for determining the access time and/or the minimally allowable cycle time of a memory |
| 07/20/2005 | CN2711857Y Test device for embedded memory |
| 07/20/2005 | CN1641795A Method for verifying testing ROM |
| 07/20/2005 | CN1641794A Semiconductor device |
| 07/19/2005 | US6920593 Logical verification apparatus and method for memory control circuit |
| 07/19/2005 | US6920590 Semiconductor apparatus for providing reliable data analysis of signals |
| 07/19/2005 | US6920589 Method and apparatus of recording/reproducing data using a U-pattern scan |
| 07/19/2005 | US6920525 Method and apparatus of local word-line redundancy in CAM |
| 07/19/2005 | US6920402 Technique for determining performance characteristics of electronic devices and systems |
| 07/19/2005 | US6920073 Row redundancy circuit and repair method |
| 07/19/2005 | US6920072 Apparatus and method for testing redundant memory elements |
| 07/19/2005 | US6920070 Read/program potential generating circuit |
| 07/19/2005 | US6919754 Fuse detection circuit |
| 07/14/2005 | US20050154962 Method and system to spin up a hard disk prior to a hard disk data exchange request |
| 07/14/2005 | US20050154944 Managing external memory updates for fault detection in redundant multithreading systems using speculative memory support |
| 07/14/2005 | US20050154943 Mechanism for adjacent-symbol error correction and detection |
| 07/14/2005 | US20050153465 Fabrication method of semiconductor integrated circuit device |
| 07/14/2005 | US20050152195 Method and device for testing a sense amp |
| 07/14/2005 | US20050152194 RAM memory circuit having a plurality of banks and an auxiliary device for testing |
| 07/14/2005 | US20050152190 Semiconductor memory device capable of testing memory cells at high speed |
| 07/14/2005 | US20050152186 Semiconductor integrated circuit device |
| 07/14/2005 | US20050152173 Semiconductor integrated circuit device and bit line capacitance adjusting method using the device |
| 07/13/2005 | CN1639800A Non-volatile memory test structure and method |
| 07/13/2005 | CN1638079A Fabrication method of semiconductor integrated circuit device |
| 07/13/2005 | CN1637953A Semiconductor memory device having advanced test mode |
| 07/13/2005 | CN1637952A Data strobe circuit using clock signal |
| 07/13/2005 | CN1637939A Semiconductor memory apparatus |
| 07/13/2005 | CN1637936A Fuse circuit |
| 07/13/2005 | CN1637934A Storage circuit, semiconductor device, and electronic apparatus |
| 07/13/2005 | CN1637930A Storage circuit, semiconductor device, and electronic apparatus |
| 07/13/2005 | CN1637716A Embedded micro computer unit (MCU) using a memory emulation module and a method of testing the same |
| 07/13/2005 | CN1210803C 半导体器件 Semiconductor devices |
| 07/13/2005 | CN1210802C Semiconductor IC |
| 07/13/2005 | CN1210779C Method and device for burn-in testing SRAM |
| 07/13/2005 | CN1210722C Semiconductor data storage circuit device and its checking method and method for alternating badly element in said device |
| 07/13/2005 | CN1210721C Semi-conductor assembly and method for testing and operating a semi-conductor assembly |
| 07/13/2005 | CN1210571C Storage lead wire calibration data based on affairs testing system for nonvolatile memory |
| 07/12/2005 | US6918075 Pattern generator for semiconductor test system |
| 07/12/2005 | US6918072 Circuit and method for time-efficient memory repair |
| 07/12/2005 | US6917563 Integrated memory |
| 07/12/2005 | US6917558 Content addressable memory with redundant repair function |
| 07/12/2005 | US6917548 Self-repairing built-in self test for linked list memories |
| 07/12/2005 | US6917547 Non-volatile semiconductor memory device |
| 07/12/2005 | US6917540 Thin film magnetic memory device storing program information efficiently and stably |
| 07/12/2005 | US6917220 Semiconductor device and a method for checking state transition thereof |
| 07/12/2005 | US6917215 Semiconductor integrated circuit and memory test method |
| 07/12/2005 | US6917214 Method for testing a plurality of devices disposed on a wafer and connected by a common data line |