Patents
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
06/2006
06/29/2006US20060143541 Method of and apparatus for detecting an error in writing to persistent memory
06/29/2006US20060140030 System for performing fast testing during flash reference cell setting
06/29/2006US20060140029 Semiconductor memory device
06/29/2006US20060140028 Semiconductor device and manufacturing method thereof
06/29/2006US20060140027 Semiconductor memory device and method of operating the same
06/29/2006US20060140026 Method and apparatus for improving yield in semiconductor devices by guaranteeing health of redundancy information
06/29/2006DE102004041553B4 Testverfahren zum Bestimmen der Verdrahtung von Schaltungsträgern mit darauf angeordneten Bauelementen Test method for determining the wiring of circuit carriers with components arranged thereon,
06/28/2006EP1675009A2 Addressing error and address detection systems and methods
06/28/2006EP1674875A1 Invalidation of an integrated circuit
06/28/2006EP1497730B1 Methods for storing data in non-volatile memories
06/28/2006CN1795393A Signal integrity self-test architecture
06/28/2006CN1794357A Time controllable sensing project for sensing amplifier in storage test
06/27/2006US7069493 Semiconductor memory device equipped with error correction circuit
06/27/2006US7069484 System for optimizing anti-fuse repair time using fuse id
06/27/2006US7069482 ROM error-correction control
06/27/2006US7069377 Scratch control memory array in a flash memory device
06/27/2006US7068561 Semiconductor memory device for controlling cell block with state machine
06/27/2006US7068555 Semiconductor memory storage device and a redundancy control method therefor
06/27/2006US7068553 Row redundancy circuit
06/27/2006US7068083 Synchronous output buffer, synchronous memory device and method of testing access time
06/22/2006WO2006063851A2 Test method, control circuit and system for reduced time combined write window and retention testing
06/22/2006WO2006063850A2 Random access memory having test circuit with test data compression
06/22/2006US20060136800 Memory system and semiconductor memory device
06/22/2006US20060136793 Memory power models related to access information and methods thereof
06/22/2006US20060136792 Random access memory having test circuit
06/22/2006US20060136791 Test method, control circuit and system for reduced time combined write window and retention testing
06/22/2006US20060136153 Technique for determining performance characteristics of electronic devices and systems
06/22/2006US20060133167 Nonvolatile semiconductor memory device using irreversible storage elements
06/22/2006US20060133166 Semiconductor memory
06/22/2006DE102004059206A1 Dynamic RAM module, has address converter designed such that its output address depends on its input address and numerical values stored in address storage, and address decoder selecting memory cell which is assigned to output address
06/21/2006EP1672647A1 A non-volatile memory device supporting high-parallelism test at wafer level
06/21/2006EP1671328A1 Accelerated life test of mram celles
06/21/2006EP1314087B1 Nonvolatile fuse in redundancy circuit for low-voltage flash memories and method for enhancing the same
06/21/2006EP1031992B1 Flash EEPROM system
06/21/2006CN1791943A Test of RAM address decoder for resistive open defects
06/21/2006CN1791942A Testing ram address decoder for resistive open defects
06/21/2006CN1790292A Data management technique for improving data reliability
06/21/2006CN1260807C Reference bit stabilizing method for multibit storage unit
06/21/2006CN1260655C Data latch time regulator
06/20/2006US7065697 Systems and methods of partitioning data to facilitate error correction
06/20/2006US7065689 Diagonal testing method for flash memories
06/20/2006US7065688 Simultaneous multiprocessor memory testing and initialization
06/20/2006US7065687 Method for replacing defective memory cells in data processing apparatus
06/20/2006US7065686 Dual port RAM
06/20/2006US7064995 Storage device employing a flash memory
06/20/2006US7064991 Semiconductor storage device
06/20/2006US7064988 Synchronous semiconductor memory device of fast random cycle system and test method thereof
06/20/2006US7064984 Circuit and method for reducing leakage current in a row driver circuit in a flash memory during a standby mode of operation
06/20/2006US7064983 Method for programming a reference cell
06/20/2006US7064571 Multiple-select multiplexer circuit, semiconductor memory device including a multiplexer circuit and method of testing the semiconductor memory device
06/20/2006US7064569 Detecting a current with a sensor having a wheatsone bridge
06/20/2006US7064018 Methods for fabricating three dimensional integrated circuits
