G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation

Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
12/2006
12/26/2006	US7154793 Integrated memory and method for functional testing of the integrated memory
12/26/2006	US7154791 Redundancy circuit
12/26/2006	US7154782 Contiguous block addressing scheme
12/26/2006	US7154781 Contiguous block addressing scheme
12/26/2006	US7154780 Contiguous block addressing scheme
12/26/2006	US7154767 Method for manufacture of semiconductor device
12/21/2006	WO2006134411A1 Built-in-self-test method for a semiconductor memory
12/21/2006	WO2006134308A2 Integrated circuit protected against short circuits and operating errors following the passage on an ionizing radiation
12/21/2006	WO2006091468A3 Enabling special modes within a digital device
12/21/2006	WO2006042058A3 Memory regulator system with test mode
12/21/2006	WO2005122630A3 Arrangement in a network node for secure storage and retrieval of encoded data distributed among multiple network nodes
12/21/2006	US20060288263 Drive device
12/21/2006	US20060285413 Semiconductor memory
12/21/2006	US20060285404 Multi-use strobe and illumination module
12/21/2006	US20060284650 Logic circuit and semiconductor integrated circuit
12/21/2006	US20060284285 Manufacturing method for a semiconductor device, semiconductor device, circuit substrate and electronic device
12/21/2006	DE102005005301B4 Integrierter Halbleiterspeicher Integrated semiconductor memory
12/21/2006	DE102004047058B4 Integrierter Halbleiterspeicher mit Testschaltung Integrated semiconductor memory with test circuit
12/20/2006	EP1734537A2 Bitmap analysis system and method for high speed testing of a memory device
12/20/2006	EP1685571A4 A method circuit and system for determining a reference voltage
12/20/2006	EP1218887B1 Method and apparatus for supplying regulated power to memory device components
12/20/2006	CN1882920A Lane testing with variable mapping
12/20/2006	CN1881478A Memory device
12/20/2006	CN1881477A Error detection and correction for encoded data
12/20/2006	CN1881476A Apparatus and method for storing array redundancy data on integrated circuit device
12/20/2006	CN1881475A System and method for memory element characterization
12/19/2006	US7152194 Method and circuit for scan testing latch based random access memory
12/19/2006	US7152192 System and method of testing a plurality of memory blocks of an integrated circuit in parallel
12/19/2006	US7152187 Low-power SRAM E-fuse repair methodology
12/19/2006	US7151713 Semiconductor memory device
12/19/2006	US7151708 Semiconductor integrated circuit and operational amplifier
12/19/2006	US7151704 Semiconductor memory device
12/19/2006	US7151694 Integrated circuit memory with fast page mode verify
12/19/2006	CA2246763C Improved redundancy selection circuit for semiconductor memories
12/14/2006	WO2006132951A1 Memory device with row shifting for defective row repair
12/14/2006	US20060282747 ECC flag for testing on-chip error correction circuit
12/14/2006	US20060282720 Method for the automatic provision of repair position data of fuse elements in integrated memory circuit
12/14/2006	US20060282719 Unique Addressable Memory Data Path
12/14/2006	US20060282718 Test mode for programming rate and precharge time for DRAM activate-precharge cycle
12/14/2006	US20060282716 Redundant storage of computer data
12/14/2006	US20060280008 Device to be used for reading out a memory cell, and method for reading out a memory cell
12/14/2006	DE102004056214B4 Speicherpuffer Memory buffer
12/14/2006	CA2610578A1 Memory device with row shifting for defective row repair
12/13/2006	EP1732083A1 Reducing false positives in configuration error detection for programmable devices
12/13/2006	EP1732082A2 A memory architecture with BIST
12/13/2006	EP1730539A2 Built-in self test method and apparatus for jitter transfer, jitter tolerance, and fifo data buffer
12/13/2006	CN2847460Y Storage chip detector
12/13/2006	CN1879234A Multiple bit chalcogenide storage device
12/13/2006	CN1879173A Refresh for dynamic cells with weak retention
12/13/2006	CN1877743A Demonstration system for phase-change memory cell array and visual demonstration method therefor
12/13/2006	CN1290189C Semiconductor device with redundant function
12/12/2006	US7150009 Space-efficient object models for object-oriented programming languages
