| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
|---|
| 05/04/2006 | US20060092728 Circuit and method for test mode entry of a semiconductor memory device |
| 05/04/2006 | US20060092727 Flood mode implementation for continuous bitline local evaluation circuit |
| 05/04/2006 | US20060092726 Memory redundancy programming |
| 05/04/2006 | US20060092725 Redundancy circuit and repair method for a semiconductor memory device |
| 05/04/2006 | US20060092724 Semiconductor memory device with MOS transistors each having floating gate and control gate |
| 05/04/2006 | DE19543834B4 Defektzellen-Reparaturschaltkreis und Defektzellen-Reparaturverfahren für eine Halbleiterspeichervorrichtung Defective cell repair circuit defect cells and repairing method for a semiconductor memory device |
| 05/04/2006 | DE102005051308A1 Test procedure for memory device e.g. for microprocessor system, includes central device configured to receive memory control information |
| 05/04/2006 | DE102005050394A1 Simulieren einer Bedingung einer floatenden Wortleitung in einer Speichervorrichtung und verwandte Techniken Simulating a condition of a floating word line in a memory device and related techniques |
| 05/04/2006 | DE102005046697A1 Integrated semiconductor memory e.g. DRAM, has data- and address-terminals driven via supply lines |
| 05/04/2006 | DE102004052594B3 Integrierter Halbleiterspeicher Integrated semiconductor memory |
| 05/04/2006 | DE102004051346A1 Halbleiter-Bauelement-Test-Einrichtung, insbesondere Daten-Zwischenspeicher-Bauelement mit Halbleiter-Bauelement-Test-Einrichtung, sowie Halbleiter-Bauelement-Test-Verfahren Semiconductor device testing apparatus, in particular data latch device having semiconductor device testing apparatus, and semiconductor device testing method |
| 05/04/2006 | DE102004051345A1 Halbleiter-Bauelement, sowie Verfahren zum Ein- und/oder Ausgeben von Testdaten A semiconductor device, and method for mounting and / or outputting of test data |
| 05/04/2006 | DE102004051344A1 Semiconductor-component test device e.g. for testing integrated computing circuits, uses shift register with additional memory device for tapping further pseudo-random value |
| 05/03/2006 | EP1653374A2 Method and apparatus for coordinating memory operations among diversely-located memory components |
| 05/03/2006 | CN1768330A A high reliability memory module with a fault tolerant address and command bus |
| 05/03/2006 | CN1767072A Error detecting memory module and method |
| 05/03/2006 | CN1767069A Nonvolatile memory devices and methods of verifying data in nonvolatile memory devices |
| 05/03/2006 | CN1767054A Memory device |
| 05/03/2006 | CN1767053A Semiconductor storage device and method of testing thereof |
| 05/02/2006 | US7039848 Data recording medium, data recording method and apparatus, data playback method and apparatus, and data determination method |
| 05/02/2006 | US7039847 Coding-decoding device and method for conversion of binary sequences |
| 05/02/2006 | US7039843 Modeling custom scan flops in level sensitive scan design |
| 05/02/2006 | US7039838 Method for testing a circuit unit to be tested and test apparatus |
| 05/02/2006 | US7039782 Memory system with channel multiplexing of multiple memory devices |
| 05/02/2006 | US7039545 Apparatus, system and/or method for converting a serial test to a parallel test |
| 05/02/2006 | US7038969 Semiconductor memory having a spare memory cell |
| 05/02/2006 | US7038957 Semiconductor memory device for testifying over-driving quantity depending on position |
| 05/02/2006 | US7038956 Apparatus and method for reading out defect information items from an integrated chip |
| 05/02/2006 | US7038955 Semiconductor device and testing apparatus for semiconductor device |
| 05/02/2006 | US7038949 Non-volatile memory device capable of changing increment of program voltage according to mode of operation |
| 05/02/2006 | US7038925 Static semiconductor memory device having T-type bit line structure |
| 05/02/2006 | US7038523 Voltage trimming circuit |
| 05/02/2006 | US7038481 Method and apparatus for determining burn-in reliability from wafer level burn-in |
| 05/02/2006 | US7038469 Method of determining localized electron tunneling in a capacitive structure |
| 04/27/2006 | US20060090117 Method And Related Apparatus For Data Error Checking |
| 04/27/2006 | US20060090108 Method and apparatus for testing a memory device with compressed data using a single output |
| 04/27/2006 | US20060090107 Semiconductor device |
| 04/27/2006 | US20060090106 Generalized BIST for multiport memories |
| 04/27/2006 | US20060090105 Built-in self test for read-only memory including a diagnostic mode |
| 04/27/2006 | US20060090104 Adapting RCU for real-time operating system usage |
| 04/27/2006 | US20060087307 Single pin multilevel integrated circuit test interface |
| 04/27/2006 | DE20221512U1 Memory system for data processor, has differential signaling data bus with symbol time lesser than specific address and control bus symbol time |
| 04/27/2006 | DE102004050104A1 Halbleiter-Bauelement, sowie Verfahren zum Auslesen von Testdaten A semiconductor device, and method of reading test data |
| 04/27/2006 | DE102004022327B4 Integrierter Halbleiterspeicher Integrated semiconductor memory |
| 04/26/2006 | CN1253724C Circuit arrangement for detecting malfunction |
| 04/26/2006 | CN1253723C Device for indicating capacity and method for measuring capacity |