06/15/2006US20060129899 Monitoring of solid state memory devices in active memory system utilizing redundant devices
06/15/2006US20060129898 Method for accessing a data sector and processing a bad sector in a hard disk drive of a mobile communication terminal
06/15/2006US20060129866 Test validation of an integrated device
06/15/2006US20060129776 Method, system and memory controller utilizing adjustable read data delay settings
06/15/2006US20060126412 Integrated circuit device having a test circuit to measure AC characteristics of internal memory macro
06/15/2006US20060126411 Pipelined burst memory access
06/15/2006US20060126410 Reduction of fusible links and associated circuitry on memory dies
06/15/2006US20060126409 Reduction of fusible links and associated circuitry on memory dies
06/15/2006US20060126408 Memory buffer
06/15/2006US20060126407 Methods for repairing and for operating a memory component
06/15/2006US20060126396 Method, system, and circuit for operating a non-volatile memory array
06/15/2006US20060124987 Capacitor of semiconductor device and method for manufacturing the same
06/14/2006EP1668671A2 Apparatus and method for selectively configuring a memory device using a bi-stable relay
06/14/2006EP1018029A4 Programmable formatter circuit for integrated circuit tester
06/14/2006DE102004059392A1 Random access memory recharging method for e.g. command memory, uses subsystem with processor to detect memory error and renew content by an error routine
06/14/2006DE102004057484B3 Semiconductor memory chip testing method in which the value of a control bit is used to control whether or not subsequent bits in a test string are jumped over or read
06/14/2006DE102004052246B3 Semiconductor device for determining electrical characteristics of checking device for semiconductor devices, has many terminal contacts, controller, many measuring units and trigger logic with many inputs and outputs
06/14/2006DE10031947B4 Schaltungsanordnung zum Ausgleich unterschiedlicher Spannungen auf Leitungszügen in integrierten Halbleiterschaltungen Circuitry to compensate for different voltages on line trains in semiconductor integrated circuits
06/13/2006US7062697 Pre-stored digital word generator
06/13/2006US7062695 Memory implementation for handling integrated circuit fabrication faults
06/13/2006US7062694 Concurrently programmable dynamic memory built-in self-test (BIST)
06/13/2006US7062691 Method and apparatus for displaying test results and recording medium
06/13/2006US7062690 System for testing fast synchronous digital circuits, particularly semiconductor memory chips
06/13/2006US7062689 Method and apparatus for memory self testing
06/13/2006US7062678 Diagnostic memory interface test
06/13/2006US7062619 Mass storage device architecture and operation
06/13/2006US7062597 Integrated circuit buffer device
06/13/2006US7062425 Method and apparatus for automated enumeration, simulation, identification and/or irradiation of device attributes
06/13/2006US7061817 Data path having grounded precharge operation and test compression capability
06/13/2006US7061816 Semiconductor memory storage device and its redundant method
06/13/2006US7061815 Semiconductor memory device providing redundancy
06/13/2006US7061800 Nonvolatile semiconductor memory device having improved redundancy relieving rate
06/13/2006US7061783 Content addressable memory (CAM) capable of finding errors in a CAM cell array and a method thereof
06/13/2006US7060512 Patching methods and apparatus for fabricating memory modules
06/13/2006US7059378 Fabric light control window covering
06/13/2006CA2202692C Column redundancy in semiconductor memories
06/08/2006WO2006059797A1 Semiconductor memory device with redundancy function
06/08/2006WO2006059559A1 Magnetic random access memory, operation method thereof, and manufacturing method thereof
06/08/2006WO2005006173A3 Data storage array
06/08/2006US20060123323 Interleaving apparatus and method for orthogonal frequency division multiplexing transmitter
06/08/2006US20060123322 Predictive error correction code generation facilitating high-speed byte-write in a semiconductor memory
06/08/2006US20060123321 System and method for reconstructing lost data in a storage system
06/08/2006US20060123299 Semiconductor integrated circuit and a method of testing the same
06/08/2006US20060123295 Register file and its storage device
06/08/2006US20060123286 Test error detection method and system
06/08/2006US20060123285 Dynamic threshold scaling in a communication system
06/08/2006US20060123284 Method of determining defects in information storage medium, recording/reproducing apparatus using the same, and information storage medium
06/08/2006US20060123283 Information storage medium, recording/reproducing apparatus, and recording/reproducing method