| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 10/03/2006 | US7117422 Error detection in storage data |
| 10/03/2006 | US7117421 Transparent error correction code memory system and method |
| 10/03/2006 | US7117420 Construction of an optimized SEC-DED code and logic for soft errors in semiconductor memories |
| 10/03/2006 | US7117414 Method for identifying an integrated circuit |
| 10/03/2006 | US7117410 Distributed failure analysis memory for automatic test equipment |
| 10/03/2006 | US7117409 Multi-port memory testing method utilizing a sequence folding scheme for testing time reduction |
| 10/03/2006 | US7117408 Method and system of testing data retention of memory |
| 10/03/2006 | US7117407 Method for testing a semiconductor memory having a plurality of memory banks |
| 10/03/2006 | US7117406 Semiconductor memory device and method of testing same |
| 10/03/2006 | US7117405 Extender card with intercepting EEPROM for testing and programming un-programmed memory modules on a PC motherboard |
| 10/03/2006 | US7117404 Test circuit for testing a synchronous memory circuit |
| 10/03/2006 | US7117403 Method and device for generating digital signal patterns |
| 10/03/2006 | US7117401 Method and apparatus for optimizing timing for a multi-drop bus |
| 10/03/2006 | US7117400 Memory device with data line steering and bitline redundancy |
| 10/03/2006 | US7117399 Method of and apparatus for controlling data storage system according to temperature, and medium |
| 10/03/2006 | US7117394 Built-in self-test circuit |
| 10/03/2006 | US7117332 Window-based flash memory storage system and management and access methods thereof |
| 10/03/2006 | US7116604 Semiconductor memory device and method for selecting multiple word lines in a semiconductor memory device |
| 10/03/2006 | US7116592 Semiconductor device and test method thereof |
| 10/03/2006 | US7116591 Redundancy circuits and memory devices having a twist bitline scheme and methods of repairing defective cells in the same |
| 10/03/2006 | US7116582 Nonvolatile semiconductor memory and method of operating the same |
| 10/03/2006 | US7116570 Access circuit and method for allowing external test voltage to be applied to isolated wells |
| 10/03/2006 | US7116133 Apparatus and method for adjusting clock skew |
| 10/03/2006 | US7116127 Circuit with fuse and semiconductor device having the same circuit |
| 09/28/2006 | WO2006101984A2 Internally generating patterns for testing in an integrated circuit device |
| 09/28/2006 | US20060218471 Optical disc recording/reproduction apparatus |
| 09/28/2006 | US20060218470 Multiply redundant raid system and XOR-efficient method and apparatus for implementing the same |
| 09/28/2006 | US20060218469 Low power cost-effective ECC memory system and method |
| 09/28/2006 | US20060218468 Memory initialization device, memory initialization method, and error correction device |
| 09/28/2006 | US20060218467 Memory having a portion that can be switched between use as data and use as error correction code (ECC) |
| 09/28/2006 | US20060218453 System and method for testing a memory for a memory failure exhibited by a failing memory |
| 09/28/2006 | US20060218452 Area efficient BIST system for memories |
| 09/28/2006 | US20060218432 Method for the recognition and/or correction of memory access error electronic circuit arrangement for carrying out said method |
| 09/28/2006 | US20060216927 Methods and systems for processing a device, methods and systems for modeling same and the device |
| 09/28/2006 | US20060215470 Data compression read mode for memory testing |
| 09/28/2006 | US20060215469 Semiconductor device and skew adjusting method |
| 09/27/2006 | EP1704571A1 Non-volatile memory and method with block management system |
| 09/27/2006 | CN1839545A Circuit for testing and fine tuning integrated circuit (switch control circuit) |
| 09/27/2006 | CN1838329A Method and apparatus for dynamically concealing memory defect |
| 09/27/2006 | CN1838328A Method for erasing memory cell on memory array |
| 09/27/2006 | CN1838327A Semiconductor memory device and semiconductor memory device test method |
| 09/26/2006 | US7114119 Detecting and correcting errors in data |
| 09/26/2006 | US7114118 System and method for providing adjustable read margins in a semiconductor memory |
| 09/26/2006 | US7114117 Memory card and memory controller |
| 09/26/2006 | US7114113 Test circuit provided with built-in self test function |
| 09/26/2006 | US7114108 Semiconductor test system and method for effectively testing a semiconductor device having many pins |
| 09/26/2006 | US7114025 Semiconductor memory having test function for refresh operation |
| 09/26/2006 | US7113441 Semiconductor memory |
| 09/26/2006 | US7113435 Data compression read mode for memory testing |
| 09/26/2006 | US7113434 Semiconductor integrated circuit having programmable delays for generating timing signals with time difference being non-integral multiple of clock cycle |
| 09/26/2006 | US7113422 Method for optimizing MRAM circuit performance |
| 09/26/2006 | US7112895 Reduced power consumption in integrated circuits with fuse controlled redundant circuits |
| 09/21/2006 | WO2006099517A2 Multiply redundant raid system and xor-efficient implementation |
| 09/21/2006 | US20060212779 Dynamic speed control method for storage device |
