| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 08/08/2006 | US7088624 System of multiplexed data lines in a dynamic random access memory |
| 08/08/2006 | US7088128 Circuit module |
| 08/08/2006 | US7088122 Test arrangement for testing semiconductor circuit chips |
| 08/03/2006 | WO2006081168A1 Automated tests for built-in self test |
| 08/03/2006 | US20060174172 Toggle memory burst |
| 08/03/2006 | US20060171221 Method for analyzing critical defects in analog integrated circuits |
| 08/03/2006 | US20060171220 Test data topology write to memory using latched sense amplifier data and row address scrambling |
| 08/03/2006 | US20060171219 Memory array decoder |
| 08/03/2006 | US20060171218 Semiconductor memory device having N-bit prefetch type and method of transferring data thereof |
| 08/03/2006 | US20060171217 Apparatus and method for low cost, multi-port protocol analysis and monitoring |
| 08/02/2006 | EP1685571A2 A method circuit and system for determining a reference voltage |
| 08/02/2006 | EP1685570A1 Refresh for dynamic cells by identifying those with weak retention and refreshing them more often than those with normal retention |
| 08/02/2006 | EP1620857A4 Enabling memory redundancy during testing |
| 08/02/2006 | CN1813197A Memory bus checking procedure |
| 08/02/2006 | CN1811992A Flexible internal address counting method and apparatus |
| 08/02/2006 | CN1811991A NAND gate flash storage testing/repairing/rewriting/analyzing four combined into one apparatus |
| 08/02/2006 | CN1267997C Semiconductor storage device |
| 08/02/2006 | CN1267740C Apparatus and method for testing circuit modules |
| 08/02/2006 | CN1267738C Semiconductor measurer and semiconductor measuring method |
| 08/01/2006 | US7085975 Method and apparatus for generating expect data from a captured bit pattern, and memory device using same |
| 08/01/2006 | US7085974 Semiconductor device, method of testing the same and electronic instrument |
| 08/01/2006 | US7085973 Testing address lines of a memory controller |
| 08/01/2006 | US7085972 System for testing a group of functionally independent memories and for replacing failing memory words |
| 08/01/2006 | US7085971 ECC based system and method for repairing failed memory elements |
| 08/01/2006 | US7085958 System and method for isolating a faulty switch, storage device or SFP in a daisy-chained configuration |
| 08/01/2006 | US7085702 Method and system for modeling and automatically generating an embedded system from a system-level environment |
| 08/01/2006 | US7085182 Fuse blowing interface for a memory chip |
| 08/01/2006 | US7085181 Semiconductor device having storage circuit which stores data in nonvolatile manner by using fuse element |
| 08/01/2006 | US7085180 Method and structure for enabling a redundancy allocation during a multi-bank operation |
| 08/01/2006 | US7085179 Integrated circuit having a non-volatile memory cell transistor as a fuse device |
| 08/01/2006 | US7085154 Device and method for pulse width control in a phase change memory device |
| 08/01/2006 | US7084675 Circuit and method of generating a boosted voltage |
| 08/01/2006 | US7084673 Output driver with pulse to static converter |
| 07/27/2006 | WO2006045755A3 Method and device for increasing the availability of a memory unit and memory unit |
| 07/27/2006 | US20060168499 Data archive verify software |
| 07/27/2006 | US20060168498 Test apparatus and program for testing a dut |
| 07/27/2006 | US20060168488 Method and system for testing RAM redundant integrated circuits |
| 07/27/2006 | US20060164894 Enabling test modes of individual integrated circuit devices out of a plurality of integrated circuit devices |
| 07/27/2006 | US20060164893 Defect address storing circuit for semiconductor memory device |
| 07/27/2006 | US20060164886 Nonvolatile semiconductor memory device having protection function for each memory block |
| 07/27/2006 | DE19835258B4 Integrierte dynamische Speicherschaltung mit einer Selbsttesteinrichtung Integrated dynamic memory circuit having a self-test device |
| 07/27/2006 | DE102005022768A1 Flash memory device transfers address signal to address comparator in 8-bit output mode, based on output mode decision signal and 8-bit forced decision signal |
| 07/27/2006 | DE102005001520A1 Integrated memory circuit e.g. dynamic RAM memory circuit, for memory module, has repairing circuit with test unit including modification unit to modify bits of read-out data, such that position of bits is changed and bits are inverted |
| 07/27/2006 | DE10163274B4 IC-Messvorrichtung IC-measuring apparatus |
| 07/26/2006 | EP1683019A2 Lane testing with variable mapping |
| 07/26/2006 | EP1604371B1 Memory system having sequentially performed fast and slow data reading mechanisms |
| 07/26/2006 | CN1809896A Semiconductor test apparatus and control method therefor |
| 07/26/2006 | CN1266754C Semiconductor memory device with reduced package test time |
| 07/25/2006 | US7082559 Semiconductor integrated circuit device and test method thereof |
| 07/25/2006 | US7082558 Increasing possible test patterns which can be used with sequential scanning techniques to perform speed analysis |