12/12/2006	US7149950 Assisted memory device for reading and writing single and multiple units of data
12/12/2006	US7149949 Method for error correction decoding in a magnetoresistive solid-state storage device
12/12/2006	US7149948 Manufacturing test for a fault tolerant magnetoresistive solid-state storage device
12/12/2006	US7149946 Systems and methods for enhanced stored data verification utilizing pageable pool memory
12/12/2006	US7149944 Semiconductor integrated circuit device equipped with read sequencer and write sequencer
12/12/2006	US7149941 Optimized ECC/redundancy fault recovery
12/12/2006	US7149940 Device and method for reading data stored in a semiconductor device having multilevel memory cells
12/12/2006	US7149939 Method of testing the data exchange functionality of a memory
12/12/2006	US7149934 Error correcting memory access means and method
12/12/2006	US7149871 Zone boundary adjustment for defects in non-volatile memories
12/12/2006	US7149869 Method and apparatus for generating generic descrambled data patterns for testing ECC protected memory
12/12/2006	US7149640 Method and system for test data capture and compression for electronic device analysis
12/12/2006	US7149136 Memory circuit with redundant memory cell array allowing simplified shipment tests and reduced power consumptions
12/12/2006	US7149135 Multi chip package type memory system and a replacement method of replacing a defect therein
12/12/2006	US7149123 Non-volatile CMOS reference circuit
12/12/2006	US7149115 Nonvolatile memory device including circuit formed of thin film transistors
12/12/2006	US7149113 Semiconductor integrated circuit device
12/12/2006	US7148717 Methods and apparatus for testing electronic circuits
12/12/2006	US7148447 Method and apparatus for laser marking by ablation
12/07/2006	WO2006129345A1 Semiconductor device and program data redundant method
12/07/2006	US20060277451 Magnetic disk apparatus, preventive maintenance detection method and program therefor
12/07/2006	US20060274586 Semiconductor memory device with redundancy function
12/07/2006	US20060274585 Memory device with row shifting for defective row repair
12/07/2006	US20060273822 Semiconductor circuit
12/07/2006	DE202006013974U1 Speicherkarte mit der Möglichkeit zum Schutz eines Testkontakts Memory card with the ability to protect a test contact
12/07/2006	DE102005029251A1 Speichermodul und Verfahren zum Betreiben eines Speichermoduls Memory module and method of operating a memory module
12/07/2006	DE102005024652A1 Memory module, has internal reference data registers coupled to internal data bus in programmable sequence based on control signals generated by multiplexer device for controlling registers based on test control signal
12/06/2006	EP1728255A1 Dft technique for stressing self-timed semiconductor memories to detect delay faults
12/06/2006	EP1728254A1 Method for detecting resistive bridge defects in the global data bus of semiconductor memories
12/06/2006	CN2845101Y Memory tester and memory testing apparatus therewith
12/06/2006	CN1873830A Fuse cutting test circuit, fuse cutting test method, and semiconductor circuit
12/06/2006	CN1288742C Manufacturing method of semiconductor memory device
12/06/2006	CN1288739C Light shield detecting method for mask ROM
12/06/2006	CN1288665C Semiconductor storage device and information apparatus
12/05/2006	US7146549 Scan-path flip-flop circuit for integrated circuit memory
12/05/2006	US7146547 Semiconductor device
12/05/2006	US7146546 Semiconductor device
12/05/2006	US7146528 Simple fault tolerance for memory
12/05/2006	US7146456 Memory device with a flexible reduced density option
12/05/2006	US7146285 Integrated circuit with parameter measurement
12/05/2006	US7145977 Diagnostic method and apparatus for non-destructively observing latch data
12/05/2006	US7145818 Semiconductor integrated circuit device having test circuit
12/05/2006	US7145817 Reduced power redundancy address decoder and comparison circuit
12/05/2006	US7145816 Using redundant memory for extra features
12/05/2006	US7145801 External storage device
12/05/2006	US7145797 Selecting a magnetic memory cell write current
12/05/2006	US7145356 Circuits for transistor testing
11/2006
11/30/2006	US20060271831 Semiconductor memory device having a test control circuit

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