| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 02/16/2006 | DE19781328B4 Speichertestgerät Memory tester |
| 02/16/2006 | DE19639972B4 Hochgeschwindigkeitstestschaltkreis für eine Halbleiterspeichervorrichtung High-speed test circuit for a semiconductor memory device |
| 02/16/2006 | DE10335978B4 Hub-Baustein zum Anschließen von einem oder mehreren Speicherbausteinen Hub module for connecting one or more storage devices |
| 02/16/2006 | DE102004035549A1 Process for replacing a defective memory chip uses substitute module to replace both defective and surrounding cells |
| 02/16/2006 | DE10026276B4 Halbleiterschaltungsanordnung Semiconductor circuitry |
| 02/15/2006 | EP1626413A1 A row decoder for nand memoiries |
| 02/15/2006 | EP1625573A1 Method of error correction coding, and apparatus for and method of recording data using the coding method |
| 02/15/2006 | CN1734675A Integrated circuit memory with fast page mode verify |
| 02/15/2006 | CN1242416C Protection circuit |
| 02/15/2006 | CN1242415C Semiconductor memory device power control method and semiconductor memory device |
| 02/15/2006 | CN1242329C Automatic insert method for semiconductor integrated circuit and simplified circuit test |
| 02/14/2006 | US7000171 Recorded medium reproducing device and method, data output controlling method, data outputting method, error detecting method, and data outputting reproducing method |
| 02/14/2006 | US7000160 Semiconductor integrated circuit and a method of testing the same |
| 02/14/2006 | US7000159 System and method for testing memory |
| 02/14/2006 | US7000156 Devices for storing and accumulating defect information, semiconductor device and device for testing the same |
| 02/14/2006 | US7000155 Redundancy register architecture for soft-error tolerance and methods of making the same |
| 02/14/2006 | US7000062 System and method featuring a controller device and a memory module that includes an integrated circuit buffer device and a plurality of integrated circuit memory devices |
| 02/14/2006 | US6999887 Memory cell signal window testing apparatus |
| 02/14/2006 | US6999366 Magnetic memory including a sense result category between logic states |
| 02/14/2006 | US6999363 Non-volatile memory with test rows for disturb detection |
| 02/14/2006 | US6999362 Method of stress-testing an isolation gate in a dynamic random access memory |
| 02/14/2006 | US6999361 Method and apparatus for data compression in memory devices |
| 02/14/2006 | US6999360 Shift redundancy circuit, method for controlling shift redundancy circuit, and semiconductor memory device |
| 02/14/2006 | US6999359 Method for screening failure of memory cell transistor |
| 02/14/2006 | US6999358 Semiconductor memory device |
| 02/14/2006 | US6999357 Memory circuit with redundant memory cell array allowing simplified shipment tests and reduced power consumptions |
| 02/14/2006 | US6999356 Semiconductor device capable of readjusting a reference potential during the reliabilty test |
| 02/14/2006 | US6999353 Semiconductor memory device including page latch circuit |
| 02/14/2006 | US6999349 Semiconductor nonvolatile storage device |
| 02/14/2006 | US6999347 Non-volatile semiconductor memory device with expected value comparison capability |
| 02/14/2006 | US6999341 Thin-film magnetic memory device with memory cells having magnetic tunnel junction |
| 02/14/2006 | US6999340 Semiconductor memory device including reference memory cell and control method |
| 02/14/2006 | US6999339 Integrated circuit including sensor to sense environmental data, method of compensating an MRAM integrated circuit for the effects of an external magnetic field, MRAM integrated circuit, and method of testing |
| 02/14/2006 | US6999336 Ferroelectric memory |
| 02/14/2006 | US6999334 System and method for determining the logic state of a memory cell in a magnetic tunnel junction memory device |
| 02/14/2006 | US6999333 Method and apparatus for assessing one-time programmable cells |
| 02/14/2006 | US6998892 Method and apparatus for accommodating delay variations among multiple signals |
| 02/14/2006 | US6998868 Test key for bridge and continuity testing |
| 02/09/2006 | WO2006013529A1 Data storage and replay apparatus |
| 02/09/2006 | WO2005114670B1 Pipelined data relocation and improved chip architectures |
| 02/09/2006 | US20060031739 Converting circuitforpreventing wrong errorcorrection codes from occurring due to an error correction rule duringdata reading operation |
| 02/09/2006 | US20060031726 Programmable multi-mode built-in self-test and self-repair structure for embedded memory arrays |
| 02/09/2006 | US20060031725 Algorithm pattern generator for testing a memory device and memory tester using the same |
| 02/09/2006 | US20060028900 Memory device employing open bit line architecture for providing identical data topology on repaired memory cell block and method thereof |
| 02/09/2006 | US20060028885 Synchronous semiconductor memory device of fast random cycle system and test method thereof |
| 02/09/2006 | US20060028884 Nonvolatile semiconductor memory device |
| 02/09/2006 | US20060028883 Information storage device, information storage method, and information storage program |
| 02/09/2006 | US20060028853 Semiconductor device |