| 04/25/2006 | US7036068 Error correction coding and decoding in a solid-state storage device |
| 04/25/2006 | US7036058 Semiconductor device having integrally sealed integrated circuit chips arranged for improved testing |
| 04/25/2006 | US7036057 Range splitting read/write methods for CD-MRW |
| 04/25/2006 | US7036056 Semiconductor memory device having time reduced in testing of memory cell data reading or writing, or testing of sense amplifier performance |
| 04/25/2006 | US7036055 Arrangements for self-measurement of I/O specifications |
| 04/25/2006 | US7036054 Memory bus checking procedure |
| 04/25/2006 | US7036053 Two dimensional data eye centering for source synchronous data transfers |
| 04/25/2006 | US7035751 Nonvolatile memory microcomputer chip, and a method for testing the nonvolatile memory microcomputer chip |
| 04/25/2006 | US7035164 Semiconductor memory device with a bypass circuit for verifying the characteristics of an internal clock signal |
| 04/25/2006 | US7035159 Techniques for storing accurate operating current values |
| 04/25/2006 | US7035158 Semiconductor memory with self fuse programming |
| 04/25/2006 | US7035154 Semiconductor memory device and its test method as well as test circuit |
| 04/25/2006 | US7035153 Semiconductor memory device of bit line twist system |
| 04/25/2006 | US7035142 Non volatile memory device including a predetermined number of sectors |
| 04/25/2006 | US7035137 Semiconductor memory device having memory cells including ferromagnetic films and control method thereof |
| 04/25/2006 | US7035131 Dynamic random access memory cell leakage current detector |
| 04/25/2006 | US7034564 Method for universally testing semiconductor devices with different pin arrangement |
| 04/25/2006 | US7034560 Device and method for testing integrated circuit dice in an integrated circuit module |
| 04/20/2006 | WO2006042058A2 Memory regulator system with test mode |
| 04/20/2006 | WO2006040900A1 Testing device and testing method for testing object memory storing data raw with error correcting codes added |
| 04/20/2006 | WO2005015569A3 Hub module for connecting one or more memory devices, comprising an address decoder unit for addressing redundant memory areas |
| 04/20/2006 | US20060085705 Memory circuit comprising an initialization unit, and method for optimizing data reception parameters in a memory controller |
| 04/20/2006 | US20060085704 Semi-conductor component, as well as a process for the reading of test data |
| 04/20/2006 | US20060085703 Memory cell test circuit for use in semiconductor memory device and its method |
| 04/20/2006 | US20060085702 Integrated circuit fuses having corresponding storage circuitry |
| 04/20/2006 | US20060085701 Method and apparatus for separating native, functional and test configurations of memory |
| 04/20/2006 | US20060085700 Decoder based set associative repair cache systems and methods |
| 04/20/2006 | US20060085589 Status register to improve initialization of a synchronous memory |
| 04/20/2006 | US20060083090 Method and apparatus for identifying short circuits in an integrated circuit device |
| 04/20/2006 | US20060083089 Non-volatile memory with test rows for disturb detection |
| 04/20/2006 | US20060083088 Spintronic devices with integrated transistors |
| 04/20/2006 | US20060083087 Apparatus and method for semiconductor device repair with reduced number of programmable elements |
| 04/20/2006 | US20060083086 Memory circuit with redundant memory cell array allowing simplified shipment tests and reduced power consumptions |
| 04/20/2006 | US20060083085 Integrated circuit device and testing method thereof |
| 04/20/2006 | US20060083084 Semiconductor test system |
| 04/20/2006 | US20060083063 Memory devices with page buffer having dual registers and method of using the same |
| 04/20/2006 | US20060083061 Flash cell fuse circuit |
| 04/20/2006 | US20060083049 Ferroelectric memory |
| 04/20/2006 | DE10338678B4 Vorrichtung und Verfahren zum Testen von zu testenden Schaltungseinheiten Apparatus and method for testing the circuit under test units |
| 04/19/2006 | EP1647992A1 Memory circuit with a substitution memory for faulty memory cells |
| 04/19/2006 | EP1647990A1 Method for refreshing a dynamic RAM, and corresponding dynamic RAM device, in particular incorporated in a cellular mobile telephone |
| 04/19/2006 | EP1647882A2 Disk array system |
| 04/19/2006 | EP1647031A1 Memory device and method of storing fail addresses of a memory cell |
| 04/19/2006 | CN1762028A Memory system having fast and slow data reading mechanisms |
| 04/19/2006 | CN1760987A Memory cell test circuit for use in semiconductor memory device and its method |
| 04/19/2006 | CN1760838A Data detection system and method of read only memory in basic input/output system |
| 04/19/2006 | CN1252807C Apparatus for testing integrated module and method for operating the testing device |
| 04/19/2006 | CN1252730C Storage circuit with test compression function |
| 04/19/2006 | CN1252727C Thin film magnetic storing device containing storage unit with magnetic tunnel junction |
| 04/19/2006 | CN1252724C Self-detecting of magnetic-resistance memory array |
| 04/18/2006 | US7032196 Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor device |
| 04/18/2006 | US7032158 System and method for recognizing and configuring devices embedded on memory modules |
| 04/18/2006 | US7032157 Method for optimizing UDMA transfer signals using CRC errors |
| 04/18/2006 | US7032144 Method and apparatus for testing multi-port memories |