Patents
Sitemap › G11 - Information storage › G11C - Static stores › G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
12/2014
12/24/2014CN102568605B 系统总线检错纠错方法和nand flash控制器 The system bus error detection and error correction method nand flash controller
12/23/2014US8918753 Correlation of device manufacturing defect data with device electrical test data
12/23/2014US8918703 Memory system with error detection and retry modes of operation
12/23/2014US8918701 Nested multiple erasure correcting codes for storage arrays
12/23/2014US8918700 Apparatus and method for controlling access to a memory device
12/23/2014US8918699 Non-volatile semiconductor storage apparatus
12/23/2014US8918690 Decreasing power supply demand during BIST initializations
12/23/2014US8918689 Circuit for testing integrated circuits
12/23/2014US8918686 Determining data valid windows in a system and method for testing an integrated circuit device
12/23/2014US8918685 Test circuit, memory system, and test method of memory system
12/23/2014US8918684 Semiconductor device and data processing system including the same
12/23/2014US8918683 One-time program cell array circuit and memory device including the same
12/23/2014US8918478 Erasure coded storage aggregation in data centers
12/23/2014US8917572 Semiconductor memory device and method of testing the same
12/23/2014US8917564 Three-dimensional semiconductor memory device having compensating data skewing according to interlayer timing delay and method of de-skewing data therein
12/23/2014US8917563 Semiconductor device and information processing system including an input circuit with a delay
12/23/2014US8917533 Circuit and system for testing a one-time programmable (OTP) memory
12/18/2014US20140372816 Accessing data stored in a command/address register device
12/18/2014US20140372815 Apparatus and method to reduce power delivery noise for partial writes
12/18/2014US20140372814 Method for testing a memory and memory system
12/18/2014US20140369145 Semiconductor Device and Test Method Thereof
12/18/2014US20140369144 Chip tester and test method of semiconductor device
12/18/2014US20140369143 Apparatuses and methods for mapping memory addresses to redundant memory
12/17/2014CN104217768A 一种eMMC内嵌式存储器的检测方法和装置 Method and apparatus for detecting embedded eMMC memory
12/17/2014CN104217767A 一种非易失性存储器测试装置及其测试方法 A non-volatile memory test device and test methods
12/17/2014CN104217766A 一种对阻变存储器阵列进行测试的系统 A resistive memory array test system
12/17/2014CN104217765A 闪存芯片操作时间的测量方法 Measurement of flash memory chips operating time
12/17/2014CN104217761A 数据储存装置及其错误校正方法 Data storage device and error correction method
12/17/2014CN104216665A 多层单元固态硬盘的存储管理方法 MLC SSD storage management
12/17/2014CN102831935B 相变存储器单元的脉冲iv特性测试方法和装置 Pulse iv characteristic test method and apparatus of phase change memory cells
12/17/2014CN102339641B 检错/纠错校验模块及该模块读写数据的方法 The method of error detection / correction calibration module and the module to read and write data
12/17/2014CN102298972B 快闪记忆体的资料读取方法 Flash memory data reading method
12/17/2014CN101866698B 使用纠错编码电路的安全闪存 Using the error correction encoding circuit of secure flash
12/16/2014US8914713 Erasure coding scheme for deadlines
12/16/2014US8914708 Bad wordline/array detection in memory
12/16/2014US8914707 Distributed storage network for modification of a data object
12/16/2014US8914706 Using parity data for concurrent data authentication, correction, compression, and encryption
12/16/2014US8914705 Probability maximum transition run codes
12/16/2014US8914703 Method for copying data in reprogrammable non-volatile memory
12/16/2014US8914702 Bit error repair method and information processing apparatus
12/16/2014US8914692 DRAM test architecture for wide I/O DRAM based 2.5D/3D system chips
12/16/2014US8914690 Multi-core processor having disabled cores
12/16/2014US8914688 System and method of reducing test time via address aware BIST circuitry
12/16/2014US8914687 Providing test coverage of integrated ECC logic en embedded memory
12/16/2014US8913451 Memory device and test method thereof
12/16/2014US8913450 Memory cell array with reserved sector for storing configuration information
12/16/2014US8913449 System and method of in-system repairs or configurations for memories
12/16/2014US8913414 Semiconductor apparatus and semiconductor system for outputting internal information according to various mode and method for outputting internal information thereof
12/16/2014US8912818 High speed multiple memory interface I/O cell