| 02/09/2006 | US20060028655 Methods and systems for precisely relatively positioning a waist of a pulsed laser beam and method and system for controlling energy delivered to a target structure |
| 02/09/2006 | DE19924153B4 Schaltungsanordnung zur Reparatur eines Halbleiterspeichers Circuit arrangement for repairing a semiconductor memory |
| 02/08/2006 | EP1624465A1 Programmable multi-mode built-in self-test and self-repair structure for embedded memory arrays |
| 02/08/2006 | EP1624464A1 Built-in self diagnosis device for a random access memory and method of diagnosing a random access memory |
| 02/08/2006 | EP1624463A1 A Programmable memory device with an improved redundancy structure |
| 02/08/2006 | EP1624461A2 Writable tracking cells |
| 02/08/2006 | EP1624458A1 Adaptive algorithm for MRAM manufacturing |
| 02/08/2006 | CN1732537A Method of addressing individual memory devices on a memory module |
| 02/08/2006 | CN1731363A Method and apparatus for a modified parity check |
| 02/08/2006 | CN1241206C Memory equipment having page buffer with double-register and using method thereof |
| 02/08/2006 | CN1241205C Address generating circuit |
| 02/07/2006 | US6996766 Error detection/correction code which detects and corrects a first failing component and optionally a second failing component |
| 02/07/2006 | US6996760 ASIC BIST employing stored indications of completion |
| 02/07/2006 | US6996755 Squence control circuit |
| 02/07/2006 | US6996754 Integrated circuit device having an internal state monitoring function |
| 02/07/2006 | US6996753 Wafer burn-in test mode circuit |
| 02/07/2006 | US6996752 System, method, and computer program product within a data processing system for converting a spare storage device to a defined storage device in a logical volume |
| 02/07/2006 | US6996749 Method and apparatus for providing debug functionality in a buffered memory channel |
| 02/07/2006 | US6996020 Semiconductor memory device |
| 02/07/2006 | US6996017 Redundant memory structure using bad bit pointers |
| 02/07/2006 | US6996014 Memory devices with page buffer having dual registers and method of using the same |
| 02/02/2006 | US20060026489 Nonvolatile memory and nonvolatile memory apparatus |
| 02/02/2006 | US20060026482 Test apparatus |
| 02/02/2006 | US20060023526 Semiconductor memory test apparatus |
| 02/02/2006 | US20060023525 Compact decode and multiplexing circuitry for a multi-port memory having a common memory interface |
| 02/02/2006 | US20060023524 Nonvolatile semiconductor memory and method for setting replacement information in nonvolatile semiconductor memory |
| 02/02/2006 | US20060023514 Semiconductor nonvolatile storage device |
| 02/02/2006 | DE69634778T2 Vorrichtung zum parallelen prüfen von halbleiterschaltkreisen Apparatus for parallel check of semiconductor switching circuits |
| 02/02/2006 | DE19752212B4 Störereigniszählvorrichtung Störereigniszählvorrichtung |
| 02/02/2006 | DE19730347B4 Statische Halbleitervorrichtung, die eine variable Stromversorgungsspannung, die an eine Speicherzelle angelegt wird, abhängig von dem Status im Gebrauch aufweist, und Verfahren zum Testen derselben Static semiconductor device, which, depending has a variable power supply voltage, which is applied to a memory cell from the state in use, and methods of testing same |
| 02/02/2006 | DE19612407B4 Halbleiterspeichereinrichtung A semiconductor memory device |
| 02/02/2006 | DE10356851B4 Schieberegister zum sicheren Bereitstellen eines Konfigurationsbits Shift register for providing a safe configuration bits |
| 02/01/2006 | EP1622167A2 Cache memory and processor and their production methods |
| 02/01/2006 | EP1620857A1 Enabling memory redundancy during testing |
| 02/01/2006 | CN1729400A Semiconductor test instrument |
| 02/01/2006 | CN1728284A Method for seanning flash memory chip in flash memory disk |
| 02/01/2006 | CN1728283A Apparatus and method for testing semiconductor memory device |
| 02/01/2006 | CN1240076C Semiconductor storage device |
| 01/31/2006 | USRE38956 Data compression circuit and method for testing memory devices |
| 01/31/2006 | US6993701 Row-diagonal parity technique for enabling efficient recovery from double failures in a storage array |
| 01/31/2006 | US6993696 Semiconductor memory device with built-in self test circuit operating at high rate |
| 01/31/2006 | US6993692 Method, system and apparatus for aggregating failures across multiple memories and applying a common defect repair solution to all of the multiple memories |
| 01/31/2006 | US6993691 Series connected TC unit type ferroelectric RAM and test method thereof |
| 01/31/2006 | US6993690 Memory unit having memory status indicator |
| 01/31/2006 | US6993688 Data sector error tracking and correction mechanism |
| 01/31/2006 | US6992949 Method and circuit for controlling generation of column selection line signal |
| 01/31/2006 | US6992939 Method and apparatus for identifying short circuits in an integrated circuit device |
| 01/31/2006 | US6992938 Methods and apparatuses for test circuitry for a dual-polarity non-volatile memory cell |
| 01/31/2006 | US6992937 Column redundancy for digital multilevel nonvolatile memory |
| 01/31/2006 | US6992924 Magnetic memory and method for optimizing write current in a magnetic memory |
| 01/31/2006 | US6992911 Semiconductor memory device |
| 01/31/2006 | US6992534 Circuits and methods of temperature compensation for refresh oscillator |