Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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01/15/2015 | US20150019924 Fault bits scrambling memory and method thereof |
01/15/2015 | US20150019922 Techniques for Adaptive Moving Read References for Memory Cell Read Error Recovery |
01/15/2015 | US20150019767 Semiconductor memory device having data compression test circuit |
01/15/2015 | US20150016200 Memory device for masking read data and a method of testing the same |
01/15/2015 | US20150016194 Semiconductor memory device and memory system including the same |
01/15/2015 | US20150016192 Method of using non-volatile memories for on-dimm memory address list storage |
01/15/2015 | US20150016184 Magnetic field sensing using magnetoresistive random access memory (mram) cells |
01/15/2015 | US20150016182 Sram memory card and voltage monitoring circuit |
01/14/2015 | EP2823487A1 Apparatuses and methods including error correction code organization |
01/14/2015 | EP2823486A1 Voltage mode sensing for low power flash memory |
01/14/2015 | EP2823399A1 Apparatuses and methods for combining error coding and modulation schemes |
01/14/2015 | CN204102578U 嵌入式单板的ddr颗粒信号测试治具 Ddr particles embedded board signal test fixture |
01/14/2015 | CN204102577U 固态硬盘测试架 SSDs test stand |
01/14/2015 | CN204102576U 芯片测试装置 Chip testing device |
01/14/2015 | CN204102575U 芯片测试装置 Chip testing device |
01/14/2015 | CN104282343A 半导体系统及其修复方法 Semiconductor systems and repair methods |
01/14/2015 | CN104282342A 闪存装置、存储器控制器及闪存的控制方法 The method of controlling the flash memory device, memory controller and the flash memory |
01/14/2015 | CN102446560B 面板驱动电路中嵌入式存储器的分析装置与方法 Apparatus and method for analyzing panel drive circuit embedded memory |
01/13/2015 | US8935594 Structure of ECC spare bits in 3D memory |
01/13/2015 | US8935593 Method and apparatus for flexible buffers in an XOR engine |
01/13/2015 | US8935592 Apparatus and method for correcting errors in data accessed from a memory device |
01/13/2015 | US8935591 System and method to correct errors in data read from a source supplying streaming data |
01/13/2015 | US8935590 Circuitry and method for multi-bit correction |
01/13/2015 | US8935584 System and method for performing scan test |
01/13/2015 | US8935460 Memory apparatus |
01/13/2015 | US8934312 Process variation skew in an SRAM column architecture |
01/13/2015 | US8934311 Semiconductor memory device capable of screening a weak bit and repairing the same |
01/13/2015 | US8933716 Test apparatus and testing method |
01/13/2015 | US8933715 Configurable vertical integration |
01/08/2015 | US20150012802 Write Operations for Defect Management in Nonvolatile Memory |
01/08/2015 | US20150012787 Testing of non-volatile memory arrays |
01/08/2015 | US20150012786 OPTIMIZING fuseROM USAGE FOR MEMORY REPAIR |
01/08/2015 | US20150012785 Advanced Programming Verification Schemes for Analog Memory Cells |
01/08/2015 | US20150012784 Mapping of random defects in a memory device |
01/08/2015 | US20150009770 Semiconductor system and method for reparing the same |
01/08/2015 | US20150009743 Low-Pin-Count Non-Volatile Memory Interface for 3D IC |
01/08/2015 | DE112012006171T5 On-Chip-Redundanzreparatur für Speichergeräte On-chip redundancy for memory repair devices |
01/07/2015 | CN104272396A 包含错误校正码组织的设备和方法 Contains device and method for error correction code organization |
01/07/2015 | CN104272262A 物理页、逻辑页及码字对应 Physical page logical page and the corresponding codeword |
01/07/2015 | CN104269190A 存储器的数据校验方法 Data verification method memory |
01/07/2015 | CN103052990B 电阻变化型非易失性存储装置及其驱动方法 Variable resistance nonvolatile memory device and driving method |
01/07/2015 | CN102592679B 一种闪存芯片的测试方法和闪存芯片 Test method for flash memory chips and flash memory chips |
01/07/2015 | CN102486938B 一种快速检测存储器的方法及装置 Method and device for rapid detection of memory |
01/07/2015 | CN102411994B 集成电路内置存储器的数据校验方法及装置 Method and apparatus for integrated data validation built-in memory |
01/06/2015 | US8930783 pBIST read only memory image compression |
01/06/2015 | US8930781 Method and apparatus for defect recovery |
01/06/2015 | US8930780 Systems and methods for non-zero syndrome based processing |
01/06/2015 | US8930779 Bit-replacement technique for DRAM error correction |
01/06/2015 | US8930536 Virtual private cluster |
01/06/2015 | US8929167 MRAM self-repair with BIST logic |
01/06/2015 | US8929166 Fault masking method for non-volatile memories |
01/06/2015 | US8929165 Memory device |
01/06/2015 | US8929158 Auto-trimming of internally generated voltage level in an integrated circuit |