12/11/2014US20140365837 Test apparatus and method for testing server
12/11/2014US20140365836 Device and Method for Resolving an LM Flag Issue
12/11/2014US20140362654 Redundancy evaluation circuit for semiconductor device
12/10/2014CN204008994U 一种多位宽大容量叠装芯片的测试板 A multi-chip large-capacity stacking test board
12/10/2014CN104205236A 抗洗脱的环氧粘合剂组合物及预胶凝粘合剂 Anti eluted epoxy adhesive composition and pre-gelling binder
12/10/2014CN104205235A 用于处理从非易失性存储器阵列检索的状态置信度数据的方法和设备 Method for processing a confidence data retrieved from the nonvolatile memory array and a state of the device
12/10/2014CN104205234A 用于存储器电路测试引擎的通用地址加扰器 General address scrambler for the memory circuit testing engine
12/10/2014CN104205233A 用于堆叠的存储器架构的内建自测试 For stacking memory BIST architecture
12/10/2014CN104205232A 用于存储器设备的芯片上冗余修复 On-chip memory device for redundancy repair
12/10/2014CN104205231A 非易失性存储器组件 Non-volatile memory components
12/10/2014CN104205230A 使用非易失性存储器的多频闪读取来获得状态置信度数据的方法和系统 Using non-volatile memory to obtain a multi-state read strobe confidence data method and system
12/10/2014CN104205227A 铁电随机存取存储器(fram)布局设备和方法 Ferroelectric random access memory (fram) layout of equipment and methods
12/10/2014CN104200847A 存储器地址的测试方法及测试装置 Test methods and test device memory address
12/10/2014CN104200846A 一种嵌入式prom测试系统及实现方法 Prom and an embedded test system implementation
12/10/2014CN104200845A 一种分析阻变存储器电流波动性的方法 A method of resistance-change memory current analysis of volatility
12/10/2014CN104200836A 表征随机存储器单元抗电流噪声容限的方法及测试结构 Characterization of the anti-current random access memory cell noise margin method and test structure
12/10/2014CN104200835A 在数据存储器中识别供电中断和重建数据存储器的方法 Identification in data memory power outages and reconstruction data storage method
12/10/2014CN102592683B 一种芯片测试模式的进入方法及相关装置 A chip test pattern into the method and related apparatus
12/10/2014CN102411993B 固态硬盘的测试方法和装置 Method and apparatus for testing SSDs
12/10/2014CN102288903B 一种fpga内连线资源的测试结构及方法 A test structure and method fpga interconnection resources
12/09/2014US8910030 Redistributing parity in a storage system
12/09/2014US8910022 Retrieval of encoded data slices and encoded instruction slices by a computing device
12/09/2014US8910021 Automatic defect management in memory devices
12/09/2014US8910020 Intelligent bit recovery for flash memory
12/09/2014US8910019 Method and apparatus for veiling and detecting data using an error correcting code
12/09/2014US8910018 Memory with dynamic error detection and correction
12/09/2014US8910017 Flash memory with random partition
12/09/2014US8910002 NAND flash-based storage device with built-in test-ahead for failure anticipation
12/09/2014US8910001 Generic march element based memory built-in self test
12/09/2014US8910000 Program-disturb management for phase change memory
12/09/2014US8909998 Phase shift adjusting method and circuit
12/09/2014US8908465 Using storage cells to perform computation
12/09/2014US8908454 Memory architecture with redundant resources
12/09/2014US8908451 Data output circuit of semiconductor device
12/09/2014US8908448 Semiconductor memory apparatus and method of controlling external voltage using the same
12/09/2014US8908436 Method and device for storing and reading reliable information in a NAND array
12/09/2014US8907698 On-die termination circuit and termination method
12/04/2014US20140359401 Field-Repair System and Method
12/04/2014US20140359400 Selection of Data for Redundancy Calculation in Three Dimensional Nonvolatile Memory
12/04/2014US20140359391 Memory system and method using partial ecc to achieve low power refresh and fast access to data
12/04/2014US20140359383 Address windowing for at-speed bitmapping with memory built-in self-test
12/04/2014US20140355369 Memory operation upon failure of one of two paired memory devices
12/04/2014US20140355368 Semiconductor device
12/04/2014US20140355345 Adaptive Operation of Three Dimensional Memory
12/04/2014US20140355344 Adaptive Operation of Three Dimensional Memory
12/04/2014US20140355340 Updating read voltages
12/02/2014US8904261 Data management in solid state storage devices
12/02/2014US8904260 Robust hamming code implementation for soft error detection, correction, and reporting in a multi-level cache system using dual banking memory scheme
12/02/2014US8904250 Autorecovery after manufacturing/system integration
12/02/2014US8904249 At speed testing of high performance memories with a multi-port BIS engine
12/02/2014US8904248 Noise rejection for built-in self-test with loopback
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