| 09/21/2006 | US20060212778 Hardware based memory scrubbing |
| 09/21/2006 | US20060212777 Medium storage device and write path diagnosis method |
| 09/21/2006 | US20060212764 Integrated circuit and method for testing memory on the integrated circuit |
| 09/21/2006 | US20060209603 Method and apparatus for supporting verification, and computer product |
| 09/21/2006 | US20060208758 Method and system for detecting a mode of operation of an integrated circuit, and a memory device including same |
| 09/21/2006 | US20060207975 High-speed, precision, laser-based method and system for processing material of one or more targets within a field |
| 09/21/2006 | DE4243611B4 Testmodusschaltung für eine Speichervorrichtung Test mode circuit for a memory device |
| 09/21/2006 | DE102005011893B3 Semiconductor memory component e.g. partial good memory, for use as audio dynamic RAM, has test logic to test component by writing result based on comparison of test-data words along with error free signal and by simulating all-good-memory |
| 09/21/2006 | DE102005011892A1 Semiconductor memory element has memory cell field with groups of data items with set number of memory cells, has plurality of address lines whereby internal address lines is addressable to transferred binary coded memory address |
| 09/21/2006 | DE102005011891B3 Semiconductor memory unit e.g. dynamic RAM, has I/O skip unit that is erased, when memory cells assigned to data lines are identified as non-functional, and erased skip unit forces error free signal to PF-signal line |
| 09/21/2006 | DE102005011874A1 Semiconductor memory element has programmable routing unit, which is connected with data connections and data links whereby each data link is connected with assigned data connection in first programmed state of routing unit |
| 09/21/2006 | DE102005009360B3 Integrierter Halbleiterspeicher mit aktivierbaren Leseverstärkern Integrated semiconductor memory with activated sense amplifiers |
| 09/21/2006 | DE102004055466B4 Einrichtung und Verfahren zum Messen von Speicherzell-Strömen Apparatus and method for measuring memory cell currents |
| 09/20/2006 | EP1702338A2 Robust data duplication and improved update method in a multibit non-volatile memory |
| 09/20/2006 | EP1461689B1 Method and test device for detecting addressing errors in control devices |
| 09/20/2006 | CN1836215A Fault tolerant data storage circuit |
| 09/20/2006 | CN1835125A Apparatus and method for correcting hardware |
| 09/20/2006 | CN1835119A Semiconductor memory and method for analyzing failure of semiconductor memory |
| 09/20/2006 | CN1834928A Soft error correction method, memory control apparatus and memory system |
| 09/19/2006 | US7111227 Methods and systems of using result buffers in parity operations |
| 09/19/2006 | US7111224 FPGA configuration memory with built-in error correction mechanism |
| 09/19/2006 | US7111211 Efficient air-flow loop through dual burn-in chambers with removable pattern-generator boards for memory-module environmental testing |
| 09/19/2006 | US7111210 Accelerated test method for ferroelectric memory device |
| 09/19/2006 | US7111190 Method and apparatus for reconfigurable memory |
| 09/19/2006 | US7111140 Increasing the memory performance of flash memory devices by writing sectors simultaneously to multiple flash memory devices |
| 09/19/2006 | US7110322 Memory module including an integrated circuit device |
| 09/19/2006 | US7110314 Semiconductor memory device and method for initializing the same |
| 09/19/2006 | US7110307 Semiconductor memory with a data holding circuit having two output terminals |
| 09/19/2006 | US7110303 Memory cell testing feature |
| 09/19/2006 | US7110294 Semiconductor memory device |
| 09/19/2006 | US7110290 Thin film magnetic memory device storing program information efficiently and stably |
| 09/19/2006 | US7110288 Thin film magnetic memory device having redundant configuration |
| 09/19/2006 | US7110282 Semiconductor memory device allowing accurate burn-in test |
| 09/14/2006 | WO2006055862A3 Programmable memory built-in-self-test (mbist) method and apparatus |
| 09/14/2006 | US20060206770 Non-Volatile Semiconductor Memory With Large Erase Blocks Storing Cycle Counts |
| 09/14/2006 | US20060206766 System and method for on-board diagnostics of memory modules |
| 09/14/2006 | US20060206672 System and method for providing one-time programmable memory with fault tolerance |
| 09/14/2006 | US20060203582 Memory compiler redundancy |
| 09/14/2006 | US20060203581 Efficient method and computer program for modeling and improving static memory performance across process variations and environmental conditions |
| 09/14/2006 | US20060203580 Programmable element latch circuit |
| 09/14/2006 | US20060203579 Device and method for compensating defect in semiconductor memory |
| 09/14/2006 | US20060203578 Apparatus and method for self-correcting cache using line delete, data logging, and fuse repair correction |
| 09/14/2006 | US20060202208 Silicon plate, producing method thereof, and solar cell |
| 09/14/2006 | DE102006000797A1 Schreiben unbeschädigter Daten in einen elektronischen Speicher Write undamaged data in an electronic memory |
| 09/13/2006 | EP1701359A1 Memory tester with test program branch on error indication |
| 09/13/2006 | EP1700314A1 Flexible and area efficient column redundancy for non-volatile memories |