01/06/2015 | US8929156 System-in package including semiconductor memory device and method for determining input/output pins of system-in package |
01/06/2015 | US8929137 Operating method of memory having redundancy circuitry |
01/01/2015 | US20150006984 Managing non-volatile media |
01/01/2015 | US20150006983 Read voltage setting method, and control circuit, and memory storage apparatus using the same |
01/01/2015 | US20150003171 Semiconductor device, semiconductor system including the same and test method thereof |
01/01/2015 | US20150003156 Nand flash word line management |
01/01/2015 | US20150003141 Semiconductor memory device and repair method thereof |
12/31/2014 | CN104254889A 共享芯片选择线的封装存储器管芯 Packaged memory die shared chip select line |
12/31/2014 | CN104252883A 闪存管理方法和系统 Flash memory management methods and systems |
12/31/2014 | CN102708929B 一种扫描切片测试数据编码方法及装置 A scanning test data slice coding method and apparatus |
12/31/2014 | CN102664044B 一种车载收放机的u盘兼容性自动化测试系统及方法 An automated u disk compatibility testing system and method of car cassette players |
12/31/2014 | CN102568614B 一种相变存储器单元高速擦写测试系统 A phase change memory cell erase speed test system |
12/31/2014 | CN102543182B 随机化电路、存储器控制单元、存储器、通信系统及方法 Unit, a memory, a communication system and method for randomization circuit, the memory control |
12/31/2014 | CN101937719B 将信息数据写入闪速存储器件时处理写错误的方法和装置 Method and apparatus for handling write errors when writing information data into flash memory device |
12/30/2014 | US8924835 Content addressable memory continuous error detection with interleave parity |
12/30/2014 | US8924834 Error correction circuit for data communication providing parallelizable linear programming decoding |
12/30/2014 | US8924832 Efficient error handling mechanisms in data storage systems |
12/30/2014 | US8924820 Memory controller, semiconductor memory system, and memory control method |
12/30/2014 | US8924819 Memory device and operation method thereof |
12/30/2014 | US8924818 Partial reconfiguration and error detection in an integrated circuit |
12/30/2014 | US8924817 Method and apparatus for calculating error correction codes for selective data updates |
12/30/2014 | US8924816 Method and system to improve the performance and/or reliability of a solid-state drive |
12/30/2014 | US8924805 Computer memory test structure |
12/30/2014 | US8924671 Semiconductor storage device and control method thereof |
12/30/2014 | US8924601 Apparatus and method for defect revectoring in a multi-channel mass storage device |
12/30/2014 | US8923085 Low-pin-count non-volatile memory embedded in a integrated circuit without any additional pins for access |
12/30/2014 | US8923083 Method of identifying damaged bitline address in non-volatile |
12/30/2014 | US8923082 Semiconductor device on which wafer-level burn-in test is performed and manufacturing method thereof |
12/30/2014 | US8923066 Storage of read thresholds for NAND flash storage using linear approximation |
12/30/2014 | US8922250 Semiconductor device and semiconductor system including the same |
12/30/2014 | US8922235 Method and system for testing semiconductor device |
12/25/2014 | US20140380117 Semiconductor memory device |
12/25/2014 | US20140380116 Semiconductor memory device |
12/25/2014 | US20140380109 Semiconductor memory device and method of operating the same |
12/25/2014 | US20140380108 Method and system to obtain state confidence data using multistrobe read of a non-volatile memory |
12/25/2014 | US20140380107 Testing electronic memories based on fault and test algorithm periodicity |
12/25/2014 | US20140380092 Efficient raid technique for reliable ssd |
12/25/2014 | US20140376324 Testing through-silicon-vias |
12/25/2014 | US20140376320 Spare memory external to protected memory |
12/25/2014 | US20140376295 Memory device and system including the same |
12/24/2014 | CN104246898A 局部错误检测和全局错误纠正 Local error detection and error correction globally |
12/24/2014 | CN104246895A 用于低功率闪存存储器的电压模式感测 A flash memory for low power sensing voltage mode |
12/24/2014 | CN104246709A 用于存储器装置的错误保护 Memory means for error protection |
12/24/2014 | CN104240770A 半导体装置及测试方法 Semiconductor device and test methods |
12/24/2014 | CN104240769A 半导体器件、多芯片封装体以及利用半导体器件的半导体系统 Semiconductor system semiconductor device, and a multi-chip package using a semiconductor device |
12/24/2014 | CN104240768A 用于测试存储器的方法和存储器系统 Method for testing a memory and a memory system |
12/24/2014 | CN104240767A 针对电容结构和mos管结构的存储器件的参数测试方法 Test methods for parameter mos capacitor structure and tube structure of a memory device |