| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 03/09/2006 | DE102004040799A1 Computer memory chip testing method in which an external test unit is used and test data written to reference and test registers prior to a bit by bit comparison of the two |
| 03/08/2006 | CN1745434A Improved method for reading a non-volatile memory cell adjacent to an inactive region of a non-volatile memory cell array |
| 03/08/2006 | CN1745433A Zone boundary adjustment for defects in non-volatile memories |
| 03/08/2006 | CN1745432A Error recovery for nonvolatile memory |
| 03/08/2006 | CN1744230A Semiconductor memory devices having column redundancy circuits therein that support multiple memory blocks |
| 03/07/2006 | US7010741 Method and circuit for error correction in CAM cells |
| 03/07/2006 | US7010740 Data storage system having no-operation command |
| 03/07/2006 | US7010735 Stuck-at fault scan chain diagnostic method |
| 03/07/2006 | US7010732 Built-in test support for an integrated circuit |
| 03/07/2006 | US7010729 Timing generator and test apparatus |
| 03/07/2006 | US7010726 Method and apparatus for saving data used in error analysis |
| 03/07/2006 | US7010643 Status register to improve initialization of a synchronous memory |
| 03/07/2006 | US7010642 System featuring a controller device and a memory module that includes an integrated circuit buffer device and a plurality of integrated circuit memory devices |
| 03/07/2006 | US7010623 External storage subsystem |
| 03/07/2006 | US7009900 Circuit arrangement for reading out, evaluating and reading in again a charge state into a memory cell |
| 03/07/2006 | US7009897 Semiconductor memory device capable of applying stress voltage to bit line pair |
| 03/07/2006 | US7009896 Apparatus and method for managing bad blocks in a flash memory |
| 03/07/2006 | US7009895 Method for skip over redundancy decode with very low overhead |
| 03/07/2006 | US7009885 Circuit and method for reducing leakage current in a row driver circuit in a flash memory during a standby mode of operation |
| 03/07/2006 | US7009883 Automatic programming time selection for one time programmable memory |
| 03/07/2006 | US7009879 Test terminal negation circuit for protecting data integrity |
| 03/07/2006 | US7009417 Semiconductor module and methods for functionally testing and configuring a semiconductor module |
| 03/02/2006 | WO2005050465A3 Lane testing with variable mapping |
| 03/02/2006 | US20060048023 Test method for nonvolatile memory |
| 03/02/2006 | US20060048022 Method for testing the serviceability of bit lines in a DRAM memory device |
| 03/02/2006 | US20060044916 Zero-enabled fuse-set |
| 03/02/2006 | US20060044899 Method and apparatus for destroying flash memory |
| 03/02/2006 | US20060044898 Semiconductor memory device and electronic equipment |
| 03/02/2006 | US20060044897 Semiconductor memory having testable redundant memory cells |
| 03/02/2006 | US20060044896 Defect management enabled PIRM and method |
| 03/02/2006 | US20060044895 System and method for capacitive coupled via structures in information handling system circuit boards |
| 03/02/2006 | DE19729163B4 System und Verfahren zur Abtaststeuerung einer programmierbaren Sicherungsschaltung in einer integrierten Schaltung System and method for scanning control of a programmable fuse circuit in an integrated circuit |
| 03/02/2006 | DE19542033B4 Redundanzschaltung und Redundanzverfahren für eine Halbleiterspeichervorrichtung Redundancy circuit and method for a redundancy semiconductor memory device |
| 03/01/2006 | EP1629506A1 Test of ram address decoder for resistive open defects |
| 03/01/2006 | EP1629505A1 Testing ram address decoder for resistive open defects |
| 03/01/2006 | CN1742344A Multiple trip point fuse latch device and test method of the fuse |
| 03/01/2006 | CN1741196A Test method for nonvolatile memory |
| 03/01/2006 | CN1244052C Non-volatile memory chip for computer and test method thereof |
| 02/28/2006 | US7007222 Apparatus for accessing data stored on an optical disc |
| 02/28/2006 | US7007215 Test circuit capable of testing embedded memory with reliability |
| 02/28/2006 | US7007211 Testing self-repairing memory of a device |
| 02/28/2006 | US7007210 Method and system for handling multiple bit errors to enhance system reliability |
| 02/28/2006 | US7007131 Method and apparatus including special programming mode circuitry which disables internal program verification operations by a memory |
| 02/28/2006 | US7006932 Technique for determining performance characteristics of electronic devices and systems |
| 02/28/2006 | US7006395 Semiconductor integrated circuit |
| 02/28/2006 | US7006394 Apparatus and method for semiconductor device repair with reduced number of programmable elements |
| 02/28/2006 | US7006392 Memory redundancy programming |
| 02/28/2006 | US7006391 Semiconductor memory device allowing increase in capacity and operation speed with a suppressed layout area |
| 02/28/2006 | US7006386 Storage device employing a flash memory |
| 02/28/2006 | US7005873 Built-in self-test hierarchy for an integrated circuit |
| 02/23/2006 | WO2006018947A1 Test device and test method |
| 02/23/2006 | WO2005006173A9 Data storage array |
| 02/23/2006 | US20060041823 Method and apparatus for storing and retrieving multiple point-in-time consistent data sets |
| 02/23/2006 | US20060041801 Acceleration of the programming of a memory module with the aid of a boundary scan (bscan) register |
| 02/23/2006 | US20060041800 Method and apparatus for generating and detecting initialization patterns for high speed DRAM systems |
| 02/23/2006 | US20060041799 Test apparatus, phase adjusting method and memory controller |
| 02/23/2006 | US20060041798 Design techniques to increase testing efficiency |
| 02/23/2006 | US20060039225 Semiconductor device, nonvolatile semiconductor memory, system including a plurality of semiconductor devices or nonvolatile semiconductor memories, electric card including semiconductor device or nonvolatile semiconductor memory, and electric device with which this electric card can be used |
| 02/23/2006 | US20060039213 Integrated circuit I/O using a high performance bus interface |
| 02/23/2006 | US20060039210 Memory address repair without enable fuses |
| 02/23/2006 | US20060039178 Device having a memory array storing each bit in multiple memory cells |
| 02/23/2006 | US20060039174 Memory module with termination component |
| 02/23/2006 | DE102004039393A1 Verfahren zum Testen einer Speichervorrichtung und Speichervorrichtung zur Durchführung des Verfahrens A method of testing a storage device and storage device for implementing the method |
| 02/23/2006 | DE102004037590A1 Integrierte Schaltung und Verfahren zum Betrieb einer solchen Integrated circuit and method for operating such a |
| 02/23/2006 | DE102004006288B4 Integrierter Halbleiterspeicher mit redundanten Speicherzellen sowie Verfahren zum Testen eines integrierten Halbleiterspeichers mit redundanten Speicherzellen und Verfahren zum Betreiben eines integrierten Halbleiterspeichers mit redundanten Speicherzellen Integrated semiconductor memory with redundant memory cells as well as methods for testing an integrated semiconductor memory with redundant memory cells and methods for operating an integrated semiconductor memory with redundant memory cells |
| 02/23/2006 | DE10011180B4 Digitale Speicherschaltung Digital memory circuit |
| 02/22/2006 | EP1535131A4 System and method for self-testing and repair of memory modules |
| 02/22/2006 | EP0946988B1 Memory redundancy circuit using single polysilicon floating gate transistors as redundancy elements |
| 02/22/2006 | CN1243376C Device and method for parallel testing semiconductor device |
| 02/22/2006 | CN1243251C Modular structure for testing momery in testing system based on event |
| 02/22/2006 | CN1243250C Data failure storage compression of semiconductor testing system |
| 02/21/2006 | US7003714 Dynamic data space |
| 02/21/2006 | US7003713 Variable Hamming error correction for a one-time-programmable-ROM |
| 02/21/2006 | US7003706 Method, system, and program for improved device blocking and suspension |
| 02/21/2006 | US7003704 Two-dimensional redundancy calculation |
| 02/21/2006 | US7003673 Method for storing and operating on data units in a security module and associated security module |
| 02/21/2006 | US7003622 Semiconductor memory |
| 02/21/2006 | US7003618 System featuring memory modules that include an integrated circuit buffer devices |
| 02/21/2006 | US7003432 Method of and system for analyzing cells of a memory device |
| 02/21/2006 | US7002859 On-die switchable test circuit |
| 02/21/2006 | US7002858 Semiconductor memory device which selectively controls a local input/output line sense amplifier |
| 02/21/2006 | US7002853 Memory card having a buffer memory for storing testing instruction |
| 02/21/2006 | US7002851 Storage device employing a flash memory |
| 02/21/2006 | US7002844 Method of repairing a failed wordline |
| 02/21/2006 | US7002831 Magnetic semiconductor memory device |
| 02/21/2006 | US7002828 Flash cell fuse circuit |
| 02/21/2006 | US7002822 Content addressable memory device |
| 02/21/2006 | US7002500 Circuit, apparatus and method for improved current distribution of output drivers enabling improved calibration efficiency and accuracy |
| 02/21/2006 | US7002367 Method and apparatus for low capacitance, high output impedance driver |
| 02/21/2006 | US7002364 Semiconductor device for reducing the number of probing pad used during wafer test and method for testing the same |
| 02/21/2006 | US7002232 Semiconductor integrated circuit device and method of testing the same |
| 02/21/2006 | US7000648 Device picker in handler |
| 02/16/2006 | US20060036921 Apparatus and method for dynamically repairing a semiconductor memory |
| 02/16/2006 | US20060036918 Method and apparatus to compare pointers associated with asynchronous clock domains |
| 02/16/2006 | US20060036917 Method for testing a memory device and memory device for carrying out the method |
| 02/16/2006 | US20060036916 Memory with test mode output |
| 02/16/2006 | US20060034145 Synchronous semiconductor memory device of fast random cycle system and test method thereof |
| 02/16/2006 | US20060034143 Semiconductor memory device having the operating voltage of the memory cell controlled |
| 02/16/2006 | US20060034137 Programmable memory device with an improved redundancy structure |
| 02/16/2006 | US20060034136 Using redundant memory for extra features |