| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
|---|
| 09/13/2006 | EP1700313A1 Adaptive deterministic grouping of blocks into multi-block units |
| 09/13/2006 | CN1833293A Method and apparatus for measuring current as in sensing a memory cell |
| 09/13/2006 | CN1832050A Method for reliable contact of probe and nano-electrode of phase transformation memory device unit |
| 09/13/2006 | CN1832049A Memory addressing error protection systems and methods |
| 09/13/2006 | CN1832047A Electrical fuses memory grid with redundancy backup function and redundancy backup method thereof |
| 09/13/2006 | CN1832042A Program verification for non-volatile memory |
| 09/13/2006 | CN1275159C Burst read incorporating output based redundancy |
| 09/12/2006 | US7107508 Manufacturing test for a fault tolerant magnetoresistive solid-state storage device |
| 09/12/2006 | US7107507 Magnetoresistive solid-state storage device and data storage methods for use therewith |
| 09/12/2006 | US7107504 Test apparatus for semiconductor device |
| 09/12/2006 | US7107501 Test device, test system and method for testing a memory circuit |
| 09/12/2006 | US7107500 Test mode circuit of semiconductor memory device |
| 09/12/2006 | US7107474 Data transfer unit and method |
| 09/12/2006 | US7107467 Semiconductor memory device having a circuit for removing noise from a power line of the memory device using a plurality of decoupling capactors |
| 09/12/2006 | US7106644 Memory device and method for burn-in test |
| 09/12/2006 | US7106643 Method for manufacturing memory device provided with a defect recovery mechanism featuring a redundancy circuit |
| 09/12/2006 | US7106641 Dynamic semiconductor memory device |
| 09/12/2006 | US7106640 Semiconductor memory device capable of detecting repair address at high speed |
| 09/12/2006 | US7106639 Defect management enabled PIRM and method |
| 09/12/2006 | US7106627 Nonvolatile semiconductor memory device with redundancy and security information circuitry |
| 09/12/2006 | US7106127 Temperature sensor and method for detecting trip temperature of a temperature sensor |
| 09/08/2006 | WO2006092953A1 Testing device, and testing method |
| 09/08/2006 | WO2006063851A3 Test method, control circuit and system for reduced time combined write window and retention testing |
| 09/07/2006 | US20060200729 Data storing method of dynamic RAM and semiconductor memory device |
| 09/07/2006 | US20060200728 Synchronous semiconductor storage device having error correction function |
| 09/07/2006 | US20060200727 Semiconductor device |
| 09/07/2006 | US20060200726 Failure trend detection and correction in a data storage array |
| 09/07/2006 | US20060200714 Test equipment for semiconductor |
| 09/07/2006 | US20060200713 Method and apparatus for memory self testing |
| 09/07/2006 | US20060200712 System and method for testing memory |
| 09/07/2006 | US20060200642 System and method for an asynchronous data buffer having buffer write and read pointers |
| 09/07/2006 | US20060198217 Multiple level cell memory device with single bit per cell, re-mappable memory block |
| 09/07/2006 | US20060198216 Memory array architecture for a memory device and method of operating the memory array architecture |
| 09/07/2006 | US20060198215 Memory device and method for testing memory devices with repairable redundancy |
| 09/07/2006 | US20060198214 Circuits and methods for controlling timing skew in semiconductor memory devices |
| 09/07/2006 | US20060198213 Non-volatile memory element |
| 09/07/2006 | US20060197546 Efficient Air-Flow Loop through Dual Burn-in Chambers with Removable Pattern-Generator Boards for Memory-Module Environmental Testing |
| 09/07/2006 | DE102006002889A1 Erzeugen einer internen Referenzspannung zum Testen von integrierten Schaltkreisen Generating an internal reference voltage for testing of integrated circuits |
| 09/06/2006 | EP1699056A1 A semiconductor memory module and a multi-layer circuit bord for |
| 09/06/2006 | CN1830038A Hub module for connecting one or more memory devices |
| 09/06/2006 | CN1273992C Writable tracking cells |
| 09/05/2006 | US7103859 System and method for improving testability independent of architecture |
| 09/05/2006 | US7103856 Determining points of maximum deflection of a printed circuit board under test |
| 09/05/2006 | US7103826 Memory system and controller for same |
| 09/05/2006 | US7103815 Testing of integrated circuit devices |
| 09/05/2006 | US7103814 Testing logic and embedded memory in parallel |
| 09/05/2006 | US7103812 Method and apparatus for tracking memory access statistics for data sharing applications |
| 09/05/2006 | US7103811 Mechanisms for detecting silent errors in streaming media devices |
| 09/05/2006 | US7103718 Non-volatile memory module for use in a computer system |
| 09/05/2006 | US7103493 Memory testing apparatus and method |
| 09/05/2006 | US7102959 Synchronous semiconductor memory device of fast random cycle system and test method thereof |
| 09/05/2006 | US7102954 Semiconductor integrated circuit device having logic circuit and dynamic random access memory on the same chip |
| 09/05/2006 | US7102953 Semiconductor memory device capable of operating at high speed and with low power consumption while ensuring reliability of memory cell |
| 09/05/2006 | US7102948 Resistance change sensor |
| 09/05/2006 | US7102943 Non-volatile semiconductor memory device |
| 09/05/2006 | US7102942 Encoding circuit for semiconductor device and redundancy control circuit using the same |
| 09/05/2006 | US7102941 Semiconductor memory device and portable electronic apparatus |
| 09/05/2006 | US7102926 Integrated circuit memory devices including programmed memory cells and programmable and erasable memory cells |
| 09/05/2006 | US7102924 Techniques of recovering data from memory cells affected by field coupling with adjacent memory cells |
| 09/05/2006 | US7102922 Thin film magnetic memory device capable of conducting stable data read and write operations |
| 09/05/2006 | US7102909 Storage circuit, semiconductor device, and electronic apparatus |
| 09/05/2006 | US7102413 Semiconductor integrated circuit device |
| 09/05/2006 | US7102362 Integrated circuit for testing circuit components of a semiconductor chip |
| 08/31/2006 | WO2006090443A1 Method for setting redundancy of storage device, and storage device |
| 08/31/2006 | WO2006090440A1 Storage device testing method and storage device |
| 08/31/2006 | WO2006063850A3 Random access memory having test circuit with test data compression |
| 08/31/2006 | US20060195766 Semiconductor memory device |
| 08/31/2006 | US20060195731 First failure data capture based on threshold violation |
| 08/31/2006 | US20060195730 Method and apparatus for file management |
| 08/31/2006 | US20060195651 Increasing the memory performance of flash memory devices by writing sectors simultaneously to multiple flash memory devices |
| 08/31/2006 | US20060193186 Method of designing semiconductor chip and program for use in designing semiconductor chip |
| 08/31/2006 | US20060193185 Semiconductor device with a plurality of fuse elements and method for programming the device |
| 08/31/2006 | US20060193184 Hub module for connecting one or more memory chips |
| 08/31/2006 | US20060193172 High bandwidth datapath load and test of multi-level memory cells |
| 08/31/2006 | US20060192845 Methods and systems for thermal-based laser processing a multi-material device |
| 08/31/2006 | US20060192600 Synchronous output buffer, synchronous memory device and method of testing access time |
| 08/31/2006 | DE69929397T2 Informationsaufzeichnungsverfahren und -gerät Information recording method and apparatus |
| 08/31/2006 | DE69833093T2 Schwebende Bitleitungen Prüfmodus mit digital steuerbaren Bitleitungen-Abgleichschaltungen Pending bit test mode with digitally controllable bit lines matching circuits |
| 08/31/2006 | DE102005007580A1 Integrated circuit unit e.g. memory circuit, testing device, has connecting unit for connecting tester circuit to circuit subunits, where one subunit has compression/decompression unit to exchange test and response signals between subunits |
| 08/30/2006 | EP1634172A4 Fault tolerant data storage circuit |
| 08/30/2006 | CN1826661A Memory device and method of storing fail addresses of a memory cell |
| 08/30/2006 | CN1825495A Error correction circuit and method |
| 08/30/2006 | CN1825494A Test data topology write to memory using latched data and row address scrambling |
| 08/30/2006 | CN1825493A Memory circuit |
| 08/30/2006 | CN1825492A Semiconductor memory device capable of switching from multiplex method to non-multiplex method |
| 08/30/2006 | CN1825488A Multi-time programmable semiconductor memory device and multi-time programming method therefor |
| 08/30/2006 | CN1825484A Method for operating a memory device |
| 08/30/2006 | CN1272841C Low-tension detector and method and system for detecting low-tension ferroeletric random access memory |
| 08/29/2006 | USRE39253 Apparatus and method for error correction |
| 08/29/2006 | US7100097 Detection of bit errors in maskable content addressable memories |
| 08/29/2006 | US7100090 Semiconductor memory device having a test circuit |
| 08/29/2006 | US7100071 System and method for allocating fail-over memory |
| 08/29/2006 | US7099960 External storage subsystem |
| 08/29/2006 | US7099224 Memory device and method for burn-in test |
| 08/29/2006 | US7099218 Differential current evaluation circuit and sense amplifier circuit for evaluating a memory state of an SRAM semiconductor memory cell |
| 08/29/2006 | US7099211 Flash memory device capable of reducing test time and test method thereof |
| 08/29/2006 | US7099209 Semiconductor memory device having repair circuit |
| 08/29/2006 | US7099208 Semiconductor memory automatically carrying out refresh operation |
| 08/29/2006 | US7099198 Row decoder in flash memory and erase method of flash memory cell using the same |
| 08/29/2006 | US7099194 Error recovery for nonvolatile memory |