Patents
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
01/2015
01/15/2015US20150019924 Fault bits scrambling memory and method thereof
01/15/2015US20150019922 Techniques for Adaptive Moving Read References for Memory Cell Read Error Recovery
01/15/2015US20150019767 Semiconductor memory device having data compression test circuit
01/15/2015US20150016200 Memory device for masking read data and a method of testing the same
01/15/2015US20150016194 Semiconductor memory device and memory system including the same
01/15/2015US20150016192 Method of using non-volatile memories for on-dimm memory address list storage
01/15/2015US20150016184 Magnetic field sensing using magnetoresistive random access memory (mram) cells
01/15/2015US20150016182 Sram memory card and voltage monitoring circuit
01/14/2015EP2823487A1 Apparatuses and methods including error correction code organization
01/14/2015EP2823486A1 Voltage mode sensing for low power flash memory
01/14/2015EP2823399A1 Apparatuses and methods for combining error coding and modulation schemes
01/14/2015CN204102578U 嵌入式单板的ddr颗粒信号测试治具 Ddr particles embedded board signal test fixture
01/14/2015CN204102577U 固态硬盘测试架 SSDs test stand
01/14/2015CN204102576U 芯片测试装置 Chip testing device
01/14/2015CN204102575U 芯片测试装置 Chip testing device
01/14/2015CN104282343A 半导体系统及其修复方法 Semiconductor systems and repair methods
01/14/2015CN104282342A 闪存装置、存储器控制器及闪存的控制方法 The method of controlling the flash memory device, memory controller and the flash memory
01/14/2015CN102446560B 面板驱动电路中嵌入式存储器的分析装置与方法 Apparatus and method for analyzing panel drive circuit embedded memory
01/13/2015US8935594 Structure of ECC spare bits in 3D memory
01/13/2015US8935593 Method and apparatus for flexible buffers in an XOR engine
01/13/2015US8935592 Apparatus and method for correcting errors in data accessed from a memory device
01/13/2015US8935591 System and method to correct errors in data read from a source supplying streaming data
01/13/2015US8935590 Circuitry and method for multi-bit correction
01/13/2015US8935584 System and method for performing scan test
01/13/2015US8935460 Memory apparatus
01/13/2015US8934312 Process variation skew in an SRAM column architecture
01/13/2015US8934311 Semiconductor memory device capable of screening a weak bit and repairing the same
01/13/2015US8933716 Test apparatus and testing method
01/13/2015US8933715 Configurable vertical integration
01/08/2015US20150012802 Write Operations for Defect Management in Nonvolatile Memory
01/08/2015US20150012787 Testing of non-volatile memory arrays
01/08/2015US20150012786 OPTIMIZING fuseROM USAGE FOR MEMORY REPAIR
01/08/2015US20150012785 Advanced Programming Verification Schemes for Analog Memory Cells
01/08/2015US20150012784 Mapping of random defects in a memory device
01/08/2015US20150009770 Semiconductor system and method for reparing the same
01/08/2015US20150009743 Low-Pin-Count Non-Volatile Memory Interface for 3D IC
01/08/2015DE112012006171T5 On-Chip-Redundanzreparatur für Speichergeräte On-chip redundancy for memory repair devices
01/07/2015CN104272396A 包含错误校正码组织的设备和方法 Contains device and method for error correction code organization
01/07/2015CN104272262A 物理页、逻辑页及码字对应 Physical page logical page and the corresponding codeword
01/07/2015CN104269190A 存储器的数据校验方法 Data verification method memory
01/07/2015CN103052990B 电阻变化型非易失性存储装置及其驱动方法 Variable resistance nonvolatile memory device and driving method
01/07/2015CN102592679B 一种闪存芯片的测试方法和闪存芯片 Test method for flash memory chips and flash memory chips
01/07/2015CN102486938B 一种快速检测存储器的方法及装置 Method and device for rapid detection of memory
01/07/2015CN102411994B 集成电路内置存储器的数据校验方法及装置 Method and apparatus for integrated data validation built-in memory
01/06/2015US8930783 pBIST read only memory image compression
01/06/2015US8930781 Method and apparatus for defect recovery
01/06/2015US8930780 Systems and methods for non-zero syndrome based processing
01/06/2015US8930779 Bit-replacement technique for DRAM error correction
01/06/2015US8930536 Virtual private cluster
01/06/2015US8929167 MRAM self-repair with BIST logic
01/06/2015US8929166 Fault masking method for non-volatile memories
01/06/2015US8929165 Memory device
01/06/2015US8929158 Auto-trimming of internally generated voltage level in an integrated circuit