| 07/25/2006 | US7082513 Integrated memory and method for checking the functioning of an integrated memory |
| 07/25/2006 | US7082510 Storage device employing a flash memory |
| 07/25/2006 | US7082072 Semiconductor memory device with refreshment control |
| 07/25/2006 | US7082068 Semiconductor memory device and method for adjusting internal voltage thereof |
| 07/25/2006 | US7082067 Circuit for verifying the write speed of SRAM cells |
| 07/25/2006 | US7082066 Flash memory having spare sector with shortened access time |
| 07/25/2006 | US7082065 Method and apparatus for efficient utilization of electronic fuse source connections |
| 07/25/2006 | US7081635 High activity, spatially distributed radiation source for accurately simulating semiconductor device radiation environments |
| 07/20/2006 | WO2006057963A3 Memory transaction burst operation and memory components supporting temporally multiplexed error correction coding |
| 07/20/2006 | US20060161833 Software testing |
| 07/20/2006 | US20060161825 Non-volatile memory device supporting high-parallelism test at wafer level |
| 07/20/2006 | US20060161824 System and method of testing a plurality of memory blocks of an integrated circuit in parallel |
| 07/20/2006 | US20060161823 Disk array system configuring a logical disk drive having a redundancy function |
| 07/20/2006 | DE69832015T2 Halbleiterspeicher mit einer verbesserten Prüfschaltung A semiconductor memory with an improved test circuit |
| 07/20/2006 | DE69831918T2 Speicherschaltung mit DMA Prüfung und sein Prüfverfahren Memory circuit with DMA testing and test methods to be |
| 07/20/2006 | DE112004001838T5 Spannungstrimmschaltung Voltage trimming circuit |
| 07/20/2006 | DE102005000812A1 Integrierter Halbleiterspeicher mit Testschaltung für Leseverstärker Integrated semiconductor memory with a test circuit for the sense amplifier |
| 07/20/2006 | DE102004027423A1 Speicherschaltung mit redundanten Speicherbereichen Memory circuit with redundant memory areas |
| 07/19/2006 | CN1806293A Universally accessible fully programmable memory built-in self-test (mbist) system and method |
| 07/19/2006 | CN1805054A Method for testing semiconductor chips using register sets |
| 07/19/2006 | CN1805053A Method for testing semiconductor chips by means of bit masks |
| 07/19/2006 | CN1805052A Apparatus and method to visually indicate the status of a data storage device |
| 07/19/2006 | CN1265461C Integrated circuit for storage |
| 07/19/2006 | CN1265457C Semiconductor storage device with tediously long system |
| 07/19/2006 | CN1265422C Semiconductor device producing system and method |
| 07/19/2006 | CN1265396C Mixed packing semiconductor integrate circuit device of controller mass storage and measuring method |
| 07/19/2006 | CN1265267C Transmission channel and its control method |
| 07/18/2006 | US7080297 Memory circuit and method for reading out data |
| 07/18/2006 | US7080296 Method for managing defects on an optical disk |
| 07/18/2006 | US7079971 Fail analysis device |
| 07/18/2006 | US7079960 Auto classification shipping system |
| 07/18/2006 | US7079467 Data processing apparatus and method for d=2 optical channels |
| 07/18/2006 | US7079436 Resistive cross point memory |
| 07/18/2006 | US7079432 Semiconductor storage device formed to optimize test technique and redundancy technology |
| 07/18/2006 | US7079431 Arrangement with a memory for storing data |
| 07/18/2006 | US7079430 Memory device with built-in error-correction capabilities |
| 07/18/2006 | US7079420 Method for operating a memory device |
| 07/18/2006 | US7079411 Ferroelectric nonvolatile code data output device |
| 07/18/2006 | US7078945 Semiconductor device having logic circuit and macro circuit |
| 07/18/2006 | US7078928 Semiconductor integrated circuit device |
| 07/18/2006 | US7078263 Method and apparatus for hermetic sealing of assembled die |
| 07/18/2006 | US7076953 Method for controlling an engine with VGT and EGR systems |
| 07/13/2006 | US20060156197 Information recording medium, recording apparatus and method for an information recording medium, reproducing apparatus and method for an information recording medium computer program for controlling record or reproduction, and data structure including control signal |
| 07/13/2006 | US20060156196 Semiconductor storage device and pseudo SRAM |
| 07/13/2006 | US20060156195 Information recording medium, recording apparatus and method for an information recording medium, reproducing apparatus and method for an information recording medium computer program for controlling record or reproduction, and data structure including control signal |
| 07/13/2006 | US20060156194 Method for reallocation of a memory of a subsystem, and subsystem |
| 07/13/2006 | US20060156193 Error test for an address decoder of a non-volatile memory |
| 07/13/2006 | US20060156192 Semiconductor memory device |
| 07/13/2006 | US20060156191 Memory addressing error protection systems and methods |
| 07/13/2006 | US20060156190 System and method for efficient use of memory device bandwidth |