01/06/2015US8929156 System-in package including semiconductor memory device and method for determining input/output pins of system-in package
01/06/2015US8929137 Operating method of memory having redundancy circuitry
01/01/2015US20150006984 Managing non-volatile media
01/01/2015US20150006983 Read voltage setting method, and control circuit, and memory storage apparatus using the same
01/01/2015US20150003171 Semiconductor device, semiconductor system including the same and test method thereof
01/01/2015US20150003156 Nand flash word line management
01/01/2015US20150003141 Semiconductor memory device and repair method thereof
12/2014
12/31/2014CN104254889A 共享芯片选择线的封装存储器管芯 Packaged memory die shared chip select line
12/31/2014CN104252883A 闪存管理方法和系统 Flash memory management methods and systems
12/31/2014CN102708929B 一种扫描切片测试数据编码方法及装置 A scanning test data slice coding method and apparatus
12/31/2014CN102664044B 一种车载收放机的u盘兼容性自动化测试系统及方法 An automated u disk compatibility testing system and method of car cassette players
12/31/2014CN102568614B 一种相变存储器单元高速擦写测试系统 A phase change memory cell erase speed test system
12/31/2014CN102543182B 随机化电路、存储器控制单元、存储器、通信系统及方法 Unit, a memory, a communication system and method for randomization circuit, the memory control
12/31/2014CN101937719B 将信息数据写入闪速存储器件时处理写错误的方法和装置 Method and apparatus for handling write errors when writing information data into flash memory device
12/30/2014US8924835 Content addressable memory continuous error detection with interleave parity
12/30/2014US8924834 Error correction circuit for data communication providing parallelizable linear programming decoding
12/30/2014US8924832 Efficient error handling mechanisms in data storage systems
12/30/2014US8924820 Memory controller, semiconductor memory system, and memory control method
12/30/2014US8924819 Memory device and operation method thereof
12/30/2014US8924818 Partial reconfiguration and error detection in an integrated circuit
12/30/2014US8924817 Method and apparatus for calculating error correction codes for selective data updates
12/30/2014US8924816 Method and system to improve the performance and/or reliability of a solid-state drive
12/30/2014US8924805 Computer memory test structure
12/30/2014US8924671 Semiconductor storage device and control method thereof
12/30/2014US8924601 Apparatus and method for defect revectoring in a multi-channel mass storage device
12/30/2014US8923085 Low-pin-count non-volatile memory embedded in a integrated circuit without any additional pins for access
12/30/2014US8923083 Method of identifying damaged bitline address in non-volatile
12/30/2014US8923082 Semiconductor device on which wafer-level burn-in test is performed and manufacturing method thereof
12/30/2014US8923066 Storage of read thresholds for NAND flash storage using linear approximation
12/30/2014US8922250 Semiconductor device and semiconductor system including the same
12/30/2014US8922235 Method and system for testing semiconductor device
12/25/2014US20140380117 Semiconductor memory device
12/25/2014US20140380116 Semiconductor memory device
12/25/2014US20140380109 Semiconductor memory device and method of operating the same
12/25/2014US20140380108 Method and system to obtain state confidence data using multistrobe read of a non-volatile memory
12/25/2014US20140380107 Testing electronic memories based on fault and test algorithm periodicity
12/25/2014US20140380092 Efficient raid technique for reliable ssd
12/25/2014US20140376324 Testing through-silicon-vias
12/25/2014US20140376320 Spare memory external to protected memory
12/25/2014US20140376295 Memory device and system including the same
12/24/2014CN104246898A 局部错误检测和全局错误纠正 Local error detection and error correction globally
12/24/2014CN104246895A 用于低功率闪存存储器的电压模式感测 A flash memory for low power sensing voltage mode
12/24/2014CN104246709A 用于存储器装置的错误保护 Memory means for error protection
12/24/2014CN104240770A 半导体装置及测试方法 Semiconductor device and test methods
12/24/2014CN104240769A 半导体器件、多芯片封装体以及利用半导体器件的半导体系统 Semiconductor system semiconductor device, and a multi-chip package using a semiconductor device
12/24/2014CN104240768A 用于测试存储器的方法和存储器系统 Method for testing a memory and a memory system
12/24/2014CN104240767A 针对电容结构和mos管结构的存储器件的参数测试方法 Test methods for parameter mos capacitor structure and tube structure of a memory